CN205374675U - Operational amplifier's testing arrangement - Google Patents
Operational amplifier's testing arrangement Download PDFInfo
- Publication number
- CN205374675U CN205374675U CN201520888159.1U CN201520888159U CN205374675U CN 205374675 U CN205374675 U CN 205374675U CN 201520888159 U CN201520888159 U CN 201520888159U CN 205374675 U CN205374675 U CN 205374675U
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- China
- Prior art keywords
- operational amplifier
- test device
- base plate
- test
- relay
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- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The utility model relates to a testing arrangement especially relates to an operational amplifier's operation part. An operational amplifier's testing arrangement, testing arrangement includes the box, the box is inside to be included: the bottom plate, transport and put the loop board, with bottom plate fixed connection, the printing has operational amplifier's test circuit, the keysets, with the bottom plate is connected, the switching the bottom plate with whole or the some test signal on the loop board are put to fortune.
Description
Technical field
This utility model relates to a kind of test device, particularly relates to the arithmetic unit of a kind of operational amplifier.
Background technology
Test device in the market not exclusively can be able to mate with various test machines, the inconvenient concordance to the data of test amplifier judges and manages, simultaneously as because of port disunity during various test machines coupling, thus being not convenient for production management to identify and safeguard, the test device simultaneously also limiting operational amplifier can not general multiple-unit operational amplifier.
Utility model content
For problems of the prior art, this utility model provides the test device of a kind of operational amplifier, it is possible to general mono-/bis-/tetra-unitary operation amplifier, various test machines is mated simultaneously.
This utility model adopts the following technical scheme that
A kind of test device of operational amplifier, described test device includes casing, and described box house includes:
Base plate, tests the wiring of circuit including described operational amplifier；
Amplifier loop plate, fixes with described base plate and is connected, be welded with the test circuit of described operational amplifier；
Keyset, is connected with described base plate, transfer described base plate and all or part of test signal on described amplifier loop plate.
Above-mentioned base plate, amplifier loop plate and keyset may be contained within the cavity of inside of casing, amplifier loop plate is double-sided PCB, front or back at amplifier loop plate is welded with relay and operational amplifier to be measured, relay and operational amplifier to be measured are welded in the front of amplifier loop plate, above-mentioned alleged front refers to the one side away from base plate, and the front that operational amplifier is arranged at amplifier loop plate facilitates the dismounting in test process.
Above-mentioned base plate is printed with the wiring of test circuit, described relay and described operational amplifier respectively through relay corresponding with the pin of operational amplifier be welded on base plate, in addition the pin of operational amplifier and relay can also be welded on amplifier loop plate by relay and operational amplifier, again through welding amplifier loop plate, weld with base plate connects up corresponding port, complete the connection of the device on amplifier loop plate and the wiring of the test circuit on base plate.Certainly, the device being welded on amplifier loop plate can comprise more than relay and operational amplifier two kinds, other necessary electronic component can also be included, the volume that the reason being generally welded on by relay on amplifier loop plate is relay is bigger, it is placed on affecting the layout of other devices, so test circuit can will need the relay used all to be welded on amplifier loop plate, in order to save the space of box house.And it is comparatively obvious that operational amplifier to be measured is welded on the position being primarily due to amplifier loop plate on amplifier loop plate, and protrude from base plate, change more convenient, so other device will not be touched in operation by mistake, cause the damage of other devices.
Preferably, it is connected by screw column between described base plate with described amplifier loop plate.
Screw column mainly fixing fixing between base plate with amplifier loop plate is connected, and is not related to the transmission of signal, is actually the annexation of hardware, as long as and testing signal and carry out the transmission of test signal between base plate and amplifier loop plate by the mode of welding pin.
Preferably, described amplifier loop plate is welded with relay, the transmission of the described test signal on amplifier loop plate described in described Control.
Above-mentioned relay is the important component part of test circuit, when the winding of relay has electric current to flow through, when namely producing voltage difference between the input of relay winding and outfan, relay can control normally opened get an electric shock Guan Bi or the normally-closed contact disconnection of this relay, the test loop work that electric shock (connectivity port) to control relay connects still does not work, relay plays the effect of a switch herein, voltage source or current source that one end (input or outfan) of relay winding in the present embodiment is generally fixing with one are connected, the other end accesses high level or low level, the two ends (input and outfan) controlling relay produce voltage difference, the test loop that Control is corresponding is devoted oneself to work, thus the partial parameters of operational amplifier is tested.And the winding of which relay is had electric current and is generally controlled by single-chip microcomputer by this, control logic described in detail below herein.
Preferably, described amplifier loop plate is also welded with overshoot voltage protection circuit, protects described relay drive circuit.Overshoot voltage protection circuit in the present embodiment is welded on base plate, input or outfan at each relay, the in-phase end of operational amplifier, end of oppisite phase or any one sampled point in test circuit are sampled, compare with the numerical value preset, when the numerical value of sampling exceed default extraneous time, carry out reporting to the police or processing, warning herein can be this overshoot voltage protection circuit and alarm connection, when sample magnitude over range time, namely send alarm signal make alarm equipment alarm, in like manner, when the numerical value over range of sampling time, overshoot voltage protection circuit can directly or indirectly control test circuit and disconnect, the mode controlling test circuit disconnection can make test circuit disconnect by above-mentioned controller.
Preferably, described relay is band screen layer dry-reed relay (BRS1A05).
Above-mentioned relay is as electronic device that is essential in test circuit and that frequently use, it is because relay can control specifically to test which parameter of operational amplifier, in test device in the present embodiment, base plate and amplifier circuit board are also gone up and are also integrated with multiple module, and these modules specifically include that
Power module, described power module is mainly used in providing electric energy, described power module more than one voltage source or current source, but refer to the voltage source or current source that need to use in the present embodiment, the object providing electric energy also mainly includes two, first relay, as mentioned above, one end of relay needs to be connected with fixing power supply, namely this fixed power source can be this power module, its two power module needs to provide electric energy for operational amplifier to be measured, it is operational amplifier and applies electric energy, when operational amplifier to be measured is single supply device time, can by operational amplifier ground connection, in addition, by changing the voltage applied at operational amplifier, control variable again, this operational amplifier parameter value under the control of different electrical power voltage can also be tested.Power module in the present embodiment also includes the situation of ground connection, for instance if it is desired to make the input common mode input of operational amplifier, then can by equal to the in-phase end of operational amplifier and end of oppisite phase ground connection.
Input/output resistive module, the in-phase end of described operational amplifier and end of oppisite phase can connect multiple resistance respectively, and by changing the resistance of the resistance accessed in circuit, it is possible to the in-phase end of operational amplifier and the input signal of end of oppisite phase are changed.
Feedback module, the outfan of operational amplifier is mainly connected by the connected mode of feedback module by the end of oppisite phase of a feedback resistance with described operational amplifier, under the open loop mode of test operational amplifier, stayed out of by a switch or Control feedback module, on the contrary, in closed network, by on-off control, feedback module is accessed in circuit.
nullAbove-mentioned described relay can pass through disconnection and the Guan Bi of its contact of Single-chip Controlling，Its control process is mainly: with the address of binary system or other system forms of expression by address bus transmission to address decoder，This address is decoded by address decoder，Data base searches for the data of correspondence，When data are searched out determine after，Again these data are decoded into corresponding control instruction by data/address bus，This control instruction can be low level or high level，Including the digital signal of low level or high level by controlling bus transfer to the input of relay or outfan，The input of such as relay accesses the voltage of+5V，Now access low level at the outfan of relay，Voltage corresponding to low level is 0V，Then will produce the pressure drop of 5V between the winding of relay，In winding, existing electric current flows through，According to electromagnetic induction principle，Shell fragment in relay can adhesive，It is the Guan Bi of normally opened electric shock，Namely corresponding test circuit is switched in the test circuit in the present embodiment.
Preferably, described casing includes:
Top cover；
Bottom, it is possible to cover with described top cover, and
Described top cover and described bottom form cavity after covering.
The above-mentioned cube that top cover is three openings being previously mentioned, including two base plates and a side plate, respectively with two base plates of one side plate connect, two base plates are parallel placement, two described base plates are provided with through hole, should by being in order to after top cover and bottom cover, it is possible to fix with bottom and be connected.
Bottom mentioned above is the cube of an opening, when covering, corresponding for the one side of this opening is covered on the side plate of top cover, form an airtight cavity, therefore bottom includes four base plates and a side plate, the side plate of top cover can parallel be placed after covering with the side plate of bottom, two base plates in the base plate of bottom are provided with the through hole that two base plates with top cover are corresponding, conveniently top cover and bottom are fixed, so also corresponding with the two of top cover side plates with the shape of the two base plate of through hole in bottom base plate, it is possible to it is rectangle.
Preferably, described test device also includes:
At least one 16 shielding winding displacement, is connected with described base plate, by the output of described test signal and/or access input signal.
Preferably, described 16 shielding winding displacements are connected with described base plate by 16PIN adapter.
Preferably, described test device also includes:
64 shielding lines, are connected with described amplifier loop, by the output of described test signal and/or access input signal.
Preferably, described 64 shielding lines are connected with described base plate by 64PIN adapter.
Preferably, described casing is rustless steel shielding shell.
Described 16PIN adapter and the pin of 64PIN adapter are 90 degree of bending shapes, it can also be other angle, the so convenient direction adjusting shielding winding displacement, shielding winding displacement may be used for input signal and output signal, and the two ends shielding winding displacement are respectively connected with adapter, the port welding that one end of of shielding winding displacement such as mentioned above is corresponding with the wiring repeat circuit on base plate, then the other end can incoming control signal (high level or low level), shielding winding displacement can also be connected with above-mentioned power module, owing to power module potentially including multiple voltage source or current source, so the shielding winding displacement that can pass through different bar connects different voltage sources or current source, concrete connected mode can according to test circuit required for external devices arrange.
The beneficial effects of the utility model are:
This utility model have employed overshoot voltage protection circuit; the relay drive circuit on base plate and amplifier loop plate can be protected; increase the service life; additionally use band screen layer dry-reed relay simultaneously; prevent external environmental signals interference and loop action crosstalk own; make duty quite stable, it is ensured that estimate the accuracy of data.
This utility model have employed double-sided belt screen layer and connects, make testing cassete can test the electric leakage of PA level and UV level output voltage, fully meet the quality requirements of finished industrial product, tailored appearance of the present utility model is attractive in appearance, less costly, volume is little, complex manufacturing technology is accurate, easily operation, it is easy to coordinate with other test equipment, popularization and application.
Accompanying drawing explanation
Fig. 1 is the front view of this utility model operational amplifier test device；
Fig. 2 is the rearview of this utility model operational amplifier test device；
Fig. 3 is the upward view of this utility model operational amplifier test device；
Fig. 4 is the axonometric chart of this utility model operational amplifier test device；
The top cover axonometric chart of Fig. 5 a-5c respectively casing, Main View Top View；
The axonometric chart of bottom of Fig. 6 a-Fig. 6 d respectively casing, front view, top view, left view；
Fig. 7 a-Fig. 7 d respectively axonometric chart of 16PIN adapter, front view, left view；
Fig. 8 a-Fig. 8 d respectively axonometric chart of 64PIN adapter, front view, left view；
Fig. 9 a-9c is the axonometric chart of amplifier loop plate, front view, upward view；
Figure 10 a-10d is the axonometric chart of this utility model relay, front view, top view, upward view.
Detailed description of the invention
It should be noted that when not conflicting, following technical proposals, can be mutually combined between technical characteristic.
Below in conjunction with accompanying drawing, detailed description of the invention of the present utility model is further described:
Embodiment one
Present embodiments provide the test device of a kind of operational amplifier, as Figure 1-4, the device of the present embodiment can the operational amplifier of general mono-/bis-/tetra-unit, the device of the present embodiment includes casing, printed circuit board (PCB) in casing is connected by 16Pin adapter and 16 shielding winding displacements, 16Pin connector construction is such as shown in Fig. 7 a-Fig. 7 d, printed circuit board (PCB) in casing connects also by 64Pin adapter and 6 shielding lines, 64Pin adapter is such as shown in Fig. 8 a-Fig. 8 d, and the connected mode of concrete box house is detailed below.
The casing of the present embodiment includes top cover, as illustrated in figs. 5 a-5 c, top cover is the cuboid of three openings, also include bottom, Fig. 6 a-Fig. 6 d, the structure of bottom is the cuboid of an opening, and top cover and bottom can cover, and forming cavity, the test PCB (printed circuit board (PCB)) of operational amplifier is just placed in this cavity.
Box house specifically includes that base plate and keyset, base plate is connected with 16Pin adapter, keyset is connected with 64Pin adapter, base plate is fixedly connected with amplifier loop plate by screw column, as shown in figures 9 a-9 c, keyset is mainly used in the test signal on switching base plate or amplifier loop plate, amplifier loop plate is printed with test circuit, band screen layer dry-reed relay is included at test circuit, as shown in figures 10 a-10d, control the transmission path of partial test signal in test circuit, keyset can be transferred the test signal of whole on base plate or amplifier loop plate or part.
The manufacture method of the present embodiment operational amplifier test device is: make printed circuit board after first drawing PCB figure on request, its technology requires there are 3 points: 1) character silk-screen white, 2) sheet metal thickness is 1.6mm, copper thickness is be more than or equal to 35um, 3) printed circuit board is increased tin spray process, in case oxidation and guarantee that welding is good；Assembling PCBA again, first check the basic electric property of PCB before element welding with circuit tester, if performance is all good, just weld successively on a printed circuit board according to component size order from small to large, during welding, whether the polarity of confirmation element and the position of installation be correct；Each unit amplifier loop plate is electrified after completing, and I/O channel seals in Agilent voltage and dual channel oscilloscope does preliminary electrically inspection；Then doing vibration experiment and high/low temperature senile experiment with screw in the enclosure by fixing for all printed circuit board assemblies again, be finally that EMC is anti-interference and burst of pulses experiment again, all experiments are energized after completing respectively with its accuracy of standard sample test verification again.
During use, it is first determined fortune amplifier is that (single amplifier device is the AUNIT (unit) of device PIN access operational amplifier testing cassete for single amplifier, double operational or four high guaily unit；Double operational device is respectively connected to AUNIT and the BUNIT of operational amplifier testing cassete in order device PIN；Four high guaily unit device is respectively connected to the AUNIT of operational amplifier testing cassete in order device PIN, BUNIT, CUNIT, DUNIT), be connected with corresponding device pin correspondence according to PIN definition (device pin definition is respectively as follows: the input of IN+-homophase, IN-anti-phase input simultaneously, OUT exports, VDD positive supply, VSS negative supply).
In sum; this utility model have employed overshoot voltage protection circuit; the relay drive circuit on base plate and amplifier loop plate can be protected; increase the service life; additionally use band screen layer dry-reed relay simultaneously; prevent external environmental signals interference and loop action crosstalk own, make duty quite stable, it is ensured that estimate the accuracy of data.
This utility model have employed double-sided belt screen layer and connects, make testing cassete can test the electric leakage of PA level and UV level output voltage, fully meet the quality requirements of finished industrial product, tailored appearance of the present utility model is attractive in appearance, less costly, volume is little, complex manufacturing technology is accurate, easily operation, it is easy to coordinate with other test equipment, popularization and application.
By illustrating and accompanying drawing, give the exemplary embodiments of the ad hoc structure of detailed description of the invention, based on this utility model spirit, also can do other conversion.Although above-mentioned utility model proposes existing preferred embodiment, but, these contents are not intended as limitation.
For a person skilled in the art, after reading described above, various changes and modifications will be apparent to undoubtedly.Therefore, appending claims should regard the whole variations and modifications containing true intention of the present utility model and scope as.In Claims scope, the scope of any and all equivalence and content, be all considered as still belonging in intention of the present utility model and scope.
Claims (11)
1. the test device of an operational amplifier, it is characterised in that described test device includes casing, and described box house includes:
Base plate；
Amplifier loop plate, fixes with described base plate and is connected, be printed with the test circuit of described operational amplifier；
Keyset, is connected with described base plate, transfer described base plate and all or part of test signal on described amplifier loop plate.
2. the test device of operational amplifier according to claim 1, it is characterised in that be connected by screw column between described base plate with described amplifier loop plate.
3. the test device of operational amplifier according to claim 1, it is characterised in that be fixedly connected with relay on described amplifier loop plate, the transmission of the described test signal on amplifier loop plate described in described Control.
4. the test device of operational amplifier according to claim 3, it is characterised in that described amplifier loop plate is also printed with overshoot voltage protection circuit, protects described relay drive circuit.
5. the test device according to any one of operational amplifier of claim 3 or 4, it is characterised in that described relay is band screen layer dry-reed relay.
6. the test device of operational amplifier according to claim 1, it is characterised in that described casing includes:
Top cover；
Bottom, it is possible to cover with described top cover, and
Described top cover and described bottom form cavity after covering.
7. the test device of operational amplifier according to claim 1, it is characterised in that described test device also includes:
At least one 16 shielding winding displacement, is connected with described base plate, is exported by described test signal.
8. the test device of operational amplifier according to claim 7, it is characterised in that described 16 shielding winding displacements are connected with described base plate by 16PIN adapter.
9. the test device of operational amplifier according to claim 1, it is characterised in that described test device also includes:
64 shielding lines, are connected with described amplifier loop, are exported by described test signal.
10. the test device of operational amplifier according to claim 9, it is characterised in that described 64 shielding lines are connected with described base plate by 16PIN adapter.
11. the test device of operational amplifier according to claim 1, it is characterised in that described casing is rustless steel shielding shell.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520888159.1U CN205374675U (en) | 2015-11-09 | 2015-11-09 | Operational amplifier's testing arrangement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520888159.1U CN205374675U (en) | 2015-11-09 | 2015-11-09 | Operational amplifier's testing arrangement |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205374675U true CN205374675U (en) | 2016-07-06 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201520888159.1U Expired - Fee Related CN205374675U (en) | 2015-11-09 | 2015-11-09 | Operational amplifier's testing arrangement |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205374675U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105372580A (en) * | 2015-11-09 | 2016-03-02 | 上海芯哲微电子科技有限公司 | Test device for operational amplifier |
-
2015
- 2015-11-09 CN CN201520888159.1U patent/CN205374675U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105372580A (en) * | 2015-11-09 | 2016-03-02 | 上海芯哲微电子科技有限公司 | Test device for operational amplifier |
| CN105372580B (en) * | 2015-11-09 | 2018-08-14 | 上海芯哲微电子科技有限公司 | A kind of test device of operational amplifier |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20160706 Termination date: 20171109 |