CN203535124U - Scanning mechanism of electromagnetic compatible scanner - Google Patents

Scanning mechanism of electromagnetic compatible scanner Download PDF

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Publication number
CN203535124U
CN203535124U CN201320641447.8U CN201320641447U CN203535124U CN 203535124 U CN203535124 U CN 203535124U CN 201320641447 U CN201320641447 U CN 201320641447U CN 203535124 U CN203535124 U CN 203535124U
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China
Prior art keywords
scanning
near field
slide block
field probes
scanning platform
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Expired - Fee Related
Application number
CN201320641447.8U
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Chinese (zh)
Inventor
俞勇祥
俞坤
谌平平
陈宏�
祝帆
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Zhejiang University ZJU
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Zhejiang University ZJU
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Priority to CN201320641447.8U priority Critical patent/CN203535124U/en
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Publication of CN203535124U publication Critical patent/CN203535124U/en
Anticipated expiration legal-status Critical
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Abstract

A scanning mechanism of an electromagnetic compatible scanner is provided. The scanning mechanism comprises a scanning platform for placing an element under detection, a movable rack which is arranged across two ends of the scanning platform and can move forwards and backwards along the scanning platform; a sliding table capable of moving left and right along a top beam is disposed on the top beam of the movable rack; a slide block capable of moving vertically up and down is disposed on the sliding table; and a near-field probe is fixedly disposed on the slide block. The scanning mechanism adopts the near-field probe capable of doing three-dimensional movement, can perform three-dimensional stereoscopic detection on a detected element under detection, satisfies the requirement of precise measurement of the electromagnetic field distribution of the detected element, and enlarges the scope of detection varieties. Moving mechanisms on shafts can perform precise control on the corresponding moving rack, sliding table and slide block.

