CN203643530U - Silicon carbide rod testing machine - Google Patents
Silicon carbide rod testing machine Download PDFInfo
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- CN203643530U CN203643530U CN201320807112.9U CN201320807112U CN203643530U CN 203643530 U CN203643530 U CN 203643530U CN 201320807112 U CN201320807112 U CN 201320807112U CN 203643530 U CN203643530 U CN 203643530U
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- elema
- silicon carbide
- carbide rod
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Abstract
A silicon carbide rod testing machine is characterized in that the silicon carbide rod testing machine mainly comprises a protection circuit, a voltage stabilizing circuit, a timing circuit, a voltage regulator circuit and a test circuit. The silicon carbide rod testing machine is simple in structure and reliable in operation, and the disadvantages that in the prior art, a method for judging whether a silicon carbide rod is aged is using a universal meter, errors are large due to different test environments, and a silicon carbide rod that is good in performance and still can be normally used is frequently judged to be not available anymore, so that large economic losses are caused in production are overcome.
Description
Technical field
The invention belongs to electronic science and technology field, particularly relate to the Design and manufacture of Elema test machine.
Background technology
The product of electronics and information industry manufacturer at present, as voltage dependent resistor (VDR), thermistor, electric capacity etc. production equipment all adopts two push-plate type tunnel resistor stoves, serviceability temperature is up to 1300 degrees Celsius of left and right, what heating element all adopted is Elema, although Elema is consumptive material, but expensive, the life-span is short, easily aging, and in electronic product manufacturing cost, Elema expense is occupied sizable ratio.
The whether aging method of industrial community differentiation Elema only has universal electric meter at present, because test environment difference, so error is large, often Elema functional, that still can meet normal use is judged and can not be re-used, cause aborning great economic loss.
Summary of the invention
The object of the invention is to manufacture and design Elema test machine, only has universal electric meter to overcome the whether aging method of current differentiation Elema, because test environment difference, so error is large, often Elema functional, that still can meet normal use is judged and can not be re-used, caused aborning the shortcoming of great economic loss.
The object of the present invention is achieved like this: Elema test machine, is characterized in that: mainly comprise the holding circuit being connected with mu balanced circuit, the mu balanced circuit that two ends are connected with timing circuit with holding circuit respectively, the timing circuit that two ends are connected with regulating circuit with mu balanced circuit respectively, the regulating circuit that two ends are connected with test circuit with timing circuit respectively, the test circuit being connected with regulating circuit.
Described holding circuit mainly comprises controlled by the A.C. contactor KM1 earth leakage circuit-breaker QF cut-offfing, the A.C. contactor KM1 being connected with stabilized voltage supply TND.
Described mu balanced circuit mainly comprises the stabilized voltage supply TND being connected with time relay sj 1 with A.C. contactor KM1.
Described timing circuit mainly comprises the time relay sj 1 that two ends are connected with controllable voltage regulating module SSR with stabilized voltage supply TND respectively.
Described regulating circuit mainly comprises the controllable voltage regulating module SSR of difference tie-time relay SJ1 and 2 Elema folder TBJ.
Described test circuit mainly comprises the Elema folder TBJ being connected with controllable voltage regulating module SSR.
Take the present invention of above measure, simple in structure, reliable operation, overcome the whether aging method of current differentiation Elema and only had universal electric meter, because test environment difference, so error is large, often Elema functional, that still can meet normal use is judged and can not be re-used, cause aborning the shortcoming of great economic loss.
Brief description of the drawings
The circuit block diagram that accompanying drawing 1 is the present invention (embodiment);
The electrical schematic diagram that accompanying drawing 2 is the present invention (embodiment);
The control electrical schematic diagram that accompanying drawing 3 is the present invention (embodiment).
Description of reference numerals: 24 volts of direct supply DC24v, time relay sj 1, A.C. contactor KM1, auxiliary reclay M, earth leakage circuit-breaker QF, start button QA, stop button TA(TS), start by set date switch S A, disappear alert knob XA, stabilized voltage supply TND, controllable voltage regulating module SSR, two sections of alarm HA, current relay JL1, precision resistor RP, Elemas folder TBJ, the door spacing MX in storehouse.
Embodiment
Accompanying drawing 1 has provided the circuit block diagram of the embodiment of the present invention.With reference to accompanying drawing 1.The present invention mainly comprises the holding circuit being connected with mu balanced circuit, the mu balanced circuit that two ends are connected with timing circuit with holding circuit respectively, the timing circuit that two ends are connected with regulating circuit with mu balanced circuit respectively, the regulating circuit that two ends are connected with test circuit with timing circuit respectively, the test circuit being connected with regulating circuit.
Accompanying drawing 2 has provided the electrical schematic diagram of the embodiment of the present invention.
With reference to accompanying drawing 2.
Holding circuit mainly comprises controlled by the A.C. contactor KM1 earth leakage circuit-breaker QF cut-offfing, the A.C. contactor KM1 being connected with stabilized voltage supply TND.
Mu balanced circuit mainly comprises the stabilized voltage supply TND being connected with time relay sj 1 with A.C. contactor KM1.
Timing circuit mainly comprises the time relay sj 1 that two ends are connected with controllable voltage regulating module SSR with stabilized voltage supply TND respectively.
Regulating circuit mainly comprises the controllable voltage regulating module SSR of difference tie-time relay SJ1 and 2 Elema folder TBJ.
Test circuit mainly comprises the Elema folder TBJ being connected with controllable voltage regulating module SSR.
The control electrical schematic diagram that accompanying drawing 3 is the embodiment of the present invention.
Principle of work explanation of the present invention:
1. Elema test machine is applicable to the pairing burn-in test of Electronic Components Manufacturing producer high temperature resistance furnace heating Elema, in equipment operating, first the Elema of needs test is positioned on workbench, after two ends use the Elema folder of TBJ fixed, close safe spacing MX pressing of a storehouse, open QF protection switch, equipment enters preliminary work state, pressing QA starting switch, KM1 coil obtains electric and utilizes the self-locking of self-locking contact, stabilized power source is sent in stabilized voltage supply TND work, supply with SSR controllable voltage regulating modular power source by SJ1-1 contact, observation voltage table V adjustment precision potentiometer obtains the operating voltage needing, under rated voltage, observe the actual current value of Elema in the situation that of normal work, thereby judge the ageing state of Elema.Circuit design has JL1 current relay (adopting mutual inductor to connect), and when Elema is certified products, when working current arrives JL1 current relay setting value, JLI obtains electric adhesive, the instruction of HA warning horn green light flicker acousto-optic.In Electronic Components Manufacturing process, need to carry out component aging test time, electronic devices and components are fixed on equipment board, operating process and step 1 are basic identical, pressing SA switch, timing circuit is started working, and timing arrived after the schedule time, cuts off SSR voltage regulating module circuit, complete aging test, and the instruction of warning lamp blinking red lamp acousto-optic, notifies operator's aging test to complete, and operator need to cut off the electricity supply, complete this senile experiment.
What embodiment used is the common components on market:
Claims (5)
1. Elema test machine, is characterized in that: mainly comprise the holding circuit being connected with mu balanced circuit, the mu balanced circuit that two ends are connected with timing circuit with holding circuit respectively, the timing circuit that two ends are connected with regulating circuit with mu balanced circuit respectively, the regulating circuit that two ends are connected with test circuit with timing circuit respectively, the test circuit being connected with regulating circuit.
2. Ju Elema test machine claimed in claim 1, is characterized in that: described holding circuit mainly comprises controlled by the A.C. contactor KM1 earth leakage circuit-breaker QF cut-offfing, the A.C. contactor KM1 being connected with stabilized voltage supply TND.
3. Ju Elema test machine claimed in claim 1, is characterized in that: described mu balanced circuit mainly comprises the stabilized voltage supply TND being connected with time relay sj 1 with A.C. contactor KM1.
4. Ju Elema test machine claimed in claim 1, is characterized in that: described timing circuit mainly comprises the time relay sj 1 that two ends are connected with controllable voltage regulating module SSR with stabilized voltage supply TND respectively.
5. Ju Elema test machine claimed in claim 1, is characterized in that: described regulating circuit mainly comprises the controllable voltage regulating module SSR of difference tie-time relay SJ1 and 2 Elema folder TBJ.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320807112.9U CN203643530U (en) | 2013-12-11 | 2013-12-11 | Silicon carbide rod testing machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320807112.9U CN203643530U (en) | 2013-12-11 | 2013-12-11 | Silicon carbide rod testing machine |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203643530U true CN203643530U (en) | 2014-06-11 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201320807112.9U Expired - Fee Related CN203643530U (en) | 2013-12-11 | 2013-12-11 | Silicon carbide rod testing machine |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203643530U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103675545A (en) * | 2013-12-11 | 2014-03-26 | 广西新未来信息产业股份有限公司 | Silicon carbide rod test machine |
-
2013
- 2013-12-11 CN CN201320807112.9U patent/CN203643530U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103675545A (en) * | 2013-12-11 | 2014-03-26 | 广西新未来信息产业股份有限公司 | Silicon carbide rod test machine |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140611 Termination date: 20141211 |
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| EXPY | Termination of patent right or utility model |