CN203454973U - Sealing glue detection apparatus and display panel box forming apparatus - Google Patents

Sealing glue detection apparatus and display panel box forming apparatus Download PDF

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Publication number
CN203454973U
CN203454973U CN201320582044.0U CN201320582044U CN203454973U CN 203454973 U CN203454973 U CN 203454973U CN 201320582044 U CN201320582044 U CN 201320582044U CN 203454973 U CN203454973 U CN 203454973U
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Prior art keywords
plastic box
sealed plastic
substrate
pick
measured
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CN201320582044.0U
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王念仁
曾小强
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BOE Technology Group Co Ltd
Beijing BOE Display Technology Co Ltd
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BOE Technology Group Co Ltd
Beijing BOE Display Technology Co Ltd
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Abstract

The utility model belongs to the display technical field, more specifically to a sealing glue detection apparatus and a display panel box forming apparatus. The sealing glue detection apparatus is used for detecting the size of sealing glue formed on a substrate and comprises a gantry and a detection head arranged on the gantry. An area for placing a substrate to be detected is correspondingly arranged under the gantry. The detection head comprises at least one sealing glue thickness detection module which is opposite to the area for placing a substrate to be detected. The sealing glue detection apparatus can detect the width of painted sealing glue, and meanwhile can accurately detect the thickness of the painted sealing glue in real time, thereby comprehensively monitor the painting quality of the sealing glue, and raising sealing glue painting yield rate and display panel yield rate.

Description

A kind of sealed plastic box pick-up unit and display panel become cartridge device
Technical field
The utility model belongs to display technique field, is specifically related to a kind of sealed plastic box pick-up unit and display panel and becomes cartridge device.
Background technology
Along with scientific and technological progress, liquid crystal display (Liquid Crystal Display, be called for short LCD) has become the main product in demonstration field, in production technology by array base palte and color membrane substrates can be formed to display panels to box.
In molding process, mainly comprise: sealed plastic box coating, solidify, contraposition detection, cutting step.In order to guarantee that sealed plastic box has enough impact resistances in vacuum in to box process, in molding process, generally also comprise the size detection step of sealed plastic box, but prior art only comprises width detection conventionally to the size detection of sealed plastic box, be illustrated in figure 1 the structural representation of sealed plastic box pick-up unit in prior art.In Fig. 1, sealed plastic box pick-up unit comprises fixed frame (Gantry) 10 and base station (Stage) 11, the both sides of base station 11 are respectively arranged with travelling belt (Transfer) 16, the top that frame 10 correspondences base station 11 is also provided with detection head 13, detection head 13 comprises sealed plastic box width measure module 14 and patcher 15(Repairing Head), sealed plastic box width measure module 14 comprises CCD camera (CCD Camera).In testing process, by travelling belt 16, drive the array base palte for example without the display panel 12(of cutting) on base station 11, along Y direction, move, when array base palte repeatedly moves back and forth along Y direction, CCD camera moves along X-direction, thereby the width of the sealed plastic box on pair array substrate after all drawing detects, and judge whether to occur disconnected glue (or broken string) phenomenon.Once there is disconnected glue (or broken string) phenomenon, patcher 15 is mended picture sealed plastic box by the sealed plastic box broken string position according to record to relevant position.
In molding process, coat the sealed plastic box on array base palte, there is the effect that array base palte and color membrane substrates are bonded together and are sealed, if its wetted surface (by width and the common area determining of thickness of the longitudinal section vertical with array base palte plate face) after drawing fails to reach requirement, vacuum to box process in due to the impact of gas, may cause sealed plastic box collapse, thereby cause occurring bubble, the serious liquid crystal leakage that even causes.But as previously mentioned, existing sealed plastic box pick-up unit only can detect the width after sealed plastic box is drawn and the glue that whether breaks, and cannot detect the thickness of sealed plastic box.Therefore, in the situation that sealed plastic box width is qualified, the thickness of sealed plastic box will directly reflect the quality of drawing of sealed plastic box, is determining the one-tenth box yield of liquid crystal panel.
Therefore,, in sealed plastic box width detection, the variation in thickness after sealed plastic box is drawn is monitored, and becomes current problem demanding prompt solution.
Utility model content
Technical problem to be solved in the utility model is for above shortcomings in prior art, provide a kind of sealed plastic box pick-up unit and display panel to become cartridge device, this sealed plastic box pick-up unit can be realized the quality of drawing of overall monitor sealed plastic box, improve the yield of drawing of sealed plastic box, improve the yield of display panel (Panel).
The technical scheme that solution the utility model technical matters adopts is this sealed plastic box pick-up unit, for detecting being formed on the size of the sealed plastic box on substrate, described sealed plastic box pick-up unit comprises frame and is arranged at the detection head in described frame, region corresponding to described frame below is substrate to be measured rest area, wherein, described detection head comprises at least one sealed plastic box thickness detection module, and described sealed plastic box thickness detection module and described substrate to be measured rest area are oppositely arranged.
Preferably, described sealed plastic box pick-up unit also comprises processor, described sealed plastic box thickness detection module comprises optical transmitting set, optical receiver lens and optical receiver, described optical transmitting set with described optical receiver from being arranged at the top of described substrate to be measured rest area and being electrically connected to described processor respectively; The range difference that described processor is set to the imaging point that forms by described optical receiver according to described substrate surface to be measured and the sealed plastic box surface on it obtains the thickness of sealed plastic box.
Preferably, described sealed plastic box thickness detection module also comprises LAL, and described LAL is arranged between described optical transmitting set and described substrate to be measured rest area, and described LAL optical axis is vertical with described optical transmitting set plane.
Preferably, described sealed plastic box thickness detection module also comprises optical filter, and described optical filter is arranged between described optical receiver lens and described substrate to be measured rest area, and described optical filter plane is parallel with described optical receiver lens principal plane.
Preferably, the relatively described substrate to be measured of described optical transmitting set rest area level/be obliquely installed in the top of described substrate to be measured rest area; And/or, the relatively described substrate to be measured of described optical receiver rest area planar horizontal/be obliquely installed in the top of described substrate to be measured rest area.
Preferably, described optical transmitting set is semiconductor laser transmitter, and described LAL is collimation lens, and described optical receiver lens is cemented doublet, and described optical receiver is linear charge coupling element array.
Preferably, described in each, detection head comprises two described sealed plastic box thickness detection modules, is respectively used to the detection of the thickness on mutually perpendicular both direction to described sealed plastic box.
Preferably, described detection head also comprises sealed plastic box width detection module, and described sealed plastic box width detection module is electrically connected to described processor.
Preferably, described sealed plastic box pick-up unit also comprises the base station being oppositely arranged with described frame, described substrate to be measured rest area is described base station table top, described sealed plastic box pick-up unit also comprises servo motor, described servo motor is arranged at the bottom of described frame, and described frame moves along Y direction with described servo motor; And/or described servo motor is arranged at the bottom of described base station, described base station moves along X-axis with described servo motor, and wherein, described Y-axis is vertical with described X-axis.
Display panel becomes a cartridge device, comprises above-mentioned sealed plastic box pick-up unit.
The beneficial effects of the utility model are: sealed plastic box pick-up unit of the present utility model, when the sealed plastic box to after drawing is carried out width measure, can also the sealed plastic box thickness after drawing be carried out in real time, measure exactly, thereby realize the quality of drawing of overall monitor sealed plastic box, improve the yield of drawing of sealed plastic box, improve the yield of display panel (Panel).
Accompanying drawing explanation
Fig. 1 is the structural representation of sealed plastic box pick-up unit in prior art;
Fig. 2 is the structural representation of sealed plastic box pick-up unit in the utility model embodiment 1;
Fig. 3 is the structural representation of sealed plastic box thickness detection module in the utility model embodiment 1;
Fig. 4 is the structural representation of sealed plastic box thickness detection module in the utility model embodiment 2;
In figure: 1-semiconductor laser transmitter; 2-collimation lens; 3-cemented doublet; 4-linear CCD array; 5-optical filter; 6-reference surface; The actual face of 7-; 8-processor; 10-frame; 11-base station; 12-display panel; 13-detection head; 14-sealed plastic box width measure module; 15-patcher; 16-travelling belt; 17-sealed plastic box thickness measure module; 18-servo motor.
Embodiment
For making those skilled in the art understand better the technical solution of the utility model, below in conjunction with the drawings and specific embodiments, to the utility model sealed plastic box pick-up unit and display panel, become cartridge device to be described in further detail.
A kind of sealed plastic box pick-up unit, for detecting being formed on the size of the sealed plastic box on substrate, described sealed plastic box pick-up unit comprises frame and is arranged at the detection head in described frame, region corresponding to described frame below is substrate to be measured rest area, wherein, described detection head comprises at least one sealed plastic box thickness detection module, and described sealed plastic box thickness detection module and described substrate to be measured rest area are oppositely arranged.
Embodiment 1:
As shown in Figure 2,3, in the present embodiment, a kind of sealed plastic box pick-up unit, for detecting being formed on the size of the sealed plastic box on substrate.Frame 10 and base station 11 that this sealed plastic box pick-up unit comprises processor 8 and is oppositely arranged, the top that frame 10 correspondences base station 11 is provided with detection head 13, detection head 13 comprises sealed plastic box width detection module 14, sealed plastic box thickness detection module 17 is oppositely arranged with base station table top, and sealed plastic box width detection module 14 is electrically connected to processor 8, wherein, detection head 13 also comprises at least one sealed plastic box thickness detection module 17, and sealed plastic box thickness detection module 17 is electrically connected to processor 8.Wherein, the region of frame 10 below correspondences is substrate to be measured rest area, and the base station table top being oppositely arranged with frame 10 in Fig. 2 is substrate to be measured rest area, for placing substrate to be measured.
In the present embodiment, utilize optical lens to carry out imaging to the surface of sealed plastic box, thereby the surface location of sealed plastic box is detected, and by processor, calculate to obtain the thickness of sealed plastic box.For example, in the present embodiment, sealed plastic box thickness detection module 17 comprises optical transmitting set, optical receiver lens and optical receiver, optical transmitting set with optical receiver from being arranged at the top of base station and being electrically connected to processor 8 respectively.Wherein, the range difference that processor 8 is set to the imaging point that forms by optical receiver according to substrate surface to be measured and the sealed plastic box surface on it obtains the thickness of sealed plastic box
In the present embodiment, preferably adopt laser imaging to carry out imaging to substrate surface to be measured or sealed plastic box to be measured surface.As shown in Figure 3, preferred light transmitter is semiconductor laser transmitter 1, optical receiver lens (being also imaging len) is cemented doublet 3, and optical receiver is that linear CCD (Charge-Coupled Device, charge coupled cell) array 4(is also called for short line array CCD).Wherein, semiconductor laser transmitter 1 is for Emission Lasers, as detecting light beam; Cemented doublet 3 is formed by the positive and negative lens gummed of two kinds of different refractivities, and on axle and paraxial point corrected spherical aberration aberration, there is short burnt long, large magnification and better image quality; In linear CCD array 4, CCD adopts the semiconductor material of ISO integrated, can produce corresponding charge signal according to the light being radiated on its face, by analog to digital converter chip, convert the digital signal of " 0 " or " 1 " to, according to these digital signals, can the position of substrate to be measured or sealed plastic box to be measured be measured accurately, be analyzed.
Further preferred, sealed plastic box thickness detection module 17 also comprises LAL, and LAL is arranged between semiconductor laser transmitter 1 and base station 11 table tops, and LAL optical axis is vertical with semiconductor laser transmitter 1 plane.By LAL, the direction of propagation of the detection light beam that can send semiconductor laser transmitter 1 is adjusted, so that detect light beam, at substrate surface to be measured or sealed plastic box to be measured surface, obtains better incident angle.In the present embodiment, as shown in Figure 3, LAL is collimation lens 2, collimation lens 2 is mainly for generation of parallel beam, preferably the detection light beam vertical incidence after collimation lens 2 regulates is to base station table top, be also vertical incidence to substrate surface to be measured (reference surface 6 in corresponding diagram 3) or sealed plastic box to be measured surface (in corresponding diagram 3 actual 7).
Further preferred, as shown in Figure 3, sealed plastic box thickness detection module also comprises optical filter 5, and optical filter 5 is arranged between optical receiver lens and base station table top, and optical filter 5 planes are parallel with optical receiver lens principal plane.By optical filter 5, can other visible rays beyond non-reflective light beam be filtered, to avoid imaging to disturb.
In the present embodiment, as shown in Figure 3, the relative base station table-surface level of semiconductor laser transmitter 1 is arranged at the top of base station 11, the relative base station table-surface level of cemented doublet 3 is arranged at the top of base station 11, semiconductor laser transmitter plane, collimation lens principal plane, base station table top are parallel to each other, and the detection light beam that semiconductor laser transmitter sends sends (normal angle that detects light beam and semiconductor laser transmitter is 0 °) along the normal direction of semiconductor laser transmitter; Folded light beam after the reflection of base station table top and the angle of semiconductor laser transmitter optical axis are α, and the angle of corresponding imaging beam and linear CCD array plane is β, wherein, and alpha+beta=90 °.
Meanwhile, as shown in Figure 3, the intersection point A(of substrate surface and incident beam detects the reflection spot that light beam is incident to substrate) with the distance A O of the photocentre O of optical receiver lens be that object distance is L 1; The distance OA ' that the photocentre O of optical receiver lens and imaging beam are incident to the incidence point A ' of linear CCD array is that image distance is L 2.According to the Gauss theorem in geometrical optics, for the position of intersecting point A of substrate surface and incident beam, the launching spot of detected substrate surface, after substrate surface reflection, by cemented doublet 3, forms blur-free imaging, L in linear ccd array 4 1and L 2should meet trigonometric function relation:
1 f = 1 L 2 + 1 L 1 - - - ( 1 )
Wherein: the focal length that f is cemented doublet.
In like manner, the position of intersecting point B for sealed plastic box surface with incident beam, by the object distance L after cemented doublet 1', image distance L 2' relation can (now use L by calculating of formula (1) equally 1' alternative L 1, use L 2' alternative L 2); And, following corresponding relation as shown in Figure 3:
L 1'=L 1-BC·cotα-------------(2)
Wherein:
BC=L 1'·tanθ-------------(3)
Wherein:
θ is the folded light beam of substrate surface to be measured and the folded light beam on sealed plastic box to be measured surface while inciding the center O of cemented doublet 3, the angle between the two.
Bringing formula (3) into formula (1) obtains:
L 1 ′ = L 1 1 + tan θ · cot α - - - ( 4 )
In like manner can obtain:
L 2 ′ = L 2 1 - tan θ · cot β - - - ( 5 )
Simultaneous formula (1)-(5), can obtain:
L 1·tanθ=L 2tanβ-------------(6)
The computing formula that prestores sealed plastic box thickness in processor is as follows:
y = x ( L 1 - f ) sin β f sin a + x ( 1 - f L 1 ) sin ( α + β ) - - - ( 7 )
In formula (7), the thickness that y is sealed plastic box, x is the range difference (displacement in other words) of substrate surface and sealed plastic box surface imaging point in linear ccd array.
After the light path system of sealed plastic box thickness detection module is determined, L 1(or L 2), α, β, f be known, therefore, only requires out the displacement x on linear ccd array, according to formula (7), can determine the thickness y of sealed plastic box.
Especially, in the present embodiment, due to alpha+beta=90 °, therefore, formula (7) can further be reduced to:
y = x ( L 1 - f ) sin β f sin a + x ( 1 - f L 1 ) - - - ( 8 )
In the testing process of sealed plastic box thickness, the detection light beam that semiconductor laser transmitter 1 sends is after collimation lens 2 regulates, vertical incidence to the display panel 12(display panel that is arranged at base station table top can be also color membrane substrates for array base palte) on, between substrate surface and sealed plastic box surface, all produce folded light beam, folded light beam is filtered and is transmitted through in linear CCD array 4 by cemented doublet 3 through optical filter 5, in linear ccd array 4, form picture point, the picture point that processor 8 receives in linear CCD array 4, utilize image processing function wherein, for example, by luminance brightness contrast peak value institute correspondence position point in picture point hot spot, identify the location point on substrate surface in picture point and sealed plastic box surface, thereby determine the surperficial object point B of substrate surface object point A and sealed plastic box corresponding range difference (displacement in other words) in linear ccd array, thereby calculate the thickness of sealed plastic box.
In the present embodiment, can be as above-mentioned detection method, in one-time detection process, identify substrate surface object point A and sealed plastic box surface object point B corresponding displacement (or range difference) in linear ccd array simultaneously, thereby calculate the thickness of sealed plastic box.More preferably, in actual process, owing to requiring all very high to the thickness of substrate in the flatness of base station, display panel and flatness, also be, the position of substrate on base station table top generally fixed, therefore, also can first to the substrate surface of uncoated photoresist, carry out a thickness measure, and the zero reference value during using this thickness measure result as sealed plastic box thickness measure; Then, then a thickness measure is carried out in the photoresist surface applying after photoresist, now, only need obtain the displacement x of photoresist surface picture point hot spot Relative Zero reference value on linear ccd array, can record the thickness y of sealed plastic box.
In the present embodiment, in the detection head of sealed plastic box pick-up unit, also comprise the sealed plastic box width detection module for sealed plastic box width is detected, sealed plastic box width detection module mainly comprises CCD camera.
Sealed plastic box pick-up unit compared to existing technology, two measurement modules that sealed plastic box thickness is detected in the detection head of the sealed plastic box pick-up unit of the present embodiment, have also additionally been increased, be respectively used to the detection of the thickness on mutually perpendicular both direction to sealed plastic box, the thickness by horizontal sealed plastic box and longitudinal sealed plastic box in pair array substrate detects, and can further improve the quality of drawing of sealed plastic box.
Embodiment 2:
The difference of the present embodiment and embodiment 1 is, in the present embodiment, as shown in Figure 4, the relative base station table-surface level of optical transmitting set is arranged at the top of base station, the relative base station table top of optical receiver is obliquely installed the top in base station, folded light beam after the reflection of base station table top and the angle of semiconductor laser transmitter optical axis are α, and the angle of corresponding imaging beam and linear CCD array plane is β.
Identical with embodiment 1, in the present embodiment, sealed plastic box thickness detection module mainly comprises: as the semiconductor laser transmitter 1 of optical transmitting set, as the collimation lens 2 of LAL, filter the optical filter 5 of stray light, as the cemented doublet 3 of optical receiver lens, as the linear CCD array 4 of optical receiver and drive and the processor 8 processed as signal forms.
Certainly, as a kind of more cost-effective mode, meeting under the condition of detection demand, can suitably reduce the requirement of optical filter, collimation lens, or directly omit optical filter and/or collimation lens.
In the present embodiment, identical with embodiment 1 with measuring process to the measuring principle of sealed plastic box thickness, repeat no more here.
In the present embodiment, by choosing and setting principle of each parts in detailed description sealed plastic box thickness measure module, mainly comprise: according to the measurement range of sealed plastic box thickness and measuring accuracy, set each parameter in this measurement module, to obtain the rational light path system parameter that can satisfy the demand.
Suppose, the position of semiconductor laser transmitter is known, and form the folded light beam of angle α through the center of cemented doublet 3 with semiconductor laser transmitter optical axis, the imaging beam that forms angle β with linear CCD array plane also passes through the center of cemented doublet 3, has:
The setting of cemented doublet position: mainly determine by angle α, distance H are unique, also by the angle α of semiconductor laser transmitter optical axis and cemented doublet optical axis, semiconductor laser transmitter optical axis and cemented doublet optical axes crosspoint A are unique definite to the vertical range H of cemented doublet center O, that is:
H=L 1cosα-------------(9)
The setting of linear CCD array position: mainly by distance L, angle γ, determined, the also i.e. distance L to linear CCD array mid point A ' by semiconductor laser transmitter optical axis, linear CCD array is definite with the angle γ of plane that is parallel to base station table top, that is:
γ=90°-α-β-------------(10)
L=(L 1+L 2)sinα-------------(11)
When the setting of linear ccd array position, take semiconductor laser transmitter optical axis to the distance L of linear CCD array mid point A ' as preferably, so that calculate; Certainly, also can to the distance of linear CCD array any point, set with semiconductor laser transmitter optical axis, but now calculate comparatively complicated.
The measurement range of sealed plastic box thickness measure module and the calculating of resolution:
In the present embodiment, known according to linear CCD array structure, x=n*u, n is the pixel number of linear CCD array, u is unit pixel dimension, for example: when the pixel number of selected linear CCD array is 2236, unit pixel dimension is 14 μ m.In actual measurement, the pixel detecting for dark current of linear CCD array edges should give up need not, in order to measure accurately, get the coefficient of performance 0.95 of effective pixel quantity, assumed origin is the mid point of linear CCD array again, and now the areas imaging x of linear CCD array is:
( - 2236 × 0.95 × 14 2 , 2236 * 0.95 * 14 2 ) μm = ( - 14869.4,14869.4 ) μm - - - ( 12 )
Therefore,, by formula (12) substitution formula (7), can obtain the measurement range of sealed plastic box thickness measure module:
y = 14869.4 ( L 1 - f ) sin β f sin α - 14.869.4 ( 1 - f L 1 ) sin ( α + β ) + 14869.4 ( L 1 - f ) sin β f sin α + 14869.4 ( 1 - f L 1 ) sin ( α + β ) - - - ( 13 )
According to formula (7), to x differentiate wherein, be amplified multiplying power and be:
k = dy dx = f ( L 1 - f ) sin β sin α [ f sin α + x ( 1 - f L 1 ) sin ( α + β ) ] 2 - - - ( 14 )
Wherein, the k value in formula (14) is larger, and the resolution of sealed plastic box thickness measure module is also just higher.In addition, also have:
β = arctan [ H tan α - f sin α f cos α ] - - - ( 13 )
In formula (15), H is that cemented doublet center O is to the vertical range of reference surface; β is the function of parameter alpha, H, f, after α, H, f determine, can calculate and determine β; And then, can, according to formula (12) and (14), calculate the value of y, k.In actual applications, can design suitable, lower-cost sealed plastic box thickness measure module according to the sensing range of sealed plastic box thickness on substrate to be measured or the requirement of accuracy of detection.
Embodiment 3:
The difference of the present embodiment and embodiment 1,2 is, in the present embodiment sealed plastic box thickness measure module, the relative base station table top of optical transmitting set is obliquely installed.
The present embodiment is identical with embodiment 1,2 with measuring process to the measuring principle of sealed plastic box thickness, and in measurement module, the setting of system light path parameter can reference example 1,2, repeats no more here.
Embodiment 4:
The present embodiment, on the arbitrary basis of embodiment 1-3, has also been realized frame and/or base station along the movement of a direction.
In the present embodiment, as shown in Figure 2, sealed plastic box pick-up unit also comprises servo motor 18, and servo motor 18 is arranged at the bottom of frame 10, and frame 10 moves along Y direction with servo motor 18; And/or servo motor 18 is arranged at the bottom of base station 11, base station 11 moves along X-axis with servo motor 18, and wherein, Y-axis is vertical with X-axis.
In the present embodiment, by the control to servo motor, realize the motion to frame and/or base station, fixed frame and base station in sealed plastic box pick-up unit compared to existing technology, width and thickness that the sealed plastic box stationary installation in the present embodiment can realize sealed plastic box on the substrate of Multiple Type, sizes, various shape more neatly detect.
The present embodiment is in the measuring process of sealed plastic box thickness: during the relative motion in Y-axis of frame and base station, the sealed plastic box that detection head scans in all Y-directions is drawn state; Frame is relative with base station when static, and each detection head is along the state of drawing of sealed plastic box on X-axis motion scan directions X.The testing result Real-time Feedback that pick-up unit obtains, to upstream sealed plastic box coating apparatus, carries out parameter adjustment to reach the effect of drawing of sealed plastic box the best to coating apparatus in time; Or, adopt 15 pairs of patchers that arrange in detection head to exist the sealed plastic box of defect to repair in time.
Simultaneously, in order to reduce parts, take up room, improve the compactedness of pick-up unit, in sealed plastic box pick-up unit in the present embodiment, to in prior art, occupy separately the patcher 15 of a detection head, be integrated in the detection head 13 that is also simultaneously provided with sealed plastic box width measure module and sealed plastic box thickness measure module.
And, relative prior art, in the present embodiment, the detection head quantity of sealed plastic box pick-up unit increases, for example: from 7 detection heads of the prior art, be increased to 12 detection heads, increase single sensing range, improve detection efficiency.
Embodiment 5:
The present embodiment provides a kind of display panel to become cartridge device, and this display panel becomes cartridge device to comprise the sealed plastic box pick-up unit that embodiment 1-4 is arbitrary.
This display panel becomes cartridge device to be applicable to carry out array base palte or the color membrane substrates of the various models of sealed plastic box coating.Adopt this kind of display panel to become cartridge device, owing to further improving the quality of drawing of sealed plastic box, therefore can further improve the one-tenth box yield of liquid crystal panel.
The utility model is in the sealed plastic box pick-up unit of prior art, add sealed plastic box thickness detection module (utilizing laser distance measuring principle), original, only can carry out on the basis of width measure the sealed plastic box after drawing, also can carry out the sealed plastic box thickness after drawing in real time simultaneously, measure exactly, thereby realize the quality of drawing of overall monitor sealed plastic box, avoid that to draw the sealed plastic box that thickness abnormity causes relevant bad due to sealed plastic box, for example there is larger bubble (Bubble Large), sealed plastic box leakage (Seal Leak) etc., improve the yield of drawing of sealed plastic box, improve the yield of display panel (Panel).
Be understandable that, above embodiment is only used to principle of the present utility model is described and the illustrative embodiments that adopts, yet the utility model is not limited to this.For those skilled in the art, in the situation that not departing from spirit of the present utility model and essence, can make various modification and improvement, these modification and improvement are also considered as protection domain of the present utility model.

Claims (10)

1. a sealed plastic box pick-up unit, for detecting being formed on the size of the sealed plastic box on substrate, described sealed plastic box pick-up unit comprises frame and is arranged at the detection head in described frame, region corresponding to described frame below is substrate to be measured rest area, it is characterized in that, described detection head comprises at least one sealed plastic box thickness detection module, and described sealed plastic box thickness detection module and described substrate to be measured rest area are oppositely arranged.
2. sealed plastic box pick-up unit according to claim 1, it is characterized in that, described sealed plastic box pick-up unit also comprises processor, described sealed plastic box thickness detection module comprises optical transmitting set, optical receiver lens and optical receiver, described optical transmitting set with described optical receiver from being arranged at the top of described substrate to be measured rest area and being electrically connected to described processor respectively; The range difference that described processor is set to the imaging point that forms by described optical receiver according to described substrate surface to be measured and the sealed plastic box surface on it obtains the thickness of sealed plastic box.
3. sealed plastic box pick-up unit according to claim 2, it is characterized in that, described sealed plastic box thickness detection module also comprises LAL, described LAL is arranged between described optical transmitting set and described substrate to be measured rest area, and described LAL optical axis is vertical with described optical transmitting set plane.
4. sealed plastic box pick-up unit according to claim 3, it is characterized in that, described sealed plastic box thickness detection module also comprises optical filter, and described optical filter is arranged between described optical receiver lens and described substrate to be measured rest area, and described optical filter plane is parallel with described optical receiver lens principal plane.
5. sealed plastic box pick-up unit according to claim 4, is characterized in that, the relatively described substrate to be measured of described optical transmitting set rest area level/be obliquely installed in the top of described substrate to be measured rest area; And/or, the relatively described substrate to be measured of described optical receiver rest area planar horizontal/be obliquely installed in the top of described substrate to be measured rest area.
6. according to the arbitrary described sealed plastic box pick-up unit of claim 3-5, it is characterized in that, described optical transmitting set is semiconductor laser transmitter, and described LAL is collimation lens, described optical receiver lens is cemented doublet, and described optical receiver is linear charge coupling element array.
7. sealed plastic box pick-up unit according to claim 6, is characterized in that, described in each, detection head comprises two described sealed plastic box thickness detection modules, is respectively used to the detection of the thickness on mutually perpendicular both direction to described sealed plastic box.
8. sealed plastic box pick-up unit according to claim 7, is characterized in that, described detection head also comprises sealed plastic box width detection module, and described sealed plastic box width detection module is electrically connected to described processor.
9. sealed plastic box pick-up unit according to claim 8, it is characterized in that, described sealed plastic box pick-up unit also comprises the base station being oppositely arranged with described frame, described substrate to be measured rest area is described base station table top, described sealed plastic box pick-up unit also comprises servo motor, described servo motor is arranged at the bottom of described frame, and described frame moves along Y direction with described servo motor; And/or described servo motor is arranged at the bottom of described base station, described base station moves along X-axis with described servo motor, and wherein, described Y-axis is vertical with described X-axis.
10. display panel becomes a cartridge device, it is characterized in that, comprises the sealed plastic box pick-up unit described in claim 1-9 any one.
CN201320582044.0U 2013-09-18 2013-09-18 Sealing glue detection apparatus and display panel box forming apparatus Expired - Lifetime CN203454973U (en)

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Cited By (13)

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CN104359915A (en) * 2014-12-08 2015-02-18 合肥京东方光电科技有限公司 Coated glue detection method and device
CN105651184A (en) * 2016-03-11 2016-06-08 京东方科技集团股份有限公司 Seal width detecting device and method
WO2017117971A1 (en) * 2016-01-05 2017-07-13 京东方科技集团股份有限公司 Sealant detection and ultrasonic cleaning device
CN107150010A (en) * 2017-07-10 2017-09-12 武汉华星光电技术有限公司 Frame glue coating mechanism and frame glue coating measuring method
CN107219691A (en) * 2017-07-28 2017-09-29 武汉华星光电技术有限公司 display panel and sealant measuring method
