CN203869704U - Fast-moving probe dual-stage transmission system - Google Patents
Fast-moving probe dual-stage transmission system Download PDFInfo
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- CN203869704U CN203869704U CN201420227053.2U CN201420227053U CN203869704U CN 203869704 U CN203869704 U CN 203869704U CN 201420227053 U CN201420227053 U CN 201420227053U CN 203869704 U CN203869704 U CN 203869704U
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- probe
- secondary driving
- driving system
- vacuum chamber
- vacuum
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Abstract
The utility model discloses a fast-moving probe dual-stage transmission system comprising a primary transmission system, a secondary transmission system, a probe system, an exchange device, a vacuum gate valve, a control system. The primary transmission system and the secondary transmission system are connected. The probe system is installed on the secondary transmission system. The primary transmission system pushes the probe system into an assigned position in a vacuum chamber. The secondary transmission system pushes the probe system from the assigned position in the vacuum chamber to a plasma boundary. The exchange device is used for maintaining a probe head. The vacuum gate valve is used for cutting off vacuum environment between the vacuum chamber and the fast-moving probe system. The control system is used for automatically controlling the secondary transmission system of the fast-moving probe. The fast-moving probe dual-stage transmission system may achieve fast and automatic control with the control system, and the maintenance of the probe head while not influencing other window diagnosis, and is an ideal diagnosis system for a Tokamak device.
Description
Technical field
The utility model relates to a kind of TOKAMAK experimental provision field, is exactly specifically a kind of snap-action probe secondary driving system.
Background technology
EAST TOKAMAK device is international big science engineering project, and probe diagnostics is the important research means of present stage TOKAMAK device border product.Along with improving constantly of requirement of experiment, need probe to enter and to exit speed and the accuracy requirement of plasma boundary product more and more higher, and will be in the situation that not affecting other window diagnosis, probe is safeguarded and changed, conventional hydraulic transmission, manually operated probe diagnostics method shows a lot of drawbacks, can not meet the requirement of experiment of present stage.Therefore, need to design a kind of novel TOKAMAK snap-action probe secondary driving system, the convenient automatic control that realizes accurately probe motion process, to meet the diagnosis of present stage to TOKAMAK device plasma boundary product.
Summary of the invention
The object of the utility model embodiment is for the deficiencies in the prior art, design a kind of snap-action probe secondary driving system, described device is according to the difference of experiment condition, realize the fast feed of probe and return fast, can automatically control speed of feed and the amount of feeding, can, in the situation that not affecting other window diagnosis, realize the replacing of probe and adjustment simultaneously.
To achieve these goals, the technical solution adopted in the utility model is as follows:
A snap-action probe secondary driving system, is characterized in that: include one-level kinematic train, secondary driving system, probe system, switch, slide valve, vacuum chamber, control system; Described one-level kinematic train is placed on mounting platform, is connected respectively with described secondary driving system with control system, and described secondary driving system is connected with control system with probe system respectively, and probe system is by switch, slide valve access vacuum chamber; After one-level kinematic train receives the signal that control system sends, one-level kinematic train drives secondary driving system to travel forward fast; After secondary driving system drives probe system to enter into described vacuum chamber, control system is sent signal, and described secondary driving system drives probe system to advance fast forward, and probe enters vacuum chamber plasma boundary position and carries out data diagnosis; Described switch is connected with slide valve with probe system respectively, for observing, change and adjust probe; Described slide valve is connected with the window of switch and vacuum chamber respectively, during for replacing and adjustment probe, cuts off the vacuum environment between vacuum chamber and probe system; Described control system is connected with one-level kinematic train, secondary driving system and probe system respectively, for the fast feed of whole system, the record of probe diagnostic data and processing etc. are controlled, it is the key control unit of described a kind of snap-action probe secondary driving system.
Described a kind of snap-action probe secondary driving system, is characterized in that: described one-level kinematic train, by stepper motor, screw pair and line slideway, formed, and for promoting secondary driving system, drive probe system to enter vacuum chamber assigned address.
Described a kind of snap-action probe secondary driving system, it is characterized in that: described secondary driving system, by servomotor and line slideway, formed, by the default curve movement control program of servomotor, control the kinematic parameter of secondary driving system, for driving probe system to enter and exit vacuum chamber applying plasma border according to the curve movement of setting.
Described a kind of snap-action probe secondary driving system, it is characterized in that: described probe system, be arranged in secondary driving system, be connected with control system, by probe tube, probe tube pillar, vacuum-pumping system, long and short two root corrugated tube and probe, formed, be that probe is installed, realize the core cell of probe data acquisition function.
