CN204188903U - Liquid crystal indicator and device substrate thereof - Google Patents

Abstract

The utility model discloses a kind of liquid crystal indicator and device substrate thereof.This device substrate comprises a substrate, a metal level and a flatness layer.Metal level is positioned on this substrate, and wherein this metal level has one first edge along a first direction.Flatness layer is positioned on this metal level, wherein this flatness layer has a contact hole, this contact hole has continuous wall and a bottom surface, this bottom surface exposes this metal level, the outline line of continuous wall on a vertical cross-section is curve, this first edge is to should a critical point of outline line in a vertical direction, and the tangent slope of this outline line in this critical point is less than 0.176.

Description

Liquid crystal indicator and device substrate thereof

Technical field

The utility model relates to a kind of liquid crystal indicator, particularly relates to a kind of liquid crystal indicator with contact hole.

Background technology

Among liquid crystal indicator, contact hole is usually used in switch on pixel electrode and source electrode.But, with reference to Fig. 1, liquid crystal molecule 2 can arrange along with the profile of contact hole 1, and the section shape designed due to contact hole 1 is often arcuate structure wide at the top and narrow at the bottom, therefore along with the liquid crystal molecule 2 of contact hole 1 profile arrangement easily causes light leakage phenomena, and the contrast of liquid crystal indicator is reduced.

With reference to Fig. 1, in the prior art, by increasing the area of the source electrode 3 bottom contact hole 1, the liquid crystal molecule 2 had problems can be covered, thus promote the contrast of liquid crystal indicator.But this mode can reduce the aperture opening ratio of liquid crystal indicator, thus the brightness of loss liquid crystal indicator.Therefore the area of an increase source electrode 3 of hiding, and the issue-resolution of non-good.

Utility model content

The purpose of this utility model is to provide a kind of liquid crystal indicator and device substrate thereof, to solve the problem of prior art.

For reaching above-mentioned purpose, a kind of device substrate that the utility model provides, comprises a substrate, a metal level and a flatness layer.Metal level is positioned on this substrate, and wherein this metal level has one first width along a first direction.Flatness layer is positioned on this metal level, and wherein this flatness layer has a contact hole, and this contact hole has continuous wall and a bottom surface, and this bottom surface exposes this metal level, and wherein this bottom surface has one second width along this first direction.Wherein, this first width and the second width need meet following formula:

$2*\{\frac{L_2}{2}+\frac{0.95h}{\ln \left(0.05\right)\·\tan \left(1.5\mathrm{\θ}\right)}\·\ln [\frac{-0.1672}{\ln \left(0.05\right)\·\tan \left(1.5\mathrm{\θ}\right)}\left]\right\}-1.8\≤L_1\≤2*\{\frac{L_2}{2}+\frac{0.95h}{\ln \left(0.05\right)\·\tan \left(1.5\mathrm{\θ}\right)}\·\ln [\frac{-0.1672}{\ln \left(0.05\right)\·\tan \left(1.5\mathrm{\θ}\right)}\left]\right\}+1.8$

Wherein, L ₁for this (second) metal level is along this first width of this first direction, L ₂for the bottom surface of this contact hole is along this second width of this first direction, h is the thickness of this flatness layer, θ is the angle of an extended surface of a straight line between a preset reference point of continuous wall and a basic point and this bottom surface, wherein, this preset reference point is positioned on this continuous wall, and the vertical range of this preset reference point and this bottom surface is 0.95h, this basic point is the position, boundary of this continuous wall and this bottom surface, p is adjustable parameters, (1-p) h is the height of this preset reference point in this vertical direction, 0<p≤0.1.

This adjustable parameters p is 0.05.

This angle theta is between 20 ~ 40 degree.

This angle theta is between 25 ~ 35 degree.

This device substrate also comprises, and a conductive layer is positioned on this flatness layer, and is electrically connected with this metal level by this contact hole.

This metal level is source electrode or the drain electrode of a driving element.

This metal level is signal wire or the sweep trace of a driving element.

This conductive layer is a transparent material.

This device substrate also comprises, and semi-conductor layer is between this metal level and this substrate.

The material of this semiconductor layer is polysilicon, amorphous silicon or metal oxide.

This conductive layer is a metal material.

A kind of liquid crystal indicator, it is characterized in that, this liquid crystal indicator comprises: subtend substrate; Device substrate, relative to this subtend substrate; Liquid crystal layer, is positioned between this subtend substrate and a device substrate; Wherein, this device substrate comprises: metal level, is positioned on this substrate, and is positioned among a pixel region, and wherein this metal level has one first width along a first direction; And flatness layer, be positioned on this metal level, wherein this flatness layer has a contact hole, this contact hole has continuous wall and a bottom surface, this bottom surface exposes this metal level, wherein this bottom surface has one second width along this first direction, and wherein, this first width and the second width need meet following formula:

$2*\{\frac{L_2}{2}+\frac{(1-p)h}{\ln \left(p\right)\&CenterDot;\tan \left(1.5\mathrm{\&theta;}\right)}\&CenterDot;\ln [\frac{-0.176*(1-p)}{\ln \left(p\right)\&CenterDot;\tan \left(1.5\mathrm{\&theta;}\right)}\left]\right\}-1.8\&le;L_1\&le;2*\{\frac{L_2}{2}+\frac{(1-p)h}{\ln \left(p\right)\&CenterDot;\tan \left(1.5\mathrm{\&theta;}\right)}\&CenterDot;\ln [\frac{-0.176*(1-p)}{\ln \left(p\right)\&CenterDot;\tan \left(1.5\mathrm{\&theta;}\right)}\left]\right\}+1.8$

Wherein, L ₁for metal level is along this first width of this first direction, L ₂for the bottom surface of this contact hole is along this second width of this first direction, h is the thickness of this flatness layer, θ is the angle of a straight line between a preset reference point of continuous wall and a basic point and surface level, wherein, this preset reference point is the position of this bottom surface of distance 0.95h on this continuous wall, and this basic point is the position, boundary of this continuous wall and this bottom surface, and p is adjustable parameters, (1-p) h is the height of this preset reference o'clock in a vertical direction, 0<p≤0.1.

This adjustable parameters p is 0.05.

This angle theta is between 20 ~ 40 degree.

This angle theta is between 25 ~ 35 degree.

This liquid crystal indicator also comprises, and a conductive layer is positioned on this flatness layer, and is electrically connected with this metal level by this contact hole.

This liquid crystal indicator also comprises, and semi-conductor layer is between this metal level and this substrate.

The material of this semiconductor layer is polysilicon, amorphous silicon or metal oxide.

The utility model also provides a kind of device substrate, comprises a substrate, a metal level and a flatness layer.Metal level is positioned on this substrate, and wherein this metal level has one first edge along a first direction.Flatness layer is positioned on this metal level, wherein this flatness layer has a contact hole, this contact hole has continuous wall and a bottom surface, this bottom surface exposes this metal level, the outline line of continuous wall on a vertical cross-section is curve, this first edge is to should a critical point of outline line in a vertical direction, and the tangent slope of this outline line in this critical point is less than 0.176.Wherein, this metal level has one first width along a first direction, and wherein this bottom surface has one second width along this first direction, and wherein, this first width and the second width need meet following formula:

$2*\{\frac{L_2}{2}+\frac{(1-p)h}{\ln \left(p\right)\&CenterDot;\tan \left(1.5\mathrm{\&theta;}\right)}\&CenterDot;\ln [\frac{-0.176*(1-p)}{\ln \left(p\right)\&CenterDot;\tan \left(1.5\mathrm{\&theta;}\right)}\left]\right\}=L_1$

Wherein, L ₁for this second metal level is along this first width of this first direction, L ₂for the bottom surface of this contact hole is along this second width of this first direction, θ is the angle of a straight line between a preset reference point of continuous wall and a basic point and surface level, wherein, this preset reference point is this basal surface position of distance on this continuous wall, (1-p) h is the height of this critical point in this vertical direction, 0<p≤0.1.

The utility model has the advantage of, apply embodiment of the present utility model, the aperture opening ratio of liquid crystal indicator and transmittance (contrast under dark-state) can reach optimized state, avoid the generation of the problem such as light leak and contrast reduction.

Accompanying drawing explanation

Fig. 1 is the schematic diagram of the device substrate of available liquid crystal display device;

Fig. 2 is the schematic diagram of the device substrate of the utility model one embodiment;

Fig. 3 A is the schematic diagram that the device substrate of the utility model embodiment is applied to a liquid crystal indicator;

Fig. 3 B is the schematic diagram of the 3B thin portion element partly in Fig. 3 A;

Fig. 4 is the schematic diagram of the device substrate of the utility model one variation;

Fig. 5 is the schematic diagram of the liquid crystal indicator of application the utility model embodiment;

Fig. 6 is preset value according to contact hole of the present utility model and actual value deck watch.

