CN103675545A - Silicon carbide rod test machine - Google Patents
Silicon carbide rod test machine Download PDFInfo
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- CN103675545A CN103675545A CN201310664645.0A CN201310664645A CN103675545A CN 103675545 A CN103675545 A CN 103675545A CN 201310664645 A CN201310664645 A CN 201310664645A CN 103675545 A CN103675545 A CN 103675545A
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Abstract
The invention relates to a silicon carbide rod test machine which is characterized by mainly comprising a protective circuit, a voltage stabilizing circuit, a timing circuit, a voltage regulator circuit and a test circuit. The silicon carbide rod test machine is simple in structure and reliable in work, and overcomes the shortcomings that only an avometer can be used for judging whether silicon carbide rods are aged or not at present, the silicon carbide rods which are good in performance and can still meet the normally-used requirements are frequently judged to be unavailable due to the fact that the test environments are different, and the errors are large, and high financial losses are caused in production.
Description
Technical field
The invention belongs to electronic science and technology field, particularly relate to the Design and manufacture of Elema test machine.
Background technology
The current product of electronics and information industry manufacturer, as voltage dependent resistor (VDR), thermistor, electric capacity etc. production equipment all adopts two push-plate type tunnel resistor stoves, serviceability temperature is up to 1300 degrees Celsius of left and right, what heating element all adopted is Elema, although Elema is consumptive material, but expensive, the life-span is short, easily aging, and in electronic product manufacturing cost, Elema expense is occupied sizable ratio.
The whether aging method of industrial community differentiation Elema only has universal electric meter at present, because test environment is different, so error is large, often Elema functional, that still can meet normal use is judged and can not be re-used, caused aborning great economic loss.
Summary of the invention
The object of the invention is to manufacture and design Elema test machine, to overcome the whether aging method of current differentiation Elema, only has universal electric meter, because test environment is different, so error is large, often Elema functional, that still can meet normal use is judged and can not be re-used, caused aborning the shortcoming of great economic loss.
The object of the present invention is achieved like this: Elema test machine, is characterized in that: mainly comprise the holding circuit being connected with mu balanced circuit, the mu balanced circuit that two ends are connected with timing circuit with holding circuit respectively, the timing circuit that two ends are connected with regulating circuit with mu balanced circuit respectively, the regulating circuit that two ends are connected with test circuit with timing circuit respectively, the test circuit being connected with regulating circuit.
Described holding circuit mainly comprises earth leakage circuit-breaker QF, the A.C. contactor KM1 being connected with stabilized voltage supply TND that cut-off by A.C. contactor KM1 control.
Described mu balanced circuit mainly comprises the stabilized voltage supply TND being connected with time relay sj 1 with A.C. contactor KM1.
Described timing circuit mainly comprises the time relay sj 1 that two ends are connected with controllable voltage regulating module SSR with stabilized voltage supply TND respectively.
Described regulating circuit mainly comprises the controllable voltage regulating module SSR of difference tie-time relay SJ1 and 2 Elema folder TBJ.
Described test circuit mainly comprises the Elema folder TBJ being connected with controllable voltage regulating module SSR.
Take the present invention of above measure, simple in structure, reliable operation, overcome the whether aging method of current differentiation Elema and only had universal electric meter, because test environment is different, so error is large, often Elema functional, that still can meet normal use is judged and can not be re-used, caused aborning the shortcoming of great economic loss.
Accompanying drawing explanation
Accompanying drawing 1 is the present invention's (embodiment) circuit block diagram;
Accompanying drawing 2 is the present invention's (embodiment) electrical schematic diagram;
Accompanying drawing 3 is the present invention's (embodiment) control electrical schematic diagram.
Description of reference numerals: 24 volts of direct supply DC24v, time relay sj 1, A.C. contactor KM1, auxiliary reclay M, earth leakage circuit-breaker QF, start button QA, stop button TA(TS), start by set date switch S A, disappear alert knob XA, stabilized voltage supply TND, controllable voltage regulating module SSR, two sections of alarm HA, current relay JL1, precision resistor RP, Elemas folder TBJ, the door spacing MX in storehouse.
Embodiment
Accompanying drawing 1 has provided the circuit block diagram of the embodiment of the present invention.With reference to accompanying drawing 1.The present invention mainly comprises the holding circuit being connected with mu balanced circuit, the mu balanced circuit that two ends are connected with timing circuit with holding circuit respectively, the timing circuit that two ends are connected with regulating circuit with mu balanced circuit respectively, the regulating circuit that two ends are connected with test circuit with timing circuit respectively, the test circuit being connected with regulating circuit.
Accompanying drawing 2 has provided the electrical schematic diagram of the embodiment of the present invention.
With reference to accompanying drawing 2.
Holding circuit mainly comprises earth leakage circuit-breaker QF, the A.C. contactor KM1 being connected with stabilized voltage supply TND that cut-off by A.C. contactor KM1 control.
Mu balanced circuit mainly comprises the stabilized voltage supply TND being connected with time relay sj 1 with A.C. contactor KM1.
Timing circuit mainly comprises the time relay sj 1 that two ends are connected with controllable voltage regulating module SSR with stabilized voltage supply TND respectively.
Regulating circuit mainly comprises the controllable voltage regulating module SSR of difference tie-time relay SJ1 and 2 Elema folder TBJ.
Test circuit mainly comprises the Elema folder TBJ being connected with controllable voltage regulating module SSR.
The control electrical schematic diagram that accompanying drawing 3 is the embodiment of the present invention.
Principle of work explanation of the present invention:
1. Elema test machine is applicable to the pairing burn-in test of Electronic Components Manufacturing producer high temperature resistance furnace heating Elema, in equipment operating, first the Elema of needs test is positioned on workbench, after two ends use the Elema folder of TBJ fixed, close safe spacing MX pressing of a storehouse, open QF protection switch, equipment enters preliminary work state, pressing QA starting switch, KM1 coil obtains electric and utilizes the self-locking of self-locking contact, stabilized power source is sent in stabilized voltage supply TND work, by SJ1-1 contact, supply with SSR controllable voltage regulating modular power source, observation voltage table V adjustment precision potentiometer obtains the operating voltage needing, under rated voltage, observe the actual current value of Elema in the situation that of normal work, thereby the ageing state of judgement Elema.Circuit design has JL1 current relay (adopting mutual inductor to connect), and when Elema is certified products, when working current arrives JL1 current relay setting value, JLI obtains electric adhesive, the indication of HA warning horn green light flicker acousto-optic.In Electronic Components Manufacturing process, in the time of need to carrying out component aging test, electronic devices and components are fixed on equipment board, operating process and step 1 are basic identical, pressing SA switch, timing circuit is started working, and timing arrived after the schedule time, cuts off SSR voltage regulating module circuit, complete aging test, and the indication of warning lamp blinking red lamp acousto-optic, notifies operator's aging test to complete, and operator need to cut off the electricity supply, complete this senile experiment.
What embodiment used is the common components on market:
Claims (5)
1. Elema test machine, is characterized in that: mainly comprise the holding circuit being connected with mu balanced circuit, the mu balanced circuit that two ends are connected with timing circuit with holding circuit respectively, the timing circuit that two ends are connected with regulating circuit with mu balanced circuit respectively, the regulating circuit that two ends are connected with test circuit with timing circuit respectively, the test circuit being connected with regulating circuit.
2. Ju Elema test machine claimed in claim 1, is characterized in that: described holding circuit mainly comprises earth leakage circuit-breaker QF, the A.C. contactor KM1 being connected with stabilized voltage supply TND that cut-off by A.C. contactor KM1 control.
3. Ju Elema test machine claimed in claim 1, is characterized in that: described mu balanced circuit mainly comprises the stabilized voltage supply TND being connected with time relay sj 1 with A.C. contactor KM1.
4. Ju Elema test machine claimed in claim 1, is characterized in that: described timing circuit mainly comprises the time relay sj 1 that two ends are connected with controllable voltage regulating module SSR with stabilized voltage supply TND respectively.
5. Ju Elema test machine claimed in claim 1, is characterized in that: described regulating circuit mainly comprises the controllable voltage regulating module SSR of difference tie-time relay SJ1 and 2 Elema folder TBJ.
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201310664645.0A CN103675545A (en) | 2013-12-11 | 2013-12-11 | Silicon carbide rod test machine |
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CN201310664645.0A CN103675545A (en) | 2013-12-11 | 2013-12-11 | Silicon carbide rod test machine |
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CN103675545A true CN103675545A (en) | 2014-03-26 |
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CN201310664645.0A Pending CN103675545A (en) | 2013-12-11 | 2013-12-11 | Silicon carbide rod test machine |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109013401A (en) * | 2018-09-17 | 2018-12-18 | 郑州工程技术学院 | A kind of U-shaped Elema automatic checkout equipment |
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CN102611290A (en) * | 2012-03-16 | 2012-07-25 | 株洲南车时代电气股份有限公司 | Power supply circuit for low voltage test system of locomotive |
CN103163492A (en) * | 2011-12-13 | 2013-06-19 | 海洋王照明科技股份有限公司 | Circuit used for preventing lamp light source aging |
CN103389424A (en) * | 2013-07-24 | 2013-11-13 | 西安交通大学 | Accelerated aging test device for nonlinear resistor disc and aging characteristic test method thereof |
CN203643530U (en) * | 2013-12-11 | 2014-06-11 | 广西新未来信息产业股份有限公司 | Silicon carbide rod testing machine |
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2013
- 2013-12-11 CN CN201310664645.0A patent/CN103675545A/en active Pending
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
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WO2003046590A2 (en) * | 2001-11-26 | 2003-06-05 | Koninklijke Philips Electronics N.V. | Test machine for testing an integrated circuit with a comparator |
CN2620284Y (en) * | 2003-05-22 | 2004-06-09 | 上海广电飞跃照明电子器材厂 | Surge current impacting test-bed |
CN201110878Y (en) * | 2007-10-29 | 2008-09-03 | 比亚迪股份有限公司 | Aging test system |
CN201273932Y (en) * | 2008-09-11 | 2009-07-15 | 中国石油天然气股份有限公司 | AC withstand voltage tester |
CN101887270A (en) * | 2010-06-29 | 2010-11-17 | 无锡隆盛科技有限公司 | Circuit of aging test stand for engine electronic control units |
CN202330674U (en) * | 2011-11-25 | 2012-07-11 | 中国科学院广州电子技术研究所 | Constant-current electronic load with soft start |
CN103163492A (en) * | 2011-12-13 | 2013-06-19 | 海洋王照明科技股份有限公司 | Circuit used for preventing lamp light source aging |
CN102611290A (en) * | 2012-03-16 | 2012-07-25 | 株洲南车时代电气股份有限公司 | Power supply circuit for low voltage test system of locomotive |
CN103389424A (en) * | 2013-07-24 | 2013-11-13 | 西安交通大学 | Accelerated aging test device for nonlinear resistor disc and aging characteristic test method thereof |
CN203643530U (en) * | 2013-12-11 | 2014-06-11 | 广西新未来信息产业股份有限公司 | Silicon carbide rod testing machine |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN109013401A (en) * | 2018-09-17 | 2018-12-18 | 郑州工程技术学院 | A kind of U-shaped Elema automatic checkout equipment |
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Application publication date: 20140326 |