CN204679547U - Voltage check device - Google Patents
Voltage check device Download PDFInfo
- Publication number
- CN204679547U CN204679547U CN201520371826.9U CN201520371826U CN204679547U CN 204679547 U CN204679547 U CN 204679547U CN 201520371826 U CN201520371826 U CN 201520371826U CN 204679547 U CN204679547 U CN 204679547U
- Authority
- CN
- China
- Prior art keywords
- voltage
- pin
- control module
- check device
- sampling
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
The utility model discloses a kind of voltage check device, there is substrate, multiple test pin, control module and alarm module.Substrate has first surface and second.Multiple test pins are arranged at the first surface of substrate, and test pin is in order to the electrical contact of pluggable ground connection handling device socket.The electrical contact of processor socket is in order to provide multiple supply voltage.Control module is arranged at second of substrate and is electrically connected test pin.When testing the electrical contact of pin connection handling device socket, control module in order to the value of comparison supply voltage and preset range to produce detection signal.Alarm module is electrically connected control module, in order to the detection signal produced according to control module, produces alarm signal.Assembler can be more convenient and promptly detect multiple voltage value of motherboard by voltage check device of the present utility model, and then complete the work of installing central processing unit.
Description
Technical field
The utility model relates to a kind of voltage check device, particularly a kind of voltage check device in order to measurement processor socket.
Background technology
Because central processing unit is quite responsive to voltage, when the supply voltage that motherboard is supplied to central processing unit is too high, be easy to burn out or puncture central processing unit.Therefore; when assembler is when keeping in repair or assemble central processing unit; usually can first detect the processor socket be arranged on motherboard, determine motherboard to be supplied to the supply voltage of central processing unit normal after, just central processing unit can be installed on processor socket.
But along with the progress of science and technology, the integrated functionality of central processing unit more comes the more.In order in response to the voltage needed for each functional interface circuit of central processing unit, motherboard must provide the supply voltage of more and more kind to central processing unit, and then make assembler in an installation central processor time, need to detect in advance the supply voltage that more motherboards provide, therefore cause the consuming time and inconvenience of assembler in an installation on central processor.
Utility model content
The utility model is to provide a kind of voltage check device, so as to solve assembler central processing unit is installed time, multiple supply voltage need be detected and the consuming time and inconvenient problem that causes.
Voltage check device disclosed in the utility model, comprises substrate, multiple test pin, control module and alarm module.Substrate has first surface and second.Multiple test pins are arranged at the first surface of substrate, and test pin is in order to multiple electrical contacts of pluggable ground connection handling device socket.The electrical contact of processor socket is in order to provide multiple supply voltage.Control module is arranged at second of substrate and is electrically connected test pin.When testing pin and being connected to the electrical contact of processor socket, control module in order to the value of comparison supply voltage and preset range to produce detection signal.Alarm module is electrically connected control module, in order to the detection signal produced according to control module, produces alarm signal.
According to above-mentioned voltage check device disclosed in the utility model, voltage check device is electrically connected multiple electrical contacts of process device socket by multiple test pin, to obtain multiple voltage value that motherboard prepares to be supplied to processor together, and by the value of each supply voltage of comparison and the mode of its magnitude of voltage preset, to determine that the value of each supply voltage is whether in normal voltage range, and then send alarm signal and whether be applicable to installation process device to point out assembler.Assembler can be more convenient and promptly detect multiple voltage value of motherboard by the utility model voltage check device, and then complete the work of installing central processing unit.
The above explanation about present disclosure and the explanation of following embodiment in order to demonstration and explanation spirit of the present utility model and principle, and provide patent claim of the present utility model further to explain.
Accompanying drawing explanation
The vertical view of voltage check device of Fig. 1 for illustrating according to the utility model one embodiment.
The upward view of voltage check device of Fig. 2 for illustrating according to the utility model one embodiment.
The vertical view of processor socket of Fig. 3 for illustrating according to the utility model one embodiment.
Fig. 4 is the functional block diagram according to the utility model control module that illustrates of an embodiment and alarm module again.
Fig. 5 is the schematic diagram according to AND door in the utility model again comparing unit that illustrates of an embodiment.
The functional block diagram that Fig. 6 is the control module that illustrates according to another embodiment of the utility model and alarm module.
The schematic diagram of buffer module of Fig. 7 for illustrating according to the another embodiment of the utility model.
Fig. 8 is electrically connected the schematic diagram of motherboard for the voltage check device that illustrates according to the another embodiment of the utility model.
Fig. 9 is electrically connected the schematic diagram of external device (ED) for the voltage check device that illustrates according to the another embodiment of the utility model.
Description of reference numerals:
10 voltage check devices
11 substrates
113 first surfaces
115 second
13_1 ~ 13_n tests pin
13 ' _ 1 ~ 13 ' _ n contact point
15,15a, 15b control module
151a, 151b sampling unit
153a, 153b storage unit
155a, 155b comparing unit
157b computing unit
17,17a, 17b alarm module
18a, 18b buffer module
19 external connection slots
30 processor sockets
50 power supply cables
70 motherboards
80 communication cables
90 external device (ED)s
31_1 ~ 31_n electrical contact
Va_1, Vb_1, Vc_1 first voltage
Va_2, Vb_2, Vc_2 second voltage
Va_3, Vb_3, Vc_3 tertiary voltage
Va_4, Vb_4, Vc_4 the 4th voltage
Va_5, Vb_5, Vc_5 the 5th voltage
Va_6, Vb_6, Vc_6 the 6th voltage
Va_m m voltage
SC detection signal
SAL alarm signal
Vs1_1 ~ Vs1_n first sampling voltage
Vs2_1 ~ Vs2_n second sampling voltage
Vs3_1 ~ Vs3_n the 3rd sampling voltage
Vs4_1 ~ Vs4_n the 4th sampling voltage
Vs5_1 ~ Vs5_n the 5th sampling voltage
Vs6_1 ~ Vs6_n the 6th sampling voltage
SP_1 first comparison signal
SP_2 second comparison signal
SP_3 the 3rd comparison signal
SP_4 the 4th comparison signal
SP_5 the 5th comparison signal
SP_6 the 6th comparison signal
R1, R2, R3 resistance
C1, C2 electric capacity
T1_1 ~ t1_n first time point
T2_1 ~ t2_n second time point
T3_1 ~ t3_n the 3rd time point
T4_1 ~ t4_n the 4th time point
T5_1 ~ t5_n the 5th time point
T6_1 ~ t6_n the 6th time point
Embodiment
Below detailed features of the present utility model and advantage is described in embodiments in detail, its content is enough to make any relevant art of haveing the knack of understand technology contents of the present utility model and implement according to this, and according to the content disclosed in this instructions, claim and accompanying drawing, any relevant art of haveing the knack of can understand the relevant object of the utility model and advantage easily.Following embodiment further describes viewpoint of the present utility model, but non-to limit category of the present utility model anyways.
Please refer to Fig. 1 to Fig. 3, Fig. 1 is the vertical view of the voltage check device according to the utility model one embodiment, the upward view of voltage check device of Fig. 2 for illustrating according to the utility model one embodiment, the vertical view of processor socket of Fig. 3 for illustrating according to the utility model one embodiment.As shown in the figure, voltage check device 10 comprises substrate 11, test pin 13_1 ~ 13_n, control module 15, alarm module 17 and external connection slot 19.Substrate 11 has first surface 113 and the second face 115, wherein tests contact point 13 ' _ 1 ~ the 13 ' _ n of pin 13_1 ~ 13_n, control module 15, alarm module 17 and external connection slot 19 and is positioned on the second face 115 of substrate 11.And test pin 13_1 ~ 13_n by contact point 13 ' _ 1 ~ 13 ' _ n outwardly and be arranged on the first surface 113 of substrate 11.In the present embodiment, the position that test pin 13_1 ~ 13_n, control module 15, alarm module 17 and external connection slot 19 are arranged also is not used to limit the utility model, in other embodiments, test pin 13_1 ~ 13_n also can be arranged on the second face 115, or external connection slot 19 can be arranged on the side surface of substrate 11.
Test pin 13_1 ~ 13_n in order to pluggable the electrical contact 31_1 ~ 31_n being connected to processor socket 30, the multiple supply voltage provided with measurement processor socket 30.For example, supply voltage be such as the first voltage Va_1 to m voltage Va_m, the electrical contact 31_1 ~ 31_2 of processor socket 30 prepares to be supplied to the first voltage Va_1 of processor in order to transmit motherboard.When test pin 13_1 ~ 13_2 is inserted in the electrical contact 31_1 ~ 31_2 of processor socket 30, the first voltage Va_1 provided with measurement processor socket 30.Electrical contact 31_3 ~ the 31_4 of processor socket 30 prepares to be supplied to the second voltage Va_2 of processor in order to transmit motherboard.Test pin 13_3 ~ 13_4 is inserted in the electrical contact 31_3 ~ 31_4 of processor socket 30, the second voltage Va_2 provided with measurement processor socket 30.All the other test pins 13_5 ~ 13_n detects the mode of the first voltage Va_1 to m voltage Va_m by that analogy.
Same supply voltage is detected with two test pins, not for restriction the utility model is in order to detect the test pin count providing identical supply voltage in the present embodiment.In other embodiments, same supply voltage can also be detected by a test pin, or three to four test pins detect same supply voltage.In addition, the test pin of voltage check device 10 can be electrically connected all or part of electrical contact providing same supply voltage.For example, five electrical contact 31_5 ~ 31_9 of processor socket 30 transmit same supply voltage that motherboards provide to processor, and voltage check device 10 can three to four test pins, electrical contact 31_5 ~ 31_7 is electrically connected, to detect the same supply voltage that motherboard provides as tested pin 13_5 ~ 13_7.
Control module 15 is electrically connected test pin 13_1 ~ 13_n.When meeting test pin 13_1 ~ 13_n and being electrically connected electrical contact 31_5 ~ 31_n, control module 15 in order to the value of comparison preset range and supply voltage, to produce detection signal SC.Supply voltage closes and is connected in the result that test pin 13_1 ~ 13_n detects electrical contact 31_3 ~ 31_n.In more detail, supply voltage refers to that motherboard prepares to be supplied to the voltage of processor originally by processor socket 30, and voltage check device 10 is before processor socket 30 installation process device, be installed on processor socket 30, to detect the supply voltage that motherboard originally will be supplied to processor, therefore test supply voltage that pin 13_1 ~ 13_n detects real-valued on the supply voltage that provides for motherboard.In other embodiments, supply voltage can also refer to test pin 13_1 ~ 13_n and sample the supply voltage that repeatedly motherboard provides, and the result of average computation in addition, or be that supply voltage refers to the voltage that the supply voltage that motherboard provides obtains after buffered.And preset range real-valued on can be the supply voltage specification of allowing according to processor and the voltage range set, positive and negative 5% of such as tolerable supply voltage, but not as limit.
In practical operation, a kind of supply voltage corresponds to a preset range, and the supply voltage that such as motherboard provides comprises the first voltage Va_1 and the second voltage Va_2, and preset range comprises the first scope and the second scope.First voltage Va_1 corresponds to the first scope, and the second voltage Va_2 corresponds to the second scope.In other words, in the program of comparison supply voltage and preset range, whether comparison first voltage Va_1 is within the first scope, and whether the second voltage Va_2 is within the second scope.When the first voltage Va_1 is within the first scope, represent that the first voltage Va_1 meets the demand of processor, when the first voltage Va_1 is outside the first scope, represent that the first voltage Va_1 does not meet the demand of processor.In like manner comparison second voltage Va_2 and the second scope.
Afterwards, control module 15 understands the result again according to comparison preset range and supply voltage, produces detection signal SC.And the detection signal SC that alarm module 17 can produce according to control module 15, optionally produce alarm signal SAL.
For convenience of description, be described for actual embodiment below.In this embodiment, processor socket 30 provides six kinds of supply voltages, if the first voltage Va_1 is to the 6th voltage Va_6.And have 16 electrical contacts in processor socket 30 respectively in order to provide the first voltage Va_1 to the 6th voltage Va_6.Electrical contact 31_1 ~ the 31_3 of such as processor socket 30 provides the first voltage Va_1, electrical contact 31_4 ~ 31_6 provides the second voltage Va_2, electrical contact 31_7 ~ 31_10 provides tertiary voltage Va_3, electrical contact 31_11 ~ 31_12 provides the 4th voltage Va_4, electrical contact 31_13 ~ 31_14 motherboard provides the 5th voltage Va_5, electrical contact 31_15 ~ 31_16 provides the 6th voltage Va_6.
The test pin 13_1 ~ 13_16 of voltage check device 10 is electrically connected the electrical contact 31_1 ~ 31_16 of process device socket 30, and the supply voltage that processor socket 30 provides can be supplied to control module 15 by order test pin 13_1 ~ 13_16.For example, the first voltage Va_1 that processor socket 30 can provide by test pin 13_1 ~ 13_3 is supplied to control module 15, the second voltage Va_2 that processor socket 30 provides by test pin 13_4 ~ 13_6 is supplied to control module 15, the tertiary voltage Va_3 that processor socket 30 provides by test pin 13_7 ~ 13_10 is supplied to control module 15, the 4th voltage Va_4 that processor socket 30 provides by test pin 13_11 ~ 13_12 is supplied to control module 15, the 5th voltage Va_5 that processor socket 30 provides by test pin 13_13 ~ 13_14 is supplied to control module 15, the 6th voltage Va_6 that processor socket 30 provides by test pin 13_15 ~ 13_16 is supplied to control module 15.
Control module 15 is according to the first voltage Va_1 detected to the 6th voltage Va_6, and comparison first voltage Va_1 is to the 6th voltage Va_6 and preset range respectively.Preset range such as the first scope is to the 6th scope.In other words, control module 15 comparison first voltage Va_1 and the first scope, comparison second voltage Va_2 and the second scope, all the other by that analogy.Afterwards, foundation the first voltage Va_1 to the 6th voltage Va_6 and the first scope, to the result of the 6th scope comparison, produce detection signal SC to control module 15 again.
The detection signal SC that alarm module 17 produces according to control module 15, optionally produces alarm signal, with the result pointing out maintenance personal's voltage check device 10 to detect.In more detail, when in control module 15 comparison first voltage Va_1 to the 6th voltage Va_6, any one value does not meet the first scope to the 6th scope, instruction alarm module 17 is produced the alarm signal that the supply voltage that processor socket 30 can be pointed out to provide does not meet processor specification by detection signal SC.When control module 15 comparison first voltage Va_1 all meets the first scope to the 6th scope to the value in the 6th voltage Va_6, instruction alarm module 17 is produced the alarm signal that the supply voltage that processor socket 30 can be pointed out to provide meets processor specification by detection signal SC.
Be the functional block diagram according to the utility model control module that illustrates of an embodiment and alarm module again please with reference to Fig. 1 to Fig. 3 and Fig. 4 to Fig. 5, Fig. 4, Fig. 5 is the schematic diagram according to AND door in the utility model again comparing unit that illustrates of an embodiment.For convenience of description, this embodiment illustrates for above-mentioned six kinds of supply voltages, 16 electrical contact 31_1 ~ 31_16 and 16 test pin 13_1 ~ 13_16 equally.With previous embodiment unlike, in this embodiment, control module 15a has sampling unit 151a, storage unit 153a and comparing unit 155a, as shown in Figure 4.Sampling unit 151a is electrically connected test pin 13_1 ~ 13_16.When test in pin 13_1 ~ 13_16 pluggable be connected to the electrical contact 31_1 ~ 31_16 of processor socket 30 time, sampling unit 151a can obtain multiple pass and is connected in the sampling voltage of the first voltage Vb_1 to the 6th voltage Vb_6 in multiple first time point t1_1 ~ t1_n to multiple 6th time point t6_1 ~ t6_n from testing pin 13_1 ~ 13_16.
For example, test pin 13_1 ~ 13_3 can obtain in multiple first time point t1_1 ~ t1_n the first sampling voltage Vs1_1 ~ Vs1_n that multiple pass is connected in the first voltage Va_1, test pin 13_4 ~ 13_6 can receive in multiple second time point t2_1 ~ t2_n the second sampling voltage Vs2_1 ~ Vs2_n that multiple pass is connected in the second voltage Va_2, test pin 13_7 ~ 13_10 can receive in multiple 3rd time point t3_1 ~ t3_n and can receive the 3rd sampling voltage Vs3_1 ~ Vs3_n that multiple pass is connected in tertiary voltage Va_3, test pin 13_11 ~ 13_12 can receive in multiple 4th time point t4_1 ~ t4_n the 4th sampling voltage Vs4_1 ~ Vs4_n that multiple pass is connected in the 4th voltage Va_4, test pin 13_13 ~ 13_14 can receive in multiple 5th time point t5_1 ~ t5_n the 5th sampling voltage Vs5_1 ~ Vs5_n that multiple pass is connected in the 5th voltage Va_5, test pin 13_15 ~ 13_16 can receive in multiple 6th time point t6_1 ~ t6_n the 6th sampling voltage Vs6_1 ~ Vs6_n that multiple pass is connected in the 6th voltage Va_6, wherein the first sampling voltage Vs1_1 ~ Vs1_n can be stored in the storer of sampling unit 151a inside to the 6th sampling voltage Vs6_1 ~ Vs6_n.In other embodiments, the first sampling voltage Vs1_1 ~ Vs1_n also can be stored in storage unit 153 to the 6th sampling voltage Vs6_1 ~ Vs6_n.And storage unit 153a is also in order to store preset range, such as the first scope is to the 6th scope.
Comparing unit 155a is electrically connected sampling unit 151a and storage unit 153a.Comparing unit 155a in order to comparison first voltage to the value of the 6th voltage and the first scope to the 6th scope, to produce detection signal SC.For example, comparing unit 155a produces the first comparison signal SP_1 according to the result of the first voltage Vc_1 and the first scope comparison, result according to the second voltage Vc_2 and the second scope comparison produces the second comparison signal SP_2, in like manner produces the 3rd comparison signal SP_3 to the 6th comparison signal SP_6.As shown in Figure 5, comparing unit 155a by AND door or NAND door, receives the first comparison signal SP_1 to the 6th comparison signal SP_6 again, produces detection signal SC according to this, as shown in Figure 5.Afterwards, the detection signal SC of generation is exported to alarm module 17 by comparing unit 155 again, produces alarm signal according to this by alarm module 17.
Please with reference to the functional block diagram that Fig. 1 to Fig. 3 and Fig. 6, Fig. 6 are the control module that illustrates according to another embodiment of the utility model and alarm module.For convenience of description, this embodiment illustrates for above-mentioned six kinds of supply voltages, 16 electrical contact 31_1 ~ 31_16 and 16 test pin 13_1 ~ 13_16 equally.But, with the embodiment shown in Fig. 4 unlike, the control module 15b of the present embodiment has outside sampling unit 151b, storage unit 153b and comparing unit 155b, has more computing unit 157b.
Computing unit 157b is electrically connected sampling unit 151b, storage unit 153b and comparing unit 155b.Computing unit 157b calculates the value of the first voltage Vb_1 to the 6th voltage Vb_6 in order to the first sampling voltage Vs1_1 ~ Vs1_n to the 6th sampling voltage Vs6_1 ~ Vs6_n obtained according to sampling unit 151b.For example, the value of the first voltage Vb_1 can be the arithmetic mean of the first sampling voltage Vs1_1 ~ Vs1_n, the value of the second voltage Vb_2 can be the arithmetic mean of the first sampling voltage Vs2_1 ~ Vs2_n, the value of tertiary voltage Vb_3 to the 6th voltage Vb_2 value by that analogy.In other embodiments, computing unit 157b can also calculate the first voltage Vc_1 according to the first sampling voltage Vs1_1 ~ Vs1_n of part.Specifically, the first sampling voltage Vs1_1 ~ Vs1_n of computing unit 157b acquisition part, such as the first sampling voltage Vs1_10 ~ Vs1_25, and the value of arithmetic mean as the first voltage Vc_1 calculating the first sampling voltage Vs1_10 ~ Vs1_25.The first sampling voltage that computing unit 157b captures can be remove magnitude of voltage comparatively outstanding in the first sampling voltage Vs1_1 ~ Vs1_n, such as exceed too much average or that subaverage is too many magnitude of voltage, and the first remaining sampling voltage, avoid the result that Tai Gao or the impact of too low magnitude of voltage detect according to this.In like manner, computing unit 157b can also adopt the second sampling voltage Vs2_1 ~ Vs2_n to the 6th sampling voltage Vs6_1 ~ Vs6_n and calculate the value of the second voltage Vc_2 to the 6th voltage Vc_6 in the same way.The technological means of the present embodiment computing unit 157b acquisition part first sampling voltage is not used to limit the utility model, and art technician can also the first sampling voltage of other suitable means acquisition part.
In concrete instance, the first sampling voltage Vs1_1 ~ Vs1_n can be the result that test pin 13_1 ~ 13_3 distinctly samples repeatedly.In more detail, test pin 13_1 ~ 13_3 can in different time points, multiple first sampling voltage Vs1_1 ~ Vs1_n is obtained from the electrical contact 31_1 ~ 31_3 of processor socket 30, in other words, test pin 13_1 ~ 13_3 can obtain in the first time point t1_1 the first sampling voltage Vs1_1 closing and be connected in the first voltage Vc_1, the the first sampling voltage Vs1_2 closing and be connected in the first voltage Vc_1 is obtained in the first time point t1_2 ... the first sampling voltage Vs1_n is obtained in the first time point t1_n.And in like manner test pin 13_4 ~ 13_6 and can obtain to close in second time point t2_1 ~ t2_n and be connected in the second sampling voltage Vs2_1 ~ Vs2_n of the second voltage Vc_2.Voltage check device 10 can adopt the mode of poll, and acquisition time pass is connected in the first sampling voltage Vs1_1 ~ Vs1_n of the first voltage Vc_1 to the 6th voltage Vc_6 to the 6th sampling voltage Vs6_1 ~ Vs6_n.That is, having gathered the first sampling voltage Vs1_1 ~ Vs1_n time, having gathered the second sampling voltage Vs2_1 ~ Vs2_n, then having gathered the 3rd sampling voltage Vs3_1 ~ Vs3_n, afterwards by that analogy.The present embodiment not deboost pick-up unit 10 gathers the order of the first sampling voltage Vs1_1 ~ Vs1_n to the 6th sampling voltage Vs6_1 ~ Vs6_n, and the quantity of sampling quantity of above-mentioned first sampling voltage Vs1_1 ~ Vs1_n to the 6th sampling voltage Vs6_1 ~ Vs6_n also can be different.
Then, please with reference to Fig. 1 to Fig. 3 and Fig. 7, Fig. 7 schematic diagram of buffer module for illustrating according to another embodiment of the utility model.As shown in the figure, voltage check device 10 can have more multiple buffer module 18a, 18b.Between the test pin that buffer module 18a, 18b are electrically connected at part and control module 15.With the embodiment shown in Fig. 7, buffer module 18a is electrically connected between test pin 13_1 ~ 13_3 and control module 15, and buffer module 18b is electrically connected between test pin 13_4 ~ 13_6 and control module 15.Buffer module 18a can bleeder circuit and electric capacity C1 be formed, bleeder circuit can reduce the first voltage received by test pin 13_1 ~ 13_3 or the first sampling voltage, such as by the resistance R1 in bleeder circuit and resistance R2, test pin 13_1 ~ 13_3 is detected that first voltage of 12V (volt) or the first sampling voltage reduce to 1.5V, by electric capacity C1, filtering is carried out to the first voltage or the first sampling voltage again, to avoid excessive voltage or pulse voltage input voltage measurement device 10, and burn out voltage check device 10.
And electric capacity C2 in buffer module 18b and resistance R3 directly can also carry out filtering to the second voltage received by test pin 13_4 ~ 13_6 or the second sampling voltage, there is pulse to avoid the second voltage or the second sampling voltage and damage voltage check device 10.In the present embodiment, buffer module 18a and buffer module 18b is arranged at outside control module 15, in other embodiments, can also be the buffer cell had in control module inside as buffer module 18a and buffer module 18b, will not limit in this.In addition, the present embodiment does not also limit buffer module 18a and buffer module 18b and the corresponding relation testing pin 13_1 ~ 13_16, in other words, in other embodiments, can test between pin and control module 15 in each and be electrically connected buffer module 18a or buffer module 18b.
In the present embodiment, voltage check device 10 can have the mechanism of fool proof, as shown in Figure 1 to Figure 3, test pin on voltage check device 10 is arranged on substrate 11 according to configuration figure, and makes voltage check device 10 have specific grafting direction to be plugged on processor socket 30 with correspondence.When voltage check device 10 direction be plugged on processor socket 30 does not meet specific grafting direction, voltage check device just cannot be inserted on processor socket 30.
Moreover please with reference to Fig. 1, Fig. 6 and Fig. 8, Fig. 8 is electrically connected the schematic diagram of motherboard for the voltage check device that illustrates according to the another embodiment of the utility model.As shown in Figure 8, voltage check device 10 also comprises power supply cable 50 to be electrically connected to motherboard 70, provides supply voltage to voltage check device 10 by motherboard 70.And the value of the supply voltage that the computing unit 157b in control module 15 can provide according to motherboard 70, revise the preset range be stored in storage unit 153.With the example of reality, motherboard 70 generally provides the supply voltage of 5V to processor, when the supply voltage that voltage check device 10 Receiving Host plate 70 provides, whether the supply voltage that voltage check device 10 more can detect motherboard 70 to be provided meets in normal voltage range, such as 4.5V ~ 5.5V, and revise the preset range be stored in storage unit 153 according to this, such as the first scope is to the 6th scope.
And in other embodiments, please with reference to Fig. 1, Fig. 6 and Fig. 9, Fig. 9 is electrically connected the schematic diagram of external device (ED) for the voltage check device that illustrates according to the another embodiment of the utility model.As shown in Figure 9, voltage check device 10 also comprises communication cable 80 to be electrically connected to external device (ED) 90.External device (ED) 90 such as can for computer or other equipment of maintenance personal's input specification information can be provided.The specification information that external device (ED) 90 inputs according to maintenance personal, produce set information, and set information is transferred to voltage check device 10 by communication cable 80, the preset range be stored in storage unit 153 is set, if the first scope is to the 6th scope according to set information by the computing unit 157b of voltage check device 10 inside.
For example, when communication cable 80 is electrically connected to external device (ED) 90, the supply voltage detected is transferred to external device (ED) 90 by communication cable 80 by voltage check device 10.Maintenance personal can be learnt the value of the supply voltage detected by voltage check device 10 by external device (ED) 90.The preset range be stored in storage unit 153 is also transferred to external device (ED) 90 by communication cable 80 by voltage check device 10, provides maintenance personal to learn the preset range of the current setting of voltage check device 10 by external device (ED) 90.Maintenance personal can according to the supply voltage required for the processor of different size, the specification information of corresponding input different processor on external device (ED) 90, set information is produced to make external device (ED) 90, and transfer to voltage check device 10 by communication cable 80, the preset range be stored in storage unit 153 is set according to this by computing unit 157b.In the present embodiment, external device (ED) 90 can also provide supply voltage to voltage check device 10 by communication cable 80, and the present embodiment will not limit.
In addition, in the operation of reality, alarm module 17 can be LED (Light-Emitting Diode) lamp.When in the first voltage Vc_1 to the 6th voltage Vc_6, any one value does not meet the first scope to the 6th scope, alarm module 17 can drive red LED with reminder alarm.Green LED can be driven to point out the detected status of voltage check device 10 when all meeting the first scope to alarm module 17 during the 6th scope in the first voltage Vc_1 to the 6th voltage Vc_6.The embodiment of the alarm module 17 and color of LED is non-is limited the utility model, described technical field technician should according to technology contents disclosed in above-mentioned alarm module 17, and be replaced into other technical method, in this, it will not go into details.
Comprehensive the above, a kind of voltage check device provided by the utility model, by multiple test pin being electrically connected multiple electrical contacts of process device socket, can prepare multiple supply voltages that be supplied to processor with one-time detection motherboard.Further, in illustrated embodiment, voltage detection module more can by repeatedly sampling the value of supply voltage, and detect whether supply voltage that motherboard provides meets the specification needed for processor more exactly.Assembler, can be more convenient and promptly detect multiple voltage value of motherboard by voltage check device of the present utility model, and then complete the work of installing central processing unit.
Although the utility model is with aforesaid embodiment openly as above, so itself and be not used to limit the utility model.Not departing from spirit and scope of the present utility model, the variation of doing and retouching, all belong to scope of patent protection of the present utility model.The protection domain defined about the utility model please refer to appended claim.
Claims (11)
1. a voltage check device, in order to detect multiple supply voltages that a processor socket provides, it is characterized in that, described voltage check device comprises:
One substrate, has a relative first surface and one second;
Multiple test pin, is arranged at the described first surface of described substrate, and described multiple test pin is in order to pluggable the multiple electrical contacts connecting described processor socket, and described multiple electrical contact is in order to provide described multiple supply voltage;
One control module, be arranged at described second of described substrate, and be electrically connected described multiple test pin, when described multiple test pin is connected to described multiple electrical contact, described control module in order to the value of supply voltage multiple described in comparison and multiple preset range to produce a detection signal; And
One alarm module, is electrically connected described control module, in order to according to described detection signal, produces an alarm signal.
2. voltage check device as claimed in claim 1, it is characterized in that, described multiple test pin comprises multiple first pin and multiple second pin, when multiple first pin is connected to the electrical contact of part, described multiple first pin is supplied to described control module in order to one first voltage provided by the described multiple electrical contact connected, when described multiple second pin is connected to the electrical contact of part in addition, described multiple second pin is supplied to described control module in order to one second voltage provided by the multiple electrical contacts connected.
3. voltage check device as claimed in claim 2, it is characterized in that, described multiple preset range comprises one first scope and one second scope, and described first scope corresponds to described first voltage, and described second scope corresponds to described second voltage.
4. voltage check device as claimed in claim 3, it is characterized in that, described control module comprises:
One sampling unit, be electrically connected described multiple first pin and described multiple second pin, described sampling unit is used to multiple first time point and obtains multiple first sampling voltage from described multiple first pin, and obtains multiple second sampling voltage in multiple second time point from described multiple second pin;
One storage unit, in order to store described first scope and described second scope; And
One comparing unit, is electrically connected described storage unit and described sampling unit, in order to the value of the first scope described in comparison and described first voltage, and the value of the second scope described in comparison and described second voltage, and produce described detection signal according to the result of comparison.
5. voltage check device as claimed in claim 4, it is characterized in that, described control module also comprises a computing unit, be electrically connected described sampling unit and described comparing unit, described computing unit calculates described first voltage in order to the first sampling voltage according to part, and calculating described second voltage according to the second sampling voltage of part, described computing unit provides described first voltage and described second voltage to described comparing unit.
6. voltage check device as claimed in claim 5, is characterized in that, the first sampling voltage of described computing unit acquisition part, and calculates by the arithmetic mean of the first sampling voltage captured, as the value of described first voltage.
7. voltage check device as claimed in claim 5, it is characterized in that, also comprise a communication cable, be electrically connected to an external device (ED), when described external device (ED) produces a set information, described computing unit is in order to set described multiple preset range of described cell stores according to described set information.
8. voltage check device as claimed in claim 5, it is characterized in that, also comprise a power supply cable, be electrically connected to a motherboard, the described multiple preset range stored in storage unit described in the supply voltage correction that described computing unit provides according to described motherboard.
9. voltage check device as claimed in claim 2, is characterized in that, also comprise a buffer module, be electrically connected between described multiple first pin and described control module, in order to the HFS of the first voltage described in filtering.
10. voltage check device as claimed in claim 1, is characterized in that, described multiple test pin is arranged at described substrate according to a configuration figure, and makes described voltage check device have a grafting direction to be plugged in described processor socket with correspondence.
11. voltage check devices as claimed in claim 1, is characterized in that, when the value of the arbitrary described supply voltage of described control module comparison do not meet described multiple preset range one of them time, described alarm module produces described alarm signal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520371826.9U CN204679547U (en) | 2015-06-03 | 2015-06-03 | Voltage check device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520371826.9U CN204679547U (en) | 2015-06-03 | 2015-06-03 | Voltage check device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204679547U true CN204679547U (en) | 2015-09-30 |
Family
ID=54179230
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201520371826.9U Expired - Fee Related CN204679547U (en) | 2015-06-03 | 2015-06-03 | Voltage check device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN204679547U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106291073A (en) * | 2015-06-03 | 2017-01-04 | 技嘉科技股份有限公司 | Voltage check device |
-
2015
- 2015-06-03 CN CN201520371826.9U patent/CN204679547U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106291073A (en) * | 2015-06-03 | 2017-01-04 | 技嘉科技股份有限公司 | Voltage check device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN208109980U (en) | USB on off test device and its system | |
| WO2020057084A1 (en) | Display module test platform | |
| CN202939234U (en) | Electrical connector insertion in/pulling out universal testing system | |
| CN211529147U (en) | Test platform framework of computer mainboard standard | |
| CN111026596A (en) | Test platform architecture and method for computer mainboard standard | |
| US10802991B2 (en) | Pluggable module identification system | |
| CN204679547U (en) | Voltage check device | |
| CN205826035U (en) | A kind of test device of refrigerator variable-frequency compressor driving plate | |
| CN207924030U (en) | Automobile instrument automatic test box | |
| CN102288841A (en) | Plug-in unit identification system and method of common testing interface | |
| CN205540248U (en) | Detection apparatus for vehicle control unit | |
| CN205880147U (en) | Test fixture of accuse board and cable before server | |
| CN102445651B (en) | Device for testing touch screen functional circuit on circuit board | |
| CN106774809A (en) | A kind of test system of hard disk power consumption | |
| US20130328580A1 (en) | Test circuit for power supply unit | |
| CN103777386A (en) | LCM (Liquid Crystal Display Module) testing machine | |
| CN204256725U (en) | A kind of pick-up unit | |
| CN203587757U (en) | Hand-held digital integrated circuit parameter tester | |
| CN216145177U (en) | Display module assembly touch function check out test set and display module assembly check out test set | |
| CN105486970A (en) | Pogopin module performance test system and method | |
| CN104166087A (en) | Circuit board fault detecting system based on VXI instrument | |
| CN204789978U (en) | Smart electric meter trouble snatchs test equipment | |
| CN203870431U (en) | Electricity consumption information acquisition system RS485 communication monitoring device | |
| US20130171841A1 (en) | Test device for testing usb sockets | |
| CN106291073A (en) | Voltage check device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20150930 Termination date: 20180603 |