CN204116459U - A kind of dielectric resonator measuring superconducting film material microwave surface impedance - Google Patents
A kind of dielectric resonator measuring superconducting film material microwave surface impedance Download PDFInfo
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- CN204116459U CN204116459U CN201420523178.XU CN201420523178U CN204116459U CN 204116459 U CN204116459 U CN 204116459U CN 201420523178 U CN201420523178 U CN 201420523178U CN 204116459 U CN204116459 U CN 204116459U
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- shielding cavity
- set collar
- sample set
- cavity
- metal substrate
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- 239000000463 material Substances 0.000 title claims abstract description 13
- 239000002184 metal Substances 0.000 claims abstract description 28
- 239000000758 substrate Substances 0.000 claims abstract description 27
- 230000008878 coupling Effects 0.000 claims abstract description 16
- 238000010168 coupling process Methods 0.000 claims abstract description 16
- 238000005859 coupling reaction Methods 0.000 claims abstract description 16
- 238000005259 measurement Methods 0.000 claims description 6
- 238000000034 method Methods 0.000 description 7
- 238000013461 design Methods 0.000 description 6
- 239000010408 film Substances 0.000 description 5
- 239000010409 thin film Substances 0.000 description 3
- 238000001816 cooling Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 238000005057 refrigeration Methods 0.000 description 2
- 239000002887 superconductor Substances 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000011900 installation process Methods 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 238000004513 sizing Methods 0.000 description 1
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- Measurement Of Resistance Or Impedance (AREA)
Abstract
Measure a dielectric resonator for superconducting film material microwave surface impedance, comprise base, spring, metal substrate, sample set collar, shielding cavity, coupling cable and upper top cover; Described shielding cavity is circle ring column knot; The cylindrical cavity bottom of described shielding cavity is provided with circular step structure, and top forms shielding cavity, and bottom forms screens chamber; Described coupling cable divides input coupling cable and exports coupling cable, is located at two offsides of shielding cavity respectively; Described spring, metal substrate and sample set collar are located in described screens chamber; Described sample set collar is clamped between the step surface of circular step structure of metal substrate and shielding cavity; Described base center is provided with snap ring; Described snap ring center is spring groove; Can, according to the size of sample, adopt the sample set collar of different inner circle radius to carry out localizing sample, eliminate the parts that sample set collar will be integrated in shielding cavity, structure be simple, can not affect the globality in shielding cavity and heat conductivity.
Description
Technical field
The utility model relates to a kind of dielectric resonator.
Background technology
The microwave surface impedance Z of superconducting thin film
s=
r s +
iω μ
--- 0λ is its important performance indexes, it not only characterizes the performance of the microwave surface loss of superconducting thin film, can also obtain magnetic penetration depth and superconducting energy gap for information about, be an important material parameter in the electronics application of Superconductor Physics and superconducting thin film.Generally for the material of routine, DC resistivity can be measured more accurately, the microwave surface resistance obtaining ideally by formula scales, but can only as a reference, because it is also relevant with machining level.And for superconductor, the exact value of its microwave surface impedance be obtained, just can not be obtained simply by above-mentioned method, it can only be one and measure parameter.Therefore, this parameter of precision measurement for the physics of Knowing material and other characteristics, development new material and design superconductive microwave element all significant.
Before the utility model, prepare characteristic sum geometric configuration according to sample, the measuring method of microwave surface resistance can have a variety of, and conventional method is exactly metal cavitg method and dielectric resonator method.The medium of dielectric resonator is generally have high-k and low-loss medium block, and it has obvious border, and most electromagnetic energy concentrates on media interior; And loss radiation is little; Compared to metal cavitg resonator, under identical resonance frequency, the volume of dielectric resonator only has tens to several percent one, Q values of metal cavitg resonator very nearly the same.
According to being a kind of dielectric resonator being called as open type chamber about the method specified in microwave surface resistance canonical measure in current draft internation standard (TC-90:INTERNATIONAL STANDARD SUPERCONDUCTIVITY-Part7), this chamber is (as Al by the conductor plate of two panels surfacing and one piece of dielectric cylinder bar
2o
3, sapphire) and composition.The dielectric resonator in open type chamber can introduce radiation loss, falls low reactance-resistance ratio.So mostly adopt the design in enclosed chamber, using the end face of testing sample as chamber, medium is placed on the center of testing sample film, places equally with cylindrical metal shielding cavity is concentric.
