CN205091522U - A probe counterpoint mechanism for liquid crystal display panel - Google Patents
A probe counterpoint mechanism for liquid crystal display panel Download PDFInfo
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- CN205091522U CN205091522U CN201520821195.6U CN201520821195U CN205091522U CN 205091522 U CN205091522 U CN 205091522U CN 201520821195 U CN201520821195 U CN 201520821195U CN 205091522 U CN205091522 U CN 205091522U
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- rotating basis
- positioning mechanism
- liquid crystal
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Abstract
The utility model discloses a probe counterpoint mechanism for liquid crystal display panel, this probe counterpoint mechanism includes: supporting pedestal and rotating basis and the positioning element of setting on supporting pedestal, install at least one probe of following the first direction and arranging in proper order on the rotating basis to and being provided with at least one registration hole who arranges in proper order along the second direction, the first direction is perpendicular with the second direction, and when the clockwise or counter -clockwise turning of rotating basis its rotating axis core of edge 90 o'clock, at least one probe with at least one registration hole coincidence, positioning element is used for fixing the rotating basis at certain rotation angle. The utility model discloses an observe registration hole with the electrode and counterpoint directly over the electrode, accomplish the rotatory rotating basis in back so that probe and electrode counterpoint entry point lamp module formula counterpointing, but have direct observation counterpoint state, counterpoint process fast, advantage that the counterpoint rate of accuracy is high.
Description
Technical field
The utility model relates to liquid crystal panel field, particularly relates to a kind of probe positioning mechanism for liquid crystal panel.
Background technology
The liquid crystal panel of liquid crystal indicator needs to carry out lighting test by ignition device usually, to detect the image quality of liquid crystal panel.Lighting test specifically to refer to the signal in signal generator by probe transmission to the electrode of liquid crystal panel, to make liquid crystal panel show, and then can detect the image quality of liquid crystal panel.Apparent, before carrying out lighting test, need the probe in ignition device and the electrode on liquid crystal panel to carry out accurate contraposition, so that carry out Signal transmissions.
Probe-electrode the alignment mode provided in prior art is provided, as shown in the figure, liquid crystal panel 10 is provided with electrode 11, liquid crystal panel 10 is relatively set with probe station 20, the probe 21 plugged in probe station 20 is connected with signal generator 30 with Received signal strength respectively, and carries out contraposition to probe 21 and electrode 11 and be also provided with microscope 40 in order to accurate at the sidepiece of the relative probe station 20 of liquid crystal panel 10.
When the contraposition process of probe 21 and electrode 11 observed by microscope 40, owing to only can observe from the side locations of probe 21 and electrode 11, so the inaccurate problem of para postion may be there is, if and microscope 40 is arranged on the top of probe 21, then microscope 40 cannot observe directly alignment, therefore causes the defect that contraposition is difficult, contraposition accuracy rate is low.
Utility model content
The utility model provides a kind of probe positioning mechanism for liquid crystal panel, to improve probe contraposition accuracy rate.
The utility model provides a kind of probe positioning mechanism for liquid crystal panel, comprising: supporting base and the rotating basis be arranged on described supporting base and positioning element;
Described rotating basis is provided with at least one probe be arranged in order along first direction, and be provided with at least one registration holes be arranged in order along second direction, described first direction is vertical with described second direction, and when described rotating basis is along its axis of rotation is clockwise or when being rotated counterclockwise 90 °, at least one probe described overlaps with at least one registration holes described;
Described positioning element, for being fixed on certain anglec of rotation by described rotating basis.
Preferably, described rotating basis comprises orthogonal first straight flange and the second straight flange, and described probe is along described first straight flange arrangement, and described registration holes is along described second straight flange arrangement.
Preferably, also comprise: be fixed on the swivel bearing on described supporting base, described rotating basis to be arranged on described swivel bearing and to rotate.
Preferably, described supporting base is provided with annular guide channel, the relatively described annular guide channel place of described rotating basis is provided with convex slide, and described convex slide embeds in described annular guide channel to make described rotating basis rotate.
Preferably, described positioning element comprises: reference column, spring and place kick, and one end of described reference column is fixed on described supporting base, the other end is connected with the first end of described spring, and the second end of described spring is connected with described place kick;
Described rotating basis is provided with the first breach and second breach of accommodating and fixing described place kick, described first breach and described second breach are 90 ° relative to the central angle of axis of rotation.
Preferably, the shape of described breach is rectangle or square or triangle.
Preferably, described first breach is parallel with described second direction with the first connecting line of the axis of rotation of described rotating basis, and described second breach is parallel with described first direction with the second connecting line of the axis of rotation of described rotating basis.
Preferably, described positioning element comprises the card be fixed on described supporting base and takes, and the first buckle be fixed on described rotating basis and the second buckle, described card is taken and is engaged with described first buckle or engage with described second buckle with fixing described rotating basis, and described first buckle and described second buckle are 90 ° relative to the central angle of axis of rotation.
Preferably, the quantity of described probe is less than or equal to the quantity of described probe aperture;
The quantity of described probe aperture and described registration holes is equal and be all more than or equal to one group of quantity to potential electrode of described liquid crystal panel.
Preferably, described probe positioning mechanism and described liquid crystal panel potential electrode group one_to_one corresponding is arranged, and described probe positioning mechanism be arranged on place described liquid crystal panel platform on.
A kind of probe positioning mechanism that the utility model provides, comprise: supporting base and the rotating basis be arranged on supporting base and positioning element, rotating basis is provided with at least one probe be arranged in order along first direction and at least one registration holes be arranged in order along second direction, when rotating basis is along its axis of rotation is clockwise or when being rotated counterclockwise 90 °, at least one probe overlaps with at least one registration holes.The utility model by observing registration holes and electrode and carrying out contraposition directly over electrode, after contraposition completes, rotate rotating basis to make probe and electrode contraposition inlet point lamp pattern, have can directly observe alignment, contraposition process fast, advantage that contraposition accuracy rate is high.
Accompanying drawing explanation
In order to be illustrated more clearly in the utility model embodiment or technical scheme of the prior art, introduce doing one to the accompanying drawing used required in embodiment or description of the prior art simply below, apparently, accompanying drawing in the following describes is embodiments more of the present utility model, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to these accompanying drawings.
The schematic diagram of probe-electrode alignment mode of Fig. 1 for providing in prior art;
Fig. 2 A is the schematic diagram of a kind of probe positioning mechanism that the utility model embodiment one provides;
Fig. 2 B is the schematic diagram of the another kind of probe positioning mechanism that the utility model embodiment one provides;
Fig. 3 is the schematic diagram of a kind of probe positioning mechanism that the utility model embodiment two provides;
Fig. 4 is the vertical view of a kind of liquid crystal panel proving installation that the utility model embodiment three provides.
Embodiment
For further setting forth the utility model for the technological means reaching predetermined utility model object and take and effect, below in conjunction with accompanying drawing and preferred embodiment, to according to the embodiment of a kind of probe positioning mechanism for liquid crystal panel that the utility model proposes, structure, feature and effect thereof, be described in detail as follows.
The schematic diagram of a kind of probe positioning mechanism that Fig. 2 A provides for the utility model embodiment one.This probe positioning mechanism being used for liquid crystal panel comprises: supporting base 110 and the rotating basis 120 be arranged on supporting base 110 and positioning element 130.
Rotating basis 120 is provided with at least one probe 121 be arranged in order along first direction, and be provided with at least one registration holes 122 be arranged in order along second direction, first direction is vertical with second direction, and when rotating basis 120 is along its axis of rotation is clockwise or when being rotated counterclockwise 90 °, at least one probe 121 described overlaps with at least one registration holes 122 described.Positioning element 130, for being fixed on certain anglec of rotation by rotating basis 120.
As shown in Figure 2 A, the initial position of optional rotating basis 120 is that its probe 121 arranges in X direction, registration holes 122 arranges along Y-direction, particularly, when rotating basis 120 along its axis of rotation turn clockwise 90 ° time, each probe 121 postrotational all overlaps with the position of one of them registration holes 122 before rotation, or, when rotating basis 120 is rotated counterclockwise 90 ° along its axis of rotation, each probe 121 before rotation all overlaps with the position of one of them registration holes 122 postrotational.
As shown in Figure 2 A the position of the position of registration holes 122 and probe 121 is set to the initial position of rotating basis 120, then its anglec of rotation is 0 °, be plugged in the side of rotating basis 120 due to probe 121 and fix rotating basis 120 for the ease of positioning element 130, then rotating basis 120 can turn clockwise 90 ° along its axis of rotation by initial position in the present embodiment, and is rotated counterclockwise 90 ° to initial position.Accordingly, positioning element 130 for rotating basis 120 is fixed on the position that the anglec of rotation is 0 °, and also for rotating basis 120 being fixed on the position of 90 ° of turning clockwise.
On the basis of technique scheme, optional rotating basis 120 comprises orthogonal first straight flange and the second straight flange, and probe 121 arranges along the first straight flange, and registration holes 122 arranges along the second straight flange, and the first straight flange is vertical with the second straight flange.In the present embodiment, other limits are set to arc-shaped edges.It will be appreciated by those skilled in the art that, the shape on the border of rotating basis 120 includes but not limited to above-mentioned shape, in other embodiments can according to circumstances from Row sum-equal matrix, as the first straight flange and/or the second straight flange are adjusted to arc-shaped edges etc., other limits are set to straight flange etc., do not illustrate at this and repeat.
Known rotating basis 120 is arranged on supporting base 110, and rotating basis 120 clockwise or can be rotated counterclockwise 90 ° along its axis of rotation, therefore probe positioning mechanism is optional also comprises: be fixed on the swivel bearing 111 on supporting base 110, and rotating basis 120 to be arranged on swivel bearing 111 and to rotate.It should be noted that at this, if fix without positioning element 130 pairs of rotating basiss 120, then under the restriction of probe 121 position, rotating basis 120 can turn clockwise 180 ° and be rotated counterclockwise 180 ° to initial position along its axis of rotation by initial position.It should be noted that, swivel bearing 111 can also be fixed on the axis of rotation place of the one side of the corresponding supporting base 110 of rotating basis 120, corresponding supporting base 110 is provided with groove for accommodating swivel bearing 111, then rotating basis 120 to be arranged on supporting base 110 by swivel bearing 111 and to rotate.It will be appreciated by those skilled in the art that, rotating basis 120 includes but not limited to foregoing description with the connection of supporting base 110, connect and the rotation of rotating basis 120 as dismountable swivel bearing 111, annular ring rail etc. realize it by other modes in other embodiments, concrete structure does not repeat them here.
Positioning element 130 is for being fixed on certain anglec of rotation by rotating basis 120, comprise at this optional positioning element 130: reference column 131, spring 132 and place kick 133, one end of reference column 131 is fixed on supporting base 110, the other end is connected with the first end of spring 132, and the second end of spring 132 is connected with place kick 133; Corresponding, rotating basis 120 being provided with accommodating and the first breach 123 of stationary positioned ball 133 and the second breach 124, first breach 123 and the second breach 124 is 90 ° relative to the central angle of axis of rotation.Optional first breach 123 is parallel with second direction with the first connecting line of the axis of rotation of rotating basis 120, and the second breach 124 is parallel with first direction with the second connecting line of the axis of rotation of rotating basis 120.The shape of optional breach is rectangle or square or triangle or other figures, and the size of breach is equal with the size of place kick 133.
Concrete, when place kick 133 is contained in the second breach 124, rotating basis 120 is fixed on the initial position that the anglec of rotation is 0 ° by positioning element 130; When place kick 133 is contained in the first breach 123, rotating basis 120 is fixed on the position of 90 ° of being turned clockwise by initial position by positioning element 130.It will be appreciated by those skilled in the art that, also can be contained in fixing rotating basis 120 in the first breach 123 or the second breach 124 by the location structure of square, triangle or other shapes in positioning element 130, the notch geometry that corresponding difform location structure is corresponding is also incomplete same; Or place kick 133, first breach 123 can also be with the second breach 124 and be magnetic to be fixedly connected with by magnetic; Or place kick 133 has magnetic, the border of rotating basis 120 is provided with the interior insert-type of stationary positioned ball 133 or the first magnetic patch of male type and the second magnetic patch, and the first magnetic patch and the second magnetic patch instead of the first breach 123 and the second breach 124.Positioning element 130 can also realize by other means.
Technical in technique scheme, probe 121 is plugged in the probe aperture of rotating substrate, and the optional quantity arranging probe 121 is less than or equal to the quantity of probe aperture; The quantity of probe aperture and registration holes 122 is equal and be all more than or equal to one group of quantity to potential electrode of liquid crystal panel.It is advantageous that, the possibility of the quantity to electrode in potential electrode group difference in different liquid crystal and the size between adjacent electrode may be different, when then contraposition and lighting test being carried out to a certain liquid crystal panel, user can arrange according to one group of quantity to potential electrode and electrode separation in this liquid crystal panel multiple probe aperture that probe 121 plugs in whole probe aperture, so that carry out lighting test to liquid crystal panel, improve the versatility of probe positioning mechanism in different liquid crystal.
Alternatively, probe positioning mechanism and liquid crystal panel potential electrode group one_to_one corresponding is arranged, and probe positioning mechanism be arranged on place liquid crystal panel platform on.If liquid crystal panel comprises many groups to potential electrode, then arrange and multiple probe positioning mechanism that potential electrode group one_to_one corresponding is arranged, before lighting test, need be placed on platform by parallel for liquid crystal panel, the probe 121 of each probe positioning mechanism is carried out contraposition with corresponding one group to potential electrode group, with to make by probe 121 simultaneously by Signal transmissions to each each electrode to potential electrode group.
Known probe positioning mechanism be used for contraposition liquid crystal panel to potential electrode group, apparent, the registration holes 122 of probe positioning mechanism is for the electrode of contraposition liquid crystal panel, and the probe 121 of probe positioning mechanism is for the electrode of lighting liquid crystal panel.Therefore the course of work of any one probe positioning mechanism contraposition is in the present embodiment: by positioning element 130, rotating basis 120 is fixed on initial position; By traveling probe positioning mechanism with the top for the treatment of the electrode group of contraposition making its registration holes 122 be positioned at liquid crystal panel; Observer observes downwards position directly over electrode, and is overlapped with the position of one of them registration holes 122 to make the position of each electrode by fine setting probe positioning mechanism; Stationary probe positioning mechanism, turns clockwise 90 ° by rotating basis 120 along its axis of rotation, and by positioning element 130, rotating basis 120 is fixed on this anglec of rotation; Then probe 121 and electrode position contraposition and overlap, now probe positioning mechanism contraposition completes and is in lighting pattern.Each probe positioning mechanism corresponding when liquid crystal panel all enters lighting pattern, then now can carry out lighting test to liquid crystal panel.
It should be noted that, probe 121 and the registration holes 122 of rotating basis 120 also can be arranged on diverse location, and the direction that corresponding rotating basis 120 rotates is also different.As the schematic diagram of the another kind of probe positioning mechanism that Fig. 2 B provides for the utility model embodiment one.Be with Fig. 2 A difference, the probe 121 of this rotating basis 120 is arranged on the clockwise place of registration holes 122, at this, diagram position of registration holes 122 and the position of probe 121 are set to the initial position of rotating basis 120, then its anglec of rotation is 0 °, accordingly, this rotating basis 120 can be rotated counterclockwise 90 ° along its axis of rotation by initial position, and turns clockwise 90 ° to initial position.When rotating basis 120 is in initial position, positioning element 130 is for being fixed on rotating basis 120 position that the anglec of rotation is 0 °; When rotating basis 120 is rotated counterclockwise 90 ° along its axis of rotation by initial position, at least one probe 121 described overlaps with at least one registration holes 122 described, and positioning element 130 is for being fixed on the position being rotated counterclockwise 90 ° by rotating basis 120; When rotating basis 120 turn clockwise 90 ° to initial position time, positioning element 130 is for being fixed on rotating basis 120 position that the anglec of rotation is 0 °.
A kind of probe positioning mechanism that the utility model embodiment one provides, comprise: supporting base 110 and the rotating basis 120 be arranged on supporting base 110 and positioning element 130, rotating basis 120 is provided with at least one probe 121 be arranged in order along first direction and at least one registration holes 122 be arranged in order along second direction, when rotating basis 120 is along its axis of rotation is clockwise or when being rotated counterclockwise 90 °, at least one probe 121 overlaps with at least one registration holes 122.The utility model embodiment carries out contraposition by observing registration holes 122 with electrode directly over electrode, after contraposition completes, rotate rotating basis 120 to make probe 121 and electrode contraposition inlet point lamp pattern, have can directly observe alignment, contraposition process fast, advantage that contraposition accuracy rate is high.
As shown in Figure 3, be a kind of probe positioning mechanism that the utility model embodiment two provides, this probe positioning mechanism comprises: supporting base 210 and the rotating basis 220 be arranged on supporting base 210 and positioning element 230.
Wherein, rotating basis 220 is provided with at least one probe 221 be arranged in order along first direction, and be provided with at least one registration holes 222 be arranged in order along second direction, first direction is vertical with second direction, and when rotating basis 220 is along its axis of rotation 223 is clockwise or when being rotated counterclockwise 90 °, at least one probe 221 described overlaps with at least one registration holes 222 described.Positioning element 230 is for being fixed on certain anglec of rotation by rotating basis 220.
On the basis of technique scheme, optional rotating basis 220 comprises orthogonal first straight flange and the second straight flange, and probe 221 arranges along the first straight flange, and registration holes 222 arranges along the second straight flange.The quantity of optional probe 221 is less than or equal to the quantity of probe aperture; The quantity of probe aperture and registration holes 222 is equal and be all more than or equal to one group of quantity to potential electrode of liquid crystal panel.Optional probe positioning mechanism and liquid crystal panel potential electrode group one_to_one corresponding is arranged, and probe positioning mechanism be arranged on place liquid crystal panel platform on.
The difference of probe positioning mechanism shown in this probe positioning mechanism and Fig. 2 A or Fig. 2 B is, supporting base 210 is provided with annular guide channel (not shown), the opposed annular guide groove place of rotating basis 220 is provided with convex slide (not shown), and convex slide embeds in annular guide channel to make rotating basis 220 rotate.It will be understood by those skilled in the art that optional convex slide is arranged on supporting base 210, and relative matrix annular guide channel is arranged on rotating basis 220, rotating basis 220 relative support pedestal 210 rotates.
The difference of probe positioning mechanism shown in this probe positioning mechanism and Fig. 2 A or Fig. 2 B is also, positioning element 230 comprises the card be fixed on supporting base 210 and takes 231, and the first buckle 232 and the second buckle 233 be fixed on rotating basis 220, blocking that the engaging frame taken on 231 to engage with the first buckle 232 or engage with the second buckle 233 with fixing rotating basis 220, first buckle 232 and the second buckle 233 relative to the central angle of axis of rotation 223 is 90 °.Wherein, the first buckle 232 is parallel with second direction with the first connecting line of the axis of rotation 223 of rotating basis 220, and the second buckle 233 is parallel with first direction with the second connecting line of the axis of rotation 223 of rotating basis 220.Optional buckle is circle, engaging frame is square.It will be understood by those skilled in the art that the shape of buckle and engaging frame can sets itself, and positioning element 230 also realizes by other modes such as magnetic devices.
Shown in the course of work of any one probe positioning mechanism contraposition in the present embodiment and Fig. 2 A, the contraposition process of probe positioning mechanism is similar, be specially: first by adjustment rotating basis 220, and traveling probe positioning mechanism, overlap with the position of registration holes 222 to make the position of each electrode; Secondly stationary probe positioning mechanism, and rotating basis 220 is turned clockwise 90 ° along its axis of rotation 223, and by positioning element 230, rotating basis 220 is fixed on this anglec of rotation; The contraposition of last probe positioning mechanism completes, and is in lighting pattern.Each probe positioning mechanism corresponding when liquid crystal panel all enters lighting pattern, then now can carry out lighting test to liquid crystal panel.
As shown in Figure 4, for the vertical view of a kind of liquid crystal panel proving installation that the utility model embodiment three provides, this liquid crystal panel proving installation comprises: probe positioning mechanism 310, liquid crystal panel 320, test board 330, also comprise be arranged on liquid crystal panel 320 to the microscope (not shown) directly over potential electrode 321 and the signal generator (not shown) to probe transmission signal.Wherein, test board 330 is for placing the area planar of probe positioning mechanism 310 higher than the area planar for placing liquid crystal panel 320, and probe positioning mechanism 310 is fixed on test board 330 by snap-in structure.
Concrete, snap fastener 331 is arranged on the both sides of probe positioning mechanism 310, when probe positioning mechanism 310 is mobile with after registration holes being alignd with electrode 321 on test board 330, mobile snap fastener 331 is with the both sides making it be fixed on probe positioning mechanism 310 in the track of snap fastener 331 for observer, and probe positioning mechanism 310 completes with the contraposition process of liquid crystal panel 320.It will be appreciated by those skilled in the art that, probe positioning mechanism 310 can also be fixed on test board 330 by magnetron configuration, or, probe positioning mechanism 310 is screwed on test board 330, known probe positioning mechanism 310 is fixed on test board 330 by multiple common snap fit, no longer illustrates and repeat at this.
For the positioning mechanism of probe shown in Fig. 3 310, the contraposition process of liquid crystal panel 320 proving installation is in the present embodiment: by positioning element, rotating basis is fixed on initial position; By traveling probe positioning mechanism 310 with the top for the treatment of the electrode group of contraposition making its registration holes be positioned at liquid crystal panel 320; Observer by being arranged on the microscopic examination directly over electrode 321, and is overlapped with the position of the position with one of them registration holes that make each electrode 321 by fine setting probe positioning mechanism 310; By snap-in structure stationary probe positioning mechanism 310, then rotating basis is turned clockwise 90 ° along its axis of rotation, and by positioning element, rotating basis is fixed on this anglec of rotation; Then probe and electrode 321 position contraposition and overlap, now probe positioning mechanism 310 contraposition completes and is in lighting pattern.When each probe positioning mechanism 310 of liquid crystal panel 320 correspondence all enters lighting pattern, then now can carry out lighting test to liquid crystal panel 320.
The above, it is only preferred embodiment of the present utility model, not any pro forma restriction is done to the utility model, although the utility model discloses as above with preferred embodiment, but and be not used to limit the utility model, any those skilled in the art, do not departing within the scope of technical solutions of the utility model, make a little change when the technology contents of above-mentioned announcement can be utilized or be modified to the Equivalent embodiments of equivalent variations, in every case be do not depart from technical solutions of the utility model content, according to any simple modification that technical spirit of the present utility model is done above embodiment, equivalent variations and modification, all still belong in the scope of technical solutions of the utility model.
Claims (10)
1. for a probe positioning mechanism for liquid crystal panel, it is characterized in that, comprising: supporting base and the rotating basis be arranged on described supporting base and positioning element;
Described rotating basis is provided with at least one probe be arranged in order along first direction, and be provided with at least one registration holes be arranged in order along second direction, described first direction is vertical with described second direction, and when described rotating basis is along its axis of rotation is clockwise or when being rotated counterclockwise 90 °, at least one probe described overlaps with at least one registration holes described;
Described positioning element, for being fixed on certain anglec of rotation by described rotating basis.
2. probe positioning mechanism according to claim 1, is characterized in that, described rotating basis comprises orthogonal first straight flange and the second straight flange, and described probe is along described first straight flange arrangement, and described registration holes is along described second straight flange arrangement.
3. probe positioning mechanism according to claim 1, is characterized in that, also comprise: be fixed on the swivel bearing on described supporting base, and described rotating basis to be arranged on described swivel bearing and to rotate.
4. probe positioning mechanism according to claim 1, it is characterized in that, described supporting base is provided with annular guide channel, and the relatively described annular guide channel place of described rotating basis is provided with convex slide, and described convex slide embeds in described annular guide channel to make described rotating basis rotate.
5. probe positioning mechanism according to claim 1, it is characterized in that, described positioning element comprises: reference column, spring and place kick, one end of described reference column is fixed on described supporting base, the other end is connected with the first end of described spring, and the second end of described spring is connected with described place kick;
Described rotating basis is provided with the first breach and second breach of accommodating and fixing described place kick, described first breach and described second breach are 90 ° relative to the central angle of axis of rotation.
6. probe positioning mechanism according to claim 5, is characterized in that, the shape of described breach is rectangle or square or triangle.
7. probe positioning mechanism according to claim 5, it is characterized in that, described first breach is parallel with described second direction with the first connecting line of the axis of rotation of described rotating basis, and described second breach is parallel with described first direction with the second connecting line of the axis of rotation of described rotating basis.
8. probe positioning mechanism according to claim 1, it is characterized in that, described positioning element comprises the card be fixed on described supporting base and takes, and the first buckle be fixed on described rotating basis and the second buckle, described card is taken and is engaged with described first buckle or engage with described second buckle with fixing described rotating basis, and described first buckle and described second buckle are 90 ° relative to the central angle of axis of rotation.
9. probe positioning mechanism according to claim 1, is characterized in that, the quantity of described probe is less than or equal to the quantity of described probe aperture;
The quantity of described probe aperture and described registration holes is equal and be all more than or equal to one group of quantity to potential electrode of described liquid crystal panel.
10. probe positioning mechanism according to claim 1, is characterized in that, arranging potential electrode group one_to_one corresponding of described probe positioning mechanism and described liquid crystal panel, and described probe positioning mechanism be arranged on place described liquid crystal panel platform on.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520821195.6U CN205091522U (en) | 2015-10-22 | 2015-10-22 | A probe counterpoint mechanism for liquid crystal display panel |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520821195.6U CN205091522U (en) | 2015-10-22 | 2015-10-22 | A probe counterpoint mechanism for liquid crystal display panel |
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| CN205091522U true CN205091522U (en) | 2016-03-16 |
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| CN201520821195.6U Active CN205091522U (en) | 2015-10-22 | 2015-10-22 | A probe counterpoint mechanism for liquid crystal display panel |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108225132A (en) * | 2018-01-12 | 2018-06-29 | 中国工程物理研究院化工材料研究所 | A kind of chip type is molded Slapper detonator |
| CN110189669A (en) * | 2019-06-12 | 2019-08-30 | 深圳市华星光电半导体显示技术有限公司 | A kind of lighting test jig and test method |
-
2015
- 2015-10-22 CN CN201520821195.6U patent/CN205091522U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108225132A (en) * | 2018-01-12 | 2018-06-29 | 中国工程物理研究院化工材料研究所 | A kind of chip type is molded Slapper detonator |
| CN110189669A (en) * | 2019-06-12 | 2019-08-30 | 深圳市华星光电半导体显示技术有限公司 | A kind of lighting test jig and test method |
| CN110189669B (en) * | 2019-06-12 | 2022-07-12 | 深圳市华星光电半导体显示技术有限公司 | Lighting test fixture and test method |
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Address after: 215301, 1, Longteng Road, Kunshan, Jiangsu, Suzhou Patentee after: Kunshan Longteng Au Optronics Co Address before: 215301, 1, Longteng Road, Kunshan, Jiangsu, Suzhou Patentee before: Kunshan Longteng Optronics Co., Ltd. |