CN203798843U - Probe disc having hollow portion structure - Google Patents
Probe disc having hollow portion structure Download PDFInfo
- Publication number
- CN203798843U CN203798843U CN201420175458.6U CN201420175458U CN203798843U CN 203798843 U CN203798843 U CN 203798843U CN 201420175458 U CN201420175458 U CN 201420175458U CN 203798843 U CN203798843 U CN 203798843U
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- China
- Prior art keywords
- probe
- panel
- dials
- hollow bulb
- thickness
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Abstract
The utility model relates to the technical field of PCB electrical tests, and especially relates to a probe disc having a hollow portion structure. The probe disc comprises a panel, a carrier board and a probe. The panel is arranged above the carrier board. Support pillars are arranged between the panel and the carrier board. The panel and the carrier board are fixedly connected through the support pillars. A hollow portion is formed between the panel and the carrier board. The probe runs through the panel and the carrier board. The probe head on the top end of the probe is extended out from the top end surface of the panel. The probe tail of the bottom end of the probe is extended out from the bottom end surface of the carrier board. Part of the probe body of the probe is located in the hollow portion. According to the probe disc having a hollow portion structure of the utility model, the hollow portion is arranged, so a space is provide for the bending of the probe body of the probe, the flexible abutting between the probe and the PAD test point of the PCB can be realized to prevent the probe from applying an excessive pressure to the PAD test point of the PCB to cause the piercing of the PCB to damage the PCB, the advantage of reasonable design can be realized, and the probe disc can be used to ensure that the electrical tests of the PCB can be performed safely.
Description
Technical field
The utility model relates to pcb board electrical testing technical field, relates in particular to a kind of probe dials with hollow bulb structure.
Background technology
PCB(Printed Circuit Board) be printed-wiring board (PWB), be called for short pcb board, be one of vitals of electronics industry.Almost every kind of electronic equipment, such as accutron, counter, computing machine, communication electronic device and military armament systems etc., as long as there are the electronic devices and components such as integrated circuit need to realize electrical connection, all need to use pcb board.
In the production run of pcb board, in order to verify the quality of pcb board, need to carry out various detection tests to pcb board, conventionally need to test the function of the components and parts such as the open defect of pcb board, open circuit, short circuit, IC etc.Wherein, the open defect test of pcb board is adopted to visual detection method; The functional test of the components and parts such as open circuit to pcb board, short circuit, IC adopts electrical testing method; The critical piece that in prior art, pcb board is carried out to the test machine of electrical testing is probe tool, probe tool comprises again drum and dials, dials is provided with probe, in the time pcb board being carried out to electrical testing work, the two ends of the probe of dials setting contact respectively the PAD(pad of pcb board) and the metal connection point of drum, realize energising, thereby can carry out effective electrical testing to pcb board.
But it is not good that the probe tool of prior art exists following defect to cause the electrical testing effect of pcb board: it is excessive to pcb board applied pressure and damage pcb board that one, dials integrated model design is unreasonable while causing probe to detect; Two, the probe needle body does not carry out insulation protection, has the problem of electric leakage.
Utility model content
The purpose of this utility model is to provide a kind of probe dials with hollow bulb structure for the deficiencies in the prior art, it can be realized when pcb board is carried out to electrical testing, restriction probe applies excessive pressure to pcb board, thereby can avoid probe to damage pcb board, plays the effect of safety test.
For achieving the above object, a kind of probe dials with hollow bulb structure of the present utility model, comprise panel, support plate and probe, panel is arranged at the top of support plate, between described panel and support plate, be provided with support column, panel is fixedly connected with by support column with support plate, forms a hollow bulb between panel and support plate; Probe runs through and is arranged at described panel and support plate, and the syringe needle of tips of probes stretches out in the top end face of panel, and the backshank of probe bottom stretches out in the bottom face of support plate, and the part needle body of probe is positioned at described hollow bulb.
Wherein, the surface of the needle body of described probe is provided with insulation course.
Concrete, described insulation course is insullac, the surface of the needle body is located in insullac spray.
Wherein, the needle body of described probe comprises that tungsten core and tungsten wicking surface plate the Gold plated Layer of establishing.
Wherein, described panel comprises test panel and is connected in the sub-panel of test panel bottom, the thickness D of test panel
1for 1.3-1.7mm, the thickness D of sub-panel
2for 1.0-1.4mm.