Described a kind of snap-action probe secondary driving system, it is characterized in that: the lengthy bellows of described probe system is connected with described switch with vacuum-pumping system respectively, during for the operation of one-level kinematic train, elongation and the compression of probe system, guarantee probe system inner vacuum; Described short corrugated pipe is connected with secondary driving system with described vacuum-pumping system respectively, realizes elongation and the compression of secondary transmission process middle probe system, realizes the sealing to described probe system.
The vacuum extraction valve of vacuum-pumping system, is arranged in probe system, for snap-action probe interior is taken out very
Empty; Control system, is arranged on one-level kinematic train base, for one-level kinematic train and secondary driving system
Each F.F., return action, realize the Long-distance Control of snap-action probe and automatically control.
In experimentation, first control system starts snap-action probe one-level kinematic train stepper motor, stepper motor drives leading screw to rotate and drives secondary driving system fast feed forward, and probe system enters vacuum chamber assigned address from vacuum vessel port under secondary driving system drives; When one-level kinematic train enters holding fix, touch location switch sends feedback signal to control system, control system is sent signal to servomotor, drive secondary driving system and drive probe system fast feed forward, probe enters plasma boundary by vacuum chamber assigned address, test border product correlation parameter; Test data is transferred in peripheral computer and is analyzed, processes and note down by probe system data line; For secondary driving system, the curve movement that presets secondary driving system completes and imports in servo control system by peripheral computer setting, curve movement is comprised of series of orders, each order comprises the information such as absolute position, maximal rate, peak acceleration, stand-by period, after having tested, control system is sent signal to secondary driving system, and secondary driving system drives probe system to exit fast plasma boundary, completes data test; When needs are changed and adjusted probe, probe returns in switch, enables easamatic power brake plate valve, cuts off the vacuum environment between vacuum chamber and probe system, opens switch and changes window, and probe is changed and the operation such as adjustment.Before retesting, close the more all windows of changing device, by vacuum extraction valve, system is vacuumized simultaneously, after internal vacuum is consistent with vacuum chamber, open slide valve, the vacuum environment that realizes snap-action probe secondary driving system and vacuum chamber is connected.
The utility model has the advantages that:
The advantages such as the utlity model has compact conformation, automaticity is high, easy to maintenance, handsome in appearance, practical.
Accompanying drawing explanation
A kind of snap-action probe secondary driving system schematic diagram that Fig. 1 provides for the utility model embodiment.
A kind of snap-action probe secondary driving system probe system front elevation that Fig. 2 provides for the utility model embodiment.
In Fig. 1: 1. one-level kinematic train, 2. secondary driving system, 3. probe system, 4. switch, 5. easamatic power brake plate valve, 6. vacuum chamber, 7. control system;
In Fig. 2: 8. lengthy bellows, 9. short corrugated pipe, 10. vacuum-pumping system.
Embodiment
For innovative characteristics, enforcement means, the principle of work and power that the utility model is realized with reach object and be easier to understand, below in conjunction with specific embodiment and schematic diagram, further set forth the utility model:
Referring to accompanying drawing 1, the utility model embodiment provides a kind of snap-action probe secondary driving system, comprising
One-level kinematic train 1, secondary driving system 2, probe system 3, switch 4, slide valve 5, vacuum chamber 6, control system 7; One-level kinematic train 1 is placed on mounting platform, is connected respectively with described secondary driving system 2 with control system 3, after receiving the signal that control system 7 sends, drives secondary driving system 2 to travel forward fast; Described secondary driving system 2 is connected with control system 7 with probe system 3 respectively, after system drives probe system 3 to enter into described vacuum chamber 6, control system 7 is sent signal, described secondary driving system 2 drives probe system 7 fast feed forward, and probe enters vacuum chamber 6 plasma boundary positions and carries out data diagnosis; Described switch 4 is connected with easamatic power brake plate valve 5 with probe system 3 respectively, for observing, change and adjust probe; Described easamatic power brake plate valve 5 is connected with vacuum chamber 6 with switch 4 respectively, during for replacing and adjustment probe, cuts off the vacuum environment between vacuum chamber 6 and probe system 3; Described control system 7 is connected with one-level kinematic train 1, secondary driving system 2 and probe system 3 respectively, for the fast feed of whole system, the record of probe diagnostic data and processing etc. are controlled, it is the key control unit of described a kind of snap-action probe secondary driving system.
Referring to accompanying drawing 2, the utility model embodiment provides a kind of snap-action probe secondary driving system, wherein also comprises: lengthy bellows 8, short corrugated pipe 9 and vacuum-pumping system 10.Described lengthy bellows 8 is connected with described switch 4 with vacuum-pumping system 10 respectively, and elongation and the compression of probe system while moving for one-level kinematic train guarantee probe system inner vacuum; Described short corrugated pipe 9 is connected with secondary driving system 2 with described vacuum-pumping system 10 respectively, realizes elongation and the compression of secondary transmission process middle probe system 3, realizes the sealing to described vacuum system 3; Described vacuum-pumping system 10, for vacuumizing this system.
More than show and described ultimate principle of the present utility model, principal character and advantage.The technician of the industry should understand; the utility model is not restricted to the described embodiments; that in above-described embodiment and instructions, describes just illustrates principle of the present utility model; do not departing under the prerequisite of the utility model spirit and scope; the utility model also has various changes and modifications, and these changes and improvements all fall within the scope of claimed the utility model.The claimed scope of the utility model is defined by appending claims and equivalent thereof.
Claims (5)
1. a snap-action probe secondary driving system, is characterized in that: include one-level kinematic train, secondary driving system, probe system, switch, slide valve, vacuum chamber, control system; Described one-level kinematic train is placed on mounting platform, is connected respectively with described secondary driving system with control system, and described secondary driving system is connected with control system with probe system respectively, and probe system is by switch, slide valve access vacuum chamber; After one-level kinematic train receives the signal that control system sends, one-level kinematic train drives secondary driving system to travel forward fast; After secondary driving system drives probe system to enter into described vacuum chamber, control system is sent signal, and described secondary driving system drives probe system to advance fast forward, and probe enters vacuum chamber plasma boundary position and carries out data diagnosis; Described switch is connected with slide valve with probe system respectively, for observing, change and adjust probe; Described slide valve is connected with the window of switch and vacuum chamber respectively, during for replacing and adjustment probe, cuts off the vacuum environment between vacuum chamber and probe system; Described control system is connected with one-level kinematic train, secondary driving system and probe system respectively, for the fast feed of whole system, the record of probe diagnostic data and processing etc. are controlled, it is the key control unit of described a kind of snap-action probe secondary driving system.
2. a kind of snap-action probe secondary driving system according to claim 1, it is characterized in that: described one-level kinematic train, by stepper motor, screw pair and line slideway, formed, for promoting secondary driving system, drive probe system to enter vacuum chamber assigned address.
3. a kind of snap-action probe secondary driving system according to claim 1, it is characterized in that: described secondary driving system, by servomotor and line slideway, formed, by the default curve movement control program of servomotor, control the kinematic parameter of secondary driving system, for driving probe system to enter and exit vacuum chamber applying plasma border according to the curve movement of setting.
4. a kind of snap-action probe secondary driving system according to claim 1, it is characterized in that: described probe system, be arranged in secondary driving system, be connected with control system, by probe tube, probe tube pillar, vacuum-pumping system, long and short two root corrugated tube and probe, formed, be that probe is installed, realize the core cell of probe data acquisition function.
5. according to a kind of snap-action probe secondary driving system described in claim 1 or 4, it is characterized in that: the lengthy bellows of described probe system is connected with described switch with vacuum-pumping system respectively, during for the operation of one-level kinematic train, elongation and the compression of probe system, guarantee probe system inner vacuum; Described short corrugated pipe is connected with secondary driving system with described vacuum-pumping system respectively, realizes elongation and the compression of secondary transmission process middle probe system, realizes the sealing to described probe system.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420227053.2U CN203869704U (en) | 2014-05-05 | 2014-05-05 | Fast-moving probe dual-stage transmission system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420227053.2U CN203869704U (en) | 2014-05-05 | 2014-05-05 | Fast-moving probe dual-stage transmission system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203869704U true CN203869704U (en) | 2014-10-08 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420227053.2U Expired - Fee Related CN203869704U (en) | 2014-05-05 | 2014-05-05 | Fast-moving probe dual-stage transmission system |
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| CN (1) | CN203869704U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103983292A (en) * | 2014-05-05 | 2014-08-13 | 合肥聚能电物理高技术开发有限公司 | Quick-operation probe two-level transmission system |
-
2014
- 2014-05-05 CN CN201420227053.2U patent/CN203869704U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103983292A (en) * | 2014-05-05 | 2014-08-13 | 合肥聚能电物理高技术开发有限公司 | Quick-operation probe two-level transmission system |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20141008 Termination date: 20170505 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |