CN205263266U - Apparatus for testing chip - Google Patents
Apparatus for testing chip Download PDFInfo
- Publication number
- CN205263266U CN205263266U CN201521127536.6U CN201521127536U CN205263266U CN 205263266 U CN205263266 U CN 205263266U CN 201521127536 U CN201521127536 U CN 201521127536U CN 205263266 U CN205263266 U CN 205263266U
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- framework
- pressure arm
- chip
- testing chip
- briquetting
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Abstract
The utility model relates to a testing arrangement especially relates to an apparatus for testing chip, include the frame, go up the press cover board, rotate briquetting, inspection center's seat and floating platform, go up the press cover board and along perpendicular to frame direction relative motion on the frame, upward be provided with first elastic component between press cover board and the frame, rotating the briquetting and be two and both ends and all rotate the connection on the frame, be provided with the rotor arm and press the pressure arm on rotating the briquetting, be provided with the bar through -hole on the rotor arm, be provided with the locating part of relative slip in the bar through -hole, locating part and last press cover board fixed connection rotate the middle part setting of briquetting and press the pressure arm, according to being provided with the pressing piece on the pressure arm, the fixed inspection center in the middle part seat of frame, the top of inspection center's seat is connected with the floating platform through the second elastic component, is provided with the chip assay position on the floating platform, the utility model aims at providing a life is longer, the apparatus for testing chip that also is suitable for to the more chip of PAD number.
Description
Technical field
The utility model relates to a kind of testing arrangement, relates in particular to a kind of apparatus for testing chip.
Background technology
Adopt at present the apparatus for testing chip of OPEN-TOP structure in test process, need to utilize larger underPressure guarantees that the binding post of IC and pcb board electrically conduct, along with the development of chip market, and chip PAD numberMore and more, therefore test chip strength used needs also increasing. Along with the needs of chip mass production,Quantity with a chip production can be very large, for also having higher requirement the service life of test bench.Existing OPEN-TOP apparatus for testing chip is generally used for the non-repeatedly tests for a long time such as burn-in test, and the life-span is limited,Situations many for chip PAD and the large strength of needs are difficult to application.
Because above-mentioned defect, the design people, actively research and innovation in addition, to founding a kind of novel knotThe apparatus for testing chip of structure, makes it have more the value in industry.
Utility model content
For solving the problems of the technologies described above, it is longer that the purpose of this utility model is to provide a kind of service life, forThe apparatus for testing chip that the more chip of PAD number is also suitable for.
Apparatus for testing chip of the present utility model, comprise framework, on press cover plate, rotate briquetting, test inHeart seat and floating platform, press on described cover plate on described framework along relatively transporting perpendicular to described framework directionMoving, press between cover plate and described framework on described and be provided with the first elastic component;
Described rotation briquetting is that two and two ends are all rotatably connected on described framework, on described rotation briquettingBe provided with cursor and by pressure arm, on described cursor, be provided with strip through-hole, in described strip through-hole, arrangeHave the locating part of relative sliding, described locating part with described on press cover plate and be fixedly connected with, described rotation briquettingMiddle part arrange described by pressure arm, described by being provided with pressing piece on pressure arm;
The fixing described test center in the middle part seat of described framework, the top of described test center seat is by the second bulletProperty part is connected with floating platform, is provided with chip detection position on described floating platform, and described pressing piece is positioned at instituteState the both sides, top of chip detection position.
Further, the two ends of described rotation briquetting are connected on described framework by rolling bearing.
Further, two side bottoms of pressing cover plate on described are provided with guide rod, arrange wired on described frameworkProperty ball bearing, described guide rod is relative sliding in described linear ball bearing.
Further, the arm of force of described cursor is greater than described by the arm of force of pressure arm.
Further, described pressing piece be rotatably connected on described by the rolling sleeve on pressure arm.
Further, described the first elastic component and the second elastic component are spring.
Further, described locating part is pin.
