CN205333996U - Display panel testing arrangement and test system - Google Patents
Display panel testing arrangement and test system Download PDFInfo
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- CN205333996U CN205333996U CN201620075711.XU CN201620075711U CN205333996U CN 205333996 U CN205333996 U CN 205333996U CN 201620075711 U CN201620075711 U CN 201620075711U CN 205333996 U CN205333996 U CN 205333996U
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- 238000012360 testing method Methods 0.000 title claims abstract description 264
- 239000000523 sample Substances 0.000 claims abstract description 155
- 238000000034 method Methods 0.000 description 8
- 238000001514 detection method Methods 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000012528 membrane Substances 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 238000003825 pressing Methods 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 230000000295 complement effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000002372 labelling Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Abstract
An embodiment of the utility model provides a display panel testing arrangement and test system relates to and shows technical field, can detect the display panel of multiple specification. Display panel testing arrangement includes probe group spare, controller and a plurality of control switch. Wherein, probe group spare includes a M test probes, M > 1, for the positive integer, and an arbitrary test port on the display panel corresponds a test probes at least. Each test probes is connected with the controller through a control switch, and test probes is used for when control switch is opened to the controller, the test signal of reception control unit output. This display panel testing arrangement is used for detecting display panel's demonstration performance.
Description
Technical field
This utility model relates to Display Technique field, particularly relates to a kind of testing device of display panel and test system。
Background technology
Making TFT-LCD (ThinFilmTransistorLiquidCrystalDisplay, thin film transistor-liquid crystal display) process in, after array base palte and color membrane substrates are to box, it is necessary to detect to the display performance of the display floater after box。
In prior art, when display floater is detected, it will usually test port 100 (CellTestPad) is set on the non-display area 01 of display floater 10 as shown in Figure 1。Then, by each the test probe 200 on test device and test port 100 one_to_one corresponding, and test probe 200 is pressed on test port 100, so that the test signal of test device input can pass through to test gets an electric shock output to display floater 10, so that display floater is detected。
Owing to the resolution of display floater 10 is had nothing in common with each other, thus causing that the width H of pixel cell 101 in viewing area 01 is different, and test each the test probe 200 on device and need to realize detection with test port 100 one_to_one corresponding。Therefore on test device, spacing (pinpitch) a between adjacent two test probes 200 needs to match with the width H being test for pixel cell 101 in display floater 10。So, in order to the display floater 10 of different size is tested, it is necessary to buy the test device of plurality of specifications to meet different demands, thus causing the rising of cost of manufacture。
Utility model content
Embodiment of the present utility model provides a kind of testing device of display panel and test system, it is possible to the display floater of plurality of specifications is detected。
For reaching above-mentioned purpose, embodiment of the present utility model adopts the following technical scheme that
The one side of this utility model embodiment, it is provided that a kind of testing device of display panel, switchs including probe assembly, controller and multiple control。Described probe assembly includes M test probe, and M > 1, for positive integer, at least corresponding described test probe of any one test port on display floater。Each described test probe controls switch by one and is connected with described controller, and described test probe is for when described control switch opened by described controller, receiving the test signal of described controller output。
Preferably, the described switch that controls is electrical switch。
Preferably, the described switch that controls is that transistor, the grid of described transistor and the first pole connect described controller, and the second pole is connected with described test probe。
Preferably, described transistor is N-type or P-type transistor。
Preferably, described transistor is enhancement mode or depletion mode transistor。
Preferably, described controller includes data processor, for calculating the relation between spacing a and the test probe width b between the width H of pixel cell in display floater and adjacent two test probes。
Preferably, in the display floater that described data processor calculates, spacing a between the width H of pixel cell with adjacent two test probes and the relation between test probe width b are H=3a+3b。
Preferably, in the display floater that described data processor calculates, spacing a between the width H of pixel cell with adjacent two test probes and the relation between test probe width b are H=2a+2b。
It is further preferred that the spacing a between adjacent two test probes is 3 μm～4 μm, the width b of test probe is 2.5 μm～3.5 μm；A >=b。
Preferably, described probe assembly also includes the common electric voltage probe for connecting common electrical pressure side on display floater。
It is further preferred that before described common electric voltage probe is arranged in first test probe of described probe assembly, or after being arranged in last test probe of described probe assembly。
Preferably, described display floater includes grid line and the data wire that transverse and longitudinal is intersected；Described test port is connected with described grid line and/or described data wire by going between。
Preferably, at least corresponding two the described test probes of any one test port on described display floater, so that when described control switch opened by described controller, testing probe described at least two being connected with described test port and all receive the test signal of described controller output。
Another aspect of the present utility model, it is provided that a kind of test system, including any one testing device of display panel described above。
Preferably, also include image collecting device, be acquired for the test image that described display floater is shown。
It is further preferred that described image collecting device includes CCD or cmos camera。
This utility model provides a kind of testing device of display panel and test system, and described display floater includes probe assembly, controller and multiple control switch。Wherein, probe assembly includes M test probe, and M > 1, for positive integer。In addition, the at least corresponding test probe of any one test port on display floater, and each test probe is connected with controller by a control switch, test probe is for when control switch opened by controller, receiving the test signal of controller output。
So, for test port quantity less than for the display floater of M, due to each test port can at least one test probe corresponding so that the display floater of the test port number any one specification less than M can be detected by this test device。In addition, owing to being provided with control switch, therefore when at least one being tested probe and pressing on a test port, for not testing the corresponding test probe of port, by controller, the control being connected with this test probe can be switched off, to avoid to the test probe input test signal being not connected with test port。
Accompanying drawing explanation
In order to be illustrated more clearly that this utility model embodiment or technical scheme of the prior art, the accompanying drawing used required in embodiment or description of the prior art will be briefly described below, apparently, accompanying drawing in the following describes is only embodiments more of the present utility model, for those of ordinary skill in the art, under the premise not paying creative work, it is also possible to obtain other accompanying drawing according to these accompanying drawings。
The structural representation of a kind of testing device of display panel that Fig. 1 provides for prior art；
The structural representation of a kind of testing device of display panel that Fig. 2 provides for this utility model embodiment；
The structural representation of the another kind of testing device of display panel that Fig. 3 provides for this utility model embodiment；
The structural representation of another testing device of display panel that Fig. 4 provides for this utility model embodiment；
Fig. 5 is the structural representation being provided with common electric voltage probe in the probe assembly shown in Fig. 2。
Accompanying drawing labelling:
01-non-display area；02-viewing area；10-display floater；20-probe assembly；30-controller；40,40 '-control switch；100-tests port；101-pixel cell；110-goes between；111-common electrical pressure side；200,200 '-test probe；201-common electric voltage probe；The width of H-pixel cell；Spacing between adjacent two the test probes of a-；B-tests the width of probe。
Detailed description of the invention
Below in conjunction with the accompanying drawing in this utility model embodiment, the technical scheme in this utility model embodiment is clearly and completely described, it is clear that described embodiment is only a part of embodiment of this utility model, rather than whole embodiments。Based on the embodiment in this utility model, the every other embodiment that those of ordinary skill in the art obtain under not making creative work premise, broadly fall into the scope of this utility model protection。
This utility model embodiment provides a kind of testing device of display panel, as in figure 2 it is shown, include probe assembly 20, controller 30 and multiple control switch 40。Wherein, probe assembly 20 includes M test probe 200, M > 1, for positive integer。
Additionally, at least corresponding test probe 200 of any one test port 100 on display floater 10。Each test probe 200 controls to switch 40 by one and is connected with controller 30, and test probe 200 is for when controller 30 is opened and controlled to switch 40, receiving the test signal of controller 30 output。
So, for test port quantity less than for the display floater of M, due to each test port can at least one test probe corresponding so that the display floater of the test port number any one specification less than M can be detected by this test device。In addition, owing to being provided with control switch, therefore when at least one being tested probe and pressing on a test port, for not testing the corresponding test probe of port, by controller, the control being connected with this test probe can be switched off, to avoid to the test probe input test signal being not connected with test port。
Wherein, the quantity of test port 100 display floater 10 less than M can be tested by this testing device of display panel with M test probe 200。In the case, as shown in Figure 2, in this probe assembly 20 spacing a between two test probes 200 of arbitrary neighborhood less than the width H of each pixel cell 101 in this display floater 10。Wherein, the direction at the spacing place between the direction of the width H of pixel cell 101 with adjacent two test probes 200 is identical。In addition this pixel cell 101 is defined formed by grid line (G1, G2 ...) a plurality of on the viewing area 02 of display floater 10 and a plurality of data lines (D1, D2, D3, D4 ...) transverse and longitudinal intersection。And this display floater 10 also includes the non-display area 01 that is positioned at viewing area 02 periphery, this non-display area is provided with the lead-in wire 110 of the grid line for connecting viewing area 02 and data wire and the test port 100 being connected with this lead-in wire。This test port 100 is at the performance detection-phase of display floater, it is possible to be connected with the test probe 200 in testing device of display panel, and detect terminate after, can be also used in the manufacturing process in later stage binding (Bonding) driving chip。
Owing in probe assembly 20, spacing a between two test probes 200 of arbitrary neighborhood, less than the width H of each pixel cell 101 in this display floater 10, therefore can ensure that and can press at least one test probe 200 on each test port 100。And the test probe 200 ' being not connected with test port 100 in figure can pass through the control switch 40 ' disconnection that controller 30 will be connected with this test probe 200 ', so that this is not connected with the test probe 200 ' of test port 100 without receiving the test signal of controller 30 output。
Additionally, any one the test port 100 on display floater 10 can at least corresponding two test probes 200。In the case, when controller 30 is opened and is controlled to switch 40, the at least two test probe 200 being connected with test port 100 can be in the state of conducting, is namely all able to receive that the test signal that controller 30 exports, and by this test signal output to test port 100。Thus when certain test probe 200 damages, remaining test probe 200 can normal operation, avoid a test port 100 is only connected to one in the conduction state under test probe 200, and this test probe 200 breaks down the generation of test run-bake-needle fault (pinmiss) phenomenon caused。Certainly, for a test port 100 is connected to plural test probe 200, it is also possible to carry out break-make control by controller 30 to controlling switch 40 so that a test port 100 only one of which test probe 200 can export test signal。
It follows that to how realizing the test probe 200 ' being not connected with test port 100 illustrate without the mode receiving the test signal of controller 30 output。For the display floater that resolution is relatively low, such as, for playing the display floater of advertisement and decorative effect on building body of wall, larger in size due to pixel cell 101, can judge which test probe 200 is not connected (namely which belongs to above-mentioned test probe 200 ') with test port 100 by the mode of manual detection, disconnect the control switch 40 ' being connected with this test probe 200 ' thereby through controller 30。
But for the display floater in some display devices such as TV, computer or mobile phone, owing to resolution is higher, be manually not easy to judge which test probe 200 is not connected with test port 100。Therefore the position of the test probe 200 ' not being connected can be calculated with test port 100 by data processor。Concrete, specification due to display floater 10, such as resolution is known, therefore the width H of each pixel cell 101 in this display floater 10 can be drawn according to resolution, in addition, due to spacing a between adjacent two test probes 200 in testing device of display panel that this display floater 10 is tested, and the width b also testing probe 200 is known。Therefore, data processor can according to above-mentioned known quantity H, a, b, calculate the spacing a between the width H of pixel cell in display floater and adjacent two test probes and the relation between test probe width b, such that it is able to obtain the position of the test probe 200 ' not being connected with test port 100。Wherein, this data processor (not shown) can be arranged in controller noted above 30。
Such as, for display floater 10 as shown in Figure 3, in the display floater that the data processor in controller 30 can calculate, the relation between spacing a and test probe width b between the width H of pixel cell with adjacent two test probes is H=3a+3b。Now, label test probe 200 1., 4., 7. can with test port 100 one_to_one corresponding, and the test probe 200 that label is 2., 3., 5., 6. not with test port 100 be connected。In the case, control switch 40 disconnection that controller 30 can will be connected with label test probe 200 2., 3., 5., 6., and control switch 40 unlatching being connected with label test probe 200 1., 4., 7., so that the test signal of controller 30 output can pass through label test probe 200 output 1., 4., 7. to the test port 100 being connected with above-mentioned label test probe 200 1., 4., 7., thus the display performance of this display floater 10 is tested。
Again such as, for display floater 10 as shown in Figure 4, in the display floater that the data processor in controller 30 can calculate, the relation between spacing a and test probe width b between the width H of pixel cell with adjacent two test probes is H=2a+2b。Now, label test probe 200 1., 3., 5. can with test port 100 one_to_one corresponding, and the test probe 200 that label is 2., 4., 6. not with test port 100 be connected。In the case, control switch 40 disconnection that controller 30 can will be connected with label test probe 200 2., 4., 6., and control switch 40 unlatching being connected with label test probe 200 1., 3., 5., so that the test signal of controller 30 output can pass through label test probe 200 output 1., 3., 5. to the test port 100 being connected with above-mentioned label test probe 200 1., 3., 5., thus the display performance of this display floater 10 is tested。
On this basis, the spacing a between adjacent two test probes 200 is 3 μm～4 μm, and the width b of test probe is 2.5 μm～3.5 μm；A >=b。Wherein, it is preferred that a is 3.5 μm, b is 3 μm, such that it is able to major part display device such as resolution domestic TV below 1920 × 1080 and the display floater in computer are detected。Additionally, a >=b can avoid the spacing a between adjacent two test probes 200 too little, thus causing signal disturbing。
It should be noted that be only that partial test probe 200 is carried out label declaration in Fig. 3 and Fig. 4, the test probe 200 of all the other non-labels is same as above with the corresponding relation of test port 100, repeats no more herein。
Hereinafter the test process of this testing device of display panel is illustrated。When showing picture due to display floater 10, the grid line on this display floater 10 is scanned line by line, such that it is able to opened line by line by pixel cell 101。In the case, data wire is by data signal input to the pixel cell 101 opened, so that this pixel cell 101 is charged, the angle that difference owing to being filled with voltage makes from the liquid crystal molecule of this corresponding position, pixel cell 101 position deflects is different, such that it is able to the transmitance of backlight light is adjusted, so that the actual gray value that pixel cell 101 shows picture is consistent with target gray scale value, realize colour display eventually through color membrane substrates。With in the above-mentioned testing device of display panel process to display floater 10 measurement of the display characteristics, can pass through the display situation (such as the data such as grey decision-making, color) of each pixel cell 101 is detected, judge whether this pixel cell 101 shows normally。Concrete, each test port 100 on display floater 10 is connected at least one test probe 200。Wherein, above-mentioned test port 100 is connected with the data wire on display floater 10 by lead-in wire 110。Now, grid line progressive scan on display floater 10, controller 30 is by the test probe 200 being sequentially connected electrically, test port 100 and goes between 110 to data wire input test signal, and the pixel cell 101 on display floater 10 is electrically charged thus showing the test image (such as solid-color image) matched with this test signal。Based on this, image collecting device can be passed through, such as CCD (ChargeCoupledDevice, charge coupled cell) or CMOS (ComplementaryMetalOxideSemiconductor, complementary metal oxide semiconductors (CMOS)) video camera test image that this display floater is shown is acquired, such that it is able to bad such as bright spot, the bad point etc. occurred in display image is detected。
It should be noted that, above-mentioned test process, it it is the test port 100 to be connected with test probe 200, it 110 is connected with data wire the explanation carried out for example by going between, this test probe 200 can also connect through the test port 100 that lead-in wire is connected with grid line, the equally possible display performance to display floater 10 detects, and concrete detection mode is same as above, repeats no more herein。
Hereinafter the concrete structure of above-mentioned control switch 40 is illustrated。
Concrete, as it is shown on figure 3, this control switch 40 is electrical switch。Or this control switch 40 can be transistor as shown in Figure 4。Wherein the grid of this transistor and the first pole connect controller 30, and the second pole is connected with testing probe 200。
It should be noted that above-mentioned transistor can be N-type transistor, it is also possible to for P-type transistor。This transistor can be enhancement mode, it is also possible to for depletion mode transistor。Additionally, this transistor first can be extremely source electrode, second can be extremely drain electrode, or first can be extremely drain electrode, the second extremely source electrode。This is not limited by this utility model。
Further, adopt in the process that display floater 10 is detected by testing device of display panel, in order to avoid there is electric potential difference between two devices, thus the element in device is caused damage。This probe assembly 20, also includes the common electric voltage probe 201 for connecting common electrical pressure side 111 on display floater 10 as shown in Figure 5。Wherein, above-mentioned common electrical pressure side 111 is for providing common electric voltage Vcom to the public electrode in display floater。So, it is connected with common electrical pressure side 111 by common electric voltage probe 201, it is possible to achieve testing device of display panel and display floater 10 equipotential。
It should be noted that in the process preparing probe assembly 20, the structure of common electric voltage probe 201 can be consistent with the structure of test probe 200, and simultaneously completes the preparation of common electric voltage probe 201 in the process of preparation test probe 200。Additionally, due to common electrical pressure side 111 is generally disposed at the side of all test ports 100, therefore common electric voltage probe 201 may be located in probe assembly 20 before first test probe 200, or be positioned at last test probe 200 after。
This utility model provides a kind of test system, including display floater 10 and any one testing device of display panel as described above。There is the identical structure of testing device of display panel and beneficial effect that provide with previous embodiment, owing to the identical structure of testing device of display panel and beneficial effect are described in detail by previous embodiment, repeat no more herein。
Additionally, this test system also includes image collecting device (not shown), for the test image of display floater 10 display is acquired, such that it is able to bad such as bright spot, the bad point etc. occurred in display image is detected。Concrete, this image collecting device includes CCD or cmos camera。
The above; it is only detailed description of the invention of the present utility model; but protection domain of the present utility model is not limited thereto; any those familiar with the art is in the technical scope that this utility model discloses; change can be readily occurred in or replace, all should be encompassed within protection domain of the present utility model。Therefore, protection domain of the present utility model should be as the criterion with described scope of the claims。
Claims (16)
1. a testing device of display panel, it is characterised in that include probe assembly, controller and multiple control switch；
Described probe assembly includes M test probe, and M > 1, for positive integer；At least corresponding described test probe of any one test port on display floater；
Each described test probe controls switch by one and is connected with described controller, and described test probe is for when described control switch opened by described controller, receiving the test signal of described controller output。
2. testing device of display panel according to claim 1, it is characterised in that described control switch is electrical switch。
3. testing device of display panel according to claim 1, it is characterised in that described control switch is transistor；
The grid of described transistor and the first pole connect described controller, and the second pole is connected with described test probe。
4. testing device of display panel according to claim 3, it is characterised in that described transistor is N-type or P-type transistor。
5. testing device of display panel according to claim 3, it is characterised in that described transistor is enhancement mode or depletion mode transistor。
6. testing device of display panel according to claim 1, it is characterized in that, described controller includes data processor, for calculating the relation between spacing a and the test probe width b between the width H of pixel cell in display floater and adjacent two test probes。
7. testing device of display panel according to claim 6, it is characterized in that, in the display floater that described data processor calculates, spacing a between the width H of pixel cell with adjacent two test probes and the relation between test probe width b are H=3a+3b。
8. testing device of display panel according to claim 6, it is characterized in that, in the display floater that described data processor calculates, spacing a between the width H of pixel cell with adjacent two test probes and the relation between test probe width b are H=2a+2b。
9. the testing device of display panel according to any one of claim 1-8, the spacing a between adjacent two test probes is 3 μm～4 μm, and the width b of test probe is 2.5 μm～3.5 μm；A >=b。
10. testing device of display panel according to claim 1, it is characterised in that described probe assembly also includes the common electric voltage probe for connecting common electrical pressure side on display floater。
11. testing device of display panel according to claim 10, it is characterised in that before described common electric voltage probe is arranged in first test probe of described probe assembly, or be arranged in described probe assembly last test probe after。
12. testing device of display panel according to claim 1, it is characterised in that described display floater includes grid line and the data wire that transverse and longitudinal is intersected；Described test port is connected with described grid line and/or described data wire by going between。
13. testing device of display panel according to claim 1, it is characterized in that, at least corresponding two the described test probes of any one test port on described display floater, so that when described control switch opened by described controller, testing probe described at least two being connected with described test port and all receive the test signal of described controller output。
14. a test system, it is characterised in that include display floater and the testing device of display panel as described in any one of claim 1-13。
15. test system according to claim 14, it is characterised in that also include image collecting device, it is acquired for the test image that described display floater is shown。
16. test system according to claim 15, it is characterised in that described image collecting device includes CCD or cmos camera。
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| CN201620075711.XU CN205333996U (en) | 2016-01-25 | 2016-01-25 | Display panel testing arrangement and test system |
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| CN201620075711.XU CN205333996U (en) | 2016-01-25 | 2016-01-25 | Display panel testing arrangement and test system |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108711397A (en) * | 2018-08-13 | 2018-10-26 | 京东方科技集团股份有限公司 | Optics adjusting method, conditioning optics and the display device of display panel |
| CN111968556A (en) * | 2020-08-28 | 2020-11-20 | 合肥维信诺科技有限公司 | Detection apparatus for display panel |
-
2016
- 2016-01-25 CN CN201620075711.XU patent/CN205333996U/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108711397A (en) * | 2018-08-13 | 2018-10-26 | 京东方科技集团股份有限公司 | Optics adjusting method, conditioning optics and the display device of display panel |
| US11250744B2 (en) | 2018-08-13 | 2022-02-15 | Chengdu Boe Optoelectronics Technology Co., Ltd. | Optical adjustment method and optical adjustment device for display panel, and display device |
| CN111968556A (en) * | 2020-08-28 | 2020-11-20 | 合肥维信诺科技有限公司 | Detection apparatus for display panel |
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