CN203535204U - Sample rod for contactless low-temperature magneto-transport tests - Google Patents
Sample rod for contactless low-temperature magneto-transport tests Download PDFInfo
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Abstract
本实用新型公开了一种无接触式低温磁输运测试的样品杆,它用于深低温强磁场下对固体材料电学性质进行微波测量。样品杆由头顶盒、波导管、引线管、同轴电缆及转接口、测试引线及插座、支架盘片、底部固定架和谐振腔等组成,其主要特征在于同时将波导管和同轴电缆引入样品杆内,波导管将微波导入到可放置样品的谐内腔内,同轴电缆接收反射出来的微波,从而实现对固体材料电学性质的微波测量。波导管和引线管选用高强度、低热导率的钛金属材料,实现了样品温度在极低温下的稳定。该系统为深低温强磁场中固体材料电学性质的微波测量提供了有力的研究工具。
The utility model discloses a non-contact low-temperature magnetic transport test sample rod, which is used for microwave measurement of the electrical properties of solid materials under a deep low-temperature strong magnetic field. The sample rod is composed of head-top box, waveguide, lead pipe, coaxial cable and adapter, test lead and socket, bracket plate, bottom fixing frame and resonance cavity, etc. Its main feature is that the waveguide and coaxial cable are introduced into the In the sample rod, the waveguide guides the microwave into the harmonic cavity where the sample can be placed, and the coaxial cable receives the reflected microwave, so as to realize the microwave measurement of the electrical properties of the solid material. The waveguide and the lead tube are made of titanium material with high strength and low thermal conductivity, which realizes the stability of the sample temperature at extremely low temperature. The system provides a powerful research tool for microwave measurement of electrical properties of solid materials in deep low temperature and strong magnetic fields.
Description
技术领域technical field
本专利涉及一种用于微波探测固体材料电学性质的样品杆,具体涉及一种用于深低温强磁场下无接触式微波测量的样品杆,用于原位研究微波辐照下电输运量子效应和电子自旋共振等。This patent relates to a sample rod for microwave detection of electrical properties of solid materials, specifically to a sample rod for non-contact microwave measurement under deep low temperature and strong magnetic field, for in situ research on electrical transport quantum under microwave irradiation effect and electron spin resonance etc.
背景技术Background technique
固体材料在极端条件下的性质研究是凝聚态物理科学领域里的重要内容。在极低温和强磁场条件下,固体材料中的量子效应变得显著起来。比如,深低温下存在着对固体材料的经典电导率的量子修正,表现为弱局域效应和弱反局域效应、磁阻振荡和量子霍尔效应等,它涉及到电子自旋特性以及自旋轨道耦合等基本的量子物理效应。与固体材料中电子自旋相关的量子特性能够为新一代的微纳电子器件--自旋电子学器件提供器件制备与操控的原理基础,因此具有重要的研究价值。The study of the properties of solid materials under extreme conditions is an important content in the field of condensed matter physics. Quantum effects in solid materials become significant at extremely low temperatures and strong magnetic fields. For example, there are quantum corrections to the classical conductivity of solid materials at deep low temperatures, manifested as weak local effects and weak antilocal effects, magnetoresistance oscillations, and quantum Hall effects, etc., which involve electron spin characteristics and self- spin-orbit coupling and other fundamental quantum physics effects. The quantum properties related to electron spin in solid materials can provide the principle basis of device fabrication and manipulation for a new generation of micro-nano electronic devices - spintronics devices, so it has important research value.
传统的低温磁输运测试样品杆采取接触式的电输运测量方法,即通过给样品加上电压(或电流)再测量所需的电流(或电压),这就必须在样品上做上电极,因此是一种有损测量的方法。而传统引入微波辐照的低温磁输运样品杆只是在电输运测量的同时引入微波辐照,利用的是微波的加热调制效应,依然是有接触式的测量且测量的是微波的间接响应,即微波响应被转换为与微波本身无关的物理量。对于某些固体材料而言,由于其自身的物质性质或样品尺寸的因素,其电极的制作十分困难。而依据微波与固体材料的相互作用,通过对样品进行微波辐照和对微波的直接响应进行测量,则能够对固体材料实现无接触式无损测量。基于微波测量的优越性,本专利设计了一种用于深低温强磁场下微波测量的样品杆,在样品杆中引入波导管和同轴电缆,实现了微波频率的大范围连续变化,能够实现对固体材料电学性质的原位微波测量,为极低温、强磁场及微波辐照下磁输运测试和电子自旋共振等研究提供了有力的研究工具。The traditional low-temperature magnetic transport test sample rod adopts a contact electrical transport measurement method, that is, by applying a voltage (or current) to the sample and then measuring the required current (or voltage), it is necessary to make electrodes on the sample , so it is a lossy measurement method. The traditional low-temperature magnetic transport sample rod that introduces microwave irradiation only introduces microwave irradiation at the same time as the electrical transport measurement, using the heating modulation effect of microwaves, and still has contact measurement and measures the indirect response of microwaves. , that is, the microwave response is transformed into a physical quantity that has nothing to do with the microwave itself. For some solid materials, due to their own material properties or sample size, the fabrication of electrodes is very difficult. According to the interaction between microwave and solid material, the non-contact and non-destructive measurement of solid material can be realized by irradiating the sample with microwave and measuring the direct response to microwave. Based on the superiority of microwave measurement, this patent designs a sample rod for microwave measurement under deep low temperature and strong magnetic field. The waveguide and coaxial cable are introduced into the sample rod to realize the continuous change of microwave frequency in a large range, which can realize The in-situ microwave measurement of the electrical properties of solid materials provides a powerful research tool for the study of magnetic transport testing and electron spin resonance under extremely low temperature, strong magnetic field and microwave irradiation.
发明内容Contents of the invention
本专利的目的是提供一种无接触式低温磁输运测试的样品杆,解决传统电输运测试中样品电极制作困难的问题。The purpose of this patent is to provide a sample rod for non-contact low-temperature magnetic transport testing, which solves the problem of difficulty in making sample electrodes in traditional electrical transport testing.
本专利在传统的固体材料极低温、强磁场下磁输运测试中引入微波测量的方法,从而原位研究微波辐照下固体材料磁输运性质,如电导量子修正以及自旋相关特性等的微波响应。其中所说的微波辐照包括不同功率和不同频率的连续及脉冲型微波信号,所说的微波测试包括在不同微波频率、功率和磁场、温度下对材料的电阻率、霍尔系数等磁输运性质的无接触式微波测量。This patent introduces a microwave measurement method into the traditional magnetic transport test of solid materials under extremely low temperature and strong magnetic field, so as to study the magnetic transport properties of solid materials under microwave irradiation in situ, such as conductance quantum correction and spin correlation characteristics. microwave response. The microwave irradiation includes continuous and pulsed microwave signals of different power and frequency, and the microwave test includes the magnetic input of materials such as resistivity and Hall coefficient at different microwave frequencies, powers, magnetic fields, and temperatures. Contactless microwave measurements of this nature.
本专利在样品杆内部引入波导管和同轴电缆,能够将微波导入到样品处,实现了微波辐照下电输运特性和自旋特性的原位研究,为固体材料磁输运性质的微波测量提供了一种有效工具。This patent introduces a waveguide and a coaxial cable inside the sample rod, which can introduce microwaves into the sample, and realize the in-situ research on the electrical transport characteristics and spin characteristics under microwave irradiation. Measurements provide an effective tool.
本专利的技术方案如下:The technical scheme of this patent is as follows:
样品杆200包括头顶盒201、头顶盒盖202、保护罩203、固定铰链204、固定铰链205、倍频器206、矩圆转换器207、同轴波导转换头208、同轴电缆转接头209、测试线转接头A210、测试线转接头B211、同轴波导连接线212、同轴电缆213、测试引线A214、测试引线B215、密封O形圈216、密封套法兰盘217、波导管218、4根引线管219、5片支架盘片220、底部固定架221、谐振腔222,基本结构见附图1。The
其总体结构如下:头顶盒201与保护罩203及波导管218、4根引线管219焊接,波导管218与4根引线管219通过5片支架盘片220、底部固定架221固定在一起,谐振腔222通过镙丝与底部固定架221连接,波导管218固定在5片支架盘片220和底部固定架221的中心圆孔上,4根引线管219固定在5片支架盘片220和底部固定架221的边沿对称圆孔上;头顶盒盖202直径与头顶盒201的相匹配,用固定铰链204和_固定铰链205通过密封O形圈216与头顶盒201进行密封;同轴电缆213、测试引线A214和测试引线B215,其一端各通过4根引线管219中的任意一根进入样品杆底部样品处,其另一端分别与同轴电缆转接头209、测试线转接头A210、测试线转接头B211相连接;密封O形圈216将头顶盒201与头顶盒盖202之间进行密封,密封套法兰盘217将保护罩203与低温杜瓦301的顶部接口进行密封。Its overall structure is as follows: the head-
头顶盒201采用非磁性不锈钢制成,其顶部开口,其底部与保护罩203顶部密封焊接,且与波导管218和引线管219密封焊接。其侧壁顶部截面上留有半圆形凹槽以放置密封O形圈216,以便与头顶盒盖202密封。其侧壁顶部两侧分别焊接有水平支撑杠,分别用以连接固定铰链204和固定铰链205。其侧壁上开有四个圆形孔,分别用以放置同轴波导转换头208、同轴电缆转换头209、测试线转接头A210和测试线转接头B211。其内部底面与矩圆转换器207焊接。其内部可放置倍频器206,与矩圆转换器207用镙丝钉连接。The head-
头顶盒盖202采用非磁性不锈钢制成,用于将头顶盒201进行密封。其表面上焊接有固定铰链205。The
保护罩203采用非磁性不锈钢制成,其顶部与头顶盒201密封焊接,其底部与低温杜瓦301的顶部接口可通过密封套法兰盘217进行密封。The
固定铰链204采用非磁性不锈钢制成,可通过长镙丝与头顶盒201一侧的水平支撑杠连接。其本身具有一蝶形柄长镙丝,用于固定固定铰链204,以便头顶盒盖202与头顶盒201密封。The
固定铰链205采用非磁性不锈钢制成,其焊接于头顶盒盖202的表面上,可通过长镙丝与头顶盒201一侧的水平支撑杠连接。其本身具有一蝶形柄长镙丝,用于固定固定铰链205,以便头顶盒盖202与头顶盒201密封。The
倍频器206用于扩展微波频率范围,可通过镙丝与矩圆转换器207连接。The
矩圆转换器207用于改变波导口形状,使微波从倍频器206的矩形波导口进入波导管218的圆形波导口。其底部焊接于头顶盒201的内部底面,头部可通过镙丝与倍频器206连接。The
同轴波导转换头208安装于头顶盒201侧壁,外端为外同轴电缆接口,内端与同轴波导连接线212连接,从而实现微波信号由外同轴电缆到波导管的转换连接。同轴波导转换头208内、外端之间气密。The coaxial
同轴电缆转接头209安装于头顶盒201侧壁,外端为外同轴电缆接口,内端与同轴电缆213连接,实现微波信号在同轴电缆108、外同轴电缆之间的连接。同轴电缆转接头209内、外端之间气密。The
测试线转接头A210安装于头顶盒201侧壁,外端为A型屏蔽电缆接口,内端与测试引线A214连接。测试线转接头A210内、外端之间气密。The test line adapter A210 is installed on the side wall of the head-
测试线转接头B211安装于头顶盒201侧壁,外端为B型屏蔽电缆接口,内端与测试引线B215连接。测试线转接头B211内、外端之间气密。The test line adapter B211 is installed on the side wall of the head-
同轴波导连接线212位于头顶盒201内部,用于连接同轴波导转换头208的内端和倍频器206。The coaxial
同轴电缆213位于样品杆200的内部,用于接收在样品杆200的底部反射的微波。其一端连接于同轴电缆转接头209,另一端通过4根引线管219中的任意一根伸入到样品杆200的底部。The
测试引线A214位于样品杆200的内部,为19芯金属导线,用于接触式测量时连接样品的电极与外部探测电路。其一端连接于测试线转接头A210,另一端通过4根引线管219中的任意一根伸入到样品杆200的底部。The test lead A214 is located inside the
测试引线B215位于样品杆200的内部,为21芯金属导线,用于接触式测量时连接样品的电极与外部探测电路。其一端连接于测试线转接头B211,另一端通过4根引线管219中的任意一根伸入到样品杆200的底部。The test lead B215 is located inside the
波导管218用于将微波导入到样品杆200的底部。其顶端焊接于头顶盒201的底面。其底端伸入到样品杆200的底部,并正对着谐振腔222,但不与谐振腔222接触。波导管218通过5片支架盘片220与4根引线管219固定在一起,其底端插入到底部固定架221的中心圆孔中。波导管218采用热导率低的钛管制作,以防止其在极低温环境中向谐振腔222导热而导致谐振腔222中的样品温度无法稳定在极低温。The
4根引线管219用于将同轴电缆213、测试引线A214、测试引线B215或其他类的引线(如光纤)引入到样品杆200的底部。其顶端焊接于头顶盒201的底面。其底端伸入到样品杆200的底部。4根引线管219通过5片支架盘片220与波导管218固定在一起,其底端插入到底部固定架221的外沿圆孔中。4根引线管219采用热导率低的钛管制作,以防止其在极低温环境中向谐振腔222导热而导致谐振腔222中的样品温度无法稳定在极低温。Four
5片支架盘片220用于固定波导管218和4根引线管219。5片支架盘片220上开有中心大圆孔和靠边沿的位置对称的四个小圆孔,其边沿上留有两个方位相互垂直的侧槽,以满足减压降温时样品杆中抽气减压的需要。Five
底部固定架221用于固定波导管218和4根引线管219的底部。其上开有中心圆孔和靠边沿的四个位置对称的圆孔,分别供波导管218和4根引线管219穿过。在其对称边沿上还伸有两臂,供与谐振腔222连接使用。The
谐振腔222为提篮形状,用于放置样品和进行微波响应,其对称边沿上伸有两臂,可与底部固定架221的两臂通过镙丝进行连接。The
本专利的使用方法与过程如下:首先将样品杆200平放于平台上,用弹性海绵分别垫高其两端使其样品杆身(即波导管218与4根引线管219部分)保持水平。将样品放置于谐振腔222内部固定好,然后将谐振腔222与底部固定架221用镙丝连接和固定好,并保证谐振腔222中轴线与波导管218中轴线重合。将样品杆200的头顶盒盖202通过固定铰链204和固定铰链205与头顶盒201闭合起来(如果已经是闭合的,则此步可省去)。将准备好的样品杆200抬起,移运到低温杜瓦301的顶部接口附近,然后将其竖起,并从低温杜瓦301的顶部接口缓慢地插入(此步可用吊动机械装置进行辅助),直到样品杆200的保护罩203与低温杜瓦301的顶部接口处接触(插入样品杆200之前要保证密封套法兰盘217已经位于低温杜瓦301的顶部接口处),此时谐振腔222和样品已经进入深低温和强磁场中心,此时整个系统如附图5所示。插入过程要缓慢,这是因为内外温差巨大,缓慢插入有利于保护系统和样品,也会节省低温介质(液氦)。插入样品杆200的整个过程中要保证从低温杜瓦301的顶部接口处有高于大气压的高纯氦气排出。将密封套法兰盘217所在处用紧捆扣扣紧。然后将头顶盒盖202微微打开,以便将头顶盒201内的空气排尽。停止向低温杜瓦301输入高纯氦气并闭合头顶盒盖202使其密封。将外部同轴电缆线与同轴波导转换头208的外端相连接,以便将微波传送到样品杆200的底部样品所在处。将另一根外部同轴电缆线与同轴电缆转接头209的外端相连接,以便接收和测量微波响应。在进行接触式测量时,将测试线转接头A210或测试线转接头B211的外端与外部屏蔽电缆相连接。连接好系统后,将低温液体液氦注入到样品处,此时样品处于4.2K左右的低温中,对低温杜瓦301的样品室进行抽气减压,可以将样品室内的温度降至1.3K左右。待系统稳定到所需测试温度,即可以对样品进行微波测量。The use method and process of this patent are as follows: first, place the
本专利具有如下优点:将波导管和同轴电缆同时引入样品杆,能够将很宽的功率和频率范围内的微波信号导入到处于极低温、强磁场环境中的样品上,实现了固体材料电学性质的原位微波测量。波导管体材料采用了低热导率的钛金属,能够保证样品温度在极低温下的稳定。This patent has the following advantages: the waveguide and coaxial cable are introduced into the sample rod at the same time, and microwave signals in a wide range of power and frequency can be introduced to the sample in an extremely low temperature and strong magnetic field environment, realizing the solid material electrical In situ microwave measurements of properties. The body material of the waveguide is titanium metal with low thermal conductivity, which can ensure the stability of the sample temperature at extremely low temperature.
附图说明Description of drawings
图1:样品杆200基本结构图。图中各部分为:头顶盒201、头顶盒盖202、保护罩203、固定铰链204、固定铰链205、倍频器206、矩圆转换器207、同轴波导转换头208、同轴电缆转接头209、测试线转接头A210、测试线转接头B211、同轴波导连接线212、同轴电缆213、测试引线A214、测试引线B215、密封O形圈216、密封套法兰盘217、波导管218、4根引线管219、5片支架盘片220、底部固定架221、谐振腔222。FIG. 1 : a basic structure diagram of a
图2:固定铰链204和固定铰链205三维结构示意图。FIG. 2 : Schematic diagram of the three-dimensional structure of the fixed
图3:5片支架盘片220平面结示意构图。FIG. 3 : a schematic plan view of the planar structure of five
图4:底部固定架221三维结构示意图。FIG. 4 : Schematic diagram of the three-dimensional structure of the
图5:样品杆200工作原理示意图。图中各部分为:样品杆200全体,低温杜瓦主体301,超导磁体302,样品303。FIG. 5 : Schematic diagram of the working principle of the
具体实施方式Detailed ways
下面根据专利内容和附图说明给出本专利的一个较好的实例,结合实例进一步说明本专利技术细节、结构特征和功能特点。但此实例并不限制本专利范围,合乎发明内容和附图说明中描述的实例均应包含在本专利范围内。A better example of this patent is given below according to the content of the patent and the accompanying drawings, and the technical details, structural features and functional characteristics of this patent are further explained in conjunction with the examples. But this example does not limit the scope of this patent, and the examples described in the summary of the invention and the description of the drawings should be included in the scope of this patent.
样品杆200所有部件都要求非磁性,否则在强磁场下会造成破坏和干扰。头顶盒201、头顶盒盖202、保护罩203、固定铰链204、固定铰链205、5片支架盘片220和底部固定架221均选用非磁性不锈钢材料,波导管218和4根引线管219均为钛金属材质。其中波导管218的直径为10.0mm,4根引线管219的直径为5.6mm,5片支架盘片220的直径为3.5cm,厚度为1mm。底部固定架221和谐振腔222的直径为3.5cm。All parts of the
头顶盒201为圆柱空心体,其底面外径为16.6cm,内径为16.0cm,高度为16.5cm,其顶面有水平突出外沿,因而外径略大,为18.0cm,内径仍为16.0cm,。头顶盒201的内部容积要保证能放得下倍频器206和矩圆转换器207。头顶盒201的侧壁上有四个出口,分别用于安装同轴波导转换头208、同轴电缆转接头209、测试线转接头A210和测试线转接头B211。同轴波导转换头208和同轴电缆转接头209需要用密封胶密封以防止空气进入样品室,测试线转接头A210和测试线转接头B211则由于具有密封O形圈而能自动密封。头顶盒盖202的直径与头顶盒201的底面直径相同,厚度约为10mm。与头顶盒201底部相连的保护罩203的外径约为3.0cm,内径为2.8cm,高度为8.0cm,其底部接口与低温杜瓦301的顶部接口相匹配。The head-
同轴波导转换头208和同轴电缆转接头209采用侧入式结构,适用频率20~40GHz,相对带宽41%,外部适配微波信号源外同轴电缆,接口为螺栓式,内部连接倍频器206的波导接口,接口为嵌套式。同轴电缆转接头209两侧均连接同轴电缆,外接口为螺栓式与同轴波导转换头208相同,内接口为嵌套式,同轴电缆213插入其中,内外导电层分别接通。The coaxial
测试线转接头A210为19针公头插座,测试线转接头B211为21针公头插座。分别与它们相连接的测试引线A214或测试引线B215为相应针数的多芯相互绝缘的漆包铜导线。The test line adapter A210 is a 19-pin male socket, and the test line adapter B211 is a 21-pin male socket. The test lead A214 or test lead B215 respectively connected to them is a multi-core mutually insulated enamelled copper wire with a corresponding number of pins.
底部固定架221下半部分长约5cm,伸出4根引线管219下端,为平行双臂结构,双臂内间距1.5cm,臂宽2.5cm,厚3mm,双臂下端各打一直径2mm圆孔,通过螺栓与谐振腔222连接。谐振腔222为自主设计和制造的,其上部分是平行双臂结构,与底部固定架221的平行双臂相匹配。The lower part of the
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CN103529407A (en) * | 2013-10-10 | 2014-01-22 | 中国科学院上海技术物理研究所 | Sample rod for contactless type low-temperature magnetic transportation test |
CN103885010A (en) * | 2014-04-16 | 2014-06-25 | 中国科学院半导体研究所 | SQUID sealing cavity system for magnetic and electrical property synchronous measurement |
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CN103529407A (en) * | 2013-10-10 | 2014-01-22 | 中国科学院上海技术物理研究所 | Sample rod for contactless type low-temperature magnetic transportation test |
CN103529407B (en) * | 2013-10-10 | 2016-01-13 | 中国科学院上海技术物理研究所 | A kind of non-contact type low temperature magnetic transports the specimen holder of test |
CN103885010A (en) * | 2014-04-16 | 2014-06-25 | 中国科学院半导体研究所 | SQUID sealing cavity system for magnetic and electrical property synchronous measurement |
CN103885010B (en) * | 2014-04-16 | 2016-04-13 | 中国科学院半导体研究所 | For the SQUID annular seal space system of magnetics and electrical properties synchro measure |
CN105911029A (en) * | 2016-01-13 | 2016-08-31 | 中国科学院上海技术物理研究所 | System for measuring sample photoluminescence under deep low temperature and intense magnetic field |
CN105911029B (en) * | 2016-01-13 | 2018-10-19 | 中国科学院上海技术物理研究所 | A kind of system for measuring sample luminescence generated by light under profound hypothermia high-intensity magnetic field |
CN114035131A (en) * | 2021-11-08 | 2022-02-11 | 之江实验室 | Device for detecting electric transport property of magnetic material at normal temperature and measuring method |
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