CN205406483U - Field emission scanning electron microscope sample platform - Google Patents
Field emission scanning electron microscope sample platform Download PDFInfo
- Publication number
- CN205406483U CN205406483U CN201620118718.5U CN201620118718U CN205406483U CN 205406483 U CN205406483 U CN 205406483U CN 201620118718 U CN201620118718 U CN 201620118718U CN 205406483 U CN205406483 U CN 205406483U
- Authority
- CN
- China
- Prior art keywords
- positioning seat
- rotating shaft
- electron microscope
- scanning electron
- field emission
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Abstract
The utility model discloses a field emission scanning electron microscope sample platform, including metal round platform face, positioning seat and rotation axis, wherein the positioning seat symmetry sets up in the middle part of metal round platform face, and the upper portion of positioning seat is equipped with relative shaft hole, and the rotation axis articulates in the shaft hole of positioning seat, through the spiro union on the positioning seat and the nut spiral shell relative with the rotation axis tight, be equipped with on the rotation axis between the positioning seat with the integrative linkage of rotation axis carry an appearance sheetmetal. The utility model discloses simple structure can realize the diversified appearance of same irregular sample and observe.
Description
Technical field
This utility model belongs to field emission scanning electron microscope auxiliary device technical field, is specifically related to a kind of field emission scanning electron microscope sample stage.
Background technology
Usually with conducting resinl (or elargol), sample is bonded on sample stage in Flied emission scanning electron microscope test process at present.Can there is fixing shakiness, the problem easily slided in the narrow sectional observation for sample, and can not realize the morphology observations of the irregular sample multi-angle of bulk.
Summary of the invention
This utility model be solve existing sample stage can not the narrow cross section of observing samples, it is impossible to the limitation of multi-angle observation sample topography, it is provided that a kind of field emission scanning electron microscope sample stage.
This utility model adopts the following technical scheme that for solving above-mentioned technical problem, a kind of field emission scanning electron microscope sample stage, including round metal table top, positioning seat and rotating shaft, wherein positioning seat is symmetricly set in the middle part of round metal table top, the top of positioning seat is provided with relative axis hole, rotating shaft is articulated with in the axis hole of positioning seat, and by being bolted on positioning seat, the nut relative with rotating shaft screws tight, and the rotating shaft between positioning seat is provided with and the load sample sheet metal of rotating shaft one linkage.
It is preferred that, described rotating shaft one end is provided with fixed pointers, and the positioning seat lateral wall relative with fixed pointers is provided with angle index.
It is preferred that, the bottom of described round metal table top is provided with pillar.
This utility model solves the morphology observations of the irregular sample multi-section multi-angle of bulk, adopt the pattern of load sample sheet metal and rotating shaft one linkage, by the position that the fixing rotating shaft of the nut on positioning seat rotates, it is possible to realize determining angle rotary sample and be prone to observe the pattern of different azimuth.
Accompanying drawing explanation
Fig. 1 is structural representation of the present utility model；
Fig. 2 is partial enlarged drawing of the present utility model.
In figure: 1, pillar, 2, round metal table top, 3, fixed pointers, 4, rotating shaft, 5, load sample sheet metal, 6, positioning seat, 7, nut, 8, angle index.
Detailed description of the invention
Of the present utility model particular content is described in detail in conjunction with accompanying drawing.A kind of field emission scanning electron microscope sample stage, including round metal table top 2, positioning seat 6 and rotating shaft 4, wherein positioning seat 6 is symmetricly set in the middle part of round metal table top 2, the top of positioning seat 6 is provided with relative axis hole, rotating shaft 4 is articulated with in the axis hole of positioning seat 6, by being bolted on positioning seat 6 and the nut 7 relative with rotating shaft 4 screws tight, the rotating shaft 4 between positioning seat 6 is provided with and the load sample sheet metal 5 of rotating shaft 4 one linkage.Described rotating shaft 4 one end is provided with fixed pointers 3, and positioning seat 6 lateral wall relative with fixed pointers 3 is provided with angle index 8.The bottom of described round metal table top 2 is provided with pillar 1.
This utility model adopts rotating shaft and load sample sheet metal one linkage pattern, the position of rotation of rotating shaft is fixed by nut, and utilize on rotating shaft the angle index of fixed pointers indication to read the number of rotation of rotating shaft, thus realizing the bulk continuous angle of irregular sample, multi-faceted morphology observation.
Of the present utility model ultimate principle has more than been shown and described; principal character and advantage; under the premise without departing from this utility model spirit and scope, this utility model also has various changes and modifications, and these changes and improvements both fall within claimed scope of the present utility model.
Claims (3)
1. a field emission scanning electron microscope sample stage, it is characterized in that including round metal table top, positioning seat and rotating shaft, wherein positioning seat is symmetricly set in the middle part of round metal table top, the top of positioning seat is provided with relative axis hole, rotating shaft is articulated with in the axis hole of positioning seat, by being bolted on positioning seat and the nut relative with rotating shaft screws tight, the rotating shaft between positioning seat is provided with and the load sample sheet metal of rotating shaft one linkage.
2. field emission scanning electron microscope sample stage according to claim 1, it is characterised in that: described rotating shaft one end is provided with fixed pointers, and the positioning seat lateral wall relative with fixed pointers is provided with angle index.
3. field emission scanning electron microscope sample stage according to claim 1, it is characterised in that: the bottom of described round metal table top is provided with pillar.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620118718.5U CN205406483U (en) | 2016-02-04 | 2016-02-04 | Field emission scanning electron microscope sample platform |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620118718.5U CN205406483U (en) | 2016-02-04 | 2016-02-04 | Field emission scanning electron microscope sample platform |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205406483U true CN205406483U (en) | 2016-07-27 |
Family
ID=56450886
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201620118718.5U Expired - Fee Related CN205406483U (en) | 2016-02-04 | 2016-02-04 | Field emission scanning electron microscope sample platform |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205406483U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107015027A (en) * | 2017-03-03 | 2017-08-04 | 复旦大学 | The Sample location fixing means and device of a kind of scanning probe microscopy |
-
2016
- 2016-02-04 CN CN201620118718.5U patent/CN205406483U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107015027A (en) * | 2017-03-03 | 2017-08-04 | 复旦大学 | The Sample location fixing means and device of a kind of scanning probe microscopy |
| CN107015027B (en) * | 2017-03-03 | 2020-09-01 | 复旦大学 | Sample positioning and fixing method and device of scanning probe microscope |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20160727 Termination date: 20170204 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |