CN205028664U - Detectable test voltage reduction's solid state hard drives automatic tester - Google Patents
Detectable test voltage reduction's solid state hard drives automatic tester Download PDFInfo
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- CN205028664U CN205028664U CN201520762161.4U CN201520762161U CN205028664U CN 205028664 U CN205028664 U CN 205028664U CN 201520762161 U CN201520762161 U CN 201520762161U CN 205028664 U CN205028664 U CN 205028664U
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Abstract
The utility model relates to a solid state hard drives especially relates to a detectable test voltage reduction's solid state hard drives automatic tester. The power supply of input power is received to this tester to can download the firmware and test solid state hard drives from the test computer automatically. Wherein, this tester includes voltage detection circuit, microprocessor, SATA connector and response equipment, and microprocessor connects with voltage detection circuit, SATA connector, response equipment respectively. When if the test voltage is less than early warning value, this solid state hard drives automatic tester can automatic suggestion be inaccurate by this test mouthful solid state hard drives value of testing to the test controlet knows, thereby improves the yield of product shipment.
Description
Technical field
The utility model relates to solid state hard disc, relates to a kind of solid state hard disc automatic tester detecting test voltage and decline in particular.
Background technology
Solid state hard disc becomes the memory device that people generally use day by day, and it is fast that it has speed, and the life-span is long, the advantage that power is low, solid state hard disc is that its volume is little, and memory space is large by high-capacity flash memory by dress in the circuit board, easy to use, and Portable computer assembling, thus obtain the welcome of user.
General solid state hard disc needs when dispatching from the factory, through many test processs, just can put on market.Existing solid state hard disc automatic testing instrument can carry out multiple solid state hard disc test simultaneously.Solid state hard disc, in test process, often can run into the environmental interference beyond test, such as input power accesses too much test load and causes the test voltage of certain testing tool lower than 3.6V.When test voltage is lower than 3.6V, the test value of the solid state hard disc of testing tool test is inaccurate, and tester often has no way of learning that this test value is inaccurate.
Therefore, this problem needs solution badly.
Utility model content
The utility model is in order to overcome the deficiencies in the prior art, object aims to provide a kind of solid state hard disc automatic tester detecting test voltage and decline, if when test voltage is lower than early warning value, the solid state hard disc value that this solid state hard disc automatic tester meeting automatic-prompting is tested by this test port is inaccurate, so that test man knows, thus provide the yield of product turnout.
In order to solve above-mentioned technical matters, the basic technical scheme that the utility model proposes is:
Detect the solid state hard disc automatic tester that test voltage declines, this solid state hard disc automatic tester receives the power supply of input power, and can download firmware testing solid state hard disc from test computer automatically; It comprises voltage detecting circuit, microprocessor, SATA connector and response apparatus, and microprocessor is connected with voltage detecting circuit, SATA connector, response apparatus respectively.
Further, described voltage detecting circuit comprises voltage comparator, two resistance, voltage stabilizing diode and diodes, input power is connected with the negative terminal of voltage comparator by the first resistance, input power is connected with the anode of voltage comparator by the second resistance, the negative pole of voltage stabilizing diode is connected with the anode of voltage comparator, the positive pole of voltage stabilizing diode is connected to ground, and the output terminal of voltage comparator is connected with the positive pole of diode, and the negative pole of diode is connected with microprocessor.
Further, the rated voltage of described voltage stabilizing diode is 3.6V.
Further, described response apparatus is hummer, and hummer is connected with microprocessor.
Further, described response apparatus is two LED, and microprocessor respectively with the first LED, the second LED are connected.
Further, described microprocessor is single-chip microcomputer.
Further, described microprocessor is arm processor.
The beneficial effects of the utility model are: from input power, voltage detecting circuit detects that the voltage now supplying tester is lower than early warning value, voltage detecting circuit can produce pulse signal toward microprocessor, this pulse signal of microprocessor processes, and trigger response apparatus generation information action, to warn user.Therefore, the solid state hard disc value that this solid state hard disc automatic tester meeting automatic-prompting is tested by this test port is inaccurate, so that test man knows, thus provides the yield of product turnout.
Accompanying drawing explanation
A kind of solid state hard disc automatic tester electrical block diagram detecting test voltage and decline that Fig. 1 provides for the present embodiment.
Embodiment
Be described further below with reference to accompanying drawing 1 pair of the utility model, but protection domain of the present utility model should do not limited with this.For convenience of description and understand the technical solution of the utility model, below illustrate that the orientation that the noun of locality used all is shown with accompanying drawing is as the criterion.
As shown in Figure 1, what the present embodiment provided a kind ofly detects the solid state hard disc automatic tester that test voltage declines and receives the power supply of input power, and can download firmware testing solid state hard disc from test computer automatically.Wherein, this tester comprises voltage detecting circuit, microprocessor, SATA connector and response apparatus, and microprocessor is connected with voltage detecting circuit, SATA connector, response apparatus respectively.Wherein, microprocessor is also connected with test computer, and microprocessor can download test firmware toward test computer, and test result is back to test computer display.Microprocessor can be single-chip microcomputer or arm processor.Microprocessor effect is herein the control module as solid state hard disc automatic tester, controls test process.Therefore microprocessor also can be replaced by the circuit structure with above-mentioned functions effect.
From input power, voltage detecting circuit detects that the voltage now supplying tester is lower than early warning value, voltage detecting circuit can produce pulse signal toward microprocessor, this pulse signal of microprocessor processes, and trigger response apparatus generation information action, to warn user.When such as response apparatus is hummer, microprocessor continues to send pulse toward hummer, makes buzzer call low-voltage be detected to point out user.When response apparatus is two LED, microprocessor continues to send pulse to the first LED, makes the first LED flashing light low-voltage be detected to point out user; Microprocessor continues to send pulse to the second LED, makes the second LED flashing light be failed to point out this test value.Therefore, the solid state hard disc value that this solid state hard disc automatic tester meeting automatic-prompting is tested by this test port is inaccurate, so that test man knows, thus provides the yield of product turnout.
As shown in Figure 2, voltage detecting circuit comprises voltage comparator U1, two resistance, voltage stabilizing diode ZD1 and diode D1, input power P1 is connected with the negative terminal of voltage comparator U1 by the first resistance R1, input power P1 is connected with the anode of voltage comparator U1 by the second resistance R2, the negative pole of voltage stabilizing diode ZD1 is connected with the anode of voltage comparator U1, the positive pole of voltage stabilizing diode ZD1 is connected to ground, the output terminal of voltage comparator U1 is connected with the positive pole of diode D1, and the negative pole of diode D1 is connected with microprocessor U2.Wherein, the rated voltage of voltage stabilizing diode ZD1 is 3.6V.The input power that the present embodiment provides is the power supply of 5V, 30A.When input power toward certain test port input voltage lower than 3.6V time, voltage detecting circuit can send pulse to microprocessor, and concrete principle is described above, is not repeated herein.The Cleaning Principle of voltage detecting circuit is introduced: in input power P1 normal power supply situation herein, the magnitude of voltage at the negative terminal place of voltage comparator U1 is be greater than 3.6V's, the magnitude of voltage at the anode place of voltage comparator U1 is 3.6V, namely preset the magnitude of voltage of 3.6V at the anode place of voltage comparator U1, externally do not export pulse due to the unilateral conduction of diode D1.When input power P1 occurs abnormal suddenly, the magnitude of voltage at the negative terminal place of voltage comparator U1 is lower than 3.6V, and therefore the output terminal of voltage comparator U1 produces positive pulse, thus produces pulse signal toward microprocessor U2.
The solid state hard disc automatic tester that the present embodiment provides can be tested multiple solid state hard disc simultaneously, wherein, microprocessor downloads test firmware from test computer, and solid state hard disc tested by execution test firmware, and this test result is back to test computer to show its test result.Relative to traditional test mode, adopt this test mode can solve the resource of test computer widely, and saved cost simultaneously.
The announcement of book and instruction according to the above description, the utility model those skilled in the art can also change above-mentioned embodiment and revise.Therefore, the utility model is not limited to embodiment disclosed and described above, also should fall in the protection domain of claim of the present utility model modifications and changes more of the present utility model.In addition, although employ some specific terms in this instructions, these terms just for convenience of description, do not form any restriction to the utility model.
Claims (7)
1. can detect the solid state hard disc automatic tester that test voltage declines, this solid state hard disc automatic tester receives the power supply of input power, and can download firmware testing solid state hard disc from test computer automatically;
It is characterized in that: comprise voltage detecting circuit, microprocessor, SATA connector and response apparatus, microprocessor is connected with voltage detecting circuit, SATA connector, response apparatus respectively.
2. a kind of solid state hard disc automatic tester detecting test voltage and decline according to claim 1, it is characterized in that: described voltage detecting circuit comprises voltage comparator, two resistance, voltage stabilizing diode and diode, input power is connected with the negative terminal of voltage comparator by the first resistance, input power is connected with the anode of voltage comparator by the second resistance, the negative pole of voltage stabilizing diode is connected with the anode of voltage comparator, the positive pole of voltage stabilizing diode is connected to ground, the output terminal of voltage comparator is connected with the positive pole of diode, the negative pole of diode is connected with microprocessor.
3. a kind of solid state hard disc automatic tester detecting test voltage and decline according to claim 2, is characterized in that: the rated voltage of described voltage stabilizing diode is 3.6V.
4. a kind of solid state hard disc automatic tester detecting test voltage and decline according to claim 1, is characterized in that: described response apparatus is hummer, and hummer is connected with microprocessor.
5. a kind of solid state hard disc automatic tester detecting test voltage and decline according to claim 1, is characterized in that: described response apparatus is two LED, and microprocessor respectively with the first LED, the second LED are connected.
6. a kind of solid state hard disc automatic tester detecting test voltage and decline according to claim 1, is characterized in that: described microprocessor is single-chip microcomputer.
7. a kind of solid state hard disc automatic tester detecting test voltage and decline according to claim 1, is characterized in that: described microprocessor is arm processor.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201520762161.4U CN205028664U (en) | 2015-09-30 | 2015-09-30 | Detectable test voltage reduction's solid state hard drives automatic tester |
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CN201520762161.4U CN205028664U (en) | 2015-09-30 | 2015-09-30 | Detectable test voltage reduction's solid state hard drives automatic tester |
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CN205028664U true CN205028664U (en) | 2016-02-10 |
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CN201520762161.4U Expired - Fee Related CN205028664U (en) | 2015-09-30 | 2015-09-30 | Detectable test voltage reduction's solid state hard drives automatic tester |
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2015
- 2015-09-30 CN CN201520762161.4U patent/CN205028664U/en not_active Expired - Fee Related
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20180828 Address after: 243000 standardization plant 7 of Zhengpu New District and state Avenue Pu, Ma'anshan, Anhui. Patentee after: Ma'anshan Chuang long Polytron Technologies Inc Address before: 518000 F1.65C-1, Tianfa building, Tianan Che Kung Temple Industrial Zone, Futian District, Shenzhen, Guangdong. Patentee before: Shenzhen Chuangjiu Tech. Co., Ltd. |
|
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20160210 Termination date: 20190930 |