CN204177747U - Planar materials surface defect detection apparatus and detection module thereof - Google Patents
Planar materials surface defect detection apparatus and detection module thereof Download PDFInfo
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- CN204177747U CN204177747U CN201420338667.8U CN201420338667U CN204177747U CN 204177747 U CN204177747 U CN 204177747U CN 201420338667 U CN201420338667 U CN 201420338667U CN 204177747 U CN204177747 U CN 204177747U
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Abstract
The utility model discloses a kind of planar materials surface defect detection apparatus, comprise main body frame, be arranged on the linear light sorurce on main body frame and be arranged at least one detection module on main body frame; Main body frame comprises two root posts being positioned at both sides and the crossbeam be fixedly mounted on two root posts, and crossbeam is provided with sliding guide; Detection module comprises the mount pad be slidably installed on sliding guide, mount pad is provided with the ccd image sensor and dot matrix type laser instrument that lay respectively at crossbeam both sides; Two root posts are respectively equipped with linear light sorurce mount pad, the two ends of linear light sorurce are arranged on two linear light sorurce mount pads respectively, and are provided with for linear adjustment light source at the governor motion perpendicular to the position on the direction of crossbeam between linear light sorurce mount pad and linear light sorurce.The defects detection that planar materials surface defect detection apparatus of the present utility model can realize planar materials surface in the mode of all standing.
Description
Technical field
The utility model belongs to surface defects detection technical field, is specifically related to a kind of pick-up unit and detection module thereof of the surface imperfection for detection plane material.
Background technology
In recent years, along with extensive introduction and the transformation of semi-automatic, automatic production line, add the iterative method of cooperation between school and enterprise and the support energetically of local policy, the process for producing of planar materials has been injected into scientific and technological new blood, and product quality is significantly enhanced.But at quality monitoring management aspect, increase productivity because it not only can not be directly used in, but also can reduce the yield rate of product, the development process of relevant robotization and Intellectualized monitoring management equipment is very slow.Especially, in surface defects detection, nearly all relying on manual observation or the mode of sampling Detection to carry out, cannot meet the demands.According to statistics, the quality objection occurred in recent years and the quality complain overwhelming majority are relevant surface imperfection problems, illustrate that manual detection also exists very large hidden danger of quality.
The production run of planar materials mostly will be dissolved through raw material, stretch the processing steps such as extruding and cooling and shaping, is all with lamellar morphology through multiple roller bearing on a production line, finally carries out rolling with the form of axle volume.Due to insufficient, many technical factors such as slurry feed is uneven and roller surface is rough that raw material dissolves in production run, the surface of planar materials there will be the defects such as particle point, crackle, cut, hole, bubble, crystallization, skin lamination, color spot and pit.These defects have impact in various degree to the wearing quality of material, fatigue resistence, the key property such as corrosion resistivity and electromagnetic property.In the production of some planar materials, such as steel, surface imperfection not only easily causes the generation of the serious industrial accident such as broken belt, the parking of heap sum, but also meeting heavy wear roll, economic and social impacts difficult to the appraisal is caused to manufacturing enterprise.
Although planar materials huge number, but the pattern of surface imperfection is roughly the same, all there is same characteristic features from the angle of digital picture, therefore in the research and development of detection system, completely likely realize the better system of versatility, instead of only for certain homogenous material.
In addition, planar materials speed of production is very fast, and product length is longer, the defect that surface exists has that area is little, sensing range and flaw size ratio comparatively greatly, scatter the outstanding features such as uneven.And according to the difference of material, purposes and production equipment, its width to be checked also has very big-difference, and accuracy requirement is also not quite similar, therefore need to design a kind of planar materials surface defect detection apparatus realizing large scale and high accuracy.
Summary of the invention
In view of this, the utility model is intended to propose a kind of planar materials surface defect detection apparatus and detection module thereof, the defects detection that this surface defect detection apparatus can realize planar materials surface in the mode of all standing.
Realize above-mentioned technical purpose, the utility model first proposed a kind of planar materials surface defects detection module, comprising mount pad, described mount pad being provided with for the ccd image sensor to planar materials surface imaging with for demarcating the dot matrix type laser instrument of view data that described ccd image sensor gathers.
Further, described ccd image sensor and dot matrix type laser instrument lay respectively at the both sides of described mount pad.
Further, described mount pad is provided with the slide opening for coordinating with sliding guide.
Further, described ccd image sensor and/or dot matrix type laser instrument rotatable engagement are arranged on described mount pad, and the axis being parallel of the rotation of described ccd image sensor and/or dot matrix type laser instrument and described slide opening.
The utility model also proposed a kind of planar materials surface defect detection apparatus, comprises main body frame, is arranged on the linear light sorurce on described main body frame and is arranged at least one detection module as above on described main body frame;
Described main body frame comprises two root posts being positioned at both sides and the crossbeam be fixedly mounted on two described columns, and described crossbeam is provided with the sliding guide coordinated with described slide opening;
Two described columns are respectively equipped with linear light sorurce mount pad, the two ends of described linear light sorurce are arranged on two described linear light sorurce mount pads respectively, and are provided with the governor motion for regulating the position of described linear light sorurce on the direction perpendicular to described crossbeam between described linear light sorurce mount pad and described linear light sorurce.
Further, described governor motion comprises the linear light sorurce regulating tank be arranged on described linear light sorurce mount pad, be provided with linear light sorurce adjuster bar in described linear light sorurce regulating tank, the two ends of described linear light sorurce are slidably installed respectively on described linear light sorurce adjuster bar; Described linear light sorurce and described dot matrix type laser instrument are positioned at the same side of described crossbeam.
Further, the retention mechanism I for fixing described linear light sorurce position is provided with between described linear light sorurce and described linear light sorurce mount pad.
Further, described sliding guide is arranged in parallel two, described slide opening correspondence is set to two, and described mount pad is slidably installed on two described sliding guides, and is provided with the retention mechanism II for fixing described mount pad position between described mount pad and described sliding guide.
Further, described crossbeam is also provided with Rodless cylinder I that is parallel with described sliding guide and that arrange with described detection module one_to_one corresponding, and described mount pad be fixedly mounted on described Rodless cylinder I slide block on and be slidably matched with described sliding guide; The length sum of all described Rodless cylinders I is less than or equal to the length of described crossbeam, and all described Rodless cylinders I are isometric and be located on the same line;
Described linear light sorurce adjuster bar is be arranged on the Rodless cylinder II in described linear light sorurce regulating tank, and the two ends of described linear light sorurce are arranged on the slide block of two described Rodless cylinders II respectively.
Further, described crossbeam is provided with the displacement transducer I for detecting described mount pad position, and described linear light sorurce mount pad is provided with the displacement transducer II for detecting described linear light sorurce position;
Also comprise control system, the image processing apparatus that described control system comprises controller and is electrically connected with described controller, the gas circuit of described Rodless cylinder I and Rodless cylinder II is respectively equipped with solenoid directional control valve I and solenoid directional control valve II, described controller is electrically connected with institute displacement sensors I, displacement transducer II, solenoid directional control valve I and solenoid directional control valve II respectively, and described image processing apparatus is electrically connected with described ccd image sensor.
The beneficial effects of the utility model are:
Planar materials surface defects detection module of the present utility model, by arranging ccd image sensor and dot matrix type laser instrument, during detection, utilize ccd image sensor to the surperficial imaging of planar materials, and by image data transmission to image detection device process, analyze the surface imperfection of planar materials, by set-point formation laser instrument, dot matrix type laser instrument is utilized to get row's laser dot-matrix at planar materials, can demarcate the view data of ccd image sensor collection, this is that coordinated between multiple detection module creates condition.
Two root posts, by arranging main body frame, can be stood in the both sides of planar materials by planar materials surface defect detection apparatus of the present utility model in use, convenient installation; By arranging linear light sorurce, for providing illumination when detecting, by arranging at least one detection module on sliding guide, when detecting, when a detection module cannot overlay planes material time, the quantity of detection module can be set up easily, and in conjunction with the coordinated between the ccd image sensor of each detection module and the sensing range of dot matrix type laser instrument, can realize detecting all standing on planar materials surface.
The coordinated principle of multiple detection modules of planar materials surface defect detection apparatus of the present utility model is: by ccd image sensor acquisition of image data, and utilizes dot matrix type laser instrument to demarcate view data; According to the coordinate position of laser facula in gathered image of dot matrix type laser instrument, find the difference of the scanning position of each detection module on planar materials, the triggered time of each detection module is coordinated, what achieve in each detection module image scanning is synchronous, and identify the scan registration surveyed area of adjacent detection module on planar materials, on the basis of single detection module acquisition of image data calibration, determine the position of surveyed area in planar materials overall width that each module detects.
Accompanying drawing explanation
In order to make the purpose of this utility model, technical scheme and beneficial effect clearly, the utility model provides following accompanying drawing to be described:
Fig. 1 is the structural representation of the utility model planar materials surface defects detection module embodiments.
Fig. 2 is the structural representation of the utility model planar materials surface defect detection apparatus first embodiment;
Fig. 3 is the vertical view of Fig. 2;
Fig. 4 is the side view of Fig. 2;
Fig. 5 is the stereographic map of the present embodiment planar materials surface defect detection apparatus;
Fig. 6 is the theory diagram of the control system of the utility model planar materials surface defect detection apparatus second embodiment.
Embodiment
Below in conjunction with accompanying drawing, embodiment of the present utility model is elaborated.
first embodiment
As shown in Figure 1, be the structural representation of the utility model planar materials surface defects detection module embodiments.The planar materials surface defects detection module of the present embodiment, comprises mount pad 4, mount pad 4 is provided with for the ccd image sensor 5 to planar materials surface imaging with for demarcating the dot matrix type laser instrument 6 of view data that ccd image sensor 5 gathers.
Preferably, the ccd image sensor 5 of the present embodiment and dot matrix type laser instrument 6 lay respectively at the both sides of mount pad 4, and mount pad 4 is provided with the slide opening for coordinating with sliding guide 3, convenient installation.
Preferably, ccd image sensor 5 and/or dot matrix type laser instrument 6 rotatable engagement are arranged on mount pad 4, and the rotation of ccd image sensor 5 and/or dot matrix type laser instrument 6 and the axis being parallel of slide opening, ccd image sensor 5 rotatable engagement of the present embodiment is arranged on mount pad 4, be convenient to the image-capture field regulating ccd image sensor 5, the image-capture field of ccd image sensor 5 and the image calibration scope of dot matrix type laser instrument 6 are overlapped.
The planar materials surface defects detection module of the present embodiment, by arranging ccd image sensor 5 and dot matrix type laser instrument 6, during detection, utilize the surperficial imaging of ccd image sensor 5 pairs of planar materials, and by image data transmission to image detection device process, analyze the surface imperfection of planar materials, by set-point formation laser instrument 6, dot matrix type laser instrument 6 is utilized to get row's laser dot-matrix at planar materials, can demarcate the view data that ccd image sensor 5 gathers, this is that coordinated between multiple detection module creates condition.
second embodiment
As shown in Figure 1, be the structural representation of the utility model planar materials surface defect detection apparatus first embodiment.The planar materials surface defect detection apparatus of the present embodiment, comprise main body frame, be arranged on the linear light sorurce on main body frame and be arranged at least one detection module as in the first embodiment on main body frame, the detection module of the present embodiment is set to one.Main body frame comprises two root posts 1 being positioned at both sides and the crossbeam 2 be fixedly mounted on two root posts 1, and crossbeam 2 is provided with the sliding guide 3 coordinated with slide opening.Two root posts 1 are respectively equipped with linear light sorurce mount pad 7, the two ends of linear light sorurce 8 are arranged on two linear light sorurce mount pads 7 respectively, and are provided with the governor motion for the position of linear adjustment light source 8 on the direction perpendicular to crossbeam 2 between linear light sorurce mount pad 7 and linear light sorurce 8.The ccd image sensor 5 of the present embodiment is high resolving power high speed linear array CCD, and the linear light sorurce 8 of the present embodiment is high brightness linear light sorurce.Linear light sorurce 8 and the dot matrix type laser instrument 6 of the present embodiment are positioned at the same side of crossbeam 2, are convenient to the surface of illumination plane material and demarcate the view data of ccd image sensor 5 collection.Be equipped with Shockproof rubber pad between joint face between each joint face of the main body frame of the present embodiment and between main body frame and planar materials production line, effectively can avoid vibrations.
The governor motion of the present embodiment comprises the linear light sorurce regulating tank 9 be arranged on linear light sorurce mount pad 7, is provided with linear light sorurce adjuster bar 10 in linear light sorurce regulating tank 9, and the two ends of linear light sorurce 8 are slidably installed respectively on linear light sorurce adjuster bar 10.And the retention mechanism I be provided with between linear light sorurce 8 and linear light sorurce mount pad 7 for fixed linear light source 8 position, the retention mechanism I of the present embodiment is for being arranged on the trip bolt 11 coordinated on linear light sorurce 8 and with linear light sorurce mount pad 7.
The sliding guide 3 of the present embodiment is arranged in parallel two, slide opening is corresponding with sliding guide 3 is set to two, mount pad 4 is slidably installed on two sliding guides 3, and is provided with the retention mechanism II for fixed mounting 4 position between mount pad 4 and sliding guide 3.The retention mechanism II of the present embodiment is for being arranged on the trip bolt 12 coordinated on mount pad 4 and with sliding guide 3.
Two root posts 1, by arranging main body frame, can be stood in the both sides of planar materials by the planar materials surface defect detection apparatus of the present embodiment in use, convenient installation; By arranging linear light sorurce 8, for providing illumination when detecting, by arranging at least one detection module on sliding guide 3, when detecting, when a detection module cannot overlay planes material time, the quantity of detection module can be set up easily, and in conjunction with the coordinated between the ccd image sensor 5 of each detection module and the sensing range of dot matrix type laser instrument 6, can realize detecting all standing on planar materials surface.
The coordinated principle of multiple detection modules of the planar materials surface defect detection apparatus of the present embodiment is: by ccd image sensor 5 acquisition of image data, and utilizes dot matrix type laser instrument 6 pairs of view data to demarcate; According to the coordinate position of laser facula in gathered image of dot matrix type laser instrument 6, find the difference of the scanning position of each detection module on planar materials, the triggered time of each detection module is coordinated, what achieve in each detection module image scanning is synchronous, and identify the scan registration surveyed area of adjacent detection module on planar materials, on the basis of single detection module acquisition of image data calibration, determine the position of surveyed area in planar materials overall width that each module detects.
3rd embodiment
As shown in Figure 5, be the theory diagram of the control system of the utility model planar materials surface defect detection apparatus second embodiment.The planar materials surface defect detection apparatus of the present embodiment, comprises main body frame, is arranged on the linear light sorurce on main body frame and is arranged at least one detection module as in the first embodiment on main body frame.Main body frame comprises two root posts 1 being positioned at both sides and the crossbeam 2 be fixedly mounted on two root posts 1, and crossbeam 2 is provided with the sliding guide 3 coordinated with slide opening.Two root posts 1 are respectively equipped with linear light sorurce mount pad 7, the two ends of linear light sorurce 8 are arranged on two linear light sorurce mount pads 7 respectively, and are provided with the governor motion for the position of linear adjustment light source 8 on the direction perpendicular to crossbeam 2 between linear light sorurce mount pad 7 and linear light sorurce 8.The ccd image sensor 5 of the present embodiment is high resolving power high speed linear array CCD, and the linear light sorurce 8 of the present embodiment is high brightness linear light sorurce.Linear light sorurce 8 and the dot matrix type laser instrument 6 of the present embodiment are positioned at the same side of crossbeam 2, are convenient to the surface of illumination plane material and demarcate the view data of ccd image sensor 5 collection.
The crossbeam 2 of the present embodiment is also provided with Rodless cylinder I 13 that is parallel with sliding guide 3 and that arrange with detection module one_to_one corresponding, and mount pad 4 be fixedly mounted on Rodless cylinder I 13 slide block on and be slidably matched with sliding guide 3.The length sum of all Rodless cylinders I 13 is less than or equal to the length of crossbeam 2, and all Rodless cylinders I 13 are isometric and be located on the same line.The detection module of the present embodiment is set to 3, and the length of three Rodless cylinders I 13 is equal, and the length sum of three Rodless cylinders I 13 equals the length of crossbeam 2.
The governor motion of the present embodiment comprises the linear light sorurce regulating tank 9 be arranged on linear light sorurce mount pad 7, is provided with linear light sorurce adjuster bar 10 in linear light sorurce regulating tank 9, and the two ends of linear light sorurce 8 are slidably installed respectively on linear light sorurce adjuster bar 10.The linear light sorurce adjuster bar 10 of the present embodiment is for being arranged on the Rodless cylinder II in linear light sorurce regulating tank 9, and the two ends of linear light sorurce 8 are arranged on the slide block of two Rodless cylinders II respectively.
Preferably, crossbeam 2 is provided with the displacement transducer I 14 for detecting mount pad 4 position, and linear light sorurce mount pad 7 is provided with the displacement transducer II 15 for detecting linear light sorurce 8 position, can the position of monitor and detection module and linear light sorurce 8 in real time.
Further, the planar materials surface defect detection apparatus of the present embodiment also comprises control system, the image processing apparatus 17 that control system comprises controller 16 and is electrically connected with controller 16, the gas circuit of Rodless cylinder I 13 and Rodless cylinder II is respectively equipped with solenoid directional control valve I 18 and solenoid directional control valve II 19, controller 16 is electrically connected with displacement transducer I 14, displacement transducer II 15, solenoid directional control valve I 16 and solenoid directional control valve II 17 respectively, and image processing apparatus 17 is electrically connected with ccd image sensor 5.
When the wider width of planar materials, need to utilize multiple detection module cooperation detection could realize all standing and detect.Now according to the regional extent of the detection of each detection module, controller 16 controls the position of each detection module respectively by solenoid directional control valve I 18 and Rodless cylinder I 13, to reach the object that all standing detects; In addition, according to the requirement detecting illumination, controller 16 can the position of linear adjustment light source 8 easily by solenoid directional control valve II 19 and Rodless cylinder II, has reached better illuminating effect.
Two root posts 1, by arranging main body frame, can be stood in the both sides of planar materials by the planar materials surface defect detection apparatus of the present embodiment in use, convenient installation; By arranging linear light sorurce 8, for providing illumination when detecting, by arranging at least one detection module on sliding guide 3, when detecting, when a detection module cannot overlay planes material time, the quantity of detection module can be set up easily, and in conjunction with the coordinated between the ccd image sensor 5 of each detection module and the sensing range of dot matrix type laser instrument 6, can realize detecting all standing on planar materials surface.
The coordinated principle of multiple detection modules of the planar materials surface defect detection apparatus of the present embodiment is: by ccd image sensor 5 acquisition of image data, and utilizes dot matrix type laser instrument 6 pairs of view data to demarcate; According to the coordinate position of laser facula in gathered image of dot matrix type laser instrument 6, find the difference of the scanning position of each detection module on planar materials, the triggered time of each detection module is coordinated, what achieve in each detection module image scanning is synchronous, and identify the scan registration surveyed area of adjacent detection module on planar materials, on the basis of single detection module acquisition of image data calibration, determine the position of surveyed area in planar materials overall width that each module detects.
What finally illustrate is, above preferred embodiment is only in order to illustrate the technical solution of the utility model and unrestricted, although be described in detail the utility model by above preferred embodiment, but those skilled in the art are to be understood that, various change can be made to it in the form and details, and not depart from the utility model claims limited range.
Claims (10)
1. a planar materials surface defects detection module, it is characterized in that: comprise mount pad, described mount pad being provided with for the ccd image sensor to planar materials surface imaging with for demarcating the dot matrix type laser instrument of view data that described ccd image sensor gathers.
2. planar materials surface defects detection module according to claim 1, is characterized in that: described ccd image sensor and dot matrix type laser instrument lay respectively at the both sides of described mount pad.
3. planar materials surface defects detection module according to claim 1 and 2, is characterized in that: described mount pad is provided with the slide opening for coordinating with sliding guide.
4. planar materials surface defects detection module according to claim 3, it is characterized in that: described ccd image sensor and/or dot matrix type laser instrument rotatable engagement are arranged on described mount pad, and the axis being parallel of the rotation of described ccd image sensor and/or dot matrix type laser instrument and described slide opening.
5. a planar materials surface defect detection apparatus, is characterized in that: at least one detection module as described in claim 3 or 4 comprising main body frame, be arranged on the linear light sorurce on described main body frame and be arranged on described main body frame;
Described main body frame comprises two root posts being positioned at both sides and the crossbeam be fixedly mounted on two described columns, and described crossbeam is provided with the sliding guide coordinated with described slide opening;
Two described columns are respectively equipped with linear light sorurce mount pad, the two ends of described linear light sorurce are arranged on two described linear light sorurce mount pads respectively, and are provided with the governor motion for regulating the position of described linear light sorurce on the direction perpendicular to described crossbeam between described linear light sorurce mount pad and described linear light sorurce.
6. planar materials surface defect detection apparatus according to claim 5, it is characterized in that: described governor motion comprises the linear light sorurce regulating tank be arranged on described linear light sorurce mount pad, be provided with linear light sorurce adjuster bar in described linear light sorurce regulating tank, the two ends of described linear light sorurce are slidably installed respectively on described linear light sorurce adjuster bar; Described linear light sorurce and described dot matrix type laser instrument are positioned at the same side of described crossbeam.
7. planar materials surface defect detection apparatus according to claim 6, is characterized in that: be provided with the retention mechanism I for fixing described linear light sorurce position between described linear light sorurce and described linear light sorurce mount pad.
8. the planar materials surface defect detection apparatus according to claim 6 or 7, it is characterized in that: described sliding guide is arranged in parallel two, described slide opening correspondence is set to two, described mount pad is slidably installed on two described sliding guides, and is provided with the retention mechanism II for fixing described mount pad position between described mount pad and described sliding guide.
9. planar materials surface defect detection apparatus according to claim 8, it is characterized in that: described crossbeam is also provided with Rodless cylinder I that is parallel with described sliding guide and that arrange with described detection module one_to_one corresponding, and described mount pad be fixedly mounted on described Rodless cylinder I slide block on and be slidably matched with described sliding guide; The length sum of all described Rodless cylinders I is less than or equal to the length of described crossbeam, and all described Rodless cylinders I are isometric and be located on the same line;
Described linear light sorurce adjuster bar is be arranged on the Rodless cylinder II in described linear light sorurce regulating tank, and the two ends of described linear light sorurce are arranged on the slide block of two described Rodless cylinders II respectively.
10. planar materials surface defect detection apparatus according to claim 9, it is characterized in that: described crossbeam is provided with the displacement transducer I for detecting described mount pad position, described linear light sorurce mount pad is provided with the displacement transducer II for detecting described linear light sorurce position;
Also comprise control system, the image processing apparatus that described control system comprises controller and is electrically connected with described controller, the gas circuit of described Rodless cylinder I and Rodless cylinder II is respectively equipped with solenoid directional control valve I and solenoid directional control valve II, described controller is electrically connected with institute displacement sensors I, displacement transducer II, solenoid directional control valve I and solenoid directional control valve II respectively, and described image processing apparatus is electrically connected with described ccd image sensor.
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