Description

A kind of scanning mechanism of EMC-Scanner
Technical field
The utility model relates to a kind of scanner, refers more particularly to a kind of scanning mechanism that can expand the EMC-Scanner of sweep limit.
Background technology
EMC-Scanner can carry out to Single Electron components and parts, PCB circuit board, cable and machine product the accurate measurement of electromagnetic field distribution, realize detecting and analyze, locate EMC source, identification problem frequency, tracking sensitive element etc., but because near field probes can only and be surveyed in facade translation, cause investigative range less, cannot meet the detection requirement of larger components and parts, and scanning platform, without fixture, cannot accurately be fixed detected element, directly impact detects quality.
Utility model content
The utility model mainly solves existing scanner near field probes can only cause the technical matters that investigative range is little in facade translation; A kind of scanning mechanism that can expand the EMC-Scanner of sweep limit is provided
In order to solve the technical matters of above-mentioned existence, the utility model is mainly to adopt following technical proposals:
The scanning mechanism of a kind of EMC-Scanner of the present utility model, comprise the scanning platform of placing detected element, across scanning platform two ends and the tressel that can move forward and backward along scanning platform and control the y-axis shift actuation mechanism that tressel moves, described tressel is portal frame shape, the back timber of tressel is provided with the slide unit that can move left and right along back timber and controls the X-axis travel mechanism that slide unit moves, described slide unit be provided with can be up and down vertical mobile slide block and control the Z axis travel mechanism that slide block moves, on described slide block, be installed with near field probes, near field probes that can three-dimensional motion, can carry out 3 D stereo scanning probe to the detected element being placed on scanning platform, met the accurate measurement that detected element electromagnetic field distributes, expanded the scope that detects kind, the travel mechanism of each axle can be to corresponding tressel, slide unit and slide block are controlled accurately.
As preferably, described near field probes is straight rod type, and the afterbody of near field probes and described slide block bottom are affixed, and the scan cycle of near field probes is and is arranged vertically and parallel with described tressel facade, scan cycle is arranged vertically, the convenient detection to the facade electromagnetic field of detected element.
As preferably, the rectangular bending of described near field probes, the afterbody of near field probes is vertical and affixed with described slide block bottom, it is horizontally disposed and parallel with described scanning platform surface that the gauging ring of near field probes is, and the gauging ring of near field probes is horizontally disposed, makes the sweep limit of gauging ring be extended to whole scanning platform, both expanded investigative range, meet the testing requirement of larger volume components and parts, be also conducive to laying of detected element, make testing process more convenient and quicker.
As preferably, described scanning platform is provided with for the fixing fixed mount of detected element, can guarantee that detected element can be fixedly mounted on scanning platform, and installation site is accurate, in scanning process, can not move, and has improved quality of scanning.
As preferably, the surface of described scanning platform is provided with the scale mark of indication detected element position, and the fixture of detected element can accurately be placed on scanning platform as required, improves and detects quality.
The beneficial effects of the utility model are: scanner adopts near field probes that can three-dimensional motion, can carry out 3 D stereo scanning probe to the detected element being placed on scanning platform, reach the accurate measurement that detected element electromagnetic field distributes, horizontally disposed scan cycle has expanded the sensing range of detected element, meets the detection of the detected element of more volume.
Accompanying drawing explanation
Fig. 1 is a kind of structural representation of the present utility model.
Fig. 2 is another kind of structural representation of the present utility model.
1. scanning platforms in figure, 2. tressel, 3. slide unit, 4. slide block, 5. near field probes, 6. scale mark.
Embodiment
Below by embodiment, and by reference to the accompanying drawings, the technical solution of the utility model is described in further detail.
Embodiment: the scanning mechanism of a kind of EMC-Scanner of the present embodiment, as shown in Figure 1, comprise the scanning platform 1 of placing detected element, across scanning platform two ends and the tressel 2 that can move forward and backward along scanning platform and control the y-axis shift actuation mechanism that tressel moves, tressel is portal frame shape, on the back timber of tressel, be designed with the slide unit 3 that can move left and right along back timber and control the X-axis travel mechanism that slide unit moves, on slide unit, be designed with can be up and down vertical mobile slide block 4 and control the Z axis travel mechanism that slide block moves, near field probes 5 is installed on slide block, the rectangular bending of near field probes, the afterbody of near field probes is vertical and affixed with slide block bottom, it is horizontally disposed and parallel with scanning platform surface that the gauging ring of near field probes is, near field probes can be carried out the translation of XY axle along scanning platform, also can move up and down along z direction of principal axis simultaneously, can carry out 3 D stereo scanning probe to the detected element being placed on scanning platform, certainly, near field probes can be also straight rod-shaped, as shown in Figure 2, can be for less detected element or only the facade scope of detected element is detected, the surface of scanning platform is printed with the scale mark 6 of indication detected element position, on scanning platform, be also installed with fixed mount, for detected element is fixed.
During use, detected element is clamped on fixed mount, and fixed mount is fixedly arranged on request to the corresponding position of scanning platform, subsequently, controller is controlled respectively tressel, slide block and slide block by testing requirement and scope and is moved, near field probes can be carried out 3-D scanning to detected element, and scanning numerical value is sent into controller and carry out spectrum analysis and calculating, finally electromagnet radiation detection result is printed or transfer to upper level computing machine.
More than explanation has not been done restriction to the utility model; the utility model is also not limited only to giving an example of above-mentioned explanation; the variation that those skilled in the art make in essential scope of the present utility model, retrofit, increase or replace, all should be considered as protection domain of the present utility model.