The design of the size of dielectric resonator can be subject to the restriction of measuring condition, will consider its feasibility equally, usually can only the sample of measuring gage sizing after dielectric resonator designs, and has limitation in the selection of sample.In order to fixed sample or can be normally measured in dielectric resonator, usually can slightly complicated in the design of shielding cavity.Usual measuring process is carried out at low temperatures, and complicated design can make the globality of shielding cavity be destroyed, and is unfavorable for heat transfer, makes superconducting sample temperature to be measured to drop to expectation value.The way of some shielding cavity becomes to be integrated by the set to shielding cavity of sample set collar at present, it is convenient time such benefit is assembling, but because this sample set collar is thinner, so be easily out of shape, the accuracy of measurement can be affected after distortion, need during replacing to change whole cavity, namely this increase cost and also lose time.
Summary of the invention
For above-mentioned the deficiencies in the prior art part, the problem that the utility model solves is: described dielectric resonator becomes to be integrated by the set to shielding cavity of sample set collar, complex structure, be unfavorable for heat transfer, limitation is had to the selection of sample, sample set collar needs to change whole shielding cavity after damaging, and loses time and cost.
The technical solution of the utility model is:
Measure a dielectric resonator for superconducting film material microwave surface impedance, comprise base, spring, metal substrate, sample set collar, shielding cavity, coupling cable and upper top cover; Described shielding cavity is circle ring column structure, and inside is provided with cylindrical cavity; The shielding cavity concentric shafts of described cylindrical cavity and described circle ring column; The cylindrical cavity bottom of described shielding cavity is provided with circular step structure, and top forms shielding cavity, and bottom forms screens chamber; Described coupling cable divides input coupling cable and exports coupling cable, is located at two offsides of shielding cavity respectively; Described spring, metal substrate and sample set collar are located in described screens chamber; Described sample set collar is ring-type wafer body; Described metal substrate is wafer body; Described sample set collar is clamped between the step surface of circular step structure of metal substrate and shielding cavity; Described base center is provided with snap ring; The external diameter of described snap ring and the diameter in described screens chamber match; Described shielding cavity is stuck on described base by described snap ring; Described snap ring center is spring groove; Described spring is located in described spring groove, and one end heads on base, and the other end heads on the below of metal substrate; Described upper top cover is located at the top of described shielding cavity; Described upper top cover, shielding cavity and base are bolted.
Further, it is fixing that described top cover, shielding cavity, base pass through bolt one, and the number of described bolt is 4.
Further, the minimum diameter of described shielding cavity is 20mm, and maximum inner diameter is 28mm.
Further, also comprise dielectric cylinder, described dielectric cylinder is freely placed on the metallic substrate, and dielectric cylinder and cylindrical cavity are placed with one heart.
The beneficial effects of the utility model:
(1) sample set collar and whole shielding cavity are unfixed, sample set collar is clamped between the step surface of circular step structure of metal substrate and shielding cavity, can according to the size of sample, the sample set collar of different inner circle radius is adopted to carry out localizing sample, eliminate the parts that sample set collar will be integrated in shielding cavity, structure is simple, can not affect the globality in shielding cavity and heat conductivity.When after long-time use sample set collar, sample set collar can deform, and only needs to change sample set collar, convenient and simple for operation.Shielding cavity is circle ring column structure, upper top cover is located at the top of described shielding cavity, each inwall of shielding cavity is made more to be convenient to processing, high manufacturing accuracy also makes measuring accuracy greatly improve, simultaneously due to the raising of shielding cavity integraty, heat can be delivered to whole chamber more swimmingly, is positioned in refrigeration machine and is more conducive to cooling.
(2) top cover, shielding cavity, base pass through bolt one and fix, and decrease the screw needed for assembling, and only need now 4 screws can fix whole device, structure is simple.
(3) the open ended maximum film sample diameter of this device is 28mm, and when sample diameter is greater than shielding cavity internal diameter 20mm, this sample set collar dismountable, obtains higher Q value, higher precision.
Accompanying drawing explanation
Perspective view in Fig. 1 the utility model installation process.
Fig. 2 schematic diagram in top down perspective of the present utility model.
The cut-open view of Fig. 3 positive apparent direction of the present utility model.
Embodiment
Below to being described in further detail the utility model content by reference to the accompanying drawings.
As shown in Figure 1, 2, a kind of dielectric resonator measuring superconducting film material microwave surface impedance, comprises base 1, spring 2, metal substrate 3, sample set collar 5, shielding cavity 6, coupling cable and upper top cover 9.Shielding cavity 6 is circle ring column structure, and inside is provided with cylindrical cavity.Shielding cavity 6 concentric shafts of cylindrical cavity and described circle ring column.As shown in Figure 3, the cylindrical cavity bottom of shielding cavity 6 is provided with circular step structure 63, and top forms shielding cavity 63, and bottom forms screens chamber 64.As shown in Figure 1, coupling cable divides input coupling cable 7 and exports coupling cable 8, is located at two offsides of shielding cavity 63 respectively.As shown in Figure 3, spring 2, metal substrate 3 and sample set collar 5 are located in screens chamber 64.As shown in Figure 1, sample set collar 5 is ring-type wafer body, and metal substrate 3 is wafer body.Sample set collar 5 is clamped between the step surface of circular step structure 63 of metal substrate 3 and shielding cavity 6.Base 1 center is provided with snap ring 13.The external diameter of snap ring 13 and the diameter in screens chamber 64 match.Shielding cavity 6 is stuck on base 1 by snap ring 13.Snap ring 13 center is spring groove 12.Spring 2 is located in described spring groove 12, and one end heads on base 1, and the other end heads on the below of metal substrate 3.Upper top cover 3 is located at the top of described shielding cavity 6.Upper top cover 3, shielding cavity 6 and base 1 is fixed by bolt 10.As shown in figs. 1 and 3, also marked sample a in figure, sample a is placed in metal substrate 3, and places with one heart with metal substrate 3.During work, sample a is placed in metal substrate 3, and sample set collar 5 is pressed on sample a, arranges with one heart, and the upper surface of sample set collar 5 is against circular step structure 63 place.It should be noted that: due to the existence of the circular step structure 63 of shielding cavity 6 lower inside, so there is maximum inner diameter and minimum diameter in shielding cavity, when the length that the outer diameter length of sample a is greater than minimum diameter is less than the length of maximum inner diameter, just sample set collar 5 can be withdrawn from; When the outer diameter length of sample a is less than the length of minimum diameter, just need to push down sample a with sample set collar 5; When the outer diameter length of sample a is greater than the length of maximum inner diameter, just beyond the measurement range of this dielectric resonator.Sample set collar 5 and whole shielding cavity 6 are unfixed, sample set collar 5 is clamped between the step surface of circular step structure 63 of metal substrate 3 and shielding cavity 6, can according to the size of sample a, the sample set collar 5 of different inner circle radius is adopted to carry out localizing sample, eliminate the parts that sample a set collar will be integrated in shielding cavity 6, structure is simple, can not affect the globality in shielding cavity 6 and heat conductivity.When after long-time use sample set collar 5, sample set collar 5 can deform, and only needs to change sample set collar 5, convenient and simple for operation.Shielding cavity 6 is circle ring column structure, upper top cover 9 is located at the top of described shielding cavity 6, each inwall of shielding cavity 6 is made more to be convenient to processing, high manufacturing accuracy also makes measuring accuracy greatly improve, simultaneously due to the raising of shielding cavity 6 integraty, heat can be delivered to whole chamber more swimmingly, is positioned in refrigeration machine and is more conducive to cooling.
Further preferably, upper top cover 9 is provided with perforation 91, and the upper surface 61 of shielding cavity 6 is provided with pilot hole 62, and base 1 is provided with threaded hole 11.It is fixing that top cover, shielding cavity, base pass through bolt one, and the number of described bolt is 4, and structure is simple.
Further preferably, the minimum diameter of described shielding cavity is 20mm, and maximum inner diameter is 28mm.The open ended maximum sample a diameter of this device is 28mm, and when sample a diameter is greater than shielding cavity internal diameter 20mm, dismountable sample set collar 5, obtains higher Q value, higher precision.
Further, also comprise dielectric cylinder 4, described dielectric cylinder is freely placed on the metallic substrate.During operation, dielectric cylinder is placed on the center of sample a, pushes down sample a.
Whole assembling process is as follows: by sample set collar 5, sample a, metal substrate 3 loads in shielding cavity 6 from top to bottom with one heart, the upper surface of sample set collar 5 is against circular step structure 63 place, again spring 2 is positioned in the spring groove 12 of snap ring 13 centre of base 1, base 1 is placed on together with spring 2 below of shielding cavity 6, dielectric cylinder 4 is placed on the center of the upper surface of sample a, the last top again upper top cover 9 being placed into shielding cavity 6, upper top cover 9 is run through from top to bottom with four set bolts 10, shielding cavity 6, base 1, last whole device has just been fixed.Can find out, assemble also very convenient.
Claims (4)
1. measure a dielectric resonator for superconducting film material microwave surface impedance, it is characterized in that, comprise base, spring, metal substrate, sample set collar, shielding cavity, coupling cable and upper top cover; Described shielding cavity is circle ring column structure, and inside is provided with cylindrical cavity; The shielding cavity concentric shafts of described cylindrical cavity and described circle ring column; The cylindrical cavity bottom of described shielding cavity is provided with circular step structure, and top forms shielding cavity, and bottom forms screens chamber; Described coupling cable divides input coupling cable and exports coupling cable, is located at two offsides of shielding cavity respectively; Described spring, metal substrate and sample set collar are located in described screens chamber; Described sample set collar is ring-type wafer body; Described metal substrate is wafer body; Described sample set collar is clamped between the step surface of circular step structure of metal substrate and shielding cavity; Described base center is provided with snap ring; The external diameter of described snap ring and the diameter in described screens chamber match; Described shielding cavity is stuck on described base by described snap ring; Described snap ring center is spring groove; Described spring is located in described spring groove, and one end heads on base, and the other end heads on the below of metal substrate; Described upper top cover is located at the top of described shielding cavity; Described upper top cover, shielding cavity and base are bolted.
2. the dielectric resonator of measurement superconducting film material microwave surface impedance according to claim 1, is characterized in that, it is fixing that described top cover, shielding cavity, base pass through bolt one, and the number of described bolt is 4.
3. the dielectric resonator of the measurement superconducting film material microwave surface impedance according to claim 1 any one, is characterized in that, the minimum diameter of described shielding cavity is 20mm, and maximum inner diameter is 28mm.
4. the dielectric resonator of measurement superconducting film material microwave surface impedance according to claim 1, it is characterized in that, also comprise dielectric cylinder, described dielectric cylinder is freely placed on the metallic substrate, and dielectric cylinder and cylindrical cavity are placed with one heart.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420523178.XU CN204116459U (en) | 2014-09-12 | 2014-09-12 | A kind of dielectric resonator measuring superconducting film material microwave surface impedance |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420523178.XU CN204116459U (en) | 2014-09-12 | 2014-09-12 | A kind of dielectric resonator measuring superconducting film material microwave surface impedance |
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| CN204116459U true CN204116459U (en) | 2015-01-21 |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105929240A (en) * | 2016-05-04 | 2016-09-07 | 南京大学 | Resonator apparatus and measurement method for measuring surface intrinsic impedance of high-temperature superconductive film |
| CN108011171A (en) * | 2017-11-30 | 2018-05-08 | 电子科技大学 | A kind of broadband dielectric resonator |
-
2014
- 2014-09-12 CN CN201420523178.XU patent/CN204116459U/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105929240A (en) * | 2016-05-04 | 2016-09-07 | 南京大学 | Resonator apparatus and measurement method for measuring surface intrinsic impedance of high-temperature superconductive film |
| CN105929240B (en) * | 2016-05-04 | 2018-11-23 | 南京大学 | Measure the Resonator device and measurement method of the impedance of high-temperature superconducting thin film Surface Intrinsic |
| CN108011171A (en) * | 2017-11-30 | 2018-05-08 | 电子科技大学 | A kind of broadband dielectric resonator |
| CN108011171B (en) * | 2017-11-30 | 2020-11-27 | 电子科技大学 | Broadband dielectric resonator |
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| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20150121 Termination date: 20200912 |
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| CF01 | Termination of patent right due to non-payment of annual fee |