Preferably, the thickness D of described test panel
1for 1.5mm, the thickness D of sub-panel
2for 1.2mm.
Wherein, all offer groove in described test panel and sub-panel, probe is arranged in described groove.
Wherein, described support plate comprises the upper auxiliary layer, middle auxiliary layer and the dials base plate that sequentially connect from top to bottom setting, the thickness D of upper auxiliary layer
3for 2-4mm, the thickness D of middle auxiliary layer
4for 1-2mm, the thickness D of dials base plate
5for 2-4mm.
Preferably, the thickness D of described upper auxiliary layer
3for 3mm, the thickness D of middle auxiliary layer
4for 1.5mm, the thickness D of dials base plate
5for 3mm.
Wherein, in described upper auxiliary layer, middle auxiliary layer and dials base plate, all offer groove, probe is arranged in described groove.
The beneficial effects of the utility model: a kind of probe dials with hollow bulb structure of the present utility model, panel and support plate position the upper and lower of probe respectively, and limit probe left and right transverse shifting, in the time carrying out test job, probe dials is installed in test machine, the syringe needle butt that tips of probes is stretched out in to panel top end face need to carry out the PAD test point of the pcb board of electrical testing, the wire that the backshank that probe bottom is stretched out in to support plate bottom face touches drum can be realized conduction and carry out electrical testing, and in the time that the syringe needle of probe abuts to the PAD test point of pcb board, whole probe dials can drive probe to exert pressure to the PAD test point of pcb board, owing to being provided with support column between panel and support plate, between panel and support plate, form a hollow bulb, in the time that probe applies excessive pressure to the PAD test point of pcb board, probe is positioned at the part needle body meeting bending of hollow bulb, be that hollow bulb provides the space that allows needle body bending, realize the flexible butt of the PAD test point of probe and pcb board, prevent that probe from applying excessive pressure to the PAD test point of pcb board and causing piercing through pcb board, pcb board is caused to damage.
Brief description of the drawings
Fig. 1 is structural representation of the present utility model.
Fig. 2 is the structural representation that the utility model contacts with the wire of drum.
Fig. 3 is the structural representation of the utility model probe.
Fig. 4 is the Section View along A-A line in Fig. 3.
Fig. 5 is the local enlarged diagram at B place in Fig. 1.
Fig. 6 is the local enlarged diagram at C place in Fig. 1.
Reference numeral comprises:
10-panel, 11-test panel, 12-sub-panel, 20-support plate
21-upper auxiliary layer 22-middle auxiliary layer 23-dials base plate 30-probe
31-syringe needle, 32-backshank, 33-insulation course, 34-tungsten core
35-Gold plated Layer, 36-needle body, 40-support column, 50-hollow bulb
60-groove, 70-drum, 71-wire.
Embodiment
Below in conjunction with accompanying drawing, the utility model is described in detail.
As shown in Figures 1 to 6, a kind of probe dials with hollow bulb structure of the present utility model, comprise panel 10, support plate 20 and probe 30, panel 10 is arranged at the top of support plate 20, between described panel 10 and support plate 20, be provided with support column 40, panel 10 is fixedly connected with by support column 40 with support plate 20, forms a hollow bulb 50 between panel 10 and support plate 20; Probe 30 runs through and is arranged at described panel 10 and support plate 20, and the syringe needle 31 on probe 30 tops stretches out in the top end face of panel 10, and the backshank 32 of probe 30 bottoms stretches out in the bottom face of support plate 20, and the part needle body 36 of probe 30 is positioned at described hollow bulb 50.
Concrete, panel 10 and support plate 20 position the upper and lower of probe 30 respectively, and limit probe 30 left and right transverse shiftings, in the time carrying out test job, probe dials is installed in test machine, syringe needle 31 butts that probe 30 tops are stretched out in to panel 10 top end faces need to carry out the PAD test point of the pcb board of electrical testing, the wire 71 that the backshank 32 that probe 30 bottoms are stretched out in to support plate 20 bottom faces touches drum 70 can be realized conduction and carry out electrical testing, and in the time that the syringe needle 31 of probe 30 abuts to the PAD test point of pcb board, whole probe dials can drive probe 30 to exert pressure to the PAD test point of pcb board, owing to being provided with support column 40 between panel 10 and support plate 20, between panel 10 and support plate 20, form a hollow bulb 50, in the time that probe 30 applies excessive pressure to the PAD test point of pcb board, probe 30 is positioned at the part needle body 36 meeting bendings of hollow bulb 50, be that hollow bulb 50 provides the space that allows the needle body 36 bendings, realize the flexible butt of probe 30 with the PAD test point of pcb board, prevent that probe 30 from applying excessive pressure to the PAD test point of pcb board and causing piercing through pcb board, pcb board is caused to damage.
In the present embodiment, the surface of the needle body 36 of described probe 30 is provided with insulation course 33, when in the time that the comparatively intensive pcb board detection piece of test point needs many probes 30 to test simultaneously, the needle body 36 of many probes 30 can not produce interference each other, ensures normally carrying out of test.
Concrete, described insulation course 33 is insullac, the surface of the needle body 36 is located in insullac spray, when production, insullac spraying is arranged to the surface of the needle body 36, produces very convenient, quick; Insullac is frivolous, and cost is low, and the technique effect of generation is more remarkable.
See Fig. 4, the needle body 36 of described probe 30 comprises the Gold plated Layer 35 that tungsten core 34 and tungsten core 34 plated surfaces are established, and tungsten core 34 is as inner core body structure, then establishes Gold plated Layer 35 in the plated surface of tungsten core 34, in conjunction with after the needle body 36 structures make electric conductivity better.
Referring to Fig. 5, described panel 10 comprises test panel 11 and is connected in the sub-panel 12 of test panel 11 bottoms, the thickness D of test panel 11
1for 1.3-1.7mm, the thickness D of sub-panel 12
2for 1.0-1.4mm, test panel 11 carries out effective location to the top of probe 30, is conducive to the PAD test point of pcb board to position test, and 12 of sub-panels play the effect that subtest panel 11 positions the top of probe 30; Concrete D
1can be 1.3mm, 1.5mm or 1.7mm, D
2can be 1.0mm, 1.2mm or 1.4mm, this kind of design can guarantee that probe 30 can be not blocked up and be difficult to run through because of test panel 11 and sub-panel 12, guaranteed that again test panel 11 and sub-panel 12 can be because of too not thin and not good to the locating effect of probe 30; Preferably, the thickness D of described test panel 11
1for 1.5mm, the thickness D of sub-panel 12
2for 1.2mm, after tested, the test panel 11 of this gauge and the cost performance of sub-panel 12 are the highest, can realize again above-mentioned mentioned technology.
In the present embodiment, the interior groove 60 that all offers of described test panel 11 and sub-panel 12, probe 30 is arranged in described groove 60, the setting of groove 60 is beneficial to probe 30 and wears test panel 11 and sub-panel 12, and groove 60 is arranged at the inside of test panel 11 and sub-panel 12, can not affect test panel 11 and sub-panel 12 positions probe 30, be conducive to the installation of probe 30.
Referring to Fig. 6, described support plate 20 comprises the upper auxiliary layer 21, middle auxiliary layer 22 and the dials base plate 23 that sequentially connect from top to bottom setting, the thickness D of upper auxiliary layer 21
3for 2-4mm, the thickness D of middle auxiliary layer 22
4for 1-2mm, the thickness D of dials base plate 23
5for 2-4mm; Concrete, D
3can be 2mm, 3mm or 4mm, D
4can be 1mm, 1.5mm or 2mm, D
5can be 2mm, 3mm or 4mm, this kind of design can guarantee that probe 30 can not be difficult to run through because upper auxiliary layer 21, middle auxiliary layer 22 and dials base plate 23 are blocked up, has guaranteed that again upper auxiliary layer 21, middle auxiliary layer 22 and dials base plate 23 can be because of too not thin and not good to the locating effect of probe 30; Preferably, the thickness D of described upper auxiliary layer 21
3for 3mm, the thickness D of middle auxiliary layer 22
4for 1.5mm, the thickness D of dials base plate 23
5for 3mm, after tested, the cost performance of the upper auxiliary layer 21 of this gauge, middle auxiliary layer 22 and dials base plate 23 is the highest, can realize again above-mentioned mentioned technology.
In the present embodiment, the interior groove 60 that all offers of described upper auxiliary layer 21, middle auxiliary layer 22 and dials base plate 23, probe 30 is arranged in described groove 60, the setting of groove 60 is beneficial to probe 30 and wears auxiliary layer 21, middle auxiliary layer 22 and dials base plate 23, and groove 60 is arranged at the inside of auxiliary layer 21, middle auxiliary layer 22 and dials base plate 23, can not affect auxiliary layer 21, middle auxiliary layer 22 and dials base plate 23 probe 30 is positioned, be conducive to the installation of probe 30.
Known the utility model is to have above-described good characteristic in sum, is made it manufacture assembling and use, and promotes the usefulness not having in conventional art and has practicality, becomes a novel product structure that has a practical value.
Above content is only preferred embodiment of the present utility model, for those of ordinary skill in the art, according to thought of the present utility model, all will change in specific embodiments and applications, this description should not be construed as restriction of the present utility model.
Claims (10)
1. one kind has the probe dials of hollow bulb structure, comprise panel (10), support plate (20) and probe (30), panel (10) is arranged at the top of support plate (20), it is characterized in that: between described panel (10) and support plate (20), be provided with support column (40), panel (10) is fixedly connected with by support column (40) with support plate (20), between panel (10) and support plate (20), forms a hollow bulb (50); Probe (30) runs through and is arranged at described panel (10) and support plate (20), the syringe needle (31) on probe (30) top stretches out in the top end face of panel (10), the backshank (32) of probe (30) bottom stretches out in the bottom face of support plate (20), and the part needle body (36) of probe (30) is positioned at described hollow bulb (50).
2. a kind of probe dials with hollow bulb structure according to claim 1, is characterized in that: the surface of the needle body (36) of described probe (30) is provided with insulation course (33).
3. a kind of probe dials with hollow bulb structure according to claim 2, is characterized in that: described insulation course (33) is insullac, and the surface of the needle body (36) is located in insullac spray.
4. a kind of probe dials with hollow bulb structure according to claim 1, is characterized in that: the needle body (36) of described probe (30) comprises the Gold plated Layer (35) that tungsten core (34) and tungsten core (34) plated surface are established.
5. a kind of probe dials with hollow bulb structure according to claim 1, is characterized in that: described panel (10) comprises test panel (11) and is connected in the sub-panel (12) of test panel (11) bottom, the thickness D of test panel (11)
1for 1.3-1.7mm, the thickness D of sub-panel (12)
2for 1.0-1.4mm.
6. a kind of probe dials with hollow bulb structure according to claim 5, is characterized in that: the thickness D of described test panel (11)
1for 1.5mm, the thickness D of sub-panel (12)
2for 1.2mm.
7. a kind of probe dials with hollow bulb structure according to claim 5, is characterized in that: in described test panel (11) and sub-panel (12), all offer groove (60), probe (30) is arranged in described groove (60).
8. a kind of probe dials with hollow bulb structure according to claim 1, it is characterized in that: described support plate (20) comprises the upper auxiliary layer (21), middle auxiliary layer (22) and the dials base plate (23) that sequentially connect from top to bottom setting, the thickness D of upper auxiliary layer (21)
3for 2-4mm, the thickness D of middle auxiliary layer (22)
4for 1-2mm, the thickness D of dials base plate (23)
5for 2-4mm.
9. a kind of probe dials with hollow bulb structure according to claim 8, is characterized in that: the thickness D of described upper auxiliary layer (21)
3for 3mm, the thickness D of middle auxiliary layer (22)
4for 1.5mm, the thickness D of dials base plate (23)
5for 3mm.
10. a kind of probe dials with hollow bulb structure according to claim 8, it is characterized in that: in described upper auxiliary layer (21), middle auxiliary layer (22) and dials base plate (23), all offer groove (60), probe (30) is arranged in described groove (60).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420175458.6U CN203798843U (en) | 2014-04-11 | 2014-04-11 | Probe disc having hollow portion structure |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420175458.6U CN203798843U (en) | 2014-04-11 | 2014-04-11 | Probe disc having hollow portion structure |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203798843U true CN203798843U (en) | 2014-08-27 |
Family
ID=51381047
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420175458.6U Expired - Fee Related CN203798843U (en) | 2014-04-11 | 2014-04-11 | Probe disc having hollow portion structure |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203798843U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112213533A (en) * | 2019-07-10 | 2021-01-12 | 三赢科技（深圳）有限公司 | Needle stand structure and test fixture adopting same |
-
2014
- 2014-04-11 CN CN201420175458.6U patent/CN203798843U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112213533A (en) * | 2019-07-10 | 2021-01-12 | 三赢科技（深圳）有限公司 | Needle stand structure and test fixture adopting same |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140827 Termination date: 20210411 |