CN205228677U - A linear calbiration system of segmentation for temperature sensor chips - Google Patents
A linear calbiration system of segmentation for temperature sensor chips Download PDFInfo
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- CN205228677U CN205228677U CN201521096567.XU CN201521096567U CN205228677U CN 205228677 U CN205228677 U CN 205228677U CN 201521096567 U CN201521096567 U CN 201521096567U CN 205228677 U CN205228677 U CN 205228677U
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Abstract
The utility model discloses a linear calbiration system of segmentation for temperature sensor chips, including base measuring temperature point register, comparator, function calculator, intercept register, slope register, intercept data selector, slope data selector, the number of intercept register, slope register is N -1, and the number of base measuring temperature point register, comparator is N -2, and N is for being not less than 5 integer, base measuring temperature point register is connected with the comparator one -to -one, and comparator and function calculator is connected, the intercept register is connected with intercept data selector, the slope register is connected with slope data selector, intercept data selector, slope data selector and function calculator respectively connect, obtain the intercept A corresponding with base measuring temperature point, slope S through calculating to in its linear scaler that transmits temperature sensor chips to. The utility model discloses can satisfy higher required precision in wideer operational temperature range.
Description
Technical field
The utility model relates to field of measuring techniques, specifically a kind of piecewise linearity calibration system for temperature sensor chip.
Background technology
Temperature sensor is device environment temperature being converted to output signal.Temperature sensor chip mainly comprises temperature sensor front end, ADC, linear scale unit three parts; Temperature sensor front end can convert environment temperature to analog voltage signal, then through ADC sampling, obtains the digital signal X after sampling; Relation between digital signal X and temperature T, close to linear relationship, calculates temperature T by linear scale unit.
As shown in Figure 1, its scheme make use of close this feature linear of relation between digital signal X and temperature T to the method for existing base measuring temperature sensor chip.Even if but inside the integrated circuit finished product of same batch, also have deviation in different temperature sensor chips.When carrying out matching X-T curve by returning linear relationship, needing to consider that different temperatures sensor chip slope of a curve exists deviation (as shown in Figure 2), also needing to consider that the intercept of different temperatures sensor chip curve exists deviation (as shown in Figure 3).At the calibration phase of chip, by 2 temperature spots in the X-T curve of observed temperature sensor chip, then calculate slope S in X-T curve and intercept A by these 2 temperature spots.When chip operation, when variation of ambient temperature, to be sampled the different digital signal X obtained by ADC, calculate corresponding temperature T by linear scale unit.The calculating formula that linear scale unit completes is: T=S × (X-A); Wherein, T is the temperature after converting, and S is linear gradient, and A is linear intercept.
Because the calibration program of existing temperature sensor chip is by the relation between digital signal X and temperature T close to premised on linear, and in fact X-T curve is not strict linear relationship.When operating temperature requirements is wide time, the limitation of this scheme is just comparatively obvious.Particularly when temperature sensor chip needs to be applied to wide thermometric environment, as some application require that temperature sensor chip can be operated in-40 DEG C ~+85 DEG C, the precision of this scheme can not ensure that chip meets accuracy requirement in whole operating temperature range.
Utility model content
The purpose of this utility model is to provide a kind of piecewise linearity calibration system for temperature sensor chip, can meet higher accuracy requirement in wider operating temperature range.
For achieving the above object, the utility model provides following technical scheme:
A kind of piecewise linearity calibration system for temperature sensor chip, wherein temperature sensor chip comprises temperature sensor front end, ADC, linear scale unit and ROM, and described system comprises base measuring temperature point register, comparer, function calculator, intercept register, slope register, intercept data selector, slope data selector switch; Described intercept register, the number of slope register are N-1, described base measuring temperature point register, the number of comparer to be N-2, N be not less than 5 integer; Described base measuring temperature point register and comparer connect one to one, and this N-2 comparer function counter connects; Described intercept register is connected with intercept data selector; Described slope register is connected with slope data selector switch; Described intercept data selector, slope data selector switch respectively function counter connect, calculate intercept A, the slope S corresponding with base measuring temperature point through function calculator, and this base measuring temperature point and intercept A, slope S are transferred in linear scale unit.
As further program of the utility model: the number of described function calculator, intercept data selector, slope data selector switch is 1.
Compared with prior art, the beneficial effects of the utility model are:
The utility model can meet higher accuracy requirement in wider operating temperature range.By gathering N number of temperature spot, making the pass between digital signal X and temperature T tie up to each sectional area all closer to linear relationship, thus enabling the temperature sensor after calibration work in wider temperature range, and there is higher precision.
Accompanying drawing explanation
Fig. 1 is the calibration program schematic diagram of existing temperature sensor chip;
Fig. 2 is different temperatures sensor chip slope of a curve deviation schematic diagram;
Fig. 3 is the intercept deviation schematic diagram of different temperatures sensor chip curve;
Fig. 4 is the piecewise linearity calibration system structural drawing of temperature sensor chip of the present utility model;
Fig. 5 is the piecewise linearity calibration steps schematic diagram of temperature sensor chip of the present utility model.
Embodiment
Below in conjunction with the utility model embodiment, be clearly and completely described the technical scheme in the utility model embodiment, obviously, described embodiment is only the utility model part embodiment, instead of whole embodiments.Based on the embodiment in the utility model, those of ordinary skill in the art are not making the every other embodiment obtained under creative work prerequisite, all belong to the scope of the utility model protection.
Embodiment 1
Refer to Fig. 4, in the utility model embodiment, a kind of piecewise linearity calibration system for temperature sensor chip, wherein temperature sensor chip comprises temperature sensor front end, ADC, linear scale unit and ROM, described system comprises base measuring temperature point register, comparer, function calculator, intercept register, slope register, intercept data selector MUX, slope data selector switch MUX, intercept register, the number of slope register is N-1, base measuring temperature point register, the number of comparer is N-2, N be not less than 5 integer, base measuring temperature point register and comparer connect one to one, N-2 comparer function counter connects, intercept register is connected with intercept data selector MUX, slope register is connected with slope data selector switch MUX, intercept data selector MUX, slope data selector switch MUX respectively function counter connects, and calculates the intercept A corresponding with base measuring temperature point through function calculator, slope S, and by this base measuring temperature point and intercept A, slope S is transferred in linear scale unit.
Refer to Fig. 5, the piecewise linearity calibration steps that the system described in utilization is carried out, comprise the following steps:
(1) the detection calibration stage: by testing the temperature X value of N number of temperature spot, wherein N be not less than 5 integer, then according to these temperature spots, (interval wherein closed is N-3 section the X-T curve of temperature sensor chip to be divided into the N-1 section range of linearity, open interval is 2 sections), namely matching temperature curve is carried out with N-2 section straight line, thus each section of range of linearity has a corresponding coefficient to represent this section of interval slope S and intercept A, through calculating N-1 slope S 1, S2, S3, SN-1, N-1 intercept A1, A2, A3, AN-1, individual temperature spot reading X1 temperature range being divided into N-1 section of N-2, X2, XN-2, these information above-mentioned all must be saved in the ROM of temperature sensor chip, specifically N-2 be divided into by temperature range N-1 section temperature spot reading X1, X2 ..., XN-2 be kept at respectively base measuring temperature point X1 register, base measuring temperature point X2 register ..., in base measuring temperature point XN-2 register, this N-2 base measuring temperature point register is corresponding with a comparer respectively to be connected, and this N-2 comparer is all connected with a function calculator, N-1 slope S 1, S2, S3 ..., SN-1 be kept at respectively slope S 1 register, slope S 2 register ..., in slope S N-1 register, this N-1 slope register is all connected with a slope data selector switch MUX, N-1 intercept A1, A2, A3 ..., AN-1 be kept at respectively intercept A1 register, intercept A2 register ..., in intercept AN-1 register, this N-1 intercept register is all connected with an intercept data selector MUX, intercept data selector MUX, slope data selector switch MUX respectively function counter connect, calculate intercept A, the slope S corresponding with base measuring temperature point through function calculator, and this base measuring temperature point and intercept A, slope S are transferred in linear scale unit,
(2) working stage: temperature sensor front end converts environment temperature to analog voltage signal, then through ADC sampling, obtains the digital signal X after sampling; Relatively the size of X value and base measuring temperature point, judges X value is in which range of linearity of the above-mentioned N-1 section range of linearity, selects the linear function corresponded to carry out accounting temperature value T, thus digital signal X is converted into temperature value T.
Next for 5 temperature spots, said system is described further:
Measure 5 temperature spots during test, whole temperature range is divided into totally 4 sections of ranges of linearity, interval of 2 sections of closed intervals and 2 sections of openings by 5 points, namely carrys out matching temperature curve with 4 sections of straight lines.Each section of range of linearity has a corresponding coefficient to represent this section of interval slope (S1, S2, S3, S4), with the intercept (A1 of 4 sections of curves and X-axis, A2, A3, A4), temperature range to be divided into the temperature spot reading (X1 of 4 sections by 3, X2, X3), these information all must be saved in the ROM of chip.(note: at each sectional area all carrys out the value of accounting temperature T according to calculating formula T=S × (X-A).) when temperature sensor front end converts environment temperature to analog voltage signal, then through ADC sampling, obtain the digital signal X after sampling.
If Current Temperatures sensor is counted as X,
As X < X1, calculate current temperature with formula T=S1 × (X-A1);
As X1 < X < X2, calculate current temperature with formula T=S2 × (X-A2);
As X2 < X < X3, calculate current temperature with formula T=S3 × (X-A3);
As X < X3, calculate current temperature with formula T=S4 × (X-A4).
The utility model can meet higher accuracy requirement in wider operating temperature range.By gathering N number of temperature spot, making the pass between digital signal X and temperature T tie up to each sectional area all closer to linear relationship, thus enabling the temperature sensor after calibration work in wider temperature range, and there is higher precision.
To those skilled in the art, obvious the utility model is not limited to the details of above-mentioned one exemplary embodiment, and when not deviating from spirit of the present utility model or essential characteristic, can realize the utility model in other specific forms.Therefore, no matter from which point, all should embodiment be regarded as exemplary, and be nonrestrictive, scope of the present utility model is limited by claims instead of above-mentioned explanation, and all changes be therefore intended in the implication of the equivalency by dropping on claim and scope are included in the utility model.
In addition, be to be understood that, although this instructions is described according to embodiment, but not each embodiment only comprises an independently technical scheme, this narrating mode of instructions is only for clarity sake, those skilled in the art should by instructions integrally, and the technical scheme in each embodiment also through appropriately combined, can form other embodiments that it will be appreciated by those skilled in the art that.
Claims (2)
1. the piecewise linearity calibration system for temperature sensor chip, wherein temperature sensor chip comprises temperature sensor front end, ADC, linear scale unit and ROM, it is characterized in that, described system comprises base measuring temperature point register, comparer, function calculator, intercept register, slope register, intercept data selector, slope data selector switch; Described intercept register, the number of slope register are N-1, described base measuring temperature point register, the number of comparer to be N-2, N be not less than 5 integer; Described base measuring temperature point register and comparer connect one to one, and this N-2 comparer function counter connects; Described intercept register is connected with intercept data selector; Described slope register is connected with slope data selector switch; Described intercept data selector, slope data selector switch respectively function counter connect, calculate intercept A, the slope S corresponding with base measuring temperature point through function calculator, and this base measuring temperature point and intercept A, slope S are transferred in linear scale unit.
2. the piecewise linearity calibration system for temperature sensor chip according to claim 1, is characterized in that, the number of described function calculator, intercept data selector, slope data selector switch is 1.
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105352630A (en) * | 2015-12-24 | 2016-02-24 | 深圳市博巨兴实业发展有限公司 | Segmental linear calibration system and method for temperature sensor chip |
| CN107084818A (en) * | 2017-03-22 | 2017-08-22 | 深圳市博巨兴实业发展有限公司 | A kind of calibration method of high-precision pressure sensor chip |
| CN107328492A (en) * | 2017-03-08 | 2017-11-07 | 芯海科技（深圳）股份有限公司 | A kind of method of calibration chip temperature sensor |
-
2015
- 2015-12-24 CN CN201521096567.XU patent/CN205228677U/en active Active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105352630A (en) * | 2015-12-24 | 2016-02-24 | 深圳市博巨兴实业发展有限公司 | Segmental linear calibration system and method for temperature sensor chip |
| CN107328492A (en) * | 2017-03-08 | 2017-11-07 | 芯海科技（深圳）股份有限公司 | A kind of method of calibration chip temperature sensor |
| CN107328492B (en) * | 2017-03-08 | 2020-02-21 | 芯海科技（深圳）股份有限公司 | Method for calibrating chip temperature sensor |
| CN107084818A (en) * | 2017-03-22 | 2017-08-22 | 深圳市博巨兴实业发展有限公司 | A kind of calibration method of high-precision pressure sensor chip |
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Address after: 518051 Shenzhen Nanshan District, Guangdong Province, Guangdong Province, Yuehai Street High-tech Zone Community Science and Technology South Road 18 Shenzhen Bay Science and Technology Eco-Park 12 Skirt Building 732 Patentee after: Shenzhen Bojuxing Microelectronics Technology Co., Ltd. Address before: 518000 4th Floor, New Material Port D(4) Building, No.2 Changyuan New Material Port, Zhongxin Road, Nanshan District, Shenzhen City, Guangdong Province Patentee before: Shenzhen Bojuxing Industrial Development Co., Ltd. |
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