CN204302330U - Be applied to chip testing pin and the tool of Kelvin's test - Google Patents

Be applied to chip testing pin and the tool of Kelvin's test Download PDF

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Publication number
CN204302330U
CN204302330U CN201420706715.4U CN201420706715U CN204302330U CN 204302330 U CN204302330 U CN 204302330U CN 201420706715 U CN201420706715 U CN 201420706715U CN 204302330 U CN204302330 U CN 204302330U
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CN
China
Prior art keywords
pin
kelvin
chip testing
test
needle
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201420706715.4U
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Chinese (zh)
Inventor
刘凯
施元军
高凯
殷岚勇
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TWINSOLUTION TECHNOLOGY Ltd
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TWINSOLUTION TECHNOLOGY Ltd
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Priority to CN201420706715.4U priority Critical patent/CN204302330U/en
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Publication of CN204302330U publication Critical patent/CN204302330U/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Abstract

The utility model relates to a kind of the chip testing pin and the tool that are applied to Kelvin's test, belongs to technical field of electronic products.This needle section being applied to the chip testing pin of Kelvin's test has two inner concaves, distance between two inner concaves is less than the width of testing needle body, and this upper cover plate top being applied to the chip testing jig of Kelvin's test is provided with the square groove be communicated with pin chamber, the width of square groove is greater than the distance between needle section two inner concaves of chip testing pin, and the width of square groove is less than the width of the body of chip testing pin.Thus when this testing needle can be made to be placed in tool pin chamber, its needle section can be placed in described square groove, thus effectively avoid the rotation of testing needle in pin chamber, improve the degree of accuracy that needle point stings tin ball, ensure the efficiency of chip detection, and chip testing pin and the tool being applied to Kelvin's test of the present utility model, its structure is simple, with low cost, range of application is also quite extensive.

Description

Be applied to chip testing pin and the tool of Kelvin's test
Technical field
The utility model relates to technical field of electronic products, particularly apparatus for testing chip technical field, specifically refers to a kind of the chip testing pin and the tool that are applied to Kelvin's test.
Background technology
Along with the development of semi-conductor industry, by integrated more devices on chip, chip also will adopt clock speed faster, the physical dimension of device will constantly be reduced, for individual devices life-span impact very large, regional area power density may be caused to improve, how can detect these circuit exactly, more and more higher requirement is proposed to measurement jig.
In chip testing, once there be big current requirement, generally all require that Kelvin tests.And manufacture and design based on the test structure tool of Kelvin's test, be one of them difficult point.As shown in Figures 1 and 2, type is selected, the material of excision syringe needle half for testing needle in general Kelvin test.Select this kind of pin design pin chamber, high especially to the requirement of machining accuracy, be easy to occur that the angle changing rate that testing needle rotates in pin chamber is large, when needle point punctures tin ball time, easily thorn partially, thus cause the damage of chip.
Therefore, how to design and a kind ofly reduce the rotation of testing needle in pin chamber, improve needle point and sting the chip testing pin being applied to Kelvin's test of the degree of accuracy of tin ball and tool becomes problem demanding prompt solution in this technical field.
Utility model content
The purpose of this utility model overcomes above-mentioned shortcoming of the prior art, there is provided a kind of and effectively can reduce the rotation of testing needle in pin chamber, improve the degree of accuracy that needle point stings tin ball, ensure the efficiency of chip detection, and structure is simple, with low cost, range of application is quite widely used in chip testing pin and the tool of Kelvin's test.
In order to realize above-mentioned object, the chip testing needle set of the Kelvin's of being applied to test of the present utility model has following formation:
This chip testing pin being applied to Kelvin's test comprises and is interconnected body and needle section, and described needle section has two inner concaves, and the distance between described two inner concaves is less than the width of described body.
This is applied in the chip testing pin of Kelvin's test, and two described inner concaves are parallel to each other.
This is applied in the chip testing pin of Kelvin's test, and described body is cylinder, and two described inner concaves are symmetrical centered by the central shaft of described cylinder body.
The invention also discloses a kind of chip testing jig being applied to Kelvin's test, it comprises upper cover plate and lower cover, described upper cover plate and position corresponding to lower cover are provided with several pin chambeies, the top of described upper cover plate is provided with the square groove be communicated with described pin chamber, the width of described square groove is greater than the distance between needle section two inner concaves of said chip testing needle, and the width of described square groove is less than the width of the body of described chip testing pin.
Have employed the chip testing pin being applied to Kelvin's test and the tool of this utility model, needle section due to its testing needle has two inner concaves, distance between described two inner concaves is less than the width of testing needle body, and the top of tool upper cover plate is provided with the square groove be communicated with described pin chamber, the width of described square groove is greater than the distance between needle section two inner concaves of said chip testing needle, and the width of described square groove is less than the width of the body of described chip testing pin.Thus when this testing needle can be made to be placed in tool pin chamber, its needle section can be placed in described square groove, thus effectively avoid the rotation of testing needle in pin chamber, improve the degree of accuracy that needle point stings tin ball, ensure the efficiency of chip detection, and chip testing pin and the tool being applied to Kelvin's test of the present utility model, its structure is simple, with low cost, range of application is also quite extensive.
Accompanying drawing explanation
Fig. 1 is the structural representation of the chip testing pin being applied to Kelvin's test in prior art.
Fig. 2 is the partial enlarged drawing of part A in Fig. 1.
Fig. 3 is the structural representation being applied to a chip testing pin side of Kelvin's test of the present utility model.
Fig. 4 is the structural representation being applied to the chip testing pin another side of Kelvin's test of the present utility model.
Fig. 5 is the schematic diagram being applied to chip testing pin, tool and the chip assembling that Kelvin tests of the present utility model.
Fig. 6 is the sectional view along H-H cross section in Fig. 5.
Fig. 7 is the partial enlarged drawing of C part in Fig. 6.
Fig. 8 is the top view being applied to the chip testing jig of Kelvin's test of the present utility model.
Fig. 9 is the partial enlarged drawing of part B in Fig. 8.
Detailed description of the invention
In order to more clearly understand technology contents of the present utility model, describe in detail especially exemplified by following examples.
In one embodiment, as shown in Fig. 2 to 9, the chip testing pin 1 of the Kelvin of being applied to of the present utility model test comprises and is interconnected body 11 and needle section 12, described needle section 12 has two inner concaves 13, and the distance w between described two inner concaves 13 is less than the width D i of described body.
In one more preferably embodiment, two described inner concaves 13 are parallel to each other.
In the preferred embodiment of one, described body 11 is cylinder, and two described inner concaves 13 are symmetrical centered by the central shaft of described cylinder body 11.
The utility model also provides a kind of chip testing jig being applied to Kelvin's test, and it comprises upper cover plate 2 and lower cover 3, the position of described upper cover plate 2 and lower cover 3 correspondence is provided with several pin chambeies 5.The top of described upper cover plate 2 is provided with the square groove 21 be communicated with described pin chamber 5, the width d of described square groove 21 is greater than the distance w between needle section 12 two inner concaves 13 of chip testing pin 1 described in claim 1, and the width d of described square groove 21 is less than the width D i of the body 11 of described chip testing pin 1.
In actual applications, compared with the testing needle that the utility model and traditional Kelvin test, its needle section 12 is both sides excisions, instead of monolateral excision.This kind of testing needle head 12 has two flat faces 13, pin chamber 5 can design with individual square groove 21 above, the both sides of groove 21 near two planes of syringe needle, thus reduce the rotation of syringe needle 12.
Operation principle: as shown in Figure 8, a square groove 21 is dug out at upper cover plate 2 top, two medial surfaces of square groove 21 are close to two inner concaves 13 of needle section 12, thus control the anglec of rotation of syringe needle 12, the latter half of upper cover plate 2 square groove 21 is designed to circular port D, the width d of square groove is less than the diameter Di of testing needle body 11, and the both ends of the surface restriction testing needle 1 being close to pin by pin hole end face is up and down.Cover plate 2,3 is then traditional large aperture design, any change that it goes without doing.The needle point of testing needle head 12 is made accurately to sting the tin ball of chip 4.
Usefulness of the present invention is: in solution Kelvin test, control the rotation of syringe needle, is a kind of well protection to chip testing.
Have employed the chip testing pin being applied to Kelvin's test and the tool of this utility model, needle section due to its testing needle has two inner concaves, distance between described two inner concaves is less than the width of testing needle body, and the top of tool upper cover plate is provided with the square groove be communicated with described pin chamber, the width of described square groove is greater than the distance between needle section two inner concaves of said chip testing needle, and the width of described square groove is less than the width of the body of described chip testing pin.Thus when this testing needle can be made to be placed in tool pin chamber, its needle section can be placed in described square groove, thus effectively avoid the rotation of testing needle in pin chamber, improve the degree of accuracy that needle point stings tin ball, ensure the efficiency of chip detection, and chip testing pin and the tool being applied to Kelvin's test of the present utility model, its structure is simple, with low cost, range of application is also quite extensive.
In this description, the utility model is described with reference to its specific embodiment.But, still can make various amendment and conversion obviously and not deviate from spirit and scope of the present utility model.Therefore, description and accompanying drawing are regarded in an illustrative, rather than a restrictive.

Claims (4)

1. be applied to a chip testing pin for Kelvin's test, it comprises and is interconnected body and needle section, and it is characterized in that, described needle section has two inner concaves, and the distance between described two inner concaves is less than the width of described body.
2. the chip testing pin being applied to Kelvin's test according to claim 1, it is characterized in that, two described inner concaves are parallel to each other.
3. the chip testing pin being applied to Kelvin's test according to claim 1, it is characterized in that, described body is cylinder, and two described inner concaves are symmetrical centered by the central shaft of described cylinder body.
4. one kind is applied to the chip testing jig of Kelvin's test, it comprises upper cover plate and lower cover, described upper cover plate and position corresponding to lower cover are provided with several pin chambeies, it is characterized in that, the top of described upper cover plate is provided with the square groove be communicated with described pin chamber, the width of described square groove is greater than the distance between needle section two inner concaves of chip testing pin described in claim 1, and the width of described square groove is less than the width of the body of described chip testing pin.
CN201420706715.4U 2014-11-21 2014-11-21 Be applied to chip testing pin and the tool of Kelvin's test Expired - Fee Related CN204302330U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201420706715.4U CN204302330U (en) 2014-11-21 2014-11-21 Be applied to chip testing pin and the tool of Kelvin's test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201420706715.4U CN204302330U (en) 2014-11-21 2014-11-21 Be applied to chip testing pin and the tool of Kelvin's test

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CN204302330U true CN204302330U (en) 2015-04-29

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111983424A (en) * 2020-07-30 2020-11-24 华润赛美科微电子(深圳)有限公司 Test fixture and test equipment

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111983424A (en) * 2020-07-30 2020-11-24 华润赛美科微电子(深圳)有限公司 Test fixture and test equipment

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C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20150429

CF01 Termination of patent right due to non-payment of annual fee