CN204251691U - A kind of device of the semiconductor film of formation of deposits on the glass substrate - Google Patents
A kind of device of the semiconductor film of formation of deposits on the glass substrate Download PDFInfo
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- CN204251691U CN204251691U CN201420689689.9U CN201420689689U CN204251691U CN 204251691 U CN204251691 U CN 204251691U CN 201420689689 U CN201420689689 U CN 201420689689U CN 204251691 U CN204251691 U CN 204251691U
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Abstract
The utility model relates to a kind of device of the semiconductor film of formation of deposits on the glass substrate, comprise a vacuum deposit chamber (1) and vapour deposition device (2), vapour deposition device (2) comprises a crucible (21), permeable porous film (22) and feed distributor (23); It is characterized in that: vapour deposition device (2) also comprises a compact outer shell (24), this compact outer shell (24) is placed on described crucible (21) outward; The bottom of compact outer shell (24) is provided with outlet passageway (241), and the below that compact outer shell (24) is located at by described glass substrate (3) is relative with outlet passageway (241); Crucible (21) inner chamber communicates with the space between crucible (21) and compact outer shell (24) through permeable porous film (22).The utility model ensure that the homogeneity of big area high-temperature substrates deposition on glass semiconductor film, solves again the glass substrate problem on deformation when big area high-temperature substrates deposition on glass semiconductor film.
Description
Technical field
The utility model relates to a kind of deposited semiconductor thin film technique, and particularly a kind of close spaced sublimation technology that adopts forms the device of semiconductor film in high-temperature substrates deposition on glass.
Background technology
Manufacture field at Cadmium Sulfide/cadmium telluride solar cell at present, a kind of method that deposition that distils near space obtains high quality cadmium telluride is just causing the concern of people.The transformation efficiency of the Cadmium Sulfide that should obtain in this way/cadmium telluride solar cell up to 16.8%(see X. Wu et al., 17th European Photovoltaic Solar Energy Conversion Conference, Munich, Germany, 22-26 Oct. 2001, II, 995-1000).Close spaced sublimation process is the one in CVD (Chemical Vapor Deposition) method.
According to No. 4207119, the U.S., the description of No. 6444043 and No. 7220321 patents, the close spaced sublimation technology that they adopt is in a vacuum deposit chamber, be placed in a crucible made with graphite by forming the material (hereinafter referred to as starting material) of Cadimium telluride thin film, base plate glass is placed on the top of crucible, separate with high temperature insulation pad between the good plumbago crucible of heat transfer property and base plate glass, distance in plumbago crucible between starting material surface and base plate glass is approximately 0.5-5 centimetre, like this, starting material become gas phase at a certain temperature after distillation, then the lower surface being deposited on base plate glass forms layer of semiconductor film.But way generally traditional in the past directly at normal temperatures in advance doses in crucible by starting material cadmium telluride, then close spaced sublimation formation of deposits Cadimium telluride thin film.According to this traditional way, along with cadmium telluride formation of deposits film on base plate glass, the capacity of the cadmium telluride in crucible just reduces thereupon, causes the increase of the spacing of glass substrate and starting material, so, the microstructure of Cadimium telluride thin film and photoelectric properties also change in time.In order to replenish the starting material consumed in thin film deposition, regular repetition in crucible is just needed to dose starting material.But so operation exists potential safety hazard, because containing toxic gas in the container be heated, repeat to open vacuum chamber and dose starting material in deposition process, just have toxic gas and come out, therefore just just starting material must can be dosed by first cooling apparatus.But so, in order to dose starting material in crucible, Cadimium telluride thin film deposition process on a glass substrate certainly will be interrupted.
Therefore, had afterwards and worked out a kind of method and apparatus carrying semiconductor material without the need to opening thin film vacuum deposition chamber directly to thin film vacuum deposition device, refer to the Chinese invention patent application Publication Specification that publication number is CN101525743, mainly be equipped with semiconductor materials supply device, this semiconductor material feeding mechanism provides carrier gases and semiconductor material, carries semiconductor material input online continuously in crucible by carrier gases.Though this prior art solves the problem of continuous feeding, but, because gas phase semiconductor material is directly deposited on glass substrate through one deck permeable porous film, the diffusion uniformity of gas phase semiconductor material is still not high, so that a film forming thickness and uniform quality degree still have much room for improvement, particularly more outstanding for homogeneity question during large-area glass substrate, and, in continuous thin film deposition process, in order to ensure to greatest extent by thin film deposition on the lower surface of glass substrate, the both sides of glass substrate are only had directly to contact with the roller of transport unit or steel band, therefore, after glass substrate temperature is higher than strain point of glass (strain point of common soda glass is 460 DEG C), easily there is the metamorphism that drops in glass substrate, affect the transmission of glass substrate and the preparation of cadmium telluride thin film solar cell modules, and Cadimium telluride thin film quality is directly directly proportional with glass substrate temperature, simultaneously, the roller that support glass substrate transmits or steel band decrease the depositional area of glass substrate upper film.
Summary of the invention
The utility model provides a kind of device of the semiconductor film of formation of deposits on the glass substrate, its first object solves the homogeneity question at big area high-temperature substrates deposition on glass semiconductor film, and the second object solves the yielding problem of glass substrate when big area high-temperature substrates deposition on glass semiconductor film.
For achieving the above object, the technical solution adopted in the utility model is: a kind of device of the semiconductor film of formation of deposits on the glass substrate, comprise a vacuum deposit chamber and be located at the vapour deposition device in vacuum deposit chamber, described vapour deposition device comprises a crucible, is covered on permeable porous film uncovered on crucible and is located at the feed distributor of crucible bottom; Described vapour deposition device also comprises a compact outer shell, and this compact outer shell is placed on outside described crucible, leaves space between crucible and compact outer shell; The bottom of described compact outer shell is provided with outlet passageway, and the below that compact outer shell is located at by described glass substrate is relative with outlet passageway; Described crucible inner chamber communicates with the space between crucible and compact outer shell through permeable porous film, be heated in described crucible be sublimed into gas phase semiconductor material through permeable porous film in the space crucible and compact outer shell, then to be deposited on described glass substrate through the outlet passageway bottom described compact outer shell.
In such scheme, described permeable porous film is fixed on crucible by clamp.
In such scheme, described outlet passageway is established the second permeable porous film.
In such scheme, the bottom nozzle of described outlet passageway is 10 ~ 30 millimeters to the spacing between described glass substrate.
In such scheme, this device also comprises a trolley type transport unit, and described glass substrate is put on this trolley type transport unit, by the horizontal transmission of trolley type transport unit.
Because technique scheme is used, the utility model compared with prior art has the following advantages:
1, due to structure design of the present utility model, film semiconductor material in deposition process has level Four concentration distribution, significantly improve the distributing homogeneity of semiconductor material, ensure that the final thickness of the film of formation of deposits and the homogeneity of quality on the glass substrate, be particularly suitable for large-area glass substrate;
2, because the utility model is placed in by glass substrate under vapour deposition device, film is the upper surface being deposited on glass substrate, can comprehensive support under glass substrate, adds the planarization of high temp glass substrate, guarantee the steady transmission of high temp glass substrate, improve thin film deposition quality;
3, equally because the utility model is placed in by glass substrate under vapour deposition device, film is the upper surface being deposited on glass substrate, the upper surface of whole glass substrate all can be used as the depositional plane of semiconductor film, namely effectively increases the useful area of glass substrate semiconductor-on-insulator thin film deposition.
Accompanying drawing explanation
Fig. 1 is the utility model embodiment one structure schematic front view;
Fig. 2 is that complete section schematic diagram is looked on a left side of Fig. 1;
Fig. 3 is the cross section schematic diagram along glass substrate delivery direction of the vapour deposition device of the utility model embodiment two;
Fig. 4 be the vapour deposition device of the utility model embodiment two overlook cross-sectional schematic;
Fig. 5 is the cross section schematic diagram along glass substrate delivery direction of the vapour deposition device of the utility model embodiment three;
Fig. 6 is the schematic diagram of the first outlet passageway structure of all available vapour deposition device of the utility model embodiment one to embodiment three;
Fig. 7 is the schematic diagram of the second outlet passageway structure of all available vapour deposition device of the utility model embodiment one to embodiment three.
In above accompanying drawing: 1, vacuum deposit chamber; 10, partiting thermal insulation shell; 11, halogen tungsten lamp; 2, vapour deposition device; 21, crucible; 211, clamp; 212, heating tube; 213, high temperature resistant plate; 22, permeable porous film; 23, feed distributor; 24, compact outer shell; 241, outlet passageway; 242, blend stop; 3, glass substrate; 4, the second permeable porous film; 5, trolley type transport unit; 6, semiconductor material feeding mechanism.
Embodiment
Below in conjunction with drawings and Examples, the utility model is further described:
Embodiment one: shown in Fig. 1, Fig. 2, Fig. 6, Fig. 7:
The present embodiment relates to a kind of device of the semiconductor film of formation of deposits on the glass substrate, specifically be used at glass substrate 3(and substrate) above deposit the semiconductor film with specific function, such as, the Cadmium Sulfide in Cadmium Sulfide/cadmium telluride solar cell and Cadimium telluride thin film.But, it is pointed out that other semiconductor material also can use in the utility model device.Such as, the material that can be sublimed into gas phase under certain temperature condition also can in the vacuum deposition system of the present embodiment formation of deposits film.
The device of a kind of formation of deposits on the glass substrate of the present embodiment semiconductor film, shown in Fig. 1,2, the vapour deposition device 2 comprising a vacuum deposit chamber 1 and be located in vacuum deposit chamber 1, the feed distributor 23 that described vapour deposition device 2 comprises a crucible 21, is covered on permeable porous film 22 uncovered on crucible 21 and is located at bottom crucible 21; Described vapour deposition device 2 also comprises a compact outer shell 24, and this compact outer shell 24 is placed on outside described crucible 21, leaves space between crucible 21 and compact outer shell 24; The bottom of described compact outer shell 24 is provided with outlet passageway 241, and the below that compact outer shell 24 is located at by described glass substrate 3 is relative with outlet passageway 241; Described crucible 21 inner chamber communicates with the space between crucible 21 and compact outer shell 24 through permeable porous film 22, the semiconductor material being sublimed into gas phase be heated in described crucible 21 through the space permeable porous film 22 to crucible 21 and compact outer shell 24, then be deposited on described glass substrate 3 through the outlet passageway 241 bottom described compact outer shell 24.
Specifically, described vacuum deposit chamber 1 is by a partiting thermal insulation shell 10 around being formed, and partiting thermal insulation shell 10 appropriate ways, as halogen tungsten lamp, heating makes the temperature in vacuum deposit chamber 1 remain between 400 DEG C to 650 DEG C.
Specifically, feed distributor 23 can be porous manifold, also can be that described in the prior other have the divider being uniformly distributed semiconductor material function, and adopting in the present embodiment is porous manifold.
Shown in Figure 1, the present embodiment device also comprises semiconductor material feeding mechanism 6(and is illustrated as right two the semiconductor material feeding mechanisms 6 of a first from left), semiconductor material feeding mechanism 6 is communicated with feed distributor 23 by pipeline, for providing semiconductor material and carrier gases, semiconductor material is carried by carrier gases and is evenly distributed in crucible 21 inner bottom part through pipeline by feed distributor 23.Right two the semiconductor material feeding mechanisms 6 of the illustrated the first from left of the present embodiment, jointly carrier gases being carried powder semiconductor material is delivered in crucible 21, bottom crucible 21, equally distributed object is reached with the powder semi-conductor entrained by this carrier gases and its, improve semiconductor material distillation and become homogeneity in crucible 21 inside after gaseous substance, guarantee to enter the homogeneity of gas phase semi-conductor along outlet passageway 241 length direction of outlet passageway 241, ensure the homogeneity of its semiconductor film formed at glass substrate 3 surface deposition.
Shown in Fig. 1, Fig. 2, the present embodiment device also comprises a trolley type transport unit 5, and glass substrate 3 is put on this trolley type transport unit 5, is at the uniform velocity transmitted by trolley type transport unit 5 level.The transport unit that namely so-called trolley type transport unit 5 is made up of multiple roller, width between centers between adjacent two rollers is not more than 30 centimetres, support the bottom surface of glass substrate 3 with it, guarantee the planarization of glass substrate 3, glass substrate 3 can be avoided to deform.Distance between adjacent two pieces of glass substrates 3 on trolley type transport unit 5 can regulate as required, and in order to reduce the loss of gas phase semiconductor material, the distance in thin film vacuum deposition chamber between adjacent two pieces of glass substrates 3 is controlled within 1 centimetre.The bottom nozzle of described outlet passageway 241 is 10 ~ 30 millimeters to the spacing between described glass substrate 3, wherein with 20 millimeters for the best, the excessive waste of raw materials that causes of spacing increases, spacing is too small, being heated inequality and local unfairness occurs may appear again in glass substrate 3, easily causes glass substrate 3 to transmit and is obstructed.Waste is caused to the both sides transfer outside glass substrate 3 in order to control gaseous substance, blend stop 242 is provided with in compact outer shell 24 outlet passageway 241 both sides, to reduce the waste that gaseous substance causes to glass substrate 3 outer both sides transfer, improve utilization rate of raw materials, and increase film equality.
Being positioned at porous manifold bottom crucible 21 to be made up of stainless steel or graphite or carbofrax material, is preferred with graphite or silicon carbide.In vapor deposition processes, crucible 21 temperature is heated to design temperature by the heating tube 212 being located at crucible 21 surrounding or bottom, between 650 DEG C to 800 DEG C.
Carrier gases is the one or more kinds of mixed gass in nitrogen, argon gas, helium, semiconductor material is best with Powdered, without the need to opening vacuum deposit chamber in actual motion, when not interrupting semiconductor material continuously at glass substrate deposit film, continuously semiconductor material is introduced crucible 21 by carrier gases, the input speed of semiconductor material just in time meets the needs of thin film deposition.
Described crucible 21 is fabricated to the best with graphite.Permeable porous film 22 is fixed on crucible 21 by clamp 211, and these clamp 211 are made with high temperature material, preferably such as, with material, graphite crucible 21.
Best permeable porous film 22 structure only allows carrier gases and gas phase semi-conductor pass through, the semiconductor material controlling not distillation in time does not allow it pass through, permeable porous film 22 temperature can by permeable porous film 22 in an embedding heating unit or direct permeable porous film 22 as heating unit time, can permeable porous film 22 two ends apply voltage temperature is raised, exceed the temperature 2-5 degree of crucible 21, can ensure like this gas phase semi-conductor can not permeable porous film 22 surface and hole in condense, not plug voids.Permeable porous film 22 can adopt graphite, silicon carbide, silicon nitride or boron carbide material, and also can adopt can heated graphite material, with having good heat conductivility advantage as the permeable porous film 22 that material is made by heated graphite.Hole in permeable porous film 22 is with certain regularly arranged distribution, the size of hole take micron order as the best, the porosity of permeable porous film 22 is at least more than 25%, only pass through for carrier gases and gas phase semi-conductor, it is interior until be sublimed into gas phase that the semiconductor powder also do not distilled that carrier gases is carried then is trapped within crucible 21, is not trapped part and then continues to be sublimed into gas phase in permeable porous film 22.The thickness of permeable porous film 22 is 5 ~ 20 millimeters, and in current embodiment, the thickness of permeable porous film 22 is 20 millimeters.
The built-in crucible 21 of compact outer shell 24, concrete as Fig. 1, shown in Fig. 2, crucible 21 and compact outer shell 24 are isometric on the width of glass substrate 3, and be that the width of crucible 21 is less than compact outer shell 24 on the delivery direction of glass substrate 3, and be positioned at the center position of compact outer shell 24, with crucible 21 up and down and leave one between front and back and compact outer shell 24 and spread for gaseous substance, the space of transfer, the gaseous substance produced in crucible 21 distributes further in this space, form the source of the gas of its even concentration distribution, finally by outlet passageway 241 uniform deposition bottom compact outer shell 24 on glass substrate 3 upper surface, generate thickness and the equally distributed semiconductor film of crystalline structure.
Compact outer shell 24 can be made up of high temperature material, such as graphite, pottery, silicon carbide or metal molybdenum, considers processing characteristics and price, preferred graphite material.The temperature of compact outer shell 24 or directly can use compact outer shell 24 as heating unit by an embedding heating unit in compact outer shell 24, such as apply voltage at compact outer shell 24 two ends temperature is raised, exceed the temperature 2-5 degree of crucible 21, can ensure that gas phase semi-conductor can not deposit at compact outer shell 24 condensed on inner walls like this.
Outlet passageway 241 on compact outer shell 24 can be a wide slit for 10-50mm, as shown in Figure 6, also can be wide the second permeable porous film 4 for 10-50mm, as shown in Figure 7.
When the present embodiment uses, deposition process specifically comprises the following steps:
The first step, carries semiconductor material by carrier gases and is evenly distributed in crucible 21 inner bottom part via feed distributor 23, namely carry out first step concentration distribution;
Second step, heating crucible 21, permeable porous film 22 and compact outer shell 24, ensure that the temperature of permeable porous film 22 and compact outer shell 24 is higher than crucible 21, semiconductor material in crucible 21 is heated, the semiconductor material being sublimed into gas phase enters the space between crucible 21 and compact outer shell 24 after carrying out second stage concentration distribution through permeable porous film 22 together with carrier gases;
3rd step, gas phase semiconductor material completes third stage concentration distribution with in the space of carrier gases between crucible 21 and compact outer shell 24;
4th step, gas phase semiconductor material with carrier gases after the outlet passageway 241 bottom compact outer shell 24 carries out fourth stage concentration distribution, be deposited on the upper surface of surface temperature than the described glass substrate 3 at the bottom of gas phase semiconductor material temperature, namely form semiconductor film.
Preferably concrete, in second step, permeable porous film 22 and compact outer shell 24 are heated above crucible 21 temperature 2 ~ 5 DEG C.
In the film deposition process of the present embodiment, semiconductor material has level Four concentration distribution, significantly improve the distributing homogeneity of semiconductor material, ensure that the finally thickness of the film of formation of deposits and the homogeneity of quality on glass substrate 3, be particularly suitable for large-area glass substrate 3.
Embodiment two: shown in Fig. 3, Fig. 4:
The present embodiment relates to a kind of device of the semiconductor film of formation of deposits on the glass substrate, be with the difference of embodiment one: the crucible 21 in vapour deposition device 2 is connected as a single entity with the compact outer shell 24 surrounding this crucible, the top of crucible 21 and leave space between front and back and compact outer shell 24, the outlet passageway 241 of compact outer shell 24 is arranged on the both sides, front and back of the crucible 21 bottom compact outer shell 24; Affect to reduce the thermal radiation of crucible 21 bottom-heated pipe 212 on glass substrate 3, this heating tube 212 high temperature resistant plate 213 of low-E is fixed on bottom crucible 21, this high temperature resistant plate 213 with ceramic plate or metal molybdenum plate for the best, this high temperature resistant plate 213 is 10-30mm from the distance of glass substrate 3 upper surface, preferred 20mm.In addition, bottom compact outer shell 24, surrounding adds blend stop 242, reduces semi-conductor gaseous substance to sedimentary province external diffusion, transfer, improves utilization rate of raw materials.
Other, with embodiment one, repeat no more here.
Embodiment three: shown in Figure 5:
The present embodiment relates to a kind of device of the semiconductor film of formation of deposits on the glass substrate, be with the difference of embodiment one: crucible 21 is placed in compact outer shell 24, crucible about 21 and left and right, front and back all have living space with between compact outer shell 24 in 6 faces totally, in vapor deposition processes, crucible 21 temperature is heated to design temperature by the heating tube 212 being located at crucible 21 surrounding and bottom, between 650 DEG C to 800 DEG C, the air-permeable envelope 40 being fixed on crucible 32 top with buckle is heated to than crucible temperature height 2-5 by heating pipe built-in or external heating tube
othe temperature of C, outlet passageway 241 is arranged on the mid-way bottom compact outer shell 24, outlet passageway 241 can for being a wide slit for 20-50mm, and also can be second permeable porous film 4 of 20-50mm with wide, outlet passageway 241 length be consistent with glass substrate 3 width.In addition, bottom compact outer shell 24, outlet passageway 241 surrounding adds blend stop 242, reduces semi-conductor gaseous substance to sedimentary province external diffusion, transfer, improves utilization rate of raw materials.
Other, with embodiment one, repeat no more here.
Above-described embodiment, only for technical conceive of the present utility model and feature are described, its object is to person skilled in the art can be understood content of the present utility model and implement according to this, can not limit protection domain of the present utility model with this.All equivalences done according to the utility model spirit change or modify, and all should be encompassed within protection domain of the present utility model.
Claims (5)
1. the device of a formation of deposits semiconductor film on the glass substrate, comprise a vacuum deposit chamber (1) and be located at the vapour deposition device (2) in vacuum deposit chamber (1), described vapour deposition device (2) comprises a crucible (21), is covered on the upper uncovered permeable porous film (22) of crucible (21) and is located at the feed distributor (23) of crucible (21) bottom; It is characterized in that: described vapour deposition device (2) also comprises a compact outer shell (24), and this compact outer shell (24) is placed on described crucible (21) outward, leaves space between crucible (21) and compact outer shell (24); The bottom of described compact outer shell (24) is provided with outlet passageway (241), and the below that compact outer shell (24) is located at by described glass substrate (3) is relative with outlet passageway (241); Described crucible (21) inner chamber communicates with the space between crucible (21) and compact outer shell (24) through permeable porous film (22), be heated in described crucible (21) be sublimed into gas phase semiconductor material through permeable porous film (22) to the space crucible (21) and compact outer shell (24), then through described compact outer shell (24) bottom outlet passageway (241) and be deposited on described glass substrate (3).
2. the device of formation of deposits semiconductor film on the glass substrate according to claim 1, is characterized in that: described permeable porous film (22) is fixed on crucible (21) by a clamp (211).
3. the device of formation of deposits semiconductor film on the glass substrate according to claim 1, is characterized in that: described outlet passageway (241) is established the second permeable porous film (4).
4. the device of formation of deposits semiconductor film on the glass substrate according to claim 1, is characterized in that: the bottom nozzle of described outlet passageway (241) is 10 ~ 30 millimeters to the spacing between described glass substrate (3).
5. the device of formation of deposits semiconductor film on the glass substrate according to claim 1, it is characterized in that: this device also comprises a trolley type transport unit (5), described glass substrate (3) is put on this trolley type transport unit (5), by trolley type transport unit (5) horizontal transmission.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN109097740A (en) * | 2018-09-30 | 2018-12-28 | 佛山科学技术学院 | A kind of vacuum coating equipment with corrosion proof function |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN109097740A (en) * | 2018-09-30 | 2018-12-28 | 佛山科学技术学院 | A kind of vacuum coating equipment with corrosion proof function |
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