CN204761394U - Simple and easy probe station - Google Patents
Simple and easy probe station Download PDFInfo
- Publication number
- CN204761394U CN204761394U CN201520465698.4U CN201520465698U CN204761394U CN 204761394 U CN204761394 U CN 204761394U CN 201520465698 U CN201520465698 U CN 201520465698U CN 204761394 U CN204761394 U CN 204761394U
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- China
- Prior art keywords
- probe
- shelf
- feeler arm
- test bench
- easy
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000000523 sample Substances 0.000 title claims abstract description 106
- 238000012360 testing method Methods 0.000 claims abstract description 49
- 238000009434 installation Methods 0.000 claims abstract description 4
- 241000251468 Actinopterygii Species 0.000 abstract 1
- 230000005389 magnetism Effects 0.000 abstract 1
- 210000004027 cell Anatomy 0.000 description 5
- 230000001105 regulatory effect Effects 0.000 description 4
- 238000000034 method Methods 0.000 description 2
- 238000001179 sorption measurement Methods 0.000 description 2
- 208000027418 Wounds and injury Diseases 0.000 description 1
- KGWWEXORQXHJJQ-UHFFFAOYSA-N [Fe].[Co].[Ni] Chemical compound [Fe].[Co].[Ni] KGWWEXORQXHJJQ-UHFFFAOYSA-N 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 208000014674 injury Diseases 0.000 description 1
- 239000000696 magnetic material Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- Measuring Leads Or Probes (AREA)
Abstract
The utility model provides a simple and easy probe station, testing the anterior shelf of base, establishing the slide bracket at test base rear portion including testing the base, establishing, the shelf is used for shelving need checking sample, the last probe support that sets up of slide bracket, the bottom of probe support installation slider, the slider is connected for magnetism with slide bracket, but about shaft rotation's probe arm is installed through the pivot to the probe support, and the probe is installed to the one end that the probe arm is located above the shelf, and the other end passes through the spring to be connected with the probe support, and spring promotion probe arm front end pushes down during initial condition to make the probe touch the need checking sample surface. The utility model discloses conveniently carry, regulation probe sensing point that can be convenient, the needle that falls simultaneously can guarantee that the probe can in close contact with determinand body surface face and be unlikely to to apply too big pressure and lead to determinand body surface face by the fish tail.
Description
Technical field
The utility model relates to experimental test technical field, specifically a kind of simple and easy probe station.
Background technology
Probe station is generally divided into manual, semi-automatic, full-automatic three types, moving and the stitch means that falls all using slide unit as probe, probe station precision is higher, but the larger portability of instrument volume is not high, and operation versus busy, just seem that practicality is not high in the occasion that ask for something precision is relatively low and there is no need; In addition, when testing solar cell, probe is generally needlepoint form, and existing probe station one is that dependence test is carried out in the position being not easy to traveling probe, but is easier to solar cell surface to damage at moving process middle probe ratio.
Summary of the invention
For the above-mentioned deficiency of prior art, the utility model provides a kind of simple and easy probe station, it is convenient for carrying, and can regulate probe sensing point easily, and the pin that simultaneously falls can ensure that probe can close contact object under test surface and be unlikely to apply too large pressure and cause object under test surface to be scratched.
A kind of simple and easy probe station, comprise Test bench, be located at the shelf of Test bench front portion, be located at the sliding platform at Test bench rear portion, described shelf is used for shelving testing sample, described sliding platform arranges probe support, slide block is installed in the bottom of probe support, slide block and sliding platform are that magnetic is connected, probe support is provided with the feeler arm that can rotate around the axis by rotating shaft, one end that feeler arm is positioned at above shelf is provided with probe, the other end is connected with probe support by spring, during initial condition, spring promotion feeler arm front end presses down, to make probes touch to testing sample surface.
Simple and easy probe station as above, the corner of Test bench is separately installed with feet.
Simple and easy probe station as above, described shelf is recessed to form a stepped step downwards by Test bench and forms.
Simple and easy probe station as above, the upper end of probe support is provided with two relative lugs, two lugs are respectively equipped with and coaxial turn hole, and on feeler arm, correspondence turns hole and is provided with perforation, and feeler arm is rotatably installed on probe support through the perforation turning hole and feeler arm of wherein lug by rotating shaft.
Simple and easy probe station as above, is provided with bayonet socket bottom feet, namely completes fixed installation in the bayonet socket that two opposite side of Test bench snap in feet.
Probe support of the present utility model relies on magnetic-adsorption on platform, so compared with carrying out the probe station of movement with traditional dependence slide unit, for the less demanding occasion of measuring accuracy, the probe of this device can fast moving, the pressing dynamics of this device probe regulates by the deformation degree of spring and the height of magnet base simultaneously, the pin that falls is convenient without the need to repeatedly regulating slide unit thus reducing regulating time, improves testing efficiency.
Accompanying drawing explanation
Fig. 1 is the decomposed structural representation of the simple and easy probe station of the utility model;
Fig. 2 is the part assembling structure schematic diagram of the simple and easy probe station of the utility model;
Fig. 3 is the perspective view of the simple and easy probe station of the utility model.
In figure: 1-Test bench, 2-shelf, 3-sliding platform, 4-slide block, 5-probe support, 6-lug, 7-turn hole, 8-feeler arm, 9-perforation, 10-probe, 11-rotating shaft, 12-spring, 13-feet.
Embodiment
Below in conjunction with the accompanying drawing in the utility model, the technical scheme in the utility model is clearly and completely described.
Refer to Fig. 1, the sliding platform 3 that the simple and easy probe station of the utility model comprises Test bench 1, is located at the shelf 2 of Test bench 1 front portion, is located at Test bench 1 rear portion, described shelf 2 is for shelving testing sample, for solar cell, described shelf 2 is recessed to form a stepped step downwards by Test bench 1 and forms, and during test, solar cell is shelved on step surface.Described sliding platform 3 arranges probe support 5, slide block 4 is installed in the bottom of probe support 5, one of them parts for magnetic is connected, can be set to magnet with sliding platform 3 by slide block 4, and another parts are set to all to be made of magnetic material by the materials such as the iron-cobalt-nickel of attraction or two parts.
Probe support 5 by rotating shaft 11 be provided with can around the shaft 11 rotate feeler arms 8, feeler arm 8 one end be positioned at above shelf 2 is provided with probe 10, the other end is connected with probe support 5 by spring 12, during initial condition, spring 12 promotes feeler arm 8 front end and presses down, and touches testing sample surface to make probe 10.The upper end of probe support 5 is provided with two relative lugs 6, two lugs 6 are respectively equipped with and coaxial turn hole 7, on feeler arm 8, correspondence turns hole 7 and is provided with perforation 9, and feeler arm 8 is rotatably installed on probe support 5 through the perforation 9 turning hole 7 and feeler arm 8 of wherein lug 6 by rotating shaft 11.Form a lever between the probe 10 of probe support 5, feeler arm 8 and rotating shaft 11, the other end mounting spring 12 of feeler arm 8 can impel probe 10 with a less power contact measured sample (as shown in Figure 2).
Please further refer to Fig. 3, the corner of Test bench 1 is separately installed with feet 13, is provided with bayonet socket bottom feet 13, namely completes fixed installation in the bayonet socket that two opposite side of Test bench 1 snap in feet 13.Install feet 13 mainly in order to need whole device upside down when some test event (test as solar cell), then light irradiates from top; Normally place at other test event Instrumentals, now do not need feet 13.
Operation principle of the present utility model: by diagramatic way assembled device, probe 10 tail end should connect wire and draw as another electrode from feeler arm 8 rear end, during test, the testing sample of specific size is put on the shelf 2 on the left of Test bench 1, binder clip is used to fix testing sample, clip is used to clip extraction one pole at testing sample electrode, Manual press feeler arm 8 rear end makes probe 10 aim at electrode to be measured on sample to lift probe 10 and to move horizontally probe support 5 range estimation, feeler arm 8 rear end is decontroled after aiming at, now spring 12 expansion makes feeler arm 8 front end fall, probe 10 touches sample surfaces, the pin that falls is complete, connect two electrodes that testing sample is drawn and start test, feeler arm 8 is promoted to make the probe 10 of the fulcrum other end can close contact object under test surface and be unlikely to apply too large pressure and cause object under test surface to be scratched by using spring, with magnet be pedestal whole probe support 5 can on sliding platform 3 seamless free fast moving, thus all regions can detected on testing sample farthest ensure that contact is good and sample surfaces is complete simultaneously.
The larger spring of the interchangeable dynamics of dynamics or longer spring is pressed to make it larger deformation occurs to increase probe 10, the pressing dynamics reducing probe 10 then can increase by one block of magnet for 4 times with padded probe support 5 and feeler arm 8 at slide block again, thus the probe 10 when making spring 10 undeformed highly improves.The method of above two kinds of change probes pressing dynamics can be worked in coordination to use and be protected sample surfaces injury-free to the full extent while reaching certain pressing dynamics.
Probe support 5 of the present utility model relies on magnetic-adsorption on platform, so compared with carrying out the probe station of movement with traditional dependence slide unit, for the less demanding occasion of measuring accuracy, the probe of this device can fast moving, the pressing dynamics of this device probe regulates by the deformation degree of spring 12 and the height of magnet base simultaneously, the pin that falls is convenient without the need to repeatedly regulating slide unit thus reducing regulating time, improves testing efficiency.
The above; be only embodiment of the present utility model; but protection range of the present utility model is not limited thereto; anyly belong to those skilled in the art in the technical scope that the utility model discloses; the change that can expect easily or replacement, all should be encompassed within protection range of the present utility model.Therefore, protection range of the present utility model should be as the criterion with the protection range of claim.
Claims (5)
1. a simple and easy probe station, it is characterized in that: comprise Test bench (1), be located at the shelf (2) that Test bench (1) is anterior, be located at the sliding platform (3) at Test bench (1) rear portion, described shelf (2) is for shelving testing sample, described sliding platform (3) is arranged probe support (5), slide block (4) is installed in the bottom of probe support (5), slide block (4) with sliding platform (3) for magnetic is connected, probe support (5) is provided with by rotating shaft (11) can (11) feeler arm (8) of rotating around the shaft, one end that feeler arm (8) is positioned at shelf (2) top is provided with probe (10), the other end is connected with probe support (5) by spring (12), during initial condition, spring (12) promotion feeler arm (8) front end presses down, testing sample surface is touched to make probe (10).
2. simple and easy probe station as claimed in claim 1, is characterized in that: the corner of Test bench (1) is separately installed with feet (13).
3. simple and easy probe station as claimed in claim 1, is characterized in that: described shelf (2) is recessed to form a stepped step downwards by Test bench (1) and forms.
4. simple and easy probe station as claimed in claim 1, it is characterized in that: the upper end of probe support (5) is provided with two relative lugs (6), two lugs (6) are respectively equipped with and coaxial turn hole (7), the upper correspondence of feeler arm (8) turns hole (7) and is provided with perforation (9), and feeler arm (8) is rotatably installed on probe support (5) by the perforation (9) turning hole (7) and feeler arm (8) that wherein lug (6) is passed in rotating shaft (11).
5. simple and easy probe station as claimed in claim 1, is characterized in that: feet (13) bottom is provided with bayonet socket, namely completes fixed installation in the bayonet socket that two opposite side of Test bench (1) snap in feet (13).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520465698.4U CN204761394U (en) | 2015-07-02 | 2015-07-02 | Simple and easy probe station |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520465698.4U CN204761394U (en) | 2015-07-02 | 2015-07-02 | Simple and easy probe station |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204761394U true CN204761394U (en) | 2015-11-11 |
Family
ID=54476061
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201520465698.4U Expired - Fee Related CN204761394U (en) | 2015-07-02 | 2015-07-02 | Simple and easy probe station |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN204761394U (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106526256A (en) * | 2016-11-03 | 2017-03-22 | 上海纳米技术及应用国家工程研究中心有限公司 | Gas sensitivity test composite probe and application thereof |
| CN110286307A (en) * | 2018-03-19 | 2019-09-27 | 科磊股份有限公司 | Probe detection system and method for detecting semiconductor element |
| CN111596154A (en) * | 2020-05-18 | 2020-08-28 | 哈尔滨工业大学 | Auxiliary clamp for testing temperature-changing electrical property of small sample |
| CN113865542A (en) * | 2021-09-17 | 2021-12-31 | 浙大宁波理工学院 | Measuring device and measuring method for curved surface morphology |
-
2015
- 2015-07-02 CN CN201520465698.4U patent/CN204761394U/en not_active Expired - Fee Related
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106526256A (en) * | 2016-11-03 | 2017-03-22 | 上海纳米技术及应用国家工程研究中心有限公司 | Gas sensitivity test composite probe and application thereof |
| CN106526256B (en) * | 2016-11-03 | 2019-02-05 | 上海纳米技术及应用国家工程研究中心有限公司 | A kind of air-sensitive test combined probe and its application |
| CN110286307A (en) * | 2018-03-19 | 2019-09-27 | 科磊股份有限公司 | Probe detection system and method for detecting semiconductor element |
| CN111596154A (en) * | 2020-05-18 | 2020-08-28 | 哈尔滨工业大学 | Auxiliary clamp for testing temperature-changing electrical property of small sample |
| CN113865542A (en) * | 2021-09-17 | 2021-12-31 | 浙大宁波理工学院 | Measuring device and measuring method for curved surface morphology |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20151111 |