CN203705326U - Device for loading CdZnTe sample - Google Patents
Device for loading CdZnTe sample Download PDFInfo
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- CN203705326U CN203705326U CN201320805192.4U CN201320805192U CN203705326U CN 203705326 U CN203705326 U CN 203705326U CN 201320805192 U CN201320805192 U CN 201320805192U CN 203705326 U CN203705326 U CN 203705326U
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- zinc cadmium
- tellurium zinc
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Abstract
The utility model discloses a device for loading a CdZnTe sample. The device comprises a square platform, wherein the square platform is used for placing the CdZnTe sample, the thickness of the square platform is not less than a first preset value; the two adjacent edges of the square platform are provided with rails which are perpendicular to the square platform, the rails are used for preventing the position moving of the CdZnTe sample to further avoid sliding, and the heights of the rails are not less than the thickness of the CdZnTe sample; a bottom plane of the square platform is provided with a bulge, and the bulge is used for embedding into an automatic platform. The device for loading the CdZnTe sample provided by the utility model has the advantages that the area is large, the rails are arranged, the veracity of a test result is guaranteed because of the use of the device, the testing efficiency and work efficiency are greatly improved, and the problems that a room temperature test board of a photoluminescence system in the prior art can not rapidly locate, the size of a test sample is limited, the sample after testing needs be moved to the edge of a sample platform to be taken down are solved.
Description
Technical field
The utility model relates to light at room temperature photoluminescence field tests, particularly relates to a kind of device that carries tellurium zinc cadmium sample.
Background technology
Tellurium zinc cadmium (Cd
1-yzn
yte) grating constant of crystal and at present the infrared detector material mercury cadmium telluride (Hg of main flow
1-xcd
xte) matching, is the desirable substrate of extension mercury cadmium telluride thin film, is also the development basis of mercury cadmium telluride high-performance focal plane arrays (FPA).The unevenness of Zn component will cause the lattice mismatch on unevenness and the epitaxial loayer of grating constant of substrate wafer to change, and only has the CdZnTe substrate of the Lattice Matching high-quality tellurium cadmium mercury epitaxial layer of low dislocation requiring that just can be applied.Therefore, before epitaxial growth, accurately measure Zn component and face distribution by nondestructive method, for the quality of control backing material homogeneity and raising epitaxial film, be very important, also significant for research and optimization tellurium-zincium-cadmium crystal growth technique.
Photoluminescence is a kind of luminescence phenomenon of semiconductor material, excites the luminous of lower radiation recombination generation in illumination.It can reflect that the energy state of Impurities in Semiconductors and defect changes, and is considered to study the of paramount importance method of semiconductor material band structure delicately.The photoluminescent process of semiconductor material is containing the abundant information of material structure and component, is the concentrated expression of Various Complex physical process.
In noncontact at present, undamaged measurement tellurium zinc cadmium, the main method of Zn component has X ray double crystal diffraction, near infrared spectrum and light at room temperature photoluminescence.The precision of X ray double crystal diffraction test Zn component is high, but the time is long; When near infrared spectroscopy test Zn component, speed is fast, but repeatability is bad; Although and in tellurium zinc cadmium Zn component light at room temperature photoluminescence test have reproducible, speed is fast, simple to operate and there is the advantages such as high precision, after the room temperature test board of existing photoluminescence system can not locate, test that sample is size-constrained fast, sample must move to sample stage edge after test, just can take off; And this method of testing can not directly obtain Zn component result in tellurium zinc cadmium, the tellurium zinc cadmium of also easily burning, this has not only had a strong impact on testing efficiency and work efficiency, has also improved cost.
Utility model content
The utility model provides a kind of device that carries tellurium zinc cadmium sample, in order to solve the room temperature test board of prior art photoluminescence system can not locate fast, test sample size-constrained, test after sample must move to the problem that just can take off behind sample stage edge.
For solving the problems of the technologies described above, the utility model provides a kind of device that carries tellurium zinc cadmium sample, be arranged in the automatic platform of Zn component device in light at room temperature photoluminescence test tellurium zinc cadmium, comprise: square platform, be used for placing tellurium zinc cadmium sample, the thickness of described square platform is not less than the first preset value; Adjacent two edges at described square platform arrange the fence perpendicular to described square platform, and described fence moves and causes landing for the protection of described tellurium zinc cadmium sample position, and the height of described fence is not less than the thickness of described tellurium zinc cadmium sample; A bossing is set on the baseplane of described square platform, and described bossing is used for embedding in described automatic platform.
Further, the top plane of described square platform is also provided with a groove part, described groove part is arranged on one or two edge side that described fence is not set, the thickness of described groove part is less than described the first preset value and is more than or equal to the second preset value, and described groove part holds for making the parts that clamp described tellurium zinc cadmium sample insert or extract.
Further, described the first preset value is 2mm, and described the second preset value is 0.5mm.
Further, described groove part is rectangular recess, and the length of described rectangular recess is 70mm-120mm, described rectangular wide be 5mm-10mm.
Further, described square platform is rectangular platform, and the length of described rectangular platform is 80mm-125mm, and the wide of described rectangular platform is 40mm-80mm; The thickness of described fence is 1mm-5mm; Described bossing is rectangle projection, and the length of described rectangle projection is 70mm-80mm, and the wide of described rectangle projection is 50mm-60mm; The thickness of described rectangle projection is 8.5mm-12mm.
Further, the device that carries tellurium zinc cadmium sample shown in adopts polytetrafluoro material to make.
The device area of the carrying tellurium zinc cadmium sample that the utility model provides is large, sample size is not strictly limited, and there is fence, make the sample in test steady, do not come off, this bogey well can also be embedded into by bossing in the automatic platform of Zn component device in light at room temperature photoluminescence test tellurium zinc cadmium, the use of this device, both ensured the accuracy of test result, testing efficiency and work efficiency are greatly improved again, the room temperature test board that has solved prior art photoluminescence system can not be located fast, test sample is size-constrained, after test, sample must move to the problem that just can take off behind sample stage edge.
Brief description of the drawings
Fig. 1 is the structural representation that carries the device of tellurium zinc cadmium sample in the utility model embodiment;
Fig. 2 is the process flow diagram of testing the method for Zn component in tellurium zinc cadmium in the utility model embodiment;
Fig. 3 is that the device that carries tellurium zinc cadmium in the utility model preferred embodiment is arranged on the scheme of installation in automatic platform;
Fig. 4 is the front view that carries the device of tellurium zinc cadmium in the utility model preferred embodiment;
Fig. 5 is the side view that carries the device of tellurium zinc cadmium in the utility model preferred embodiment;
Fig. 6 is the birds-eye perspective that carries the device of tellurium zinc cadmium in the utility model embodiment.
Embodiment
Just for solve the room temperature test board of prior art photoluminescence system can not locate fast, test sample size-constrained, test after sample must move to the problem that can take off behind sample stage edge, the utility model provides a kind of method of carrying the device of tellurium zinc cadmium sample and testing Zn component in tellurium zinc cadmium, below in conjunction with accompanying drawing and embodiment, the utility model is further elaborated.Should be appreciated that specific embodiment described herein, only in order to explain the utility model, does not limit the utility model.
The utility model embodiment provides a kind of device that carries tellurium zinc cadmium sample, and this device is arranged in the automatic platform of Zn component device in light at room temperature photoluminescence test tellurium zinc cadmium, and its structural representation as shown in Figure 1, comprising:
Square platform 1, for placing tellurium zinc cadmium sample, the thickness of square platform is not less than the first preset value; Adjacent two edges at square platform arrange the fence perpendicular to square platform, and fence 2 moves and causes landing for the protection of tellurium zinc cadmium sample position, and the height of fence is not less than the thickness of tellurium zinc cadmium sample; A bossing 3 is set on the baseplane of square platform, and bossing is used for embedding in automatic platform.
The utility model embodiment provides a kind of device that carries tellurium zinc cadmium sample, this bogey area is large, sample size is not strictly limited, and there is fence, make the sample in test steady, do not come off, this bogey well can also be embedded into by bossing in the automatic platform of Zn component device in light at room temperature photoluminescence test tellurium zinc cadmium, the use of this device, both ensured the accuracy of test result, testing efficiency and work efficiency are greatly improved again, the room temperature test board that has solved prior art photoluminescence system can not be located fast, test sample is size-constrained, after test, sample must move to the problem that just can take off behind sample stage edge.
In the time of design, can also also be provided with a groove part in the top plane of stating square platform 1, groove part is arranged on one or two edge side that fence is not set, a groove can be set, two grooves also can be set, if two grooves, this groove can be arranged to the connection of L-type, certainly, also can be set to not be communicated with, those skilled in the art can select to arrange one, two or even multiple groove according to actual needs.When design, the thickness of groove part is less than the first preset value and is more than or equal to the second preset value, and groove part holds for making the parts that clamp tellurium zinc cadmium sample insert or extract, by the design of this groove part, can insert easily hold assembly, promote user's experience.Above-mentioned groove part can be designed as square or rectangular, as long as facilitate gripping.
When specific design, the first preset value can be set to 2mm, and the second preset value can be set to 0.5mm, and certainly, this value is not a value necessarily requiring, and those skilled in the art can reasonably arrange according to the actual requirements.
If designed according to above-mentioned specification, its groove part is designed to rectangular recess, and the length of rectangular recess can be within the scope of 70mm-120mm, rectangular wide within the scope of 5mm-10mm.Above-mentionedly state square platform and also can be designed as rectangular platform, the length of rectangular platform within the scope of 80mm-125mm, rectangular platform wide within the scope of 40mm-80mm; The thickness of fence is within the scope of 1mm-5mm; Bossing also can be designed as rectangle projection, the length of rectangle projection within the scope of 70mm-80mm, rectangle projection wide within the scope of 50mm-60mm; The thickness of rectangle projection is within the scope of 8.5mm-12mm.
The present embodiment also provides a kind of method of testing Zn component in tellurium zinc cadmium, and its flow process as shown in Figure 2, comprises that step S202 is to step S206:
S202, is placed on tellurium zinc cadmium sample on the device of above-mentioned carrying tellurium zinc cadmium sample;
S204, by microexamination Sample location, and focuses on sample;
S206, arranges test condition by after Sample location zero point, and carries out the photoluminescence test of room temperature face scanning, to determine Zn component in tellurium zinc cadmium.
In implementation procedure, determine that in tellurium zinc cadmium, Zn component can comprise following process: test sample is taken off, and test by testing software, wherein, testing software is the value of energy gap Eg corresponding to the position of glow peak peak value after completing according to test, and experimental formula is determined Zn component in tellurium zinc cadmium.Concrete, can select energy (eV) for transverse axis unit, the position of having tested rear glow peak peak value is corresponding to the value of tellurium zinc cadmium energy gap Eg.According to experimental formula Eg(x, 296K)=(0.139+a) x
2+ (0.606+b) x+ (1.51+c) is (eV), by a, b in correction formula and tri-parameters of c, having obtained the concrete numerical value of a, b and c, is the Zn component value that can calculate tellurium zinc cadmium in the above-mentioned formula of value substitution of Eg the glow peak peak position that obtains in test.
Preferred embodiment
The utility model embodiment provides a kind of method for light at room temperature photoluminescence test tellurium zinc cadmium Zn component and the device of carrying tellurium zinc cadmium, not only solve the restriction of Sample location, sample size, sample in test and taken off the problems such as simple and efficient, directly obtain problem but also solved tellurium zinc cadmium Zn component result, test duration has been got back significantly to be reduced, both ensured the accuracy of test result, testing efficiency and work efficiency are greatly improved again, also effectively solve burning of sample, greatly reduced cost.
A kind of method for light at room temperature photoluminescence test tellurium zinc cadmium Zn component that the utility model embodiment provides, comprises the following steps:
Step 1: the device of carrying tellurium zinc cadmium is arranged in the automatic platform of light at room temperature photoluminescence system and fixes;
Step 2: the right angle place, collimation limit that tellurium zinc cadmium sample to be measured is put in to this device;
Step 3: utilize the microexamination Sample location in this system and sample is focused on;
Step 4: the photoluminescence test that after sample lower left corner location zero point, test condition is set and carries out the scanning of room temperature face;
Step 5: test finishes to take off sample, adopts self-editing software calculate tellurium zinc cadmium Zn component result and use the checking of X ray double crystal diffraction.
Wherein, in described step 1, to adopt the device of the carrying tellurium zinc cadmium made of polytetrafluoro to be arranged in the automatic platform of light at room temperature photoluminescence system to fix, it installs signal as shown in Figure 3, the structural representation of the device of this carrying tellurium zinc cadmium is as Fig. 4, shown in Fig. 5 and Fig. 6, Fig. 4 is the front view of this device, Fig. 5 is the side view of this device, Fig. 6 is the birds-eye perspective of this device, wherein, 0.5mm≤a1≤1.5mm, 1mm≤a2≤1.5mm, 3mm≤a3≤5mm, 8.5mm≤a4≤12mm, 0mm≤b2≤18mm, 5mm≤b3≤10mm, 80mm≤b4≤125mm, 70mm≤b5≤80mm, 5mm≤b6≤10mm, 5mm≤b7≤10mm, 50mm≤b9≤60mm, 40mm≤b10≤80mm.
In described step 3, utilize the microexamination Sample location in this system and sample is focused on, comprise the following steps: selected microscopical × 5, × 20, × 50 object lens are after one of them, the gulde edge of sample for reference is also finely tuned, then sample is focused on, until occur on screen that the center that is brought to is the hot spot of bright spot.
In described step 4, the photoluminescence test that after sample lower left corner location zero point, test condition is set and carries out the scanning of room temperature face, comprise the following steps: by microscope, zero point to be orientated as in the sample lower left corner according to object lens selected in step 3, the power of selecting laser is 1%～100%, laser beam expanding 0～30%, time shutter is 0.5～10s, the surveying range of spectrum is elected 1.485eV～1.544eV as, test step-length minimum is 0.1 μ m, number of test points arranges starting point coordinate and test step-length as required, carries out after setting completed light at room temperature photoluminescence test.
In described step 5, test finishes to take off sample, adopt self-editing software to calculate Zn component result in tellurium zinc cadmium, and verify with X ray double crystal diffraction, comprise the following steps: one jiao of self-control clamping tool to put into the recess that test sample edge contacts with utility model device, take off sample and put back in box, adopting self-editing software calculate tellurium zinc cadmium Zn component result and use the checking of X ray double crystal diffraction.Result demonstration, the result that the tellurium zinc cadmium Zn component result that this test macro records and X ray double crystal diffraction record is coincide finely, and relative error is in 5%.Wherein, self-programmed software is that those skilled in the art are according to the disclosed content Programming of the utility model embodiment, its principle is the value of energy gap Eg corresponding to the position of glow peak peak value after completing according to test, and experimental formula Eg(x, 296K)=(0.139+a) x
2+ (0.606+b) x+ (1.51+c) (eV) determines Zn component in tellurium zinc cadmium.
Below in conjunction with instantiation, such scheme is further described.
Example 1
The present embodiment adopts polytetrafluoro to make the device of carrying tellurium zinc cadmium, and polytetrafluoro material is not crisp not hard, and easily cleans, and is comparatively applicable to making the device of carrying tellurium zinc cadmium.When enforcement, fix adopting the bogey made of polytetrafluoro to be arranged in the automatic platform of light at room temperature photoluminescence system, wherein, a1=1mm, a2=1mm, a3=4mm, a4=10mm, b2=5mm, b3=5mm, b4=120mm, b5=75mm, b6=5mm, b7=5mm, b9=55mm, b10=80mm; Tellurium zinc cadmium sample to be measured is put in the right angle place, collimation limit of this device; Elect as × 50 object lens of microscope, sample for reference is located and is focused on; Sample lower left corner right angle electrical is orientated as to zero point, the power of selecting laser is 5%, laser beam expanding 10%, time shutter is 2s, the surveying range of spectrum is elected 1.490eV～1.535eV as, test step-length is 2mm, and tellurium zinc cadmium sample is carried out to light at room temperature photoluminescence test, within 40 minutes, has completed on sample the test of 108 and has utilized the self-programmed software to have obtained rapidly the Zn component result of tellurium zinc cadmium; Put into one jiao of self-control clamping tool the recess that test sample edge contacts with utility model device, take off sample and put back in box, adopt self-editing software calculate tellurium zinc cadmium Zn component result and use the checking of X ray double crystal diffraction, result shows, the result that the tellurium zinc cadmium Zn component result that this test macro records and X ray double crystal diffraction record is coincide finely, and relative error is in 5%.
Example 2
Fix a1=0.5mm, a2=1.5mm, a3=5mm, a4=12mm adopting the utility model device made of polytetrafluoro to be arranged in the automatic platform of light at room temperature photoluminescence system, b2=18mm, b3=8mm, b4=80mm, b5=70mm, b6=10mm, b7=8mm, b9=50mm, b10=50mm; Tellurium zinc cadmium sample to be measured is put in the right angle place, collimation limit of this device; Elect as × 20 object lens of microscope, sample for reference is located and is focused on; Sample lower left corner right angle electrical is orientated as to zero point, the power of selecting laser is 50%, laser beam expanding 20%, time shutter is 1s, the surveying range of spectrum is elected 1.495eV～1.539eV as, test step-length is 2mm, and tellurium zinc cadmium sample is carried out to light at room temperature photoluminescence test, within 40 minutes, has completed on sample the test of 108 and has utilized the self-programmed software to have obtained rapidly the Zn component result of tellurium zinc cadmium; Put into one jiao of self-control clamping tool the recess that test sample edge contacts with utility model device, take off sample and put back in box, adopt self-editing software calculate tellurium zinc cadmium Zn component result and use the checking of X ray double crystal diffraction, result shows, the result that the tellurium zinc cadmium Zn component result that this test macro records and X ray double crystal diffraction record is coincide finely, and relative error is in 5%.
Although be example object, preferred embodiment of the present utility model is disclosed, it is also possible those skilled in the art will recognize various improvement, increase and replacement, therefore, scope of the present utility model should be not limited to above-described embodiment.
Claims (6)
1. carry a device for tellurium zinc cadmium sample, be arranged in the automatic platform of Zn component device in light at room temperature photoluminescence test tellurium zinc cadmium, it is characterized in that, comprising:
Square platform, for placing tellurium zinc cadmium sample, the thickness of described square platform is not less than the first preset value;
Adjacent two edges at described square platform arrange the fence perpendicular to described square platform, and described fence moves and causes landing for the protection of described tellurium zinc cadmium sample position, and the height of described fence is not less than the thickness of described tellurium zinc cadmium sample;
A bossing is set on the baseplane of described square platform, and described bossing is used for embedding in described automatic platform.
2. device as claimed in claim 1, it is characterized in that, the top plane of described square platform is also provided with a groove part, described groove part is arranged on one or two edge side that described fence is not set, the thickness of described groove part is less than described the first preset value and is more than or equal to the second preset value, and described groove part holds for making the parts that clamp described tellurium zinc cadmium sample insert or extract.
3. device as claimed in claim 2, is characterized in that, described the first preset value is 2mm, and described the second preset value is 0.5mm.
4. device as claimed in claim 1, is characterized in that, described groove part is rectangular recess,
The length of described rectangular recess is 70mm-120mm, described rectangular wide be 5mm-10mm.
5. the device as described in any one in claim 1 to 4, is characterized in that, described square platform is rectangular platform, and the length of described rectangular platform is 80mm-125mm, and the wide of described rectangular platform is 40mm-80mm;
The thickness of described fence is 1mm-5mm;
Described bossing is rectangle projection, and the length of described rectangle projection is 70mm-80mm, and the wide of described rectangle projection is 50mm-60mm; The thickness of described rectangle projection is 8.5mm-12mm.
6. the device as described in any one in claim 1 to 4, is characterized in that, shown in carry tellurium zinc cadmium sample device adopt polytetrafluoro material to make.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320805192.4U CN203705326U (en) | 2013-12-09 | 2013-12-09 | Device for loading CdZnTe sample |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320805192.4U CN203705326U (en) | 2013-12-09 | 2013-12-09 | Device for loading CdZnTe sample |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203705326U true CN203705326U (en) | 2014-07-09 |
Family
ID=51055747
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201320805192.4U Withdrawn - After Issue CN203705326U (en) | 2013-12-09 | 2013-12-09 | Device for loading CdZnTe sample |
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| CN (1) | CN203705326U (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103674841A (en) * | 2013-12-09 | 2014-03-26 | 中国电子科技集团公司第十一研究所 | Device for bearing tellurium, zinc, and cadmium sample, and method for detecting Zn component in tellurium, zinc, and cadmium sample |
| CN105467576A (en) * | 2015-12-30 | 2016-04-06 | 中国科学院苏州生物医学工程技术研究所 | Rotatable multi-angle imaging two-photon microscope |
| CN113945591A (en) * | 2021-09-14 | 2022-01-18 | 中国电子科技集团公司第十一研究所 | Half-peak-width automatic test tool |
| CN114414478A (en) * | 2021-12-21 | 2022-04-29 | 北京智创芯源科技有限公司 | Sample testing device and testing method for cadmium zinc telluride sample |
-
2013
- 2013-12-09 CN CN201320805192.4U patent/CN203705326U/en not_active Withdrawn - After Issue
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103674841A (en) * | 2013-12-09 | 2014-03-26 | 中国电子科技集团公司第十一研究所 | Device for bearing tellurium, zinc, and cadmium sample, and method for detecting Zn component in tellurium, zinc, and cadmium sample |
| CN105467576A (en) * | 2015-12-30 | 2016-04-06 | 中国科学院苏州生物医学工程技术研究所 | Rotatable multi-angle imaging two-photon microscope |
| CN105467576B (en) * | 2015-12-30 | 2019-01-15 | 中国科学院苏州生物医学工程技术研究所 | A kind of rotatable multi-angle imaging Two Photon Fluorescence |
| CN113945591A (en) * | 2021-09-14 | 2022-01-18 | 中国电子科技集团公司第十一研究所 | Half-peak-width automatic test tool |
| CN113945591B (en) * | 2021-09-14 | 2023-10-24 | 中国电子科技集团公司第十一研究所 | Half-peak width automatic test fixture |
| CN114414478A (en) * | 2021-12-21 | 2022-04-29 | 北京智创芯源科技有限公司 | Sample testing device and testing method for cadmium zinc telluride sample |
| CN114414478B (en) * | 2021-12-21 | 2022-09-02 | 北京智创芯源科技有限公司 | Sample testing device and testing method for cadmium zinc telluride sample |
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