CN203705600U - Transistor test circuit - Google Patents
Transistor test circuit Download PDFInfo
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- CN203705600U CN203705600U CN201420050833.4U CN201420050833U CN203705600U CN 203705600 U CN203705600 U CN 203705600U CN 201420050833 U CN201420050833 U CN 201420050833U CN 203705600 U CN203705600 U CN 203705600U
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Abstract
The utility model relates to a transistor test circuit for testing parameters of a transistor. The objective of the utility model is to realize the accurate test of a plurality of parameters of the transistor with a simple circuit, and reduce the cost at the same time. Thus, the transistor test circuit is provided. The transistor test circuit comprises a B end, a C end and an E end for connecting pins of a NPN-type transistor and a C' end, a B' end and the E end for connecting pins of a PNP-type transistor. The transistor test circuit further comprises a first adjustable power source, a first diverter switch, a first voltage display device, a second current display device, a second adjustable power source, a second diverter switch, a second voltage display device, a second current display device and a third diverter switch. In order to test four parameters including BVCEO, BVEBO, VCE(Eat) and VBE, a test circuit, a sample circuit and a single chip microcomputer need to be adopted in the prior art, and according to the utility model, only two adjustable power sources, three diverter switches, two ampere meters and two voltage display devices need to be adopted, so the test circuit is simplified, the cost is reduced, and the test is more accurate.
Description
Technical field
The utility model relates to a kind of triode test circuit, for testing the parameter of triode.
Background technology
About the test of transistor parameter, taking the triode of the positive-negative-positive of certain model as example:
The test condition of collector-emitter breakdown reverse voltage BVCEO is that the c electrode current of triode is 1mA, and the b electrode current of triode is 0;
The test condition of base-emitter breakdown reverse voltage BVEBO is that the electric current of the e utmost point of triode is 10uA, and the electric current of the c utmost point of triode is 0;
Saturation voltage VCE(Eat) and the test condition of saturation voltage VBE be all that the electric current of the c utmost point of triode is 4A, the electric current of the b utmost point of triode is 0.2A;
The test condition of enlargement factor hFE is VCE(Eat) be 2V, the c electrode current of triode is 0.5A.
Visible, different parameter, its test condition is not identical, therefore need to adopt the circuit of different syndetons.
For the parameters of convenient test triode, existing special testing apparatus, as the Chinese utility model patent that the patent No. is ZL201320097645.2, it discloses a kind of transistor parameter tester, comprises test circuit, sample circuit, single-chip microcomputer and display device; Described test circuit is connected with sample circuit with tested triode, for testing the various parameters of triode and sending the parameter value of gained to sample circuit; Sample circuit is connected with single-chip microcomputer, for obtaining the measured parameter value of test circuit, and parameter value is carried out sending single-chip microcomputer to after sampling processing; On single-chip microcomputer, be also connected with described display device, described display device is for showing the transistor parameter that single-chip microcomputer transmits.Above transistor parameter tester, its circuit structure is comparatively complicated, and cost is high.
Summary of the invention
The purpose of this utility model is to realize the test accurately of the multiple parameters of triode with simple circuit, to reduce costs.
Provide a kind of triode test circuit for this reason, comprise for the B end to the access of NPN type triode pin, C end, E and hold and hold for the C ' end to the access of positive-negative-positive triode pin, B ' end, described E, also comprise the first regulated power supply, the first change-over switch, the first voltage display device, the second current display device, the second regulated power supply, the second change-over switch, second voltage display device, the second current display device and the 3rd change-over switch
The first regulated power supply and the second regulated power supply select one or be triode test circuit power supply jointly;
Direction of current when the first change-over switch is specifically used for switching the first regulated power supply and is the power supply of triode test circuit;
Direction of current when the second change-over switch is specifically used for switching the second regulated power supply and is the power supply of triode test circuit;
The 3rd change-over switch is particularly when the second change-over switch is unsettled and in the time that B end, C end and E termination enter the triode of NPN type, its can by operation allow the first reometer serial connection B end be connected in series C hold between switching; When the second change-over switch is unsettled and enter the triode of positive-negative-positive in B ' end, C ' end and E termination, its can by operation allow the first reometer serial connection B ' end be connected in series C ' hold between switching; In the time that the first change-over switch and the second change-over switch are all connected in circuit, it can be allowed the first reometer hold and to be connected in series switching between B ' end at serial connection B by operation, allow the second reometer hold and be connected in series switching between C ' end at serial connection C simultaneously, when the first reometer serial connection B end, the second reometer serial connection C end, when the first reometer serial connection B ' end, the second reometer serial connection C ' end;
The first voltage display device is in parallel with the first regulated power supply;
Second voltage display device is in parallel with the second regulated power supply;
The first reometer is serially connected with one end of the first regulated power supply and between the first change-over switch and the 3rd change-over switch;
The second reometer is serially connected with one end of the second regulated power supply and between the second change-over switch and the 3rd change-over switch.
Wherein, the first regulated power supply is serially connected with the voltage trim element of the first regulated power supply.
Wherein, the voltage trim element of described the first regulated power supply is made as adjustable resistance R1.
Wherein, the second regulated power supply is serially connected with the voltage trim element of the second regulated power supply.
Wherein, the voltage trim element of described the second regulated power supply is made as adjustable resistance R2.
Wherein, the first change-over switch is double-point double-throw switch S1.
Wherein, the second change-over switch is double-point double-throw switch S2.
Wherein, the 3rd change-over switch is double-point double-throw switch S3.
Wherein, the first voltage display device is the first voltage table V1.
Wherein, second voltage display device is second voltage Table V 2.
Beneficial effect: a kind of triode test circuit of the present utility model, for test b VCEO, BVEBO, VCE(Eat) and these four parameters of VBE, prior art need to adopt test circuit, sample circuit and single-chip microcomputer etc., the utility model only needs to adopt two regulated power supplies, three change-over switches, two reometers and two voltage display device, simplify test circuit, lower cost, and added the voltage trim element of two power supplys to make test more accurate.
Brief description of the drawings
Fig. 1 is the circuit diagram of triode test circuit.
Embodiment
Taking the triode of the positive-negative-positive of certain model of providing in background technology as example, test it, first the B utmost point of triode, the C utmost point and the E utmost point are accessed respectively to B end, C end and the E end of the triode test circuit in Fig. 1.
Because the first regulated power supply BAT1 is in the time regulating, can not adjust very accurately, therefore, be serially connected with the voltage trim element of the first regulated power supply BAT1 at the first regulated power supply BAT1, in Fig. 1, the voltage trim element of described the first regulated power supply BAT1 is made as adjustable resistance R1, and auxiliary the first regulated power supply BAT1 of adjustable resistance R1 plays the effect of fine setting, makes the accuracy of test higher.
Because the second regulated power supply BAT2 is in the time regulating, can not adjust very accurately, therefore, be serially connected with the voltage trim element of the second regulated power supply BAT2 at the second regulated power supply BAT2, in Fig. 1, the voltage trim element of described the second regulated power supply BAT2 is made as adjustable resistance R2, and auxiliary the second regulated power supply BAT2 of adjustable resistance R2 plays the effect of fine setting, makes the accuracy of test higher.
In Fig. 1, the first change-over switch is double-point double-throw switch S1, and the second change-over switch is double-point double-throw switch S2, and the 3rd change-over switch is double-point double-throw switch S3, and the first voltage display device is the first voltage table V1, and second voltage display device is second voltage Table V 2.
In Fig. 1, the positive pole of the first regulated power supply BAT1 meets a stiff end S1-1 of double-point double-throw switch S1, the negative pole of the first regulated power supply BAT1 meets another stiff end S1-2 of double-point double-throw switch S1, the movable end of double-point double-throw switch S1 is allocated to K1, the positive pole of the first regulated power supply BAT1 is connected to one end of adjustable resistance R1, the negative pole of the first regulated power supply BAT1 is connected to E end; The movable end of double-point double-throw switch S1 is allocated to K2, the positive pole of the first regulated power supply BAT1 is connected to E end, the negative pole of the first regulated power supply BAT1 is connected to one end of adjustable resistance R1, one end of another termination the first reometer A1 of adjustable resistance R1 and one end of the first voltage table V1, the other end of the first voltage table V1 is connected to E end, the first stiff end S3-1 of another termination double-point double-throw switch S3 of the first reometer A1;
The positive pole of the second regulated power supply BAT2 meets a stiff end S2-1 of double-point double-throw switch S2, the negative pole of the second regulated power supply BAT2 meets another stiff end S2-2 of double-point double-throw switch S2, the movable end of double-point double-throw switch S2 is allocated to K3, the positive pole of the second regulated power supply BAT2 is connected to one end of adjustable resistance R2, the negative pole of the second regulated power supply BAT2 is connected to E end; The movable end of double-point double-throw switch S2 is allocated to K4, the positive pole of the second regulated power supply BAT2 is connected to E end, the negative pole of the second regulated power supply BAT2 is connected to one end of adjustable resistance R2, one end of another termination the second reometer A2 of adjustable resistance R2 and one end of second voltage Table V 2, the other end of second voltage Table V 2 is connected to E end, the second stiff end S3-2 of another termination double-point double-throw switch S3 of the second reometer A2;
Wherein, together with C end terminates at B ', when the movable end of double-point double-throw switch S3 is allocated to K5, the other end of the first reometer A1 is connected to B end, the other end of the second reometer A2 is connected to C end or B ' end; When the movable end of double-point double-throw switch S3 is allocated to K6, the other end of the first reometer A1 is connected to C end or B ' end, the other end of the second reometer A2 is connected to C ' end.
The test condition of collector-emitter breakdown reverse voltage BVCEO is that the c electrode current of triode is 1mA, the b electrode current of triode is 0, when user needs test set electrode-emitter breakdown reverse voltage BVCEO, only need allow double-point double-throw switch S2 unsettled, double-point double-throw switch S1 is pushed to K2, and dpdt double-pole double-throw (DPDT) S3 pushes K6, regulates the first regulated power supply BAT1 and adjustable resistance R1 to make the electric current I C=1mA of the first reometer A1, now, the value that the first voltage table V1 shows is exactly BVCEO.
The test condition of base-emitter breakdown reverse voltage BVEBO is that the electric current of the e utmost point of triode is 10uA, the electric current of the c utmost point of triode is 0, when user need to survey base-emitter breakdown reverse voltage BVEBO, only need be by unsettled double-point double-throw switch S2, double-point double-throw switch S1 is pushed to K2, double-point double-throw switch S3 is pushed to K5, regulate the first regulated power supply BAT1 and adjustable resistance R1 to make the electric current I E=1uA of the first reometer A1, now, the value that the first voltage table V1 shows is exactly BVEBO.
Saturation voltage VCE(Eat) and the test condition of saturation voltage VBE be all that the electric current of the c utmost point of triode is 4A, the electric current of the b utmost point of triode is 0.2A.When testing saturation voltage VCE(Eat) or when saturation voltage VBE, only double-point double-throw switch S1 need be pushed to K1, double-point double-throw switch S2 is pushed to K3, double-point double-throw switch S3 is pushed to K5, regulate the second regulated power supply BAT2 and adjustable resistance R2 to make the electric current I C=4A of the second reometer A2, regulate again the first regulated power supply BAT1 and adjustable resistance R1, the electric current that makes the first reometer A1 is IB=0.2A, the value that now second voltage Table V 2 shows is exactly VCE(Eat), the value that the first voltage table V1 shows is exactly VBE.
The test condition of enlargement factor hFE is VCE(Eat) be 2V, the c electrode current of triode is 0.5A.In the time that needs are tested enlargement factor hFE, only double-point double-throw switch S1 need be pushed to K1, double-point double-throw switch S2 is pushed to K3, double-point double-throw switch S3 is pushed to K5, regulate the second regulated power supply BAT2 and adjustable resistance R2 to make the electric current I C=0.5A of the second reometer A2, regulate again the first regulated power supply BAT1 and adjustable resistance R1 to make the voltage VCE(Eat of second voltage Table V 2)=2V, now see that the value that the first reometer A1 shows is M, enlargement factor hFE equals the value of the second reometer A2 demonstration divided by the value of the first reometer A1 demonstration, be enlargement factor hFE=0.5A/M.
In the time will testing the triode of positive-negative-positive, other operation is all identical with the triode of test NPN type, difference is the B utmost point of the triode of positive-negative-positive, the C utmost point and the E utmost point to access respectively C ' end, B ' end and the E end of the triode test circuit in Fig. 1, the value that simultaneously regulates test condition is corresponding negative value, the c electrode current that is triode as the test condition of collector-emitter breakdown reverse voltage BVCEO is-1mA, the b electrode current of triode is 0, and the rest may be inferred in the time regulating for the value of other test condition.
Claims (10)
1. a triode test circuit, it is characterized in that, comprise for the B end to the access of NPN type triode pin, C end, E and hold and hold for the C ' end to the access of positive-negative-positive triode pin, B ' end, described E, also comprise the first regulated power supply, the first change-over switch, the first voltage display device, the second current display device, the second regulated power supply, the second change-over switch, second voltage display device, the second current display device and the 3rd change-over switch
The first regulated power supply and the second regulated power supply select one or be triode test circuit power supply jointly;
Direction of current when the first change-over switch is specifically used for switching the first regulated power supply and is the power supply of triode test circuit;
Direction of current when the second change-over switch is specifically used for switching the second regulated power supply and is the power supply of triode test circuit;
The 3rd change-over switch is particularly when the second change-over switch is unsettled and in the time that B end, C end and E termination enter the triode of NPN type, its can by operation allow the first reometer serial connection B end be connected in series C hold between switching; When the second change-over switch is unsettled and enter the triode of positive-negative-positive in B ' end, C ' end and E termination, its can by operation allow the first reometer serial connection B ' end be connected in series C ' hold between switching; In the time that the first change-over switch and the second change-over switch are all connected in circuit, it can be allowed the first reometer hold and to be connected in series switching between B ' end at serial connection B by operation, allow the second reometer hold and be connected in series switching between C ' end at serial connection C simultaneously, when the first reometer serial connection B end, the second reometer serial connection C end, when the first reometer serial connection B ' end, the second reometer serial connection C ' end;
The first voltage display device is in parallel with the first regulated power supply;
Second voltage display device is in parallel with the second regulated power supply;
The first reometer is serially connected with one end of the first regulated power supply and between the first change-over switch and the 3rd change-over switch;
The second reometer is serially connected with one end of the second regulated power supply and between the second change-over switch and the 3rd change-over switch.
2. a kind of triode test circuit according to claim 1, is characterized in that, the first regulated power supply is serially connected with the voltage trim element of the first regulated power supply.
3. a kind of triode test circuit according to claim 2, is characterized in that, the voltage trim element of described the first regulated power supply is made as adjustable resistance R1.
4. a kind of triode test circuit according to claim 1, is characterized in that, the second regulated power supply is serially connected with the voltage trim element of the second regulated power supply.
5. a kind of triode test circuit according to claim 4, is characterized in that, the voltage trim element of described the second regulated power supply is made as adjustable resistance R2.
6. a kind of triode test circuit according to claim 1, is characterized in that, the first change-over switch is double-point double-throw switch S1.
7. a kind of triode test circuit according to claim 1, is characterized in that, the second change-over switch is double-point double-throw switch S2.
8. a kind of triode test circuit according to claim 1, is characterized in that, the 3rd change-over switch is double-point double-throw switch S3.
9. a kind of triode test circuit according to claim 1, is characterized in that, the first voltage display device is the first voltage table V1.
10. a kind of triode test circuit according to claim 1, is characterized in that, second voltage display device is second voltage Table V 2.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420050833.4U CN203705600U (en) | 2014-01-26 | 2014-01-26 | Transistor test circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420050833.4U CN203705600U (en) | 2014-01-26 | 2014-01-26 | Transistor test circuit |
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| Publication Number | Publication Date |
|---|---|
| CN203705600U true CN203705600U (en) | 2014-07-09 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420050833.4U Expired - Lifetime CN203705600U (en) | 2014-01-26 | 2014-01-26 | Transistor test circuit |
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| CN (1) | CN203705600U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104267329A (en) * | 2014-10-21 | 2015-01-07 | 京东方科技集团股份有限公司 | Transistor test circuit and method |
| CN109765474A (en) * | 2019-01-25 | 2019-05-17 | 无锡固电半导体股份有限公司 | A kind of test method of Darlington transistor parameter |
-
2014
- 2014-01-26 CN CN201420050833.4U patent/CN203705600U/en not_active Expired - Lifetime
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104267329A (en) * | 2014-10-21 | 2015-01-07 | 京东方科技集团股份有限公司 | Transistor test circuit and method |
| US10006957B2 (en) | 2014-10-21 | 2018-06-26 | Boe Technology Group Co., Ltd. | Circuit and method for testing transistor(s) |
| CN109765474A (en) * | 2019-01-25 | 2019-05-17 | 无锡固电半导体股份有限公司 | A kind of test method of Darlington transistor parameter |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term |
Granted publication date: 20140709 |
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| CX01 | Expiry of patent term |