CN204287321U - A kind of crystal oscillator frequency test macro - Google Patents

A kind of crystal oscillator frequency test macro Download PDF

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Publication number
CN204287321U
CN204287321U CN201420819524.9U CN201420819524U CN204287321U CN 204287321 U CN204287321 U CN 204287321U CN 201420819524 U CN201420819524 U CN 201420819524U CN 204287321 U CN204287321 U CN 204287321U
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China
Prior art keywords
crystal oscillator
measured
near field
field probes
circuit board
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CN201420819524.9U
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Chinese (zh)
Inventor
黄和聪
张国忠
杨连池
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Xiamen Intretech Inc
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Xiamen Intretech Inc
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Priority to CN201420819524.9U priority Critical patent/CN204287321U/en
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Abstract

The utility model relates to frequency test field, there is provided a kind of crystal oscillator accurate testing degree high, effective guarantee crystal oscillator frequency of operation is at the crystal oscillator frequency test macro of allowed band, comprise signal analyzer, near field probes, PC computing machine and power supply, described near field probes is connected with signal analyzer input end, described PC computing machine is by GPIB cable connection signal analyser, described power supply is that the circuit board containing crystal oscillator to be measured is powered, connect with crystal oscillator to be measured directly over the crystal oscillator to be measured that described near field probes is positioned over the circuit board containing crystal oscillator to be measured, described PC computer control signal analyser to be tested the circuit board containing crystal oscillator to be measured by near field probes and is generated test report.

Description

A kind of crystal oscillator frequency test macro
Technical field
The utility model relates to frequency test field, particularly a kind of crystal oscillator frequency test macro.
Background technology
Radio frequency crystal oscillator is a kind of very important components and parts of electronics big family, its role is to produce original clock frequency, this frequency after the frequency multiplication or frequency division of frequency generator as electronic product in various different bus frequency.Can test with crystal analyzer during the frequency test of crystal oscillator monomer, but be welded to the crystal oscillator in circuit board, its frequency just cannot adopt crystal analyzer to test.If take the mode connecting the output frequency angle of probe point survey crystal oscillator with analyser to measure its frequency, then can produce impedance matching to it, change the peripheral circuit of crystal oscillator, cause test result inaccurate, thus produce crystal oscillator open shake after frequency error test, effectively cannot ensure that crystal oscillator frequency of operation is in allowed band.
Utility model content
Therefore, for above-mentioned problem, the utility model proposes that a kind of crystal oscillator accurate testing degree is high, effective guarantee crystal oscillator frequency of operation is at the crystal oscillator frequency test macro of allowed band.
For solving this technical matters, the utility model takes following scheme: a kind of crystal oscillator frequency test macro, comprise signal analyzer, near field probes, PC computing machine and power supply, described near field probes is connected with signal analyzer input end, described PC computing machine is by GPIB cable connection signal analyser, described power supply is that the circuit board containing crystal oscillator to be measured is powered, connect with crystal oscillator to be measured directly over the crystal oscillator to be measured that described near field probes is positioned over the circuit board containing crystal oscillator to be measured, described PC computer control signal analyser to be tested the circuit board containing crystal oscillator to be measured by near field probes and is generated test report.
Further improvement, the described near field probes vertical placement distance be positioned over directly over crystal oscillator to be measured is high 0.8-1.2cm position, distance crystal oscillator surface.
By adopting preceding solution, the beneficial effects of the utility model are: carry out aerial radiation connection by near field probes being connected to signal analyzer and being placed in above crystal oscillator to be measured, by PC computer control signal analyser, its frequency is measured, test result is obtained from signal analyzer by the automatic test software being installed on PC computing machine, and generate test report, test result precision is high, effectively can ensure that crystal oscillator frequency of operation on circuit board is in allowed band.
Accompanying drawing explanation
Fig. 1 is the structural representation of the utility model embodiment.
Embodiment
Now with embodiment, the utility model is further illustrated by reference to the accompanying drawings.
With reference to figure 1, preferred crystal oscillator frequency test macro of the present utility model, comprise signal analyzer 1, near field probes 2, PC computing machine 3, power supply and the circuit board 4 containing crystal oscillator to be measured, described near field probes 2 is connected with signal analyzer 1 input end, described PC computing machine 3 is by GPIB cable connection signal analyser 1, described power supply is that the circuit board 4 containing crystal oscillator to be measured is powered, set up aerial radiation with crystal oscillator 41 to be measured directly over the crystal oscillator to be measured 41 that described near field probes 2 is positioned over the circuit board 4 containing crystal oscillator to be measured to be connected, the vertical placement distance that near field probes is positioned over directly over crystal oscillator 41 to be measured is high 1cm position surperficial apart from crystal oscillator 41 to be measured, described PC computing machine 3 control signal analyser 1 is tested by the crystal oscillator to be measured 41 of near field probes 2 to the circuit board 4 containing crystal oscillator to be measured and is generated test report.
In the utility model, near field probes is positioned over the vertical placement distance directly over crystal oscillator to be measured is good with high 0.8-1.2cm position, distance crystal oscillator surface.
The utility model carries out aerial radiation connection by near field probes being connected to signal analyzer and being placed in above crystal oscillator to be measured, by PC computer control signal analyser, its frequency is measured, test result is obtained from signal analyzer by the automatic test software being installed on PC computing machine, and generate test report, test result precision is high, effectively can ensure that crystal oscillator frequency of operation on circuit board is in allowed band.
Although specifically show in conjunction with preferred embodiment and describe the utility model; but those skilled in the art should be understood that; not departing from the spirit and scope of the present utility model that appended claims limits; can make a variety of changes the utility model in the form and details, be protection domain of the present utility model.

Claims (2)

1. a crystal oscillator frequency test macro, it is characterized in that: comprise signal analyzer, near field probes, PC computing machine and power supply, described near field probes is connected with signal analyzer input end, described PC computing machine is by GPIB cable connection signal analyser, described power supply is that the circuit board containing crystal oscillator to be measured is powered, connect with crystal oscillator to be measured directly over the crystal oscillator to be measured that described near field probes is positioned over the circuit board containing crystal oscillator to be measured, described PC computer control signal analyser to be tested the circuit board containing crystal oscillator to be measured by near field probes and is generated test report.
2. crystal oscillator frequency test macro according to claim 1, is characterized in that: the described near field probes vertical placement distance be positioned over directly over crystal oscillator to be measured is high 0.8-1.2cm position, distance crystal oscillator surface.
CN201420819524.9U 2014-12-22 2014-12-22 A kind of crystal oscillator frequency test macro Active CN204287321U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201420819524.9U CN204287321U (en) 2014-12-22 2014-12-22 A kind of crystal oscillator frequency test macro

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201420819524.9U CN204287321U (en) 2014-12-22 2014-12-22 A kind of crystal oscillator frequency test macro

Publications (1)

Publication Number Publication Date
CN204287321U true CN204287321U (en) 2015-04-22

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CN201420819524.9U Active CN204287321U (en) 2014-12-22 2014-12-22 A kind of crystal oscillator frequency test macro

Country Status (1)

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CN (1) CN204287321U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106967959A (en) * 2017-05-15 2017-07-21 成都西沃克真空科技有限公司 A kind of crystal oscillator probe control system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106967959A (en) * 2017-05-15 2017-07-21 成都西沃克真空科技有限公司 A kind of crystal oscillator probe control system

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