CN204883107U - Glass substrate's test fixture - Google Patents
Glass substrate's test fixture Download PDFInfo
- Publication number
- CN204883107U CN204883107U CN201520651019.2U CN201520651019U CN204883107U CN 204883107 U CN204883107 U CN 204883107U CN 201520651019 U CN201520651019 U CN 201520651019U CN 204883107 U CN204883107 U CN 204883107U
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- test
- glass substrate
- base
- guiding mechanism
- guide rod
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Abstract
The utility model provides a glass substrate's test fixture, including base, drive mainboard, spacing frame, bed frame, guiding mechanism, test clamp plate, guide arm, test wire and test probes, the drive mainboard set up in the inside of base, spacing frame with the bed frame set up in the upper portion of base, guiding mechanism set up in the bed frame, test probes set up in the test clamp plate, the guide arm with the guiding mechanism cooperation, the lower extreme of guide arm is connected the test clamp plate is taking the test clamp plate to be close to or to keep away from spacing frame, the test probes warp the test wire with drive mainboard connection. The beneficial effects of the utility model are that: adopt this test fixture directly to test glass substrate, in time discover the defective products, avoid getting into the back process, reduce the waste of material.
Description
Technical field
The utility model relates to technical field of LED display, particularly a kind of measurement jig of glass substrate.
Background technology
Existing film liquid crystal display, its thin film transistor (TFT), can carry out independent control to each pixel, so have, brightness is high, contrast is high, stereovision is strong, brightly painted advantage, but, there is power consumption, cost is high, yield is low shortcoming.
In factory, general supplied materials is large glass substrate, cuts out through cutting machine the small powder glass substrate that production line uses dimensions.
Glass substrate, because the reason of processing procedure, supplied materials yield only reaches 92%, can reach 97% time preferably, cannot reach 100%.And, the glass substrate of aniseed cuts in the glass substrate process of small powder, has with glass surface the technique contacted, and can produce chips of glass, hard burr, hard object particle, the surface of these little materials and glass substrate produces and rubs, and causes the scuffing of glass baseplate surface.If not carrying out testing directly puts into production, until rear operation just finds that this is bad, easily cause the waste of other material.
Utility model content
In order to solve above-mentioned existing technical matters, the utility model provides a kind of measurement jig of glass substrate, directly tests glass substrate, Timeliness coverage defective products, avoids entering rear operation, reduces the waste of material.
The utility model solves above-mentioned existing technical matters, provides a kind of measurement jig of glass substrate, comprises base, drives mainboard, spacing frame, pedestal, guiding mechanism, test pressing plate, guide rod, p-wire and test probe; Described driving mainboard is arranged at the inside of described base; Described spacing frame and described pedestal are arranged at the top of described base; Described guiding mechanism is arranged at described pedestal; Described test probe is arranged at described test pressing plate; Described guide rod coordinates with described guiding mechanism, and the lower end of described guide rod connects described test pressing plate, with test pressing plate near or away from described spacing frame; Described test probe is connected with described driving mainboard through described p-wire.
The utility model further improves as described below.
Comprise handle; Described handle is connected with described guide rod, through described guide rod make test pressing plate near or away from described spacing frame.
Comprise supply hub; Described supply hub is arranged at described base.
Comprise power switch; Described power switch is arranged at described base, and is electrically connected with described driving mainboard.
Comprise touch switch; Described touch switch is arranged at described base, and is electrically connected with described driving mainboard.
Described guide rod is arranged side by side three; The mating holes of corresponding described guiding mechanism is three.
Compared to prior art, the beneficial effects of the utility model are: adopt this measurement jig directly to test glass substrate, Timeliness coverage defective products, avoid entering rear operation, reduce the waste of material.
Accompanying drawing explanation
Fig. 1 is the measurement jig structural representation of the utility model glass substrate.
| Base 11 | Supply hub 13 |
| Power switch 14 | Touch switch 15 |
| Spacing frame 16 | Pedestal 17 |
| Guiding mechanism 18 | Test pressing plate 19 |
| Handle 20 | Guide rod 21 |
| P-wire 22 | Test probe 23 |
Embodiment
To illustrate below in conjunction with accompanying drawing and embodiment further illustrates the utility model.
As shown in Figure 1, a kind of measurement jig of glass substrate, comprise base 11, drive mainboard (being positioned at the inside of base 11, not shown), spacing frame 16, pedestal 17, guiding mechanism 18, test pressing plate 19, guide rod 21, p-wire 22 and test probe 23.Mainboard is driven to be arranged at the inside of base 11; Spacing frame 16 and pedestal 17 are arranged at the top of base 11; Guiding mechanism 18 is arranged at pedestal 17; Test probe 23 is arranged at test pressing plate 19; Guide rod 21 coordinates with guiding mechanism 18, the lower end connecting test pressing plate 19 of guide rod 21, with test pressing plate 19 near or away from spacing frame 16; Test probe 23 after tested line 22 is connected with driving mainboard.Its principle of work is: moving leader 21, with test pressing plate 19 away from spacing frame 16, lower polaroid, glass substrate to be measured and upper polaroid to be placed in spacing frame 16.Moving leader 21 again, with test pressing plate 19 near spacing frame 16, docks the signal testing point on glass substrate, such as: R, G, B, VCOM signal testing point to test probe 23.When the power is turned on, carry out the display of picture, thus judge that whether this glass substrate is qualified.
The utility model measurement jig also comprises handle 20; Handle 20 is connected with guide rod 21, through guide rod 21 make test pressing plate 19 near or away from spacing frame 16, handle 20 is set, facilitates human users's moving leader 21.Also supply hub 13 is comprised; Supply hub 13 is arranged at base 11, facilitates external power supply.Also power switch 14 is comprised; Power switch 14 is arranged at base 11, and is electrically connected with driving mainboard.Also touch switch 15 is comprised; Touch switch 15 is arranged at base 11, and is electrically connected with driving mainboard, presses the switching that touch switch 15 carries out picture.
The utility model, in order to ensure to test the steady of pressing plate 19, guide rod 21 is arranged side by side three; The mating holes of corresponding guiding mechanism 18 is three, and when test pressing plate 19 is near spacing frame 16, it steadily docks multiple signal testing points of glass substrate.
The utility model adopts this measurement jig directly to test glass substrate, Timeliness coverage defective products, avoids entering rear operation, reduces the waste of material.
Above content is in conjunction with concrete preferred implementation further detailed description of the utility model, can not assert that concrete enforcement of the present utility model is confined to these explanations.For the utility model person of an ordinary skill in the technical field, without departing from the concept of the premise utility, some simple deduction or replace can also be made, all should be considered as belonging to protection domain of the present utility model.
Claims (6)
1. a measurement jig for glass substrate, is characterized in that:
Comprise base, drive mainboard, spacing frame, pedestal, guiding mechanism, test pressing plate, guide rod, p-wire and test probe;
Described driving mainboard is arranged at the inside of described base; Described spacing frame and described pedestal are arranged at the top of described base; Described guiding mechanism is arranged at described pedestal; Described test probe is arranged at described test pressing plate;
Described guide rod coordinates with described guiding mechanism, and the lower end of described guide rod connects described test pressing plate, with test pressing plate near or away from described spacing frame;
Described test probe is connected with described driving mainboard through described p-wire.
2. the measurement jig of glass substrate according to claim 1, is characterized in that: comprise handle; Described handle is connected with described guide rod, through described guide rod make test pressing plate near or away from described spacing frame.
3. the measurement jig of glass substrate according to claim 2, is characterized in that: comprise supply hub; Described supply hub is arranged at described base.
4. the measurement jig of glass substrate according to claim 3, is characterized in that: comprise power switch; Described power switch is arranged at described base, and is electrically connected with described driving mainboard.
5. the measurement jig of glass substrate according to claim 4, is characterized in that: comprise touch switch; Described touch switch is arranged at described base, and is electrically connected with described driving mainboard.
6. the measurement jig of the glass substrate according to claim 1 to 5 any one, is characterized in that: described guide rod is arranged side by side three; The mating holes of corresponding described guiding mechanism is three.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520651019.2U CN204883107U (en) | 2015-08-26 | 2015-08-26 | Glass substrate's test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520651019.2U CN204883107U (en) | 2015-08-26 | 2015-08-26 | Glass substrate's test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204883107U true CN204883107U (en) | 2015-12-16 |
Family
ID=54827463
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201520651019.2U Active CN204883107U (en) | 2015-08-26 | 2015-08-26 | Glass substrate's test fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN204883107U (en) |
-
2015
- 2015-08-26 CN CN201520651019.2U patent/CN204883107U/en active Active
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address | ||
| CP03 | Change of name, title or address |
Address after: 518000 Guangdong Province Baoan District Songgang Street Shapuwei Community Maozhou Industrial Zone 11 Building 1, 2 Patentee after: Shenzhen Zhongshen Au Optronics Co Address before: 518000, 5th Floor, 3rd Building, South Dayang Road, Fuyong Street, Baoan District, Shenzhen City, Guangdong Province Patentee before: Shenzhen Zhongshen Optoelectronics Co., Ltd. |