CN204731379U - A kind of SOC measuring equipment - Google Patents
A kind of SOC measuring equipment Download PDFInfo
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- CN204731379U CN204731379U CN201520371282.6U CN201520371282U CN204731379U CN 204731379 U CN204731379 U CN 204731379U CN 201520371282 U CN201520371282 U CN 201520371282U CN 204731379 U CN204731379 U CN 204731379U
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Abstract
The utility model relates to chip testing technology field, in particular to a kind of SOC measuring equipment, this equipment precisely to detect the voltage reference source of soc chip by increasing voltage tester plate and test data is fed back to ic tester, so that ic tester trims chip, in addition, voltage tester plate is realized detecting by test circuit, and by reference to potential circuit for test circuit provides reference voltage, guarantees that the stable testing of test circuit is accurate.
Description
Technical field
The utility model relates to chip testing technology field, particularly a kind of SOC measuring equipment.
Background technology
SOC is the developing direction of current electronic electricity meter chip, and namely a slice chip can the complete measuring function of complete independently, and does not need the cooperation of other peripheral chips, wherein comprises the repertoires such as metering, MCU and power carrier.Together with MCU, clock, nonvolatile memory and some standard interfaces are inherited, this easily realizes technically, but on this basis, how to carry out accurate measurement is then technological difficulties.
Ammeter chip can the basis of accurate measurement power consumption be exactly a metastable voltage reference source, but the voltage reference source produced in existing semiconductor technology all can there are differences due to the different chip chamber of technological problems, therefore chip must trim before use, and the reference value of all voltage reference sources made all meets design load.But the prerequisite trimmed chip is the voltage measurement carried out the voltage reference source of chip is accurately, otherwise trims when application condition is large, chip finally can measure inaccurate and become waste product.
Current general ic tester is measuring the very large difficulty of the upper existence of small voltage (± 1mV precision), and usual error can arrive more than 20mV, cannot trim the circuit of chip accurately, cause the extreme loss of batch production.
Summary of the invention
The purpose of this utility model is avoid above-mentioned weak point of the prior art and provide one can measure small voltage, so that test machine carries out the SOC measuring equipment trimmed.
The purpose of this utility model is achieved through the following technical solutions:
Provide a kind of SOC measuring equipment, comprise the ic tester that can carry out functional test to SOC to be detected, also comprise voltage tester plate, described voltage tester plate carries out voltage measurement to the voltage reference source of SOC to be detected and measurement data is fed back to described ic tester, and described voltage tester plate comprises the test circuit that is connected with described SOC to be detected and provides the reference voltage circuit of reference voltage for described test chip.
Wherein, described voltage tester plate also comprises main control circuit, and described main control circuit carries out communication with ic tester and test circuit respectively and is connected, and the test data of described test circuit is sent to described ic tester.
Wherein, described voltage tester plate also comprises power circuit, and test circuit, reference voltage circuit and main control circuit that described power circuit is respectively described provide power supply.
Wherein, described test circuit comprises and obtains the input circuit of data from SOC to be tested and be connected to the low-pass filter circuit of output terminal of input circuit.
Wherein, described reference voltage circuit comprises reference voltage chip and is connected to the follow circuit of described reference voltage chip output, and described follow circuit realizes based on operational amplifier.
Wherein, described reference voltage chip is serial fiducial chip.
The beneficial effects of the utility model: the utility model precisely to detect the voltage reference source of soc chip by increasing voltage tester plate and test data is fed back to ic tester, so that ic tester trims chip, in addition, voltage tester plate is realized detecting by test circuit, and by reference to potential circuit for test circuit provides reference voltage, guarantee that the stable testing of test circuit is accurate.
Accompanying drawing explanation
The utility model is described in further detail to utilize accompanying drawing, but the embodiment in accompanying drawing does not form any restriction of the present utility model, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to the following drawings.
Fig. 1 is the structural representation of the utility model SOC measuring equipment.
Fig. 2 is the circuit diagram of the reference voltage circuit of the utility model SOC measuring equipment.
Include in fig. 1 and 2:
1---ic tester, 2---voltage tester plate, 21---test circuit, 22---reference voltage circuit, 221---follow circuit, 23---control circuit, 24---power circuit, 3---SOC to be detected.
Embodiment
With the following Examples the utility model is further described.
The embodiment of the utility model SOC measuring equipment, as shown in Figure 1, comprise the ic tester 1 that can carry out functional test to SOC 3 to be detected, also comprise voltage tester plate 2, the voltage reference source of described voltage tester plate 2 to SOC 3 to be detected carries out voltage measurement and measurement data is fed back to described ic tester 1, described voltage tester plate 2 comprises test circuit 21, reference voltage circuit 22, control circuit 23 and power circuit 24, the test circuit 21 that test circuit 21 is connected with described SOC 3 to be detected, reference voltage circuit 22 provides the reference voltage circuit 22 of reference voltage for described test chip, main control circuit 23 carries out communication with ic tester 1 and test circuit 21 respectively and is connected, and the test data of described test circuit 21 is sent to described ic tester 1, power circuit 24 is respectively described test circuit 21, reference voltage circuit 22 and main control circuit 23 provide power supply.
After start detection, ic tester 1 sends measurement order by communication link to the main control circuit 23 on test board, main control circuit 23 by IIC agreement to test circuit 21 send order and and test circuit 21 is configured to state quantity measurement, start to test after test circuit 21 has been configured, and by IIC, repeatedly original test result being sent to main control circuit 23 after having tested, test result is repeatedly gathered the magnitude of voltage calculating and measure by main control circuit 23 by computing.Result put back to ic tester 1. the utility model finally by communication link precisely to detect the voltage reference source of soc chip by increasing voltage tester plate 2 and test data is fed back to ic tester 1, so that ic tester 1 pair of chip trims, in addition, voltage tester plate 2 is realized detecting by test circuit 21, and provide reference voltage by reference to potential circuit 22 for test circuit 21, guarantee that the stable testing of test circuit 21 is accurate.
Concrete, described test circuit 21 comprises and obtains the input circuit of data from SOC to be tested and be connected to the low-pass filter circuit of output terminal of input circuit, thus reduces the impact of high frequency noise on test, improves measurement accuracy.
Described reference voltage circuit 22 comprises reference voltage chip and is connected to the follow circuit 221 of described reference voltage chip output, and described follow circuit 221 realizes based on operational amplifier.Described reference voltage chip is serial fiducial chip, and stability is higher than parallel fiducial chip.
Finally should be noted that; above embodiment is only in order to illustrate the technical solution of the utility model; but not the restriction to the utility model protection domain; although done to explain to the utility model with reference to preferred embodiment; those of ordinary skill in the art is to be understood that; can modify to the technical solution of the utility model or equivalent replacement, and not depart from essence and the scope of technical solutions of the utility model.
Claims (6)
1. a SOC measuring equipment, comprise the ic tester that can carry out functional test to SOC to be detected, it is characterized in that: also comprise voltage tester plate, described voltage tester plate carries out voltage measurement to the voltage reference source of SOC to be detected and measurement data is fed back to described ic tester, and described voltage tester plate comprises the test circuit that is connected with described SOC to be detected and provides the reference voltage circuit of reference voltage for described test chip.
2. a kind of SOC measuring equipment as claimed in claim 1, it is characterized in that: described voltage tester plate also comprises main control circuit, described main control circuit carries out communication with ic tester and test circuit respectively and is connected, and the test data of described test circuit is sent to described ic tester.
3. a kind of SOC measuring equipment as claimed in claim 2, it is characterized in that: described voltage tester plate also comprises power circuit, test circuit, reference voltage circuit and main control circuit that described power circuit is respectively described provide power supply.
4. a kind of SOC measuring equipment as claimed in claim 1, is characterized in that: described test circuit comprises and obtains the input circuit of data from SOC to be tested and be connected to the low-pass filter circuit of output terminal of input circuit.
5. a kind of SOC measuring equipment as claimed in claim 1, is characterized in that: described reference voltage circuit comprises reference voltage chip and is connected to the follow circuit of described reference voltage chip output, and described follow circuit realizes based on operational amplifier.
6. a kind of SOC measuring equipment as claimed in claim 5, is characterized in that: described reference voltage chip is serial fiducial chip.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520371282.6U CN204731379U (en) | 2015-06-02 | 2015-06-02 | A kind of SOC measuring equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520371282.6U CN204731379U (en) | 2015-06-02 | 2015-06-02 | A kind of SOC measuring equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204731379U true CN204731379U (en) | 2015-10-28 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201520371282.6U Active CN204731379U (en) | 2015-06-02 | 2015-06-02 | A kind of SOC measuring equipment |
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| CN (1) | CN204731379U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111596201A (en) * | 2020-05-25 | 2020-08-28 | 上海岱矽集成电路有限公司 | Method for supplying power by using digital channel |
| CN114200374A (en) * | 2021-12-06 | 2022-03-18 | 广东利扬芯片测试股份有限公司 | Automatic change test platform voltage and frequency self-checking system |
| CN114625198A (en) * | 2020-12-10 | 2022-06-14 | 圣邦微电子（北京）股份有限公司 | Over-temperature protection threshold value measuring device and measuring method thereof |
-
2015
- 2015-06-02 CN CN201520371282.6U patent/CN204731379U/en active Active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111596201A (en) * | 2020-05-25 | 2020-08-28 | 上海岱矽集成电路有限公司 | Method for supplying power by using digital channel |
| CN114625198A (en) * | 2020-12-10 | 2022-06-14 | 圣邦微电子（北京）股份有限公司 | Over-temperature protection threshold value measuring device and measuring method thereof |
| CN114200374A (en) * | 2021-12-06 | 2022-03-18 | 广东利扬芯片测试股份有限公司 | Automatic change test platform voltage and frequency self-checking system |
| CN114200374B (en) * | 2021-12-06 | 2024-03-22 | 广东利扬芯片测试股份有限公司 | Automatic change test platform voltage and frequency self-checking system |
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