CN203643359U - 一种基于折射成像的高反光表面同轴光路检测系统 - Google Patents

一种基于折射成像的高反光表面同轴光路检测系统 Download PDF

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CN203643359U
CN203643359U CN201420024410.5U CN201420024410U CN203643359U CN 203643359 U CN203643359 U CN 203643359U CN 201420024410 U CN201420024410 U CN 201420024410U CN 203643359 U CN203643359 U CN 203643359U
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imaging device
imaging
light
light path
dioptric
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赵治军
袁雷
曹晓娜
刘长鹤
刘鸿鹏
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TANGSHAN YINGLAI SCIENCE & TECHNOLOGY Co Ltd
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Abstract

本实用新型涉及一种基于折射成像的高反光表面同轴光路检测系统,包括成像装置和与其连接的图像控制器,在成像装置一侧固定设置光源发生装置,在成像装置入光口竖直下方设置有三棱镜,光源发生装置射出的光线先经被检测板表面漫反射,再经三棱镜折射后进入成像装置,成像装置将成出的像传送给图像控制器,图像控制器将收到的像处理后得到高清的高反光板材表面检测图像。该检测系统采用折射光路实现了同轴光路检测的效果,折射成像采用漫反射光束,避免了镜面反射光直接进入成像装置引起的高光反射现象,采用激光作为照明光源,避免了三棱镜折射成像引起的色散现象,保障了成像的清晰程度,获得高清的高反光板材表面检测图像。

Description

一种基于折射成像的高反光表面同轴光路检测系统
技术领域
本实用新型涉及高反光板材表面检测领域,具体为一种基于折射成像的高反光表面同轴光路检测系统。
背景技术
高反光板材,如铝板、不锈钢板的表面视觉检测,如缺陷、划痕、缝隙等检测在自动化领域中有大量的应用,其主要的特点是表面反射系数高,在同轴光路的情况下高光反射对检测产生了大量的干扰作用,影响了该类工件的视觉检测的成像质量,有必要研究一种能够实现同轴检测效果并能够避免高光反射影响的检测系统。
实用新型内容
针对上述现有技术的缺点,本实用新型提供一种可以避开表面高光反射实现同轴光路检测的基于折射成像的检测系统。
本实用新型解决上述技术问题采用以下技术方案:一种基于折射成像的高反光表面同轴光路检测系统,包括成像装置和与其连接的图像控制器,在所述成像装置一侧固定设置光源发生装置,在所述成像装置入光口竖直下方设置有三棱镜,所述光源发生装置射出的光线先经被检测板表面漫反射,再经三棱镜折射后进入所述成像装置,成像装置将成出的像传送给所述图像控制器,图像控制器将收到的像处理后得到高清的高反光板材表面检测图像。
作为优选,所述成像装置为CCD相机或CMOS相机。
作为优选,所述三棱镜顶部面和成像装置的光轴垂直。
作为优选,所述三棱镜的顶角为30度~35度。
作为优选,所述三棱镜的折射率为1.5。
作为优选,所述光源为激光。
本实用新型与现有技术相比具有如下优点:采用折射光路实现了同轴光路检测的效果;折射成像采用漫反射光束,避免了镜面反射光直接进入成像装置引起的高光反射现象;采用激光作为照明光源,避免了三棱镜折射成像引起的色散现象,保障了成像的清晰程度;三棱镜顶部面和成像装置的光轴垂直,且顶角为30度~35度,折射率为1.5,这样可以使得检测效果更好;该系统采用三棱镜折射成像实现同轴光路的检测效果,并避开表面的高光反射对检测产生的干扰作用,获得高清的高反光板材表面检测图像。
附图说明
图1是本实用新型的结构示意图。
具体实施方式
为了使本实用新型实现的技术手段、创作特征、达成目的与功效易于明白了解,下面结合具体图示及实施例,进一步阐述本实用新型。应当理解,此处所描述的具体实施例仅仅用以解释本实用新型,并不用于限定本实用新型。
参考图1,本实用新型实施例提供一种基于折射成像的高反光表面同轴光路检测系统,包括成像装置1和与其连接的图像控制器4,所述成像装置为CCD相机或CMOS相机,在所述成像装置1一侧固定设置光源发生装置2,所述光源为激光,在所述成像装置1入光口竖直下方设置有三棱镜3,三棱镜3顶部面和成像装置1的光轴垂直,三棱镜3的顶角为30度~35度,三棱镜3的折射率为1.5,所述光源发生装置2射出的一束激光01照射到被检测板5的表面检测点51,发生漫反射激光02,激光02再经三棱镜3折射后形成折射激光03,激光03再射入所述成像装置1成像,其成像为一个虚像,位置为被检测板5的表面检测点52,相对原表面检测点51产生了 δ的偏移量,成像装置1将成出的像传送给所述图像控制器4,图像控制器4将收到的像处理后得到高清的高反光板材表面检测图像,采用折射光路所产生的效果和相机正对检测点51的效果相同,实现了同轴光路的检测效果,同时因检测点52成像所用光束为检测点51的漫反射光束进行成像的结果,避免了镜面反射光直接进入成像装置引起高光反射现象。
在本实用新型中,先将需要做缺陷、划痕、缝隙等表面视觉检测的铝板、不锈钢板等高反光板材放置在该检测系统下,打开固定设置CCD相机或CMOS相机一侧的光源发生装置,光源发生装置射出一束激光,照射到高反光板材表面相应的检测点上,并产生漫反射,漫反射激光再经三棱镜折射后再射入CCD相机或CMOS相机成像,其成像为一个虚像,位置为被检测板的表面检测点相对原表面检测点产生了一定的偏移量,CCD相机或CMOS相机将成出的像传送给所述图像控制器,图像控制器将收到的像处理后得到高清的高反光板材表面检测图像。该检测系统采用折射光路实现了同轴光路检测的效果,折射成像采用漫反射光束,避免了镜面反射光直接进入成像装置引起的高光反射现象,采用激光作为照明光源,避免了三棱镜折射成像引起的色散现象,保障了成像的清晰程度,该系统采用三棱镜折射成像实现同轴光路的检测效果,并避开表面的高光反射对检测产生的干扰作用,获得高清的高反光板材表面检测图像。
以上显示和描述了本实用新型的基本原理和主要特征及本实用新型的优点,本行业的技术人员应该了解,本实用新型不受上述实施例的限制,上述实施例和说明书中描述的只是说明本实用新型的原理,在不脱离本实用新型精神和范围的前提下,本实用新型还会有各种变化和改进,这些变化和改进都落入要求保护的本实用新型范围内,本实用新型要求保护范围由所附的权利要求书及其等效物界定。 

Claims (6)

1.一种基于折射成像的高反光表面同轴光路检测系统,其特征在于:包括成像装置和与其连接的图像控制器,在所述成像装置一侧固定设置光源发生装置,在所述成像装置入光口竖直下方设置有三棱镜,所述光源发生装置射出的光线先经被检测板表面漫反射,再经三棱镜折射后进入所述成像装置,成像装置将成出的像传送给所述图像控制器,图像控制器将收到的像处理后得到高清的高反光板材表面检测图像。
2.根据权利要求1所述的一种基于折射成像的高反光表面同轴光路检测系统,其特征在于:所述成像装置为CCD相机或CMOS相机。
3.根据权利要求1所述的一种基于折射成像的高反光表面同轴光路检测系统,其特征在于:所述三棱镜顶部面和成像装置的光轴垂直。
4.根据权利要求3所述的一种基于折射成像的高反光表面同轴光路检测系统,其特征在于:所述三棱镜的顶角为30度~35度。
5.根据权利要求4所述的一种基于折射成像的高反光表面同轴光路检测系统,其特征在于:所述三棱镜的折射率为1.5。
6.根据权利要求1所述的一种基于折射成像的高反光表面同轴光路检测系统,其特征在于:所述光源为激光。
CN201420024410.5U 2014-01-15 2014-01-15 一种基于折射成像的高反光表面同轴光路检测系统 Expired - Lifetime CN203643359U (zh)

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Cited By (1)

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Publication number Priority date Publication date Assignee Title
CN103760167A (zh) * 2014-01-15 2014-04-30 唐山英莱科技有限公司 一种基于折射成像的高反光表面同轴光路检测系统

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103760167A (zh) * 2014-01-15 2014-04-30 唐山英莱科技有限公司 一种基于折射成像的高反光表面同轴光路检测系统

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