CN204086397U - Testing impedance is popped one's head in - Google Patents
Testing impedance is popped one's head in Download PDFInfo
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- CN204086397U CN204086397U CN201420513689.3U CN201420513689U CN204086397U CN 204086397 U CN204086397 U CN 204086397U CN 201420513689 U CN201420513689 U CN 201420513689U CN 204086397 U CN204086397 U CN 204086397U
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Abstract
The utility model provides a kind of lower-cost testing impedance probe, comprises characteristic impedance probe and differential impedance probe, and described characteristic impedance probe is connected with a main frame respectively with described differential impedance probe.Described characteristic impedance probe comprises the first mainboard, a first main frame link and two first spy points, described first main frame link and described two first spy points lay respectively at an opposite end for described first mainboard, described two first spy points are distributed in the relative both sides of described first mainboard with one end, described two first spy points are connected with described first main frame link respectively, described differential impedance probe comprises the second mainboard, two the second main frame links and four second spy points, described two the second main frame links and described four second spy points lay respectively at an opposite end for described second mainboard, visit point with the formal distribution of every two group in the relative both sides of described second mainboard with one end for described four second.
Description
Technical field
The utility model relates to a kind of lower-cost testing impedance probe.
Background technology
Along with the fast development of small-sized, high frequency, multifunction electronic product, characteristic impedance is the object that PCB industry is paid close attention to as the important symbol of transmission line always.When signal is propagated on the transmission line, the transient impedance value that signal is experienced, once change, will cause large impact to the integrality of signal.Therefore, for the PCB of high-frequency signal transmission, not only want measuring circuit " leading to ", " breaking " and " short circuit " whether to meet the requirements, but also the characteristic impedance of reply PCB signal transmssion line is carried out testing and controlling, and ensures the integrality of signal transmission.
In High-speed Board Design, signal exports from drive source, and the circuit that many characteristic impedance values are different transmits, if the impedance that signal is experienced remains unchanged or changes accepting in scope, so the quality of signal just keeps complete; But once the resistance value in transmitting procedure is undergone mutation, signal distortion can occur immediately, affect the correctness that terminal accepts data.Therefore, detecting wiring board characteristic impedance value is the inexorable trend that PCB design and manufacturing develop.But the main testing impedance probe used is all from Britain or imported from America at present, its import cost is higher, and accessory is expensive, and especially probe segment often contacts with test point and easily damages, and strengthens use cost further.
Utility model content
The technical matters that the utility model mainly solves is that the use cost of existing testing impedance probe is higher.
In order to solve the problems of the technologies described above, the utility model embodiment discloses a kind of testing impedance probe, and described testing impedance probe comprises characteristic impedance probe and differential impedance probe, and described characteristic impedance probe is connected with a main frame respectively with described differential impedance probe.Described characteristic impedance probe comprises the first mainboard, a first main frame link and two first spy points, described first main frame link and described two first spy points lay respectively at an opposite end for described first mainboard, described two first spy points are distributed in the relative both sides of described first mainboard with one end, described two first spy points are connected with described first main frame link respectively, described differential impedance probe comprises the second mainboard, two the second main frame links and four second spy points, described two the second main frame links and described four second spy points lay respectively at an opposite end for described second mainboard, visit point with the formal distribution of every two group in the relative both sides of described second mainboard with one end for described four second, described four second spy points are connected with described two the second main frame links respectively.
In a preferred embodiment of the present utility model, described characteristic impedance probe comprises the first shell, described first mainboard of described first shell collecting, and described two first ends visiting point and described first main frame link expose to described first shell respectively.
In a preferred embodiment of the present utility model, described differential impedance probe comprises second housing, described second mainboard of described second housing collecting, and described four first ends visiting point and described two the second main frame links expose to described second housing respectively.
In a preferred embodiment of the present utility model, described first main frame link is connected with described main frame respectively with described two the second main frame links.
In a preferred embodiment of the present utility model, described first main frame link and described two the second main frame links are attaching nut, described first main frame link is welded on described first mainboard, and described two the second main frame links are welded on described second mainboard.
In a preferred embodiment of the present utility model, described first mainboard and described second mainboard are double face copper.
In a preferred embodiment of the present utility model, described first mainboard and described second mainboard comprise multiple for fixing screw hole respectively.
In a preferred embodiment of the present utility model, described first main frame link and described second main frame link are threaded connector, and its skin is copper material, and internal layer is the unit of plastic of band metal aperture.
The structure of described testing impedance probe of the present utility model is simple, and the cost of element used is lower, and no matter be new purchase or follow-up working service, its cost is all lower.
Accompanying drawing explanation
In order to be illustrated more clearly in the technical scheme in the utility model embodiment, below the accompanying drawing used required in describing embodiment is briefly described, apparently, accompanying drawing in the following describes is only embodiments more of the present utility model, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to these accompanying drawings, wherein:
Fig. 1 is that the utility model testing impedance is popped one's head in the perspective view of a preferred embodiment.
Fig. 2 is the part-structure schematic diagram of the characteristic impedance probe of the probe of testing impedance shown in Fig. 1.
Fig. 3 is the package assembly schematic diagram of the characteristic impedance probe of the probe of testing impedance shown in Fig. 1.
Fig. 4 is the part-structure schematic diagram of the differential impedance probe of the probe of testing impedance shown in Fig. 1.
Fig. 5 is the package assembly schematic diagram of the differential impedance probe of the probe of testing impedance shown in Fig. 1.
Embodiment
Be clearly and completely described to the technical scheme in the utility model embodiment below, obviously, described embodiment is only a part of embodiment of the present utility model, instead of whole embodiments.Based on the embodiment in the utility model, those of ordinary skill in the art are not making other embodiments all obtained under creative work prerequisite, all belong to the scope of the utility model protection.
See also Fig. 1 to Fig. 5, the utility model embodiment discloses a kind of testing impedance probe, described testing impedance probe comprises characteristic impedance probe 2 and differential impedance probe 3, and described characteristic impedance probe 2 is connected with a main frame 1 respectively with described differential impedance probe 3.Described characteristic impedance probe 2 comprises the first mainboard 21, a first main frame link 22 and two first spy points 23, described first main frame link 22 and described two first spy points 23 lay respectively at the opposite end of described first mainboard 21, described two first spy points 23 are distributed in the relative both sides of described first mainboard 21 with one end, described two first spy points 23 are connected with described first main frame link 22 respectively, described differential impedance probe 3 comprises the second mainboard 31, two the second main frame links 32 and four second spy points 33, described two the second main frame links 32 and described four second spy points 33 lay respectively at the opposite end of described second mainboard 31, visit point 33 with the formal distribution of every two group in the relative both sides of described second mainboard 31 with one end for described four second, described four second spy points 33 are connected with described two the second main frame links 32 respectively.Wherein, described first main frame link 22 is connected with described main frame 1 respectively with described two the second main frame links 32, thus the impedance data detected is sent to described main frame 1.
Further, described characteristic impedance probe 2 comprises the first shell 24, and described first shell 24 accommodates described first mainboard 21, and described two first ends visiting point 23 and described first main frame link 22 expose to described first shell 24 respectively.Described differential impedance probe 3 comprises second housing 34, and described second housing 34 accommodates described second mainboard 31, and described four first ends visiting point 23 and described two the second main frame links 32 expose to described second housing 34 respectively.
Preferably, described first main frame link 22 and described two the second main frame links 32 are attaching nut, and described first main frame link 22 is welded on described first mainboard 21, and described two the second main frame links 32 are welded on described second mainboard 31.
Preferably, described first mainboard 21 and described second mainboard 31 are double face copper, and it comprises multiple for fixing screw hole 25,35 respectively.
Preferably, described first main frame link 22 and described second main frame link 32 are threaded connector, and its skin is copper material, and internal layer is the unit of plastic of band metal aperture.
The structure of described testing impedance probe of the present utility model is simple, and the cost of element used is lower, and no matter be new purchase or follow-up working service, its cost is all lower.
The foregoing is only embodiment of the present utility model; not thereby the scope of the claims of the present utility model is limited; every utilize the utility model description to do equivalent structure or equivalent flow process conversion; or be directly or indirectly used in other relevant technical field, be all in like manner included in scope of patent protection of the present utility model.
Claims (8)
1. a testing impedance probe, comprise characteristic impedance probe and differential impedance probe, described characteristic impedance probe is connected with a main frame respectively with described differential impedance probe, it is characterized in that, described characteristic impedance probe comprises the first mainboard, a first main frame link and two first spy points, described first main frame link and described two first spy points lay respectively at an opposite end for described first mainboard, described two first spy points are distributed in the relative both sides of described first mainboard with one end, described two first spy points are connected with described first main frame link respectively, described differential impedance probe comprises the second mainboard, two the second main frame links and four second spy points, described two the second main frame links and described four second spy points lay respectively at an opposite end for described second mainboard, visit point with the formal distribution of every two group in the relative both sides of described second mainboard with one end for described four second, described four second spy points are connected with described two the second main frame links respectively.
2. testing impedance probe according to claim 1, it is characterized in that, described characteristic impedance probe comprises the first shell, described first mainboard of described first shell collecting, and described two first ends visiting point and described first main frame link expose to described first shell respectively.
3. testing impedance probe according to claim 1, it is characterized in that, described differential impedance probe comprises second housing, described second mainboard of described second housing collecting, and described four first ends visiting point and described two the second main frame links expose to described second housing respectively.
4. testing impedance probe according to claim 1, it is characterized in that, described first main frame link is connected with described main frame respectively with described two the second main frame links.
5. testing impedance probe according to claim 1, it is characterized in that, described first main frame link and described two the second main frame links are attaching nut, described first main frame link is welded on described first mainboard, and described two the second main frame links are welded on described second mainboard.
6. testing impedance probe according to claim 1, it is characterized in that, described first mainboard and described second mainboard are double face copper.
7. testing impedance probe according to claim 1, is characterized in that, described first mainboard and described second mainboard comprise multiple for fixing screw hole respectively.
8. testing impedance probe according to claim 1, it is characterized in that, described first main frame link and described second main frame link are threaded connector, and its skin is copper material, and internal layer is the unit of plastic of band metal aperture.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420513689.3U CN204086397U (en) | 2014-09-05 | 2014-09-05 | Testing impedance is popped one's head in |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420513689.3U CN204086397U (en) | 2014-09-05 | 2014-09-05 | Testing impedance is popped one's head in |
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| Publication Number | Publication Date |
|---|---|
| CN204086397U true CN204086397U (en) | 2015-01-07 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201420513689.3U Active CN204086397U (en) | 2014-09-05 | 2014-09-05 | Testing impedance is popped one's head in |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105092975A (en) * | 2015-09-23 | 2015-11-25 | 广州兴森快捷电路科技有限公司 | Single-end impedance test head in PCB |
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2014
- 2014-09-05 CN CN201420513689.3U patent/CN204086397U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105092975A (en) * | 2015-09-23 | 2015-11-25 | 广州兴森快捷电路科技有限公司 | Single-end impedance test head in PCB |
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| GR01 | Patent grant |