By such scheme, the utility model at least has the following advantages: this OPEN-TOP apparatus for testing chipIn test process, according to lever principle, by the large arm of force, realize by relatively little strength, reach and pressThe object of chip; Sliding friction in structure motion is all converted to rolling friction simultaneously, reduces to greatest extentPower frictionally damage, to realize for a long time repeatedly test, the object of high life.
Above-mentioned explanation is only the general introduction of technical solutions of the utility model, new in order to better understand this practicalityThe technological means of type, and can being implemented according to the content of description, below with better reality of the present utility modelExecute example and coordinate accompanying drawing to be described in detail as follows.
Brief description of the drawings
Fig. 1 is structural representation of the present utility model;
Fig. 2 is that the utility model unloads the structural representation of pressing after cover plate;
Fig. 3 is that the utility model unloads the structural representation of pressing after cover plate and a rotation briquetting;
Fig. 4 is that the utility model unloads the structural representation of pressing after cover plate, rotation briquetting and chip;
Fig. 5 is the structural representation after the utility model framework and test center's seat are installed;
Fig. 6 rotates the cutaway view under briquetting open mode while being the utility model installation chip;
Fig. 7 is the cutaway view under test mode after the utility model installation chip.
Detailed description of the invention
Below in conjunction with drawings and Examples, detailed description of the invention of the present utility model is described in further detail.Following examples are used for illustrating the utility model, but are not used for limiting scope of the present utility model.
Referring to Fig. 1 to Fig. 5, a kind of apparatus for testing chip described in the utility model one preferred embodiment, comprisesFramework 1, on press cover plate 2, rotate briquetting 3, test center's seat 4 and floating platform 5, above press cover plate 2On framework 1, along perpendicular to framework 1 direction relative motion, above press between cover plate 2 and framework 1 and be provided withThe first elastic component 7; Rotating briquetting 3 is that two and two ends are all rotatably connected on framework 1, rotates briquetting 3On be provided with cursor 8 and by pressure arm 9, on cursor 8, be provided with strip through-hole 10, in strip through-hole 10Be provided with the locating part 11 of relative sliding, locating part 11 with on press cover plate 2 and be fixedly connected with, comparatively simple,Locating part 11 is pin, and the middle part of rotating briquetting 3 arranges presses pressure arm 9, by being provided with pressing piece on pressure arm 912; The middle part fixing test centre mount 4 of framework 1, the top of test center's seat 4 is by the second elastic component 13Be connected with floating platform 5, be provided with chip detection position on floating platform, chip 6 is arranged in chip detection position,Pressing piece 12 is positioned at the both sides, top of chip detection position.
It should be noted that the rotation connection structure rotating between briquetting 3 and framework 1, for affecting this practicalityThe comparatively key structure of Life Of Type, in order to improve service life, chip testing dress of the present utility modelPut, the two ends of rotating briquetting 3 are connected on framework 1 by rolling bearing.
In addition, two side bottoms of above pressing cover plate 2 are provided with guide rod 14, are provided with linear ball on framework 1Bearing 15, guide rod 14 is at the interior relative sliding of linear ball bearing 15; On how prior art leads by boltPress cover plate, upper and lower folding, is used for a long time, above presses cover plate guiding hole wall and can rub seriously; Use line insteadProperty ball bearing, change sliding friction into rolling friction, realize the object that increases test bench service life,Simultaneously linear ball bearing can on press cover plate and play good guide effect.
Apparatus for testing chip of the present utility model, the arm of force of cursor 8 is greater than by the arm of force of pressure arm 9; TraditionStructure is generally that the arm of force of cursor 8 is less than by the arm of force of pressure arm 9, needs very big spring power, presses to realizePress equalising torque; The arm of force of the utility model cursor 8 is by more than the arm of force twice of pressure arm 9, therefore only needVery little spring force, just can realize equalising torque, and chip is pressed.
In order effectively to press chip, do not cause damage simultaneously, pressing piece 12 is for being rotatably connected on by pressure armRolling sleeve.
The first elastic component 7 is set to spring, for the reseting movement of this spring that leads, above presses 2 ends of cover platePortion is also provided with guide rod, and this spring housing is contained on guide rod; The second elastic component 13 also can be set to spring, forThe lead reseting movement of this spring, is provided with groove or the through hole of accommodating this spring on test center's seat 4.
