CN205376460U - Sample holding device of scanning electron microscope - Google Patents
Sample holding device of scanning electron microscope Download PDFInfo
- Publication number
- CN205376460U CN205376460U CN201620012881.3U CN201620012881U CN205376460U CN 205376460 U CN205376460 U CN 205376460U CN 201620012881 U CN201620012881 U CN 201620012881U CN 205376460 U CN205376460 U CN 205376460U
- Authority
- CN
- China
- Prior art keywords
- electron microscope
- scanning electron
- fixture block
- sample
- workstation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Abstract
The utility model provides a sample holding device of scanning electron microscope, includes the workstation, the one end of workstation is equipped with the fixture block no. One, the workstation upper surface transversely be equipped with the spout, it has the slider to inlay in the spout, the top of slider is equipped with the fixture block no. Two, the other end of workstation is equipped with the boss, the limit portion of boss passes through cylindrical spring and is connected with the slider, bottom in the spout is equipped with a plurality of blind holes, be equipped with the bracing piece in the blind hole, the top of bracing piece is equipped with the layer board. The utility model discloses can be through the cooperation of fixture block, no. Two fixture blocks and layer board, convenient sample to irregular, different weight, different volumes carries out centre gripping, convenient and practical.
Description
Technical field
This utility model relates to a kind of scanning electron microscope sample clamping device.
Background technology
When using scanning electron microscope, need to be put on workbench by sample, but sample is irregular sometimes, require that when placing sample seeing substandard products face is in level and keeps stationary state again as much as possible, traditional workbench is can only to put on the table by sample, thus for the irregular sample of part, it is difficult to ensure that the level of inspection surface, so that a kind of clamping device that can be suitably used for irregular sample.
Summary of the invention
The purpose of this utility model is for above-mentioned deficiency, it is provided that a kind of scanning electron microscope sample clamping device.
Described purpose is achieved by the following scheme: a kind of scanning electron microscope sample clamping device, including workbench, one end of described workbench is provided with a fixture block, described worktable upper surface be transversely provided with chute, it is inlaid with slide block in described chute, the top of described slide block is provided with No. two fixture blocks, the other end of described workbench is provided with boss, the edge of described boss is connected with slide block by cylindrical spring, bottom in described chute is provided with multiple blind hole, being provided with support bar in described blind hole, the top of described support bar is provided with supporting plate.
A described fixture block and the corresponding sidewall of No. two fixture blocks are provided with anti-slip veins.
This utility model has the advantage that this utility model can pass through the cooperation of a fixture block, No. two fixture blocks and supporting plate, and the convenient sample to irregular, Different Weight, different volumes clamps, convenient and practical.
Accompanying drawing explanation
Fig. 1 is structural representation of the present utility model.
Wherein, 1-workbench, number fixture block of 2-, 3-chute, 4-slide block, No. bis-fixture blocks of 5-, 6-boss, 7-cylindrical spring, 8-blind hole, 9-support bar, 10-supporting plate.
Detailed description of the invention
This utility model is elaborated preferred embodiment below in conjunction with accompanying drawing.
A kind of scanning electron microscope sample clamping device, including workbench 1, one end of described workbench 1 is provided with a fixture block 2, described workbench 1 upper surface be transversely provided with chute 3, it is inlaid with slide block 4 in described chute 3, the top of described slide block 4 is provided with No. two fixture blocks 5, the other end of described workbench 1 is provided with boss 6, the edge of described boss 6 is connected with slide block 4 by cylindrical spring 7, bottom in described chute 3 is provided with multiple blind hole 8, it is provided with support bar 9 in described blind hole 8, the top of described support bar 9 is provided with supporting plate 10, a described fixture block 2 sidewall corresponding with No. two fixture blocks 5 is provided with anti-slip veins.
Slide block 4 is promoted to slide in chute 3 by the elastic force of cylindrical spring 7, by the cooperation of a fixture block 2 and No. two fixture blocks 5, sample is clamped, the design of anti-slip veins is conducive to fixing sample, meet sample heavier time, volume per sample is held by the supporting plate 10 on support bar 9, and support bar 9 can volume size per sample be alternatively provided in suitable blind hole 8.
The exemplary illustrated of this patent is not simply limited its protection domain by present embodiment; it can also be carried out local and change by those skilled in the art; as long as no the spirit beyond this patent, all it is considered as the equivalent replacement to this patent, all at the protection domain of this patent.
Claims (2)
1. a scanning electron microscope sample clamping device, including workbench (1), it is characterized in that: one end of described workbench (1) is provided with a fixture block (2), described workbench (1) upper surface be transversely provided with chute (3), slide block (4) it is inlaid with in described chute (3), the top of described slide block (4) is provided with No. two fixture blocks (5), the other end of described workbench (1) is provided with boss (6), the edge of described boss (6) is connected with slide block (4) by cylindrical spring (7), bottom in described chute (3) is provided with multiple blind hole (8), support bar (9) it is provided with in described blind hole (8), the top of described support bar (9) is provided with supporting plate (10).
2. scanning electron microscope sample clamping device according to claim 1, it is characterised in that: the sidewall that a described fixture block (2) is corresponding with No. two fixture blocks (5) is provided with anti-slip veins.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620012881.3U CN205376460U (en) | 2016-01-08 | 2016-01-08 | Sample holding device of scanning electron microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620012881.3U CN205376460U (en) | 2016-01-08 | 2016-01-08 | Sample holding device of scanning electron microscope |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205376460U true CN205376460U (en) | 2016-07-06 |
Family
ID=56275266
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201620012881.3U Expired - Fee Related CN205376460U (en) | 2016-01-08 | 2016-01-08 | Sample holding device of scanning electron microscope |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205376460U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107907550A (en) * | 2017-10-30 | 2018-04-13 | 郑州旭飞光电科技有限公司 | Glass substrate blade fixing device and sections observation equipment |
-
2016
- 2016-01-08 CN CN201620012881.3U patent/CN205376460U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107907550A (en) * | 2017-10-30 | 2018-04-13 | 郑州旭飞光电科技有限公司 | Glass substrate blade fixing device and sections observation equipment |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20160706 Termination date: 20170108 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |