CN203658276U - Sapphire ingot stress detection device - Google Patents

Sapphire ingot stress detection device Download PDF

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Publication number
CN203658276U
CN203658276U CN201320861256.2U CN201320861256U CN203658276U CN 203658276 U CN203658276 U CN 203658276U CN 201320861256 U CN201320861256 U CN 201320861256U CN 203658276 U CN203658276 U CN 203658276U
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CN
China
Prior art keywords
stress
camera
guide rail
crystal bar
detection device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
CN201320861256.2U
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Chinese (zh)
Inventor
宁敏
任玉建
高玉强
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shandong Tianyue Advanced Technology Co Ltd
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SICC Science and Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
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Priority to CN201320861256.2U priority Critical patent/CN203658276U/en
Application granted granted Critical
Publication of CN203658276U publication Critical patent/CN203658276U/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

The utility model discloses a sapphire ingot stress detection device. A polarization analyzer and a camera are integrated; an image collecting device and a stress instrument main body are combined together; images collected by the camera are transmitted to a computer by a data line; a sample table can rotate by 360 degrees so as to find the maximal position of stress. The sapphire ingot stress detection device provided by the utility model saves time and labor, is simple to operate, and can operate and complete the whole process on the computer by a visualized software interface; when to-be-detected ingots are multiple, the detection efficiency is improved greatly; the image collection accuracy can be ensured; the stress detection accuracy is improved further.

Description

A kind of sapphire crystal bar stress detection device
Technical field
The utility model relates to a kind of stress detection device, is specifically related to a kind of sapphire crystal bar stress detection device.
Background technology
In recent years, along with the continuous expansion of sapphire crystal bar market scale, the quality testing of sapphire crystal bar is also more and more important, and wherein stress detection is one very important in the quality testing of sapphire crystal bar.Current stress ga(u)ge is on the market all universal tension gauges, is not suitable for the detection to sapphire crystal bar stress; And the mode that must adopt stress ga(u)ge to combine with digital camera in practical operation is first carried out the collection of stress image by two people's compounding practices, then complete detection, so on the one hand, in the time gathering the image of stress maximum, need testing staff's slow circumvolve crystal bar to rake about and determine stress maximum, and in the time that quantity to be detected is larger, relatively waste time and energy, the while, because the friction of the exiting surface of crystal bar and stress ga(u)ge causes exiting surface frosted to affect light extraction efficiency, has been reduced the serviceable life of stress ga(u)ge; On the other hand, the quality of stress image and the height of shooting, the angle that gather have very large relation, due to the restriction of various factors, testing staff's hand-held digital camera is difficult to hold suitable height and angle, like this sapphire crystal bar stress image gather inaccurate, thereby cause that detection efficiency is low and testing result is inaccurate.
Summary of the invention
For the deficiencies in the prior art, the utility model provides a kind of sapphire crystal bar stress detection device, solved in prior art, waste time and energy, stress ga(u)ge serviceable life is short and the inaccurate detection efficiency causing of image is low and the inaccurate defect of testing result.
Concrete technical scheme of the present utility model is: a kind of sapphire crystal bar stress detection device, comprise pedestal, described pedestal is hollow, in pedestal, be provided with incandescent source, described base-plates surface is provided with guide rail I, in guide rail I, be placed with the sample stage matching with guide rail I, guide rail I below is provided with polarizer; Described pedestal one side is provided with guide rail II, is placed with the elevating lever matching with guide rail II in guide rail II, is provided with camera on elevating lever, and camera bottom is provided with analyzer.
Described analyzer and camera unite two into one, and can save like this hand-held analyzer, and image collecting device and stress ga(u)ge body junction are combined simultaneously, do not need extra capture apparatus; The image of camera collection is transferred to computer by data line III.
Described sample stage is connected by Double-gear drive unit I with one end of sensor I, and the other end of sensor I is connected with control gear by data line I; Described elevating lever is connected by Double-gear drive unit II with one end of sensor II, and the other end of sensor II is connected with control gear by data line II; Described camera is connected with computer by data line III.
Described control gear and computer can be integrated.
The power source of described Double-gear drive unit I and Double-gear drive unit II is motor.
In the time that the stress of sapphire crystal bar is detected, need to gather the stress image of sapphire crystal bar.First switch on power, open the stress image acquisition software on computer, sapphire crystal bar to be measured is placed on sample stage, sensor II receives the signal that on control gear or computer, control gear transmits, regulate elevating lever by Double-gear drive unit II, camera is adjusted to stress image size to fit, picture is height clearly, then sensor I receives the signal that on control gear or computer, control gear transmits, make sample stage rotation by Double-gear drive unit I, observe the stress image that computer collects simultaneously, find stress maximum position, sample stage can be as required clockwise or rotate counterclockwise, stop being saved to file by grabgraf after image acquisition, complete the collection of sapphire crystal bar stress image, in the time that quantity to be detected is larger, repeat above step, automatically complete fast the collection of the stress image of sapphire crystal bar.Time saving and energy saving like this, sample stage drives the rotation of sapphire crystal bar, while avoiding manually rotating crystal bar, because the friction of crystal bar and stress ga(u)ge exiting surface affects the problem of light extraction efficiency, extend the serviceable life of stress ga(u)ge, the accuracy simultaneously gathering due to stress image, has ensured higher detection efficiency and testing result accurately.
Described sample stage is made up compared with the unstressed material in highland of physical strength and transmittance, is dentate gyrus dish type, can realize 360 ° of rotations, finds the maximum position of stress with this.
On described sample stage, be provided with the concentric circles scale mark that the center of circle is identical, diameter is different, while carrying out image acquisition, the scale mark on platform is positioned over crystal bar to be measured on sample stage per sample, ensure crystal bar to be measured concentric with sample stage together with rotation.
Described camera is CCD(charge-coupled device) camera, have high resolving power, can self-focusing advantage.
The beneficial effects of the utility model have:
(1) in image acquisition process, the rotation of sapphire crystal bar is automatic by manually changing into, with high-resolution CCD camera replacement digital camera, whole process can one man operation complete, and has saved manpower and materials;
(2) simple to operate, whole process can operate on computers by visual software interface, in the time that crystal bar quantity to be detected is more, will greatly improve detection efficiency;
(3) in image acquisition process, the height of CCD camera can regulate, and shooting angle is accurately located, and ensures the accuracy of image acquisition, further improves the accuracy that stress detects.
Brief description of the drawings
Fig. 1 is structural representation of the present utility model;
Fig. 2 is the vertical view of sample stage described in Fig. 1.
In figure, 1 is camera, the 2nd, and analyzer, the 3rd, sample, the 4th, sample stage, the 5th, guide rail I, the 6th, polarizer, the 7th, incandescent source, the 8th, elevating lever, the 9th, guide rail II, the 10th, Double-gear drive unit II, the 11st, Double-gear drive unit I, the 12nd, pedestal, the 13rd, sensor II, the 14th, data line II, the 15th, data line III, the 16th, computer, the 17th, data line I, the 18th, sensor I, the 19th, control gear.
Embodiment
A kind of sapphire crystal bar stress detection device, comprises pedestal 12, and described pedestal 12 is hollow, in pedestal 12, be provided with incandescent source, described pedestal 12 surfaces are provided with guide rail I 5, are placed with the sample stage 4 matching with guide rail I 5 in guide rail I 5, and guide rail I 5 belows are provided with polarizer 6; Described pedestal 12 1 sides are provided with guide rail II 9, are placed with the elevating lever 8 matching with guide rail II 9 in guide rail II 9, are provided with camera 1 on elevating lever 8, and camera 1 bottom is provided with analyzer 2.
Described analyzer 2 unites two into one with camera 1, can save like this hand-held analyzer, and image collecting device and stress ga(u)ge body junction are combined simultaneously, do not need extra capture apparatus; The image of camera collection is transferred to computer 16 by data line III 15.
Described sample stage 4 is connected by Double-gear drive unit I 11 with one end of sensor I 18, and the other end of sensor I 18 is connected with control gear 19 by data line I 11; Described elevating lever 8 is connected by Double-gear drive unit II 10 with one end of sensor II 13, and the other end of sensor II 13 is connected with control gear 19 by data line II 14; Described camera 1 is connected with computer 16 by data line III 15.
The power source of described Double-gear drive unit I 11 and Double-gear drive unit II 10 is motor.
Described sample stage 4 is made up compared with the unstressed material in highland of physical strength and transmittance, is dentate gyrus dish type, can realize 360 ° of rotations, finds the maximum position of stress with this.
On described sample stage 4, be provided with the concentric circles scale mark that the center of circle is identical, diameter is different, while carrying out image acquisition, the scale mark on platform is positioned over crystal bar sample 3 to be measured on sample stage 4 per sample, ensure crystal bar sample 3 to be measured concentric with sample stage 4 together with rotation.
Described camera 1 is CCD(charge-coupled device) camera, have high resolving power, can self-focusing advantage.
In the time that the stress of sapphire crystal bar is detected, need to gather the stress image of sapphire crystal bar.First switch on power, open the stress image acquisition software on computer 16, sapphire crystal bar sample 3 to be measured is placed on sample stage 4, sensor II 13 receives the signal that on control gear 19 or computer 16, control gear 19 transmits, regulate elevating lever 8 by Double-gear drive unit II 10, camera 1 is adjusted to stress image size to fit, picture is height clearly, then sensor I 18 receives the signal that on control gear 19 or computer 16, control gear 19 transmits, by Double-gear drive unit I 11, sample stage 4 is rotated, observe the stress image that computer 16 collects simultaneously, find stress maximum position, sample stage 4 can be as required clockwise or rotate counterclockwise, stop being saved to file by grabgraf after image acquisition, complete the collection of sapphire crystal bar stress image, in the time that quantity to be detected is larger, repeat above step, automatically complete fast the collection of the stress image of sapphire crystal bar.Time saving and energy saving like this, sample stage 4 drives sapphire crystal bar sample 3 to rotate, while avoiding manually rotating crystal bar, because the friction of crystal bar sample and stress ga(u)ge exiting surface affects the problem of light extraction efficiency, extend the serviceable life of stress ga(u)ge, the accuracy simultaneously gathering due to stress image, has ensured higher detection efficiency and testing result accurately.

Claims (4)

1. a sapphire crystal bar stress detection device, comprise pedestal (12), described pedestal (12) is hollow, in pedestal (12), be provided with incandescent source (7), it is characterized in that: described pedestal (12) surface is provided with guide rail I (5), in guide rail I (5), be placed with the sample stage (4) matching with guide rail I (5), guide rail I (5) below is provided with polarizer (6); Described pedestal (12) one sides are provided with guide rail II (9), are placed with the elevating lever (8) matching with guide rail II (9) in guide rail II (9), are provided with camera (1) on elevating lever (8), and camera (1) bottom is provided with analyzer (2);
Described sample stage (4) is connected by Double-gear drive unit I (11) with one end of sensor I (18), and the other end of sensor I (18) is connected with control gear (19) by data line I (17); Described elevating lever (8) is connected by Double-gear drive unit II (10) with one end of sensor II (13), and the other end of sensor II (13) is connected with control gear (19) by data line II (14); Described camera (1) is connected with computer (16) by data line III (15).
2. sapphire crystal bar stress detection device according to claim 1, is characterized in that: described sample stage (4) is dentate gyrus dish type.
3. sapphire crystal bar stress detection device according to claim 2, is characterized in that: on described sample stage (4), be provided with the concentric circles scale mark that the center of circle is identical, diameter is different.
4. sapphire crystal bar stress detection device according to claim 1, is characterized in that: described camera (1) is CCD camera.
CN201320861256.2U 2013-12-25 2013-12-25 Sapphire ingot stress detection device Expired - Lifetime CN203658276U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201320861256.2U CN203658276U (en) 2013-12-25 2013-12-25 Sapphire ingot stress detection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201320861256.2U CN203658276U (en) 2013-12-25 2013-12-25 Sapphire ingot stress detection device

Publications (1)

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CN203658276U true CN203658276U (en) 2014-06-18

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105549216A (en) * 2016-02-19 2016-05-04 天津市职业大学 Multi-user real-time visual gem polariscope
CN106501262A (en) * 2016-12-06 2017-03-15 深圳大学 A kind of sapphire ingot detection means
CN108333181A (en) * 2018-01-08 2018-07-27 苏州中汽检测技术服务有限公司 A kind of full-automatic quality detecting system for fatigue test specimen

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105549216A (en) * 2016-02-19 2016-05-04 天津市职业大学 Multi-user real-time visual gem polariscope
CN106501262A (en) * 2016-12-06 2017-03-15 深圳大学 A kind of sapphire ingot detection means
CN108333181A (en) * 2018-01-08 2018-07-27 苏州中汽检测技术服务有限公司 A kind of full-automatic quality detecting system for fatigue test specimen
CN108333181B (en) * 2018-01-08 2023-10-10 苏州中汽检测技术服务有限公司 Full-automatic quality detection system for fatigue test sample

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C14 Grant of patent or utility model
GR01 Patent grant
CP03 Change of name, title or address
CP03 Change of name, title or address

Address after: No.99, Tianyue South Road, Huaiyin District, Jinan City, Shandong Province

Patentee after: Shandong Tianyue advanced technology Co.,Ltd.

Address before: 3-409, Yinhe building, 2008 Xinluo street, Lixia District, Jinan City, Shandong Province

Patentee before: SICC Co.,Ltd.

CX01 Expiry of patent term
CX01 Expiry of patent term

Granted publication date: 20140618