Apparatus for testing chip of the present utility model, as shown in Figure 6 and Figure 7, when test chip by upper pressing coverPlate is pressed into the end, rotates briquetting rotating opening, now chip can be put into; Unclamp and press cover plate, be subject to bulletSpring bounce, rotates briquetting rotation and presses chip.
The above is only preferred embodiment of the present utility model, is not limited to the utility model, shouldWhen pointing out, for those skilled in the art, do not departing from the utility model know-whyPrerequisite under, can also make some improvement and modification, these improve and modification also should be considered as the utility modelProtection domain.
Claims (7)
1. an apparatus for testing chip, is characterized in that: comprise framework, on press cover plate, rotate briquetting,Test center's seat and floating platform, press on described cover plate on described framework along perpendicular to described framework directionRelative motion, presses between cover plate and described framework on described and is provided with the first elastic component;
Described rotation briquetting is that two and two ends are all rotatably connected on described framework, on described rotation briquettingBe provided with cursor and by pressure arm, on described cursor, be provided with strip through-hole, in described strip through-hole, arrangeHave the locating part of relative sliding, described locating part with described on press cover plate and be fixedly connected with, described rotation briquettingMiddle part arrange described by pressure arm, described by being provided with pressing piece on pressure arm;
The fixing described test center in the middle part seat of described framework, the top of described test center seat is by the second bulletProperty part is connected with floating platform, is provided with chip detection position on described floating platform, and described pressing piece is positioned at instituteState the both sides, top of chip detection position.
2. apparatus for testing chip according to claim 1, is characterized in that: two of described rotation briquettingEnd is connected on described framework by rolling bearing.
3. apparatus for testing chip according to claim 1, is characterized in that: on described, press cover plateTwo side bottoms are provided with guide rod, on described framework, are provided with linear ball bearing, and described guide rod is in described linearityRelative sliding in ball bearing.
4. apparatus for testing chip according to claim 1, is characterized in that: the arm of force of described cursorBe greater than described by the arm of force of pressure arm.
5. apparatus for testing chip according to claim 1, is characterized in that: described pressing piece is for rotatingBe connected to described by the rolling sleeve on pressure arm.
6. apparatus for testing chip according to claim 1, is characterized in that: described the first elastic component andThe second elastic component is spring.
7. apparatus for testing chip according to claim 1, is characterized in that: described locating part is pin.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201521127536.6U CN205263266U (en) | 2015-12-30 | 2015-12-30 | Apparatus for testing chip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201521127536.6U CN205263266U (en) | 2015-12-30 | 2015-12-30 | Apparatus for testing chip |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205263266U true CN205263266U (en) | 2016-05-25 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201521127536.6U Active CN205263266U (en) | 2015-12-30 | 2015-12-30 | Apparatus for testing chip |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205263266U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108957284A (en) * | 2017-05-25 | 2018-12-07 | 东宸精密有限公司 | The pick-and-place chip operation device of elastic press type chip detection jig |
| CN109709466A (en) * | 2017-10-25 | 2019-05-03 | 吴俊杰 | Cacheable limiting device |
| CN118382251A (en) * | 2024-04-30 | 2024-07-23 | 扬州工业职业技术学院 | Microwave mixer with high protection |
-
2015
- 2015-12-30 CN CN201521127536.6U patent/CN205263266U/en active Active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108957284A (en) * | 2017-05-25 | 2018-12-07 | 东宸精密有限公司 | The pick-and-place chip operation device of elastic press type chip detection jig |
| CN109709466A (en) * | 2017-10-25 | 2019-05-03 | 吴俊杰 | Cacheable limiting device |
| CN109709466B (en) * | 2017-10-25 | 2024-06-04 | 吴俊杰 | Buffering limiting device |
| CN118382251A (en) * | 2024-04-30 | 2024-07-23 | 扬州工业职业技术学院 | Microwave mixer with high protection |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |