CN203479913U - Ultra-short electronic impulse width measuring device - Google Patents

Abstract

The utility model belongs to the field of ultrafast diagnosis and particularly relates to an ultra-short electronic impulse width measuring device. The device comprises auger target material, an electronic impulse to be measured, a sparse-period super-strong near-infrared femto-second impulse source locked by a carrier envelope phase and an electron spectrum detecting and analyzing system. Impulses emitted by the near-infrared femto-second impulse source and the electronic impulse to be measured are transmitted to the same spatial point on an auger target. The electronic impulse to be measured is ionized to form an auger electronic impulse through the auger target material. The electron spectrum detecting and analyzing system can receive the auger electronic impulse formed through ionization, and the time-domain outline of the auger electronic impulse can be rebuilt through a two-dimension electron spectrum diagram of an auger electron. A de-convolution operation is carried out on the distribution of the time-domain outline and the auger process of the auger target material to obtain the time-domain outline of the electronic impulse to be measured and to further obtain the impulse width of the electronic impulse to be measured. The ultra-short electronic impulse width measuring device capable of measuring the impulse width is provided.

Description

A kind of ultrashort electronic impulse pulse width measure device

Technical field

The invention belongs to ultrafast diagnostic field, relate to a kind of ultrafast temporal information measuring technique, relate in particular to a kind of ultrashort electronic impulse pulse width measure device.

Background technology

The research of time resolution ultrafast phenomena just launches at the numerous areas of fundamental research, research in new high-tech, the ultrashort electronic impulse of take quick and precisely control as basic charged particle optics diagnostic techniques be the important means of current many applied researcies, as ultrafast electric diffraction, crystallography, microscopy, electronic imaging, ultrashort X ray pulse generation and x-ray laser pumping etc.Along with going deep into of applied research, they become more urgent to the demand of the shorter electronic impulse of pulsewidth.As pulsewidth several fs even the electronic impulse of Ah's second-time will greatly expand the degree of depth of time resolution electron diffraction technique applied research, make it possible to observe directly the ultrafast dynamic process of electron waves bag and molecular structure in atom.Undoubtedly, ultrashort electronic impulse generating technique and corresponding electronic impulse pulse width measure technology are by the focus place that is all the time this type of research.

Aspect ultrashort electronic impulse pulse width measure, current existing technology mainly contains: streak camera technology; Relevant transition radiation interferometry; Radio frequency zero phase method; Terahertz emission diagnostic techniques; Electron optics coding techniques; The matter action usage of laser and electronic impulse.Yet these technology are being measured pulsewidth at several fs even during the electronic impulse of Ah's second-time, all the technical matters of various degrees: streak camera technology and radio frequency zero phase method are not suitable for the electronic impulse that pulsewidth is less than 200fs; The electronics that relevant transition radiation interferometry, hertz radiation diagnosis technology and the electronic impulse to be measured of electron optics coding techniques needs comprise larger amt is to produce enough strong signal; And the action of the matter of laser and electronic impulse needs higher laser intensity by rule, its time resolution is determined by the width of laser pulse used simultaneously.Therefore, people are still continuing the exploration of ultrashort electronic impulse pulse width measure technology.

Summary of the invention

In order to solve existing technical matters in background technology, the present invention proposes a kind of ultrashort electronic impulse pulse width measure device.

Technical scheme of the present invention is:

A ultrashort electronic impulse pulse width measure device, its special character is: the superpower near infrared femtosecond pulse source of thin cycle and the electronic energy spectrum detecting analytic system that comprise Auger target, electronic impulse to be measured, carrier envelope phase locking; The pulse that send in above-mentioned near infrared femtosecond pulse source and electronic impulse to be measured are incident on the same space point on Auger target; Above-mentioned electronic impulse to be measured ionizes out Auger electron pulse by impact ionization process from Auger target; Above-mentioned electronic energy spectrum detecting analytic system can receive the Auger electron pulse ionizing out, can reconstruct the time domain profile of Auger electron pulse by the Two-dimensional electron energy spectrogram of Auger electron; The Auger process of this time domain contoured profile and Auger target is carried out to de-convolution operation, draw the time domain profile of electronic impulse to be measured, and then draw electronic impulse pulsewidth to be measured.

Technique effect of the present invention is:

1. the present invention is based on brand-new time domain to energy domain mapping techniques, thereby can measure pulsewidth in the even ultrashort electronic impulse of Ah's second-time of several femtoseconds.

2. the energy of the measurable electronic impulse of the present invention has wider scope, from several electron volts until MeV magnitude.

3. the monopulse electron number of the measurable electronic impulse of the present invention has wider scope, from millions of until single.

Accompanying drawing explanation

Fig. 1 is apparatus of the present invention structural representation;

Fig. 2 is the energy modulation procedure chart of the near infrared light field that is subject to of the Auger electron of the present invention's a certain moment ionization;

Wherein, 1 ?Auger target, 2 ?carrier envelope phase locking superpower near infrared femtosecond pulse of thin cycle, 3 ?electronic impulse to be measured, 4 ?Auger electron pulse, 5 ?electronic energy spectrum detecting analytic system.

Embodiment

Referring to figure 1 ?2.As shown in Figure 1, superpower near infrared femtosecond pulse of the thin cycle of carrier envelope phase locking and electronic impulse to be measured are incident on the same space point on Auger target to technique device of the present invention, and two peak value of pulses are at space coincidence simultaneously; Electronic impulse to be measured ionizes out Auger electron pulse from Auger target with impact ionization mechanism, Auger electron burst length information is the convolution of incident electron pulse and Auger process; Auger electron Pulse Electric from after, be at once subject to the energy modulation effect of near infrared light field, and electron energy modulation amplitude is only relevant with the constantly distribution of near infrared light field of ionization; Auger electron after modulation is received by electronic energy spectrum detecting analytic system.By the relative time delay of regulating near-infrared light field and electronic impulse to be measured, just can obtain Two-dimensional electron energy spectrogram.Two-dimentional spectral distribution is released the temporal information of Auger electron pulse thus.This time is distributed and carries out de-convolution operation with the Auger process of Auger target, draw the time domain profile of electronic impulse to be measured, and then draw electronic impulse pulsewidth to be measured.

The related physical process essence of Fig. 1 can be divided into two minute processes in succession: (1) electronic impulse to be measured ionizes out Auger electron pulse from Auger target with impact ionization mechanism; (2) Auger electron pulse is engraved in motion near infrared light field and is subject to energy modulation effect.Thereby, near infrared light field can be become to modulated Field.In first process, the temporal information of the Auger electron pulse producing is the convolution of electronic impulse to be measured and the distribution of Auger process time of incident.To second process, consider at t=t _iconstantly result from

polarization drives the Auger electron in field, and its speed v (t) can be tried to achieve as follows according to the method for classical mechanics:

$\stackrel{\→}{v}\left(t\right)=-\frac{e}{m_e}\stackrel{\→}{A}\left(t\right)+[{\stackrel{\→}{v}}_0+\frac{e}{m_e}\stackrel{\→}{A}\left(t_i\right)].---\left(1\right)$

Here,

it is the vector potential of electric field.First representative on formula (1) the right be the vibration of electronics near infrared modulated Field, when modulated Field disappears, it is tending towards 0; And second final drift velocity v of electronics while disappearing for modulated Field _f.V _fwith v ₀difference, from the angle of classical mechanics, can be regarded as the result of Auger electron to effects such as the absorption of modulated Field photon or scatterings.As shown in Figure 2, wherein that broken circle representative is the initial ionization state v of Auger electron to the energy modulation process of the near infrared light field that the Auger electron of a certain moment ionization is subject to ₀, that solid line circle represents is the drifting state v of Auger electron _f, θ is v _fwith x direction of principal axis angulation.That is to say, the result of modulated Field effect is to make t=t _ithe initial velocity of all Auger electron that constantly produce has a speed increment along the polarization direction of light field

obviously, this speed increment only has relation with the time that photoelectron produces, and this dependence core physical thought of this ultrashort electronic impulse pulse width measure technology just.

By regulating the relative time of modulated Field and electronic impulse to be measured to postpone, the electronic energy spectrum in the time of just can obtaining different delay, is also two-dimentional Auger electron spectroscopy figure.Use double blinding iterative algorithm, as PCGPA, can reconstruct the time domain profile of Auger electron pulse.This time is distributed and carries out de-convolution operation with the Auger process of Auger target, draw the time domain profile of electronic impulse to be measured, and then draw electronic impulse pulsewidth to be measured.

Aspect the arranging of modulation light field and electronic impulse related angle to be measured, the principle of following is: the polarization direction of (1) modulation light field is identical with the transmission direction of Auger electron pulse; (2) speed of light modulated field pulse Auger target material surface relative to electronic impulse to be measured is identical.For condition (1), can obtaining α and β, first to need satisfied relational expression be α=β.For condition (2), for relativistic electron, the transmission speed of chirped pulse to be measured is approximately light velocity c, thus now modulate light field and electronic impulse to be measured by conllinear symport until incide the space same point on Auger target.And for nonrelativistic electronics, establishing its energy is E _i, the restriction relation that related angle α and β need be satisfied is as follows

$\sqrt{\frac{{2E}_i}{m_e}}\cos \mathrm{\α}=c\·\sin \mathrm{\α}.---\left(2\right)$

M wherein _efor electric proton rest mass.If E _i=20keV, by known α=15.6 ° of above formula.

Claims (1)

1. a ultrashort electronic impulse pulse width measure device, is characterized in that: the superpower near infrared femtosecond pulse of thin cycle and the electronic energy spectrum detecting analytic system that comprise Auger target, electronic impulse to be measured, carrier envelope phase locking; Pulse and the electronic impulse to be measured that send in superpower near infrared femtosecond pulse of the thin cycle source of described carrier envelope phase locking are incident on the same space point on Auger target; Described electronic impulse to be measured ionizes out Auger electron pulse by impact ionization process from Auger target; Described electronic energy spectrum detecting analytic system can receive the Auger electron pulse ionizing out.

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