CN107515484A (en) * 2017-09-28 2017-12-26 京东方科技集团股份有限公司 Each device and detection method that a kind of sealant detecting system and the system include
CN107883866A (en) * 2016-09-30 2018-04-06 上海微电子装备(集团)股份有限公司 A kind of optical measuring device and method
CN108180880A (en) * 2017-12-27 2018-06-19 武汉华星光电技术有限公司 Bull measuring apparatus measuring point position auto-allocation method
CN108871191A (en) * 2018-06-29 2018-11-23 武汉华星光电技术有限公司 The method that contraposition checks equipment and measures frame glue width
CN110044277A (en) * 2019-04-04 2019-07-23 深圳市华星光电技术有限公司 Frame glue detection device and frame glue detection method
CN110248013A (en) * 2019-06-25 2019-09-17 深圳市金东迪科技有限公司 A kind of mobile phone display screen Function detection and automatic sending and taking device and its implementation
CN113031323A (en) * 2021-03-22 2021-06-25 绵阳惠科光电科技有限公司 Frame sealing glue width detection method, display panel and display device
CN114608458A (en) * 2022-03-02 2022-06-10 通富微电子股份有限公司 Device and method for detecting thickness of mounting adhesive

Cited By (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104359915A (en) * 2014-12-08 2015-02-18 合肥京东方光电科技有限公司 Coated glue detection method and device
US10026162B2 (en) 2014-12-08 2018-07-17 Boe Technology Group Co., Ltd. Method and device for sealant coating inspection
WO2017117971A1 (en) * 2016-01-05 2017-07-13 京东方科技集团股份有限公司 Sealant detection and ultrasonic cleaning device
US20180111172A1 (en) * 2016-01-05 2018-04-26 Boe Technology Group Co., Ltd. Sealant detection and ultrasonic cleaning apparatus
CN105651184A (en) * 2016-03-11 2016-06-08 京东方科技集团股份有限公司 Seal width detecting device and method
CN105651184B (en) * 2016-03-11 2018-06-15 京东方科技集团股份有限公司 Sealant width detecting and detection method
CN107883866A (en) * 2016-09-30 2018-04-06 上海微电子装备(集团)股份有限公司 A kind of optical measuring device and method
CN107883866B (en) * 2016-09-30 2019-11-26 上海微电子装备(集团)股份有限公司 A kind of optical measuring device and method
CN107150010A (en) * 2017-07-10 2017-09-12 武汉华星光电技术有限公司 Frame glue coating mechanism and frame glue coating measuring method
CN107219691A (en) * 2017-07-28 2017-09-29 武汉华星光电技术有限公司 display panel and sealant measuring method
CN107515484A (en) * 2017-09-28 2017-12-26 京东方科技集团股份有限公司 Each device and detection method that a kind of sealant detecting system and the system include
CN107515484B (en) * 2017-09-28 2020-04-24 京东方科技集团股份有限公司 Frame sealing glue detection system, devices contained in system and detection method
WO2019128981A1 (en) * 2017-12-27 2019-07-04 武汉华星光电技术有限公司 Multi-head measurement device and measurement site automatic allocation method thereof
US11300401B2 (en) * 2017-12-27 2022-04-12 Wuhan China Star Optoelectronics Technology Co., Ltd. Multi-head measuring apparatus and measuring point automatic allocation method thereof
CN108180880A (en) * 2017-12-27 2018-06-19 武汉华星光电技术有限公司 Bull measuring apparatus measuring point position auto-allocation method
CN108180880B (en) * 2017-12-27 2020-05-12 武汉华星光电技术有限公司 Multi-head measuring equipment measuring point location automatic allocation method
CN108871191A (en) * 2018-06-29 2018-11-23 武汉华星光电技术有限公司 The method that contraposition checks equipment and measures frame glue width
CN108871191B (en) * 2018-06-29 2020-07-03 武汉华星光电技术有限公司 Frame glue width measuring equipment and frame glue width measuring method
CN110044277B (en) * 2019-04-04 2020-11-24 深圳市华星光电技术有限公司 Frame glue detection device and frame glue detection method
CN110044277A (en) * 2019-04-04 2019-07-23 深圳市华星光电技术有限公司 Frame glue detection device and frame glue detection method
WO2020199257A1 (en) * 2019-04-04 2020-10-08 深圳市华星光电技术有限公司 Sealant detection apparatus and sealant detection method
CN110248013B (en) * 2019-06-25 2020-08-25 深圳市金东迪科技有限公司 Mobile phone display screen function detection and automatic sending and taking device and implementation method thereof
CN110248013A (en) * 2019-06-25 2019-09-17 深圳市金东迪科技有限公司 A kind of mobile phone display screen Function detection and automatic sending and taking device and its implementation
CN113031323A (en) * 2021-03-22 2021-06-25 绵阳惠科光电科技有限公司 Frame sealing glue width detection method, display panel and display device
CN113031323B (en) * 2021-03-22 2022-09-09 绵阳惠科光电科技有限公司 Frame sealing glue width detection method, display panel and display device
CN114608458A (en) * 2022-03-02 2022-06-10 通富微电子股份有限公司 Device and method for detecting thickness of mounting adhesive
CN114608458B (en) * 2022-03-02 2023-11-03 通富微电子股份有限公司 Device and method for detecting thickness of die attach adhesive

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