CN204228841U - Capacitor high/low temperature proving installation - Google Patents
Capacitor high/low temperature proving installation Download PDFInfo
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- CN204228841U CN204228841U CN201420460778.6U CN201420460778U CN204228841U CN 204228841 U CN204228841 U CN 204228841U CN 201420460778 U CN201420460778 U CN 201420460778U CN 204228841 U CN204228841 U CN 204228841U
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- test
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- capacitor
- instrumentation
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Abstract
The utility model discloses a kind of capacitor high/low temperature proving installation, comprise high-low temperature test chamber, test board, control panel, experiment power supply and test instrumentation, described test board is provided with testing capacitor, described test board is positioned at high-low temperature test chamber, described control panel and test instrumentation are all positioned at control chamber, described test instrumentation is connected with described control panel, and described test board is connected with described control panel, and described control panel is electrically connected with described experiment power supply.Described high-low temperature test chamber, control panel and test instrumentation connect a controller respectively.The utility model solves the performance test difficult problem of capacitor under high and low temperature environment, can be real-time the performance change process of electrolysis condenser under high and low temperature environment; Automatically can be carried out the procedural style test of condition of different temperatures by control software design, greatly improve testing efficiency; The test data under each temperature environment can be preserved, for analyzing and processing.
Description
Technical field
The utility model relates to a kind of capacitor high/low temperature proving installation.
Background technology
The mode of manual single test under normal temperature is taked in current domestic capacitor test, suitable way is not then had for the performance test of capacitor under high and low temperature environment, capacitor can only be taked to be placed in high-low temperature chamber store after, take rapidly the mode of carrying out in tester testing.Operation bothers very much, and really can not reflect the performance change of capacitor under high/low temperature.
Summary of the invention
In order to overcome the troublesome poeration that existing capacitor exists in the performance test methods under high and low temperature environment, the shortcoming accurately can not reacting its performance change, the utility model provide a kind of solve the performance test difficult problem of capacitor under high and low temperature environment, the performance change process of electrolysis condenser under high and low temperature environment, can automatically be carried out by control software design condition of different temperatures procedural style test, greatly improve testing efficiency, the capacitor high/low temperature proving installation of the test data under each temperature environment for analyzing and processing can be preserved.
The technical solution adopted in the utility model is:
Capacitor high/low temperature proving installation, it is characterized in that: comprise high-low temperature test chamber, test board, control panel, experiment power supply and test instrumentation, described test board is provided with testing capacitor, described test board is positioned at high-low temperature test chamber, described control panel and test instrumentation are all positioned at control chamber, described test instrumentation is connected with described control panel, and described test board is connected with described control panel, and described control panel is electrically connected with described experiment power supply.
Further, described high-low temperature test chamber, control panel and test instrumentation connect a controller respectively.Tested by unified test instrumentation, high-low temperature test chamber and the control panel of controlling of controller, test parameter is by controller record and analysis.
Further, described test board is connected with described control panel connected components by golden finger.
The beneficial effects of the utility model are embodied in: 1, simple to operate, and under the condition finishing testing process, operating personnel only need operation control software to send to control just to complete all the other by computer for controlling and operate; 2, the complete test data of capacitor under each temperature environment can be obtained, the detailed performance change of electrolysis condenser under condition of different temperatures.
Accompanying drawing explanation
Fig. 1 is the utility model one-piece construction schematic diagram.
Fig. 2 is utility model works process flow diagram.
Embodiment
See figures.1.and.2, capacitor high/low temperature proving installation, comprise high-low temperature test chamber 1, test board 2, control panel 3, experiment power supply 4 and test instrumentation, described test board 2 is provided with testing capacitor 5, described test board 2 is positioned at high-low temperature test chamber 1, described control panel 3 and test instrumentation are all positioned at control chamber 6, described test instrumentation is connected with described control panel 3, described test board 2 is connected with described control panel 3, and described control panel 3 is electrically connected with described experiment power supply 4.
Further, described high-low temperature test chamber 1, control panel 3 and test instrumentation connect a controller respectively, and tested by unified test instrumentation, high-low temperature test chamber and the control panel of controlling of controller, test parameter is by controller record and analysis.
Further, described test board 2 is connected with described control panel 3 connected components 7 by golden finger.
In the present embodiment, capacitor parameters adopts standard testing instrument to test, and controller controls test instrumentation by communication interface, and probe temperature regulates high-low temperature test chamber to control by controller automatically.
When this device uses, first edit testing process, content comprises probe temperature, temperature retention time, test parameter etc.By controller, test parameter is sent to test instrumentation, high-low temperature test chamber and control panel respectively.During test, under the control of the controller, control panel performs gating action, once by unique capacitor incision test loop; Automatic control instrumentation carries out corresponding parameter testing simultaneously, and carries out showing and preserving from test instrumentation acquisition test data.
Content described in this instructions embodiment is only enumerating the way of realization of inventive concept; protection domain of the present utility model should not be regarded as being only limitted to the concrete form that embodiment is stated, protection domain of the present utility model also and conceive the equivalent technologies means that can expect according to the utility model in those skilled in the art.
Claims (3)
1. capacitor high/low temperature proving installation, it is characterized in that: comprise high-low temperature test chamber, test board, control panel, experiment power supply and test instrumentation, described test board is provided with testing capacitor, described test board is positioned at high-low temperature test chamber, described control panel and test instrumentation are all positioned at control chamber, described test instrumentation is connected with described control panel, and described test board is connected with described control panel, and described control panel is electrically connected with described experiment power supply.
2. capacitor high/low temperature proving installation as claimed in claim 1, is characterized in that: described high-low temperature test chamber, control panel and test instrumentation connect a controller respectively.
3. capacitor high/low temperature proving installation as claimed in claim 1 or 2, is characterized in that: described test board is connected with described control panel connected components by golden finger.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420460778.6U CN204228841U (en) | 2014-08-15 | 2014-08-15 | Capacitor high/low temperature proving installation |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420460778.6U CN204228841U (en) | 2014-08-15 | 2014-08-15 | Capacitor high/low temperature proving installation |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204228841U true CN204228841U (en) | 2015-03-25 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420460778.6U Active CN204228841U (en) | 2014-08-15 | 2014-08-15 | Capacitor high/low temperature proving installation |
Country Status (1)
| Country | Link |
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| CN (1) | CN204228841U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107907741A (en) * | 2017-11-14 | 2018-04-13 | 杭州可靠性仪器厂 | Capacitor high temperature high resistant test device |
-
2014
- 2014-08-15 CN CN201420460778.6U patent/CN204228841U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107907741A (en) * | 2017-11-14 | 2018-04-13 | 杭州可靠性仪器厂 | Capacitor high temperature high resistant test device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |