CN204313787U - A kind of testing circuit of angular encoder - Google Patents
A kind of testing circuit of angular encoder Download PDFInfo
- Publication number
- CN204313787U CN204313787U CN201420811033.XU CN201420811033U CN204313787U CN 204313787 U CN204313787 U CN 204313787U CN 201420811033 U CN201420811033 U CN 201420811033U CN 204313787 U CN204313787 U CN 204313787U
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- sheffer stroke
- stroke gate
- type flip
- flip flop
- resistance
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Abstract
The utility model relates to a kind of testing circuit of angular encoder, it is characterized in that: comprise the first filtering circuit, the second filtering circuit, negative circuit, sense of rotation testing circuit, and anglec of rotation testing circuit.Compared with prior art, the utility model has the advantage of: provide a kind of Digital detection circuit that can detect A phase, B phase signals, without the need to using single-chip microcomputer to carry out program computation, have response fast, hardware circuit is simple, high reliability.
Description
Technical field
The utility model relates to a kind of testing circuit of angular encoder.
Background technology
Angular encoder has A phase, B phase, Z signal three-way output signal usually.Wherein A phase, B phase signals contain the information such as sense of rotation, the anglec of rotation of tested angle scrambler, in prior art, in order to obtain sense of rotation, the rotation angle information of angular encoder, general is all be used alone microprocessor detect, directly be connected with single-chip microcomputer by the A phase of angular encoder, B phase, Z three-way output signal, calculated by the inner preset program of single-chip microcomputer, draw sense of rotation and the anglec of rotation of angular encoder.The sense of rotation of direct employing microprocessor detect angular encoder and the anglec of rotation, cost is high, and response speed is lower, and reliability is poor.
Utility model content
Technical problem to be solved in the utility model is the testing circuit providing the angular encoder that a kind of fast response time, circuit are simple, reliability is high for above-mentioned prior art.
The utility model solves the problems of the technologies described above adopted technical scheme: a kind of testing circuit of angular encoder, is characterized in that: comprise
First filtering circuit, this first filtering circuit comprises the first resistance, the first electric capacity, wherein the B phase of angular encoder outputs signal and is connected with the first end of the first resistance, and the second end of the first resistance is connected with the first end of the first electric capacity, the second end ground connection of the first electric capacity;
Second filtering circuit, this second filtering circuit comprises the second resistance, the second electric capacity, wherein the A phase of angular encoder outputs signal and is connected with the first end of the second resistance, and the second end of the second resistance is connected with the first end of the second electric capacity, the second end ground connection of the second electric capacity;
Negative circuit, this negative circuit comprises the first Sheffer stroke gate, the second Sheffer stroke gate, the 3rd Sheffer stroke gate, the 4th Sheffer stroke gate, the 5th Sheffer stroke gate, wherein the second end of the first resistance is connected to two input ends of the 3rd Sheffer stroke gate, second end of the second resistance is connected to two input ends of the first Sheffer stroke gate, the output terminal of the first Sheffer stroke gate is connected to the first input end of the second Sheffer stroke gate, and the output terminal of the second Sheffer stroke gate is connected to the second input end of the 4th Sheffer stroke gate; Second end of the second resistance is also connected to the second input end of the 5th Sheffer stroke gate, and the output terminal of the 5th Sheffer stroke gate is connected to the first input end of the 4th Sheffer stroke gate;
Sense of rotation testing circuit, this sense of rotation testing circuit comprises the 6th Sheffer stroke gate, the 7th Sheffer stroke gate, the first d type flip flop, wherein in negative circuit, the output terminal of the 3rd Sheffer stroke gate is connected with the first input end of the 6th Sheffer stroke gate, the output terminal of the 6th Sheffer stroke gate is connected to two input ends of the 7th Sheffer stroke gate, the output terminal of the 7th Sheffer stroke gate is connected to the CLK end of the first d type flip flop, second end of the second resistance is connected to the D end of the first d type flip flop, the SD end of the first d type flip flop is all connected stabilized voltage supply VCC with CD end, the first d type flip flop
end exports the sense of rotation of angular encoder, the first d type flip flop
end output low level represents that angular encoder clockwise direction rotates, the first d type flip flop
bring out high level and represent that angular encoder counterclockwise rotates, the first d type flip flop
end is also connected to the first input end of the 5th Sheffer stroke gate, and the Q end of the first d type flip flop is then connected to the second input end of the second Sheffer stroke gate;
Anglec of rotation testing circuit, this anglec of rotation testing circuit comprises the 8th Sheffer stroke gate, the 3rd resistance, the 3rd electric capacity, the second d type flip flop, wherein the output terminal of the 4th Sheffer stroke gate is held with the D of the second d type flip flop and is connected, the output terminal of the 3rd Sheffer stroke gate is held with the CLK of the second d type flip flop and is connected, the SD end of the second d type flip flop connects stabilized voltage supply VCC, the CD of the second d type flip flop holds the output terminal of connection the 8th Sheffer stroke gate, and the Q end of the second d type flip flop exports the pulse signal representing the angle of angular encoder; The Q end of the second d type flip flop is connected with the first end of the 3rd resistance, and the second end of the 3rd resistance is connected with the first end of the 3rd electric capacity, the second end ground connection of the 3rd electric capacity, and the second end of the 3rd resistance is connected to two input ends of the 8th Sheffer stroke gate, the second d type flip flop
end is connected to the second input end of the 6th Sheffer stroke gate.
As improvement, the utility model also comprises jumper terminal, and the first end of this jumper terminal is held with the Q of the first d type flip flop and is connected, the second end of first this jumper terminal of d type flip flop and the first d type flip flop
end connects.
Compared with prior art, the utility model has the advantage of: provide a kind of Digital detection circuit that can detect A phase, B phase signals, without the need to using single-chip microcomputer to carry out program computation, have response fast, hardware circuit is simple, high reliability.
Accompanying drawing explanation
Fig. 1 is the testing circuit schematic diagram of angular encoder in the utility model embodiment.
Embodiment
Below in conjunction with accompanying drawing embodiment, the utility model is described in further detail.
The testing circuit of angular encoder as shown in Figure 1: comprise
First filtering circuit, this first filtering circuit comprises the first resistance R1, the first electric capacity C1, wherein the B phase of angular encoder outputs signal and is connected with the first end of the first resistance R1, and second end of the first resistance R1 is connected with the first end of the first electric capacity C1, the second end ground connection of the first electric capacity C1;
Second filtering circuit, this second filtering circuit comprises the second resistance R2, the second electric capacity C2, wherein the A phase of angular encoder outputs signal and is connected with the first end of the second resistance R2, and second end of the second resistance R2 is connected with the first end of the second electric capacity C2, the second end ground connection of the second electric capacity C2;
Negative circuit, this negative circuit comprises the first Sheffer stroke gate U2B, the second Sheffer stroke gate U2C, the 3rd Sheffer stroke gate U2A, the 4th Sheffer stroke gate U1D, the 5th Sheffer stroke gate U1B, wherein second end of the first resistance R1 is connected to two input ends of the 3rd Sheffer stroke gate U2A, second end of the second resistance R2 is connected to two input ends of the first Sheffer stroke gate U2B, the output terminal of the first Sheffer stroke gate U2B is connected to the first input end of the second Sheffer stroke gate U2C, and the output terminal of the second Sheffer stroke gate U2C is connected to second input end of the 4th Sheffer stroke gate U1D; Second end of the second resistance R2 is also connected to second input end of the 5th Sheffer stroke gate U1B, and the output terminal of the 5th Sheffer stroke gate U1B is connected to the first input end of the 4th Sheffer stroke gate U1D;
Sense of rotation testing circuit, this sense of rotation testing circuit comprises the 6th Sheffer stroke gate U1A, 7th Sheffer stroke gate U1C, first d type flip flop U3A, wherein in negative circuit, the output terminal of the 3rd Sheffer stroke gate U2A is connected with the first input end of the 6th Sheffer stroke gate U1A, the output terminal of the 6th Sheffer stroke gate U1A is connected to two input ends of the 7th Sheffer stroke gate U1C, the output terminal of the 7th Sheffer stroke gate U1C is connected to the CLK end of the first d type flip flop U3A, second end of the second resistance R2 is connected to the D end of the first d type flip flop U3A, the SD end of the first d type flip flop U3A is all connected stabilized voltage supply VCC with CD end, first d type flip flop U3A's
end exports the sense of rotation of angular encoder, the first d type flip flop U3A's
end output low level represents that angular encoder clockwise direction rotates, the first d type flip flop U3A's
bring out high level and represent that angular encoder counterclockwise rotates, the first d type flip flop U3A's
end is also connected to the first input end of the 5th Sheffer stroke gate U1B, and the Q end of the first d type flip flop U3A is then connected to second input end of the second Sheffer stroke gate U2C,
Anglec of rotation testing circuit, this anglec of rotation testing circuit comprises the 8th Sheffer stroke gate U2D, the 3rd resistance R3, the 3rd electric capacity C3, the second d type flip flop U3B, wherein the output terminal of the 4th Sheffer stroke gate U1D is held with the D of the second d type flip flop U3B and is connected, the output terminal of the 3rd Sheffer stroke gate U2A is held with the CLK of the second d type flip flop U3B and is connected, the SD end of the second d type flip flop U3B connects stabilized voltage supply VCC, the CD of the second d type flip flop U3B holds the output terminal of connection the 8th Sheffer stroke gate U2D, and the Q end of the second d type flip flop U3B exports the pulse signal representing the angle of angular encoder; The Q end of the second d type flip flop U3B is connected with the first end of the 3rd resistance R3, second end of the 3rd resistance R3 is connected with the first end of the 3rd electric capacity C3, the second end ground connection of the 3rd electric capacity C3, second end of the 3rd resistance R3 is connected to two input ends of the 8th Sheffer stroke gate U2D, the second d type flip flop U3B's
end is connected to second input end of the 6th Sheffer stroke gate U1A;
The first end of jumper terminal JP1, this jumper terminal JP1 is held with the Q of the first d type flip flop U3A and is connected, second end of this jumper terminal JP1 and the first d type flip flop U3A's
end connects.
In above-described embodiment, anglec of rotation testing circuit---the 8th Sheffer stroke gate U2D, the 3rd resistance R3, the 3rd electric capacity C3, the second d type flip flop U3B constitute monostalbe trigger, if the second d type flip flop U3B
end exports high level, then can pass through the 8th Sheffer stroke gate U2D, the 3rd resistance R3, the 3rd electric capacity C3 charges rear anti-phase output low level, inputs the clear terminal of the second d type flip flop U3B---CLK pin, force the Q pin output low level of the second d type flip flop U3B,
end exports high level.
In above-described embodiment, sense of rotation testing circuit---the 6th Sheffer stroke gate U1A, the 7th Sheffer stroke gate U1C, the first d type flip flop U3A, the first d type flip flop U3A's
end exports the sense of rotation of angular encoder, the first d type flip flop U3A's
end output low level represents that angular encoder clockwise direction rotates, the first d type flip flop U3A's
bring out high level and represent that angular encoder counterclockwise rotates; . if angular encoder clockwise direction rotates, then A phase signals through the first Sheffer stroke gate U2B, the second Sheffer stroke gate U2C and the 4th Sheffer stroke gate U1D anti-phase after input the second d type flip flop U3B D end, if and angular encoder counterclockwise rotates, then A phase signals inputs the D port of the second d type flip flop U3B through the 5th Sheffer stroke gate U1B, the 4th Sheffer stroke gate U1D, B phase signals inputs the CLK end of the second d type flip flop U3B after anti-phase, under monostalbe trigger effect, the Q pin of the second last d type flip flop U3B exports the pulse signal representing angle.The wherein charge-discharge circuit that forms of the 3rd resistance R3 and the 3rd electric capacity C3, can the width size of regulating impulse.
The model of the OMRON company that angular encoder adopts is the rotary encoder of E6B2, this rotary encoder often circles, and A phase or B phase export 360 pulses, can obtain thus, angular encoder testing circuit often exports a pulse, and the angle that angular encoder rotates is 1 degree.If add that speed gear will improve angle-measurement accuracy.Pulse is exported receives on one of single-chip microcomputer counting pin, when often there is a pulse, adding one or subtract one, thus achieve the accurate measurement of angle according to direction signal.
Claims (2)
1. a testing circuit for angular encoder, is characterized in that: comprise
First filtering circuit, this first filtering circuit comprises the first resistance (R1), the first electric capacity (C1), wherein the B phase of angular encoder outputs signal and is connected with the first end of the first resistance (R1), second end of the first resistance (R1) is connected with the first end of the first electric capacity (C1), the second end ground connection of the first electric capacity (C1);
Second filtering circuit, this second filtering circuit comprises the second resistance (R2), the second electric capacity (C2), wherein the A phase of angular encoder outputs signal and is connected with the first end of the second resistance (R2), second end of the second resistance (R2) is connected with the first end of the second electric capacity (C2), the second end ground connection of the second electric capacity (C2);
Negative circuit, this negative circuit comprises the first Sheffer stroke gate (U2B), second Sheffer stroke gate (U2C), 3rd Sheffer stroke gate (U2A), 4th Sheffer stroke gate (U1D), 5th Sheffer stroke gate (U1B), wherein the second end of the first resistance (R1) is connected to two input ends of the 3rd Sheffer stroke gate (U2A), second end of the second resistance (R2) is connected to two input ends of the first Sheffer stroke gate (U2B), the output terminal of the first Sheffer stroke gate (U2B) is connected to the first input end of the second Sheffer stroke gate (U2C), the output terminal of the second Sheffer stroke gate (U2C) is connected to the second input end of the 4th Sheffer stroke gate (U1D), second end of the second resistance (R2) is also connected to the second input end of the 5th Sheffer stroke gate (U1B), and the output terminal of the 5th Sheffer stroke gate (U1B) is connected to the first input end of the 4th Sheffer stroke gate (U1D),
Sense of rotation testing circuit, this sense of rotation testing circuit comprises the 6th Sheffer stroke gate (U1A), 7th Sheffer stroke gate (U1C), first d type flip flop (U3A), wherein in negative circuit, the output terminal of the 3rd Sheffer stroke gate (U2A) is connected with the first input end of the 6th Sheffer stroke gate (U1A), the output terminal of the 6th Sheffer stroke gate (U1A) is connected to two input ends of the 7th Sheffer stroke gate (U1C), the output terminal of the 7th Sheffer stroke gate (U1C) is connected to the CLK end of the first d type flip flop (U3A), second end of the second resistance (R2) is connected to the D end of the first d type flip flop (U3A), the SD end of the first d type flip flop (U3A) is all connected stabilized voltage supply VCC with CD end, first d type flip flop (U3A)
end exports the sense of rotation of angular encoder, the first d type flip flop (U3A)
end output low level represents that angular encoder clockwise direction rotates, the first d type flip flop (U3A)
bring out high level and represent that angular encoder counterclockwise rotates, the first d type flip flop (U3A)
end is also connected to the first input end of the 5th Sheffer stroke gate (U1B), and the Q end of the first d type flip flop (U3A) is then connected to the second input end of the second Sheffer stroke gate (U2C),
Anglec of rotation testing circuit, this anglec of rotation testing circuit comprises the 8th Sheffer stroke gate (U2D), 3rd resistance (R3), 3rd electric capacity (C3), second d type flip flop (U3B), wherein the output terminal of the 4th Sheffer stroke gate (U1D) is held with the D of the second d type flip flop (U3B) and is connected, the output terminal of the 3rd Sheffer stroke gate (U2A) is held with the CLK of the second d type flip flop (U3B) and is connected, the SD end of the second d type flip flop (U3B) connects stabilized voltage supply VCC, the CD of the second d type flip flop (U3B) holds the output terminal of connection the 8th Sheffer stroke gate (U2D), the Q end of the second d type flip flop (U3B) exports the pulse signal representing the angle of angular encoder, the Q end of the second d type flip flop (U3B) is connected with the first end of the 3rd resistance (R3), second end of the 3rd resistance (R3) is connected with the first end of the 3rd electric capacity (C3), second end ground connection of the 3rd electric capacity (C3), second end of the 3rd resistance (R3) is connected to two input ends of the 8th Sheffer stroke gate (U2D), the second d type flip flop (U3B)
end is connected to the second input end of the 6th Sheffer stroke gate (U1A).
2. the testing circuit of angular encoder according to claim 1, it is characterized in that: also comprise a jumper terminal (JP1), the first end of this jumper terminal (JP1) is held with the Q of the first d type flip flop (U3A) and is connected, second end of this jumper terminal (JP1) and the first d type flip flop (U3A)
end connects.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420811033.XU CN204313787U (en) | 2014-12-18 | 2014-12-18 | A kind of testing circuit of angular encoder |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420811033.XU CN204313787U (en) | 2014-12-18 | 2014-12-18 | A kind of testing circuit of angular encoder |
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| Publication Number | Publication Date |
|---|---|
| CN204313787U true CN204313787U (en) | 2015-05-06 |
Family
ID=53136095
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420811033.XU Withdrawn - After Issue CN204313787U (en) | 2014-12-18 | 2014-12-18 | A kind of testing circuit of angular encoder |
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| Country | Link |
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| CN (1) | CN204313787U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104776793A (en) * | 2014-12-18 | 2015-07-15 | 宁波宏大纺织仪器有限公司 | Detection circuit for angle encoder |
| CN108955732A (en) * | 2018-07-13 | 2018-12-07 | 福州大学 | A kind of photoelectric encoder structure |
| CN110799807A (en) * | 2017-12-29 | 2020-02-14 | 深圳市英威腾电气股份有限公司 | Orthogonal encoder signal filtering method, device and system |
-
2014
- 2014-12-18 CN CN201420811033.XU patent/CN204313787U/en not_active Withdrawn - After Issue
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104776793A (en) * | 2014-12-18 | 2015-07-15 | 宁波宏大纺织仪器有限公司 | Detection circuit for angle encoder |
| CN104776793B (en) * | 2014-12-18 | 2017-08-08 | 宁波宏大纺织仪器有限公司 | A kind of detection circuit of angular encoder |
| CN110799807A (en) * | 2017-12-29 | 2020-02-14 | 深圳市英威腾电气股份有限公司 | Orthogonal encoder signal filtering method, device and system |
| CN110799807B (en) * | 2017-12-29 | 2021-10-22 | 深圳市英威腾电气股份有限公司 | Orthogonal encoder signal filtering method, device and system |
| CN108955732A (en) * | 2018-07-13 | 2018-12-07 | 福州大学 | A kind of photoelectric encoder structure |
| CN108955732B (en) * | 2018-07-13 | 2024-01-02 | 福州大学 | Photoelectric encoder structure |
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| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| AV01 | Patent right actively abandoned |
Granted publication date: 20150506 Effective date of abandoning: 20170808 |
|
| AV01 | Patent right actively abandoned |