Claims (5)

1. the scanning mechanism of an EMC-Scanner, it is characterized in that: comprise place the scanning platform (1) of detected element, across scanning platform both sides and the tressel (2) that can move forward and backward along scanning platform and control the y-axis shift actuation mechanism that tressel moves, described tressel is portal frame shape, the back timber of tressel is provided with the slide unit (3) that can move left and right along back timber and controls the X-axis travel mechanism that slide unit moves, described slide unit be provided with can be up and down vertical mobile slide block (4) and control the Z axis travel mechanism that slide block moves, on described slide block, be installed with near field probes (5).
2. the scanning mechanism of a kind of EMC-Scanner according to claim 1, it is characterized in that: described near field probes (5) is straight rod type, the afterbody of near field probes and described slide block (4) bottom are affixed, and the scan cycle of near field probes is and is arranged vertically and parallel with described tressel (2) facade.
3. the scanning mechanism of a kind of EMC-Scanner according to claim 1, it is characterized in that: described near field probes (5) is bending at right angles, the afterbody of near field probes is vertical and affixed with described slide block (4) bottom, and it is horizontally disposed and parallel with described scanning platform (1) surface that the gauging ring of near field probes is.
4. according to the scanning mechanism of a kind of EMC-Scanner described in claim 1 or 2 or 3, it is characterized in that: described scanning platform (1) is provided with for the fixing fixed mount of detected element.
5. the scanning mechanism of a kind of EMC-Scanner according to claim 4, is characterized in that: the surface of described scanning platform (1) is provided with the scale mark (6) of indication detected element position.
CN201320641447.8U 2013-10-14 2013-10-14 Scanning mechanism of electromagnetic compatible scanner Expired - Fee Related CN203535124U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201320641447.8U CN203535124U (en) 2013-10-14 2013-10-14 Scanning mechanism of electromagnetic compatible scanner

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201320641447.8U CN203535124U (en) 2013-10-14 2013-10-14 Scanning mechanism of electromagnetic compatible scanner

Publications (1)

Publication Number Publication Date
CN203535124U true CN203535124U (en) 2014-04-09

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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104463271A (en) * 2014-12-01 2015-03-25 南京大学 Gantry type automatic scanning recognition device based on RFID technology
CN105346730A (en) * 2015-11-06 2016-02-24 中国民航大学 Automatic detecting and marking system of wing pit during airplane maintaining
CN108037323A (en) * 2017-11-09 2018-05-15 奥士康科技股份有限公司 A kind of circuit board gauge tests system
WO2018098870A1 (en) * 2016-12-01 2018-06-07 深圳市新益技术有限公司 Testing apparatus for determining electromagnetic performance of tested object
CN110412502A (en) * 2019-08-06 2019-11-05 西安科技大学 Direction of arrival measuring device and method based on large-scale antenna array
CN115184694A (en) * 2022-09-01 2022-10-14 苏州瑞地测控技术有限公司 Automatic measuring device and method for electromagnetic radiation outside automobile

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104463271A (en) * 2014-12-01 2015-03-25 南京大学 Gantry type automatic scanning recognition device based on RFID technology
CN104463271B (en) * 2014-12-01 2017-10-10 南京大学 A kind of planer-type automatically scanning identifying device based on RFID technique
CN105346730A (en) * 2015-11-06 2016-02-24 中国民航大学 Automatic detecting and marking system of wing pit during airplane maintaining
WO2018098870A1 (en) * 2016-12-01 2018-06-07 深圳市新益技术有限公司 Testing apparatus for determining electromagnetic performance of tested object
CN108132388A (en) * 2016-12-01 2018-06-08 深圳市新益技术有限公司 A kind of test device of determining measured object electromagnetic performance
CN108132388B (en) * 2016-12-01 2019-12-06 深圳市新益技术有限公司 Test device for determining electromagnetic performance of measured object
CN108037323A (en) * 2017-11-09 2018-05-15 奥士康科技股份有限公司 A kind of circuit board gauge tests system
CN110412502A (en) * 2019-08-06 2019-11-05 西安科技大学 Direction of arrival measuring device and method based on large-scale antenna array
CN115184694A (en) * 2022-09-01 2022-10-14 苏州瑞地测控技术有限公司 Automatic measuring device and method for electromagnetic radiation outside automobile

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Granted publication date: 20140409

Termination date: 20141014

EXPY Termination of patent right or utility model