Symbol description

1 ~ contact hole

2 ~ liquid crystal molecule

3 ~ source electrode

100 ~ device substrate

110 ~ substrate

120 ~ metal level

121 ~ the first edges

130 ~ flatness layer

131,131 ', 131 " ~ contact hole

132 ~ wall continuously

133 ~ bottom surface

134 ~ preset reference point

135 ~ basic point

136 ~ critical point

137 ~ semiconductor layer

140 ~ conductive layer

150 ~ liquid crystal layer

200 ~ liquid crystal indicator

201 ~ sweep trace

202 ~ signal wire

203 ~ semiconductor layer

204 ~ drain electrode

205 ~ common electrode

210 ~ pixel electrode

222 ~ gate insulation layer

231 ~ contact hole

The bottom surface of 233 ~ contact hole

240 ~ source electrode

250 ~ liquid crystal layer

260 ~ subtend substrate

L ₁~ the first width

L ₂~ the second width

H ~ thickness

θ ~ angle

β ~ angle

A ~ viewing area

B ~ non-display area

L ~ straight line

L ' ~ tangent line

Embodiment

With reference to Fig. 2, the device substrate 100 of its display the utility model one embodiment, comprises substrate 110, metal level 120 and a flatness layer 130.Metal level 120 is positioned on this substrate 110, and wherein this metal level 120 has one first width L along a first direction X ₁.Flatness layer 130 is positioned on this metal level 120, wherein this flatness layer 130 has a contact hole 131, this contact hole 131 has continuous wall 132 and a bottom surface 133, and this bottom surface 133 exposes this metal level 120, and wherein this bottom surface 133 has one second width L along this first direction X ₂.

Applicant finds, liquid crystal molecule arranges along continuous wall 132, and penetrance (contrast under dark-state) changes with the slope gradual change of continuous wall 132.When the tangent slope of continuous wall 132 approximates tan10 °, can not there is serious light leak condition in liquid crystal molecule herein, therefore can not reduce the contrast of liquid crystal indicator.With regard to the angle in design, covering of metal level 120 pairs of contact holes 131, only need to reach the position in critical point 136, the tangent slope being equivalent to continuous wall 132 approximates the position of tan10 °, the aperture opening ratio of liquid crystal indicator and transmittance (contrast under dark-state) namely reach optimized state, to accord with the demands of the market.

Refer again to Fig. 2, applicant is learnt by the derivation of curve equation, and when this first width and the second width need meet following formula, the aperture opening ratio of liquid crystal indicator and transmittance can reach optimized state:

$2*\{\frac{L_2}{2}+\frac{0.95h}{\ln \left(0.05\right)\&CenterDot;\tan \left(1.5\mathrm{\&theta;}\right)}\&CenterDot;\ln [\frac{-0.1672}{\ln \left(0.05\right)\&CenterDot;\tan \left(1.5\mathrm{\&theta;}\right)}\left]\right\}-1.8\&le;L_1\&le;2*\{\frac{L_2}{2}+\frac{0.95h}{\ln \left(0.05\right)\&CenterDot;\tan \left(1.5\mathrm{\&theta;}\right)}\&CenterDot;\ln [\frac{-0.1672}{\ln \left(0.05\right)\&CenterDot;\tan \left(1.5\mathrm{\&theta;}\right)}\left]\right\}+1.8$

Wherein, L ₁for this metal level 120 is along this first width of this first direction X, L ₂for the bottom surface of this contact hole 131 is along this second width of this first direction X, h is the thickness of this flatness layer 130, θ is the angle of an extended surface of a straight line L between a preset reference point 134 of continuous wall 132 and a basic point 135 and this bottom surface, wherein, this preset reference point 134 is positioned on this continuous wall 132, and this preset reference point 134 is 0.95h with the vertical range of this bottom surface, this basic point 135 is the position, boundary of this continuous wall 132 and this bottom surface 133.Wherein, ± 1.8 is tolerance allowable value in manufacture craft.According to the adjustment of above-mentioned each parameter, curvature and the shape of continuous wall 132 can moderate change.

With reference to Fig. 2, the derivation of curve equation is as follows:

The first step, curve equation matching (hypothesis), supposes that this contact hole meets following formula from the inclined-plane equation of continuous wall

y＝f(x)＝-A’exp(-x).....(1)

By in equation (1), be only define the asymptote of this contact hole from continuous wall, therefore equation (1) need correct x and y

Second step, curve equation matching (correcting by preset reference point 134, basic point 135 and angle θ), the preset reference point 134 supposing on slope be the p of the degree of depth total depth h at distance flatness layer top doubly, and meet f (R ') relational expression, wherein, this preset reference point 134 is R ' apart from the horizontal range of basic point 135, then

$\begin{array}{c}f\left(R^{\&prime;}\right)=-\mathrm{ph}=-\mathrm{hexp}\left(\frac{-R^{\&prime;}}{\mathrm{\&alpha;}}\right)\\ \&DoubleRightArrow;\mathrm{\&alpha;}=\frac{-R^{\&prime;}}{\ln \left(p\right)}.....\left(1\right);p>0,h>0,R^{\&prime;}>0...\left(2\right)\end{array}$

Obtain correction parameter α

3rd step, the line shape L in line of preset reference point 134 and basic point 135, this straight line L be θ relative to horizontal angle

$\begin{array}{c}\tan \mathrm{\&theta;}=\frac{(1-p)h}{R^{\&prime;}}\\ \&DoubleRightArrow;R^{\&prime;}=\frac{(1-p)h}{\tan \mathrm{\&theta;}}\end{array}...\left(3\right)$

Introduce material characteristics θ

4th step, apart from 0.05 times of the degree of depth total depth h at flatness layer top, formula (2) and formula (3) simultaneous can obtain

$\mathrm{\&alpha;}=\frac{-R^{\&prime;}}{\ln \left(0.05\right)}=\frac{-0.95h}{\ln \left(0.05\right)\&CenterDot;\tan \mathrm{\&theta;}}.....\left(4\right)$

Obtain correction parameter α

5th step, because of determine tangent line L ' that the angle of flatness layer 130 curve should be basic point 135 with relative to horizontal angle β, and rough 1.5 θ that equal of angle β, therefore need to correct (to angularity correction) to curve equation again, then can obtain

$\begin{array}{c}f\left(R^{\&prime;}\right)=-h\&CenterDot;\exp \{-R^{\&prime;}/\mathrm{\&alpha;}\}=-h\&CenterDot;\exp \{R^{\&prime;}\&CenterDot;\frac{\ln \left(0.05\right)\&CenterDot;\tan \mathrm{\&beta;}}{0.95h}\}\\ =-h\&CenterDot;\exp \{R^{\&prime;}\&CenterDot;\frac{\ln \left(0.05\right)\&CenterDot;\tan \left(1.5\mathrm{\&theta;}\right)}{0.95h}\end{array}.....\left(5\right)$

Contact hole fitting equation

6th step, wherein R=R ₀+ R ', and take back full scale equation Shi Ke get

∵ R'=R-R ₀.... (translation)

$\begin{array}{c}\&DoubleRightArrow;f\left(R^{\&prime;}\right)=-h\&CenterDot;\exp \{-(R-R_0)/\mathrm{\&alpha;}\}\\ =-h\&CenterDot;\exp \{(R-R_0)\&CenterDot;\frac{\ln \left(0.05\right)\&CenterDot;\tan \left(1.5\mathrm{\&theta;}\right)}{0.95h}\}\end{array}.....\left(6\right)$

Contact hole actual curve equation

7th step, push away metal level 120 along the half of this second width of this first direction

Because having error in the process of manufacture craft, and ± 1.8 is tolerance allowable value in manufacture craft, and the whole above-mentioned formula that therefore converges can obtain the aperture opening ratio of liquid crystal indicator and transmittance can reach optimized state equation:

$2*\{\frac{L_2}{2}+\frac{0.95h}{\ln \left(0.05\right)\&CenterDot;\tan \left(1.5\mathrm{\&theta;}\right)}\&CenterDot;\ln [\frac{-0.1672}{\ln \left(0.05\right)\&CenterDot;\tan \left(1.5\mathrm{\&theta;}\right)}\left]\right\}-1.8\&le;L_1\&le;2*\{\frac{L_2}{2}+\frac{0.95h}{\ln \left(0.05\right)\&CenterDot;\tan \left(1.5\mathrm{\&theta;}\right)}\&CenterDot;\ln [\frac{-0.1672}{\ln \left(0.05\right)\&CenterDot;\tan \left(1.5\mathrm{\&theta;}\right)}\left]\right\}+1.8$

In one embodiment, this angle theta is between 20 ~ 40 degree, and such as, this angle theta is between 25 ~ 35 degree.

With reference to Fig. 2, device substrate 100 also comprises a conductive layer 140 and is positioned on this flatness layer 130, and is electrically connected with this metal level 120 by this contact hole 131.This conductive layer 140 can be transparent conductive material or metal material.

This metal level 120 can be source electrode or the drain electrode of a driving element.In one embodiment, device substrate 100 also comprises semi-conductor layer 137 between this metal level 120 and this substrate 110.The material of this semiconductor layer 137 can be polycrystalline silicon material, amorphous silicon material or metal oxide materials.

With reference to Fig. 3 A, the device substrate of the utility model embodiment is applied to a liquid crystal indicator 200, and it comprises a viewing area (pixel region) A and non-display area B.With reference to Fig. 3 B, the thin portion element of the 3B part in its display Fig. 3 A, liquid crystal indicator 200 also comprises sweep trace 201, signal wire 202, semiconductor layer 203, source electrode 240, contact hole 231, the bottom surface 233 of contact hole, drain electrode 204, common electrode 205 and pixel electrode 210 etc. element in the A of viewing area.In the utility model embodiment, this metal level 120 comprises source electrode 240, drain electrode 204, sweep trace 201 and signal wire 202.

Refer again to Fig. 2, in another embodiment, this metal level 120 has one first edge 121 along first direction X, the outline line of continuous wall 132 on a vertical cross-section is curve, this first edge 121 is to should the critical point 136 of outline line in a vertical direction, and the tangent slope of this outline line in this critical point 136 is less than 0.176 (tan10 °).Similar in appearance to previous embodiment, one basic point 135 is positioned at this continuous wall 132 and the boundary position of this bottom surface 133 on this vertical cross-section, this basic point 135 is positioned on a straight line L with this preset reference point 134, θ is the angle of this straight line L and a surface level, wherein this angle theta is between 20 ~ 40 degree, such as, this angle theta is between 25 ~ 35 degree.This metal level 120 has one first width L along first direction X ₁, wherein this bottom surface 133 has the second width L along this first direction X ₂, wherein, this first width L ₁with the second width L ₂following formula need be met:

$2*\{\frac{L_2}{2}+\frac{(1-p)h}{\ln \left(p\right)\&CenterDot;\tan \left(1.5\mathrm{\&theta;}\right)}\&CenterDot;\ln [\frac{-0.176*(1-p)}{\ln \left(p\right)\&CenterDot;\tan \left(1.5\mathrm{\&theta;}\right)}\left]\right\}=L_1$

Wherein, L ₁for this second metal level is along this first width of this first direction, L ₂for the bottom surface of this contact hole is along this second width of this first direction, p is adjustable parameters, θ is the angle of a straight line between a preset reference point of continuous wall and a basic point and surface level, wherein, this preset reference point is this basal surface position of distance on this continuous wall, and (1-p) h is the height of this preset reference point in this vertical direction, 0<p≤0.1, such as, 0<p≤0.05.According to the adjustment of above-mentioned each parameter, curvature and the shape of continuous wall 132 can moderate change.

Although in the above-described embodiments, contact hole is positioned among viewing area (pixel region) A, but above-mentioned disclosing does not limit the utility model.Contact hole structure of the present utility model also can be used among non-display area B.Such as, with reference to Fig. 4, in one embodiment, conductive layer 140 in contact hole 131 ' of the present utility model can connection signal line 202, and above-mentioned formula between the width of the profile of contact hole 131 ' and signal wire 202, can be met, and by flatness layer 130 and the contact hole 131 on gate insulation layer 222 " be connected sweep trace 201, wherein contact hole 131 " profile and the width of sweep trace 201 between can meet above-mentioned formula.In the above-described embodiments, gate insulation layer 222 is formed between signal wire 202 and sweep trace 201.

With reference to Fig. 5, the liquid crystal indicator 200 of its display application the utility model embodiment, comprises device substrate 100, liquid crystal layer 250 and subtend substrate 260.

With reference to following deck watch 1 and Fig. 6, from following deck watch and Fig. 6, according to the default metal level of the utility model embodiment (M2) 120 width, in the mill, the technologic error of actual fabrication is had to fall into ± tolerance the permissible range of 1.8.

Deck watch 1

Apply embodiment of the present utility model, the aperture opening ratio of liquid crystal indicator and transmittance (contrast under dark-state) can reach optimized state, avoid the generation of the problem such as light leak and contrast reduction.

Claims (18)

1. a device substrate, is characterized in that, this device substrate comprises:

Substrate;

Metal level, is positioned on this substrate, and wherein this metal level has one first width along a first direction; And

Flatness layer, be positioned on this metal level, wherein this flatness layer has a contact hole, and this contact hole has continuous wall and a bottom surface, and this bottom surface exposes this metal level, and wherein this bottom surface has one second width along this first direction,

Wherein, this first width and the second width meet following formula:

Wherein, L ₁for this metal level is along this first width of this first direction, L ₂for the bottom surface of this contact hole is along this second width of this first direction, h is the thickness of this flatness layer, θ is the angle of an extended surface of a straight line between a preset reference point of continuous wall and a basic point and this bottom surface, wherein, this preset reference point is positioned on this continuous wall, and the vertical range of this preset reference point and this bottom surface is 0.95h, this basic point is the position, boundary of this continuous wall and this bottom surface, p is adjustable parameters, (1-p) h is the height of this preset reference point in this vertical direction, 0<p≤0.1.

2. device substrate as claimed in claim 1, it is characterized in that, this adjustable parameters p is 0.05.

3. device substrate as claimed in claim 1, it is characterized in that, this angle theta is between 20 ~ 40 degree.

4. device substrate as claimed in claim 1, it is characterized in that, this angle theta is between 25 ~ 35 degree.

5. device substrate as claimed in claim 1, it is characterized in that, this device substrate also comprises conductive layer, is positioned on this flatness layer, and is electrically connected with this metal level by this contact hole.

6. device substrate as claimed in claim 1, it is characterized in that, this metal level is source electrode or the drain electrode of a driving element.

7. device substrate as claimed in claim 1, it is characterized in that, this metal level is signal wire or the sweep trace of a driving element.

8. device substrate as claimed in claim 5, it is characterized in that, this conductive layer is a transparent material.

9. device substrate as claimed in claim 1, it is characterized in that, this device substrate also comprises semiconductor layer, between this metal level and this substrate.

10. device substrate as claimed in claim 9, it is characterized in that, the material of this semiconductor layer is polysilicon, amorphous silicon or metal oxide.

11. device substrates as claimed in claim 5, it is characterized in that, this conductive layer is a metal material.

12. 1 kinds of liquid crystal indicators, is characterized in that, this liquid crystal indicator comprises:

Subtend substrate;

Device substrate, relative to this subtend substrate;

Liquid crystal layer, is positioned between this subtend substrate and a device substrate; Wherein, this device substrate comprises:

Metal level, is positioned on this substrate, and is positioned among a pixel region, and wherein this metal level has one first width along a first direction; And

Flatness layer, be positioned on this metal level, wherein this flatness layer has a contact hole, and this contact hole has continuous wall and bottom surface, and this bottom surface exposes this metal level, and wherein this bottom surface has one second width along this first direction,

Wherein, this first width and the second width need meet following formula:

Wherein, L ₁for this metal level is along this first width of this first direction, L ₂for the bottom surface of this contact hole is along this second width of this first direction, h is the thickness of this flatness layer, θ is the angle of a straight line between a preset reference point of continuous wall and a basic point and surface level, wherein, this preset reference point is this basal surface position of distance on this continuous wall, and this basic point is the position, boundary of this continuous wall and this bottom surface, and p is adjustable parameters, (1-p) h is the height of this preset reference o'clock in a vertical direction, 0<p≤0.1.

13. liquid crystal indicators as claimed in claim 12, it is characterized in that, this adjustable parameters p is 0.05.

14. liquid crystal indicators as claimed in claim 12, it is characterized in that, this angle theta is between 20 ~ 40 degree.

15. liquid crystal indicators as claimed in claim 12, it is characterized in that, this angle theta is between 25 ~ 35 degree.

16. liquid crystal indicators as claimed in claim 12, it is characterized in that, this liquid crystal indicator also comprises conductive layer, is positioned on this flatness layer, and is electrically connected with this metal level by this contact hole.

17. liquid crystal indicators as claimed in claim 12, it is characterized in that, this liquid crystal indicator also comprises semiconductor layer, between this metal level and this substrate.

18. liquid crystal indicators as claimed in claim 17, is characterized in that, the material of this semiconductor layer is polysilicon, amorphous silicon or metal oxide.