CN205194926U - Semiconductor laser burn -in screen socket - Google Patents
Semiconductor laser burn -in screen socket Download PDFInfo
- Publication number
- CN205194926U CN205194926U CN201520943745.1U CN201520943745U CN205194926U CN 205194926 U CN205194926 U CN 205194926U CN 201520943745 U CN201520943745 U CN 201520943745U CN 205194926 U CN205194926 U CN 205194926U
- Authority
- CN
- China
- Prior art keywords
- semiconductor laser
- main part
- socket
- main body
- burn
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model provides a semiconductor laser burn -in screen socket, dispels the heat the calotte in the main part including heat dissipation cap and main part, the main part is the cylindricality, and the top of main part has the arch, and the lateral surface of main part is provided with three electrically conductive preforming, the upper portion and the protruding in close contact with of three electrically conductive preforming. Bellied upper portion is the toper. Electrically conductive preforming setting is in the recess of main part lateral surface. This socket has improved semiconductor laser's burn -in screen yield, production efficiency has been improved under the prerequisite of guaranteeing product quality, the operation drawback in the present production has been solved, the size is small, the tennis ball retriever is simple in structure, and convenient use, so that space is saved, fabrication cost is reduced, the arch that the main part top has can be rectified pipe leg crooked on the semiconductor laser tube socket, the heat dissipation cap not only plays fine thermolysis, can also avoid the harm that external force was brought in aging process to semiconductor laser.
Description
Technical field
The utility model relates to a kind of socket for semiconductor laser ageing screening, belongs to semiconductor laser ageing triage techniques field.
Background technology
Semiconductor laser optical storage, optical communication, national defence, industry and medical etc. in have very large development prospect.In most application, the reliability of device is an a crucial factor, and whether this is also be related to them can commercial principal element.The Reliability Check of semiconductor laser, the general voltage ageing that adopts is tested, and observes device exactly and export between aging period under certain electric current.The ageing process of semiconductor laser determines durability, the reliability of product to a certain extent, and aging used aging device just plays key effect to product.
Diversified burn-in screen mode is there is at the semicon industry of present stage, burn-in screen mode determines the quality of device to a certain extent, the importance of burn-in screen seems particularly important at semicon industry, semiconductor laser is to device durability in semicon industry, the industry that the requirement of reliability is the harshest.Aging compared to other products of the burn-in screen mode of semiconductor laser and method thus, it is more accurate to the requirement of aging equipment, the important component part of the burn-in screen equipment of semiconductor laser and the ageing and screening method noise spectra of semiconductor lasers Total Product performance test based on this equipment.
All noise spectra of semiconductor lasers voltage ageing can be carried out in the current industry.Because semiconductor laser exists heating problem in energising ageing process, heating have impact on the ageing process of whole semiconductor laser to a certain extent, if dispel the heat insufficient performance that will affect whole product.And its essence of semiconductor laser be exactly triode amplification develop, its external structure determines in its burn-in screen process to a certain extent exists certain obstacle, three energising pipe legs of semiconductor laser are too thin, if be subject to, applied external force is excessive will cause distortion.But the conducting of electric current must be realized by three pipe legs in the process of burn-in screen.The burn-in screen device of present stage mainly realizes the current lead-through of triode three pipe legs by distinctive burn-in sockets.The performance of burn-in sockets determines the final working result of whole aging equipment to a certain extent with doing manual work thus.
In semicon industry, the development range of laser is relatively more extensive, and can see now the figure of semiconductor laser in field, many places, good development prospect is equally also the challenge to its quality, and the aging equipment being related to quality thus seems particularly important.
Chinese patent literature CN011298278 discloses semiconductor laser ageing screening installation and screening technique.What this aging equipment adopted is the support base being with the mode of jack to connect luminescence chip, operator needs alignment receptacles the base holding luminescence chip could be injected aging equipment, then switch on power, thus realize ageing process, if encounter the crooked situation of pipe leg so very large degree will affect operating efficiency, if it is bad with coordinating of jack to run into pipe leg, base tension not easy-pulling when choosing will be caused, once firmly excessive, that whole product will be made to be subject to external force is excessive and have influence on the quality of whole product, and by the accumulation of time, long service wear will make the stiff end of aging jack occur to loosen.While there are the problems referred to above, the radiating element that this equipment is imperfect, makes the heat brought in ageing process well not leave, causes very large impact to product.And this equipment complex structure, reduce the efficiency of work to a certain extent.
Comprehensively above-mentioned various problems, at present at semicon industry, particularly in field of semiconductor lasers, there is burn-in screen device miscellaneous, there is respective advantage, but equally all there is shortcoming in varying degrees, the popularity of semicon industry in intra-class correlation industry be improved, the particularly application of semiconductor laser, just must have the burn-in screen device of a set of perfect noise spectra of semiconductor lasers.
Summary of the invention
For the deficiency that the burn-in screen technology of existing semiconductor laser exists, the utility model provides that a kind of structure is simple, volume is little, fixation, convenience of choosing, good heat dissipation effect, semiconductor laser ageing screening socket that burn-in screen efficiency is high.
Semiconductor laser ageing screening socket of the present utility model, by the following technical solutions:
This burn-in screen socket, comprises radiating cap and main body, and radiating cap covers in main body; Main body is cylindricality, and the top of main body is with projection, and the lateral surface of main body is provided with three conductive wafer, the top of three conductive wafer and protruding close contact.
The top of described projection is tapered
Described conductive wafer is arranged in the groove of main body lateral surface.
Distribution and the semiconductor laser three on described three conductive wafer tops conduct electricity the corresponding of lead leg.
The height of described tapered protrusion is higher than the height of conductive wafer.
The utility model improves the burn-in screen rate of finished products of semiconductor laser, under the prerequisite ensureing product quality, improve production efficiency, solves existing operating defect aborning, has the following advantages:
(1) little, the simple structure of volume, light, saves space, reduces cost of manufacture.
(2) in ageing process, well adapted to length and the angle thereof of semiconductor laser base three energising pipe leg, well served the effect of fixed support, solve aging device in ageing process and loosen, cause the problem that ageing results is bad.
(3) main body top is with projection, is used for, by the correction of pipe leg (conduction lead leg) crooked on semiconductor laser base, saving the time that manual synchronizing pipe leg spends, improve operating efficiency and production capacity.
(4) with special radiating cap, not only play good thermolysis, the harm that external force noise spectra of semiconductor lasers is brought in ageing process can also be avoided.
Accompanying drawing explanation
Fig. 1 is the structural representation of radiating cap in the utility model semiconductor laser ageing screening socket.
Fig. 2 is the structural representation of main body in the utility model semiconductor laser ageing screening socket.
Wherein: 1, radiating cap, 2, main body, 3, protruding, 4, conductive wafer.
Embodiment
Semiconductor laser ageing screening socket of the present utility model comprises radiating cap 1 and main body 2, and radiating cap 1 covers on the body 2.The structure of radiating cap 1 as shown in Figure 1; its external shape matches with main body; the copper material of good heat dissipation effect is adopted to make; solve semiconductor laser in energising ageing process well to generate heat the impact brought; simultaneously; radiating cap also plays certain protective effect, prevents semiconductor laser to be subject to external force in the process that energising is aging and works the mischief to it.
The structure of main body 2 is as shown in Figure 2, cylindrical, for poly-plastic matter that is high temperature resistant, good insulating makes.The top of main body 2, with protruding 3, is structure as a whole with main body, and protruding 3 is four prisms cylinders, and its top is tapered.The outer circumference face of main body 2 is divided into four parts, and three parts are wherein provided with groove, is all fixed with a conductive wafer 4 by screw in three grooves.The tip height of tapered protrusion is slightly higher than the top of conductive wafer.Three conductive wafer by natural resiliency all with protruding 3 close contacts.The copper fitting that conductive wafer 3 is that resistivity is little, good conductivity, loss are low, has certain elasticity, not only plays fixed support effect, and can be energized leg close contact with three of semiconductor laser piece, plays the effect of conducting when being energized.
Due to the impact due to external force in the production process of semiconductor laser make three of semiconductor laser pipe legs exist in varying degrees crooked, the crooked process slowing down whole ageing process to a certain extent of pipe leg, and crooked pipe leg can cause the loose contact with conductive wafer 4, thus affect final ageing results.Therefore, adopt taper configurations with the projection 3 of conductive wafer close contact, run into pipe leg crooked when not being very serious, when in the process that pipe leg is inserted to socket, pipe leg can be corrected, well solve the inconvenience that brings of this problem to whole aging work.
Under normal operating conditions, radiating cap is buckled on whole burn-in sockets, and whole burn-in sockets is be fixed on special aging circuit plate together with radiating cap, is connected by three conductive wafer and aging circuit plate, realizes the conducting of energising.Normal aging process starts to be first be inserted on burn-in sockets by semiconductor laser by the circular hole at radiating cap top, ensures between the tapered protrusion that three conduction lead legs of semiconductor laser are inserted in main body 2 top and conductive wafer.Then switch on power and enter voltage ageing process, aging through certain hour (characteristic according to product itself specifies), according to technological requirement screening product.
Claims (5)
1. a semiconductor laser ageing screening socket, comprise radiating cap and main body, it is characterized in that, radiating cap covers in main body; Main body is cylindricality, and the top of main body is with projection, and the lateral surface of main body is provided with three conductive wafer, the top of three conductive wafer and protruding close contact.
2. semiconductor laser ageing screening socket according to claim 1, it is characterized in that, the top of described projection is tapered.
3. semiconductor laser ageing screening socket according to claim 1, it is characterized in that, described conductive wafer is arranged in the groove of main body lateral surface.
4. semiconductor laser ageing according to claim 1 screening socket, is characterized in that, distribution and the semiconductor laser three on described three conductive wafer tops conduct electricity the corresponding of lead leg.
5. semiconductor laser ageing according to claim 1 screening socket, is characterized in that, the tip height of described tapered protrusion is higher than the tip height of conductive wafer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520943745.1U CN205194926U (en) | 2015-11-24 | 2015-11-24 | Semiconductor laser burn -in screen socket |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520943745.1U CN205194926U (en) | 2015-11-24 | 2015-11-24 | Semiconductor laser burn -in screen socket |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205194926U true CN205194926U (en) | 2016-04-27 |
Family
ID=55787884
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201520943745.1U Active CN205194926U (en) | 2015-11-24 | 2015-11-24 | Semiconductor laser burn -in screen socket |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205194926U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111123058A (en) * | 2018-10-29 | 2020-05-08 | 潍坊华光光电子有限公司 | Semiconductor laser whole aging device and aging method |
-
2015
- 2015-11-24 CN CN201520943745.1U patent/CN205194926U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111123058A (en) * | 2018-10-29 | 2020-05-08 | 潍坊华光光电子有限公司 | Semiconductor laser whole aging device and aging method |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN110838626B (en) | Electrical control cabinet terminal strip | |
| CN107728032B (en) | Testing device for crimping type power semiconductor device | |
| CN203734065U (en) | Connection structure of distribution box and conductive joint | |
| CN102890031B (en) | Conductive clamp for plug lead bending test | |
| CN205194926U (en) | Semiconductor laser burn -in screen socket | |
| CN110133344A (en) | The not easy device of electricity cut-off type quick-replaceable electric energy meter | |
| CN207148270U (en) | One kind insulation spraying Hi-pot test frock | |
| CN203965474U (en) | The test jack of tape insulation frame ageing | |
| CN210298206U (en) | Low-voltage compensation circuit | |
| CN203979972U (en) | One exempts to weld LED bulb lamp | |
| US20130271115A1 (en) | Power supply efficiency measurement device | |
| CN204577310U (en) | A kind of rotary pneumatic high voltage isolator | |
| CN201266553Y (en) | Tact device for electrolytic capacitor | |
| CN108169609B (en) | Super capacitor parallel charging and discharging tool | |
| CN105375213A (en) | LED aging tester socket | |
| CN104034931A (en) | Junction device for electric energy meter | |
| CN202204907U (en) | Dielectric voltage withstand testing appliance for terminal type capacitors | |
| CN208656108U (en) | A kind of attachment device adjusted for contactor | |
| CN201859968U (en) | Temperature controller of liquid heating device | |
| CN205195016U (en) | LED aging testing is socket for appearance | |
| CN207009798U (en) | Multiconductor cassette plugs and sockets | |
| CN220128619U (en) | Clamping structure for testing microwave device | |
| CN206864320U (en) | A kind of electrical power contacts device of low-voltage outlet device | |
| CN220552930U (en) | Interlayer withstand voltage test tool for testing surface mount inductor | |
| CN203734093U (en) | Three-section switch lamp holder |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CP01 | Change in the name or title of a patent holder |
Address after: Tianchen Avenue high tech Zone of Ji'nan City, Shandong Province, No. 1835 250101 Patentee after: SHANDONG HUAGUANG OPTOELECTRONICS CO., LTD. Address before: Tianchen Avenue high tech Zone of Ji'nan City, Shandong Province, No. 1835 250101 Patentee before: Shandong Huaguang Photoelectronic Co., Ltd. |