CN203396645U - Vickers hardness meter with electron microscope - Google Patents
Vickers hardness meter with electron microscope Download PDFInfo
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- CN203396645U CN203396645U CN201320460636.5U CN201320460636U CN203396645U CN 203396645 U CN203396645 U CN 203396645U CN 201320460636 U CN201320460636 U CN 201320460636U CN 203396645 U CN203396645 U CN 203396645U
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Abstract
The utility model relates to the technical field of measurement instruments, and in particular relates to a Vickers hardness meter with an electron microscope. The Vickers hardness meter with the electron microscope comprises a machine body, an XY sample table and a microscope unit, wherein the XY sample table is fixedly arranged on the machine body; the microscope unit is arranged above the XY sample table and is connected with a CCD (charge coupled device) camera unit; the CCD camera unit is arranged on a central processing unit in the machine body in a connection manner; the central processing unit is arranged on a display control unit on the machine body in the connection manner; and the microscope unit is provided with a fine adjustment unit for regulating the measurement precision, and the fine adjustment unit is in data connection with the central processing unit. According to the Vickers hardness meter with the electron microscope, which is disclosed by the utility model, the signal acquisition and processing of a measurement video are realized by utilizing the integrated CCD camera unit and central processing unit, and the display and the control of measurement data are carried out by the display control unit; according to the length of a diagonal line of a creasing of a material, which is measured by the fine adjustment unit by matching video images, the hardness of the material is obtained without additionally utilizing a computer or other auxiliary devices, so that various functions are integrated, the measurement precision is high, the operation is convenient, and the practicability is strong.
Description
Technical field
The utility model relates to surveying instrument technical field, especially a kind of electron microscope Vickers.
Background technology
Vickers is a kind of by measuring the catercorner length of material impression, and recycling formula calculates the big or small surveying instrument of material hardness.Conventional Vickers is to measure by eye-observation microscope, and after long-time measurement, survey crew eyes are easy to tired out, and then causes that measuring error is large, inefficiency, for this defect, also there is on the market at present the Vickers that adopts CCD camera to measure, its function composition is generally an additional CCD camera on the scleroscopic basis of routine, then CCD camera is connected on computer, writing on computers a Survey Software measures, so, although avoided survey crew, observe for a long time measurement, but owing to adopting split-type structural, need corresponding support equipment etc., in completing the whole step of hardness measurement, exist measuring process loaded down with trivial details, measure inefficiency, take up room large, the problems such as operation inconvenience.
Utility model content
The deficiency existing for above-mentioned prior art, the purpose of this utility model is to provide a kind of image acquisition and hardness measurement is integrated, Based Intelligent Control, electron microscope Vickers convenient to operation.
To achieve these goals, the utility model adopts following technical scheme:
A kind of electron microscope Vickers, it comprises body, be fixedly installed in the XY sample bench on body and be arranged at the microscope unit of XY sample bench top, described microscope unit is connected with CCD image unit, described CCD image unit is connected in the central processing unit in body, and described central processing unit is connected in the indicative control unit on body; In described microscope unit, be provided with the fine-adjusting unit for adjusting measuring accuracy, being connected with central processing unit data.
Preferably, described microscope unit comprises object lens and the eyepiece being used in conjunction with object lens, and described CCD image unit connects eyepiece, and described fine-adjusting unit is arranged on eyepiece.
Preferably, described fine-adjusting unit comprises drum and be arranged at the scrambler on drum, and described scrambler is connected with central processing unit data.
Preferably, described CCD image unit comprises the CCD camera that is connected with eyepiece and is installed on the vision signal decoder module in body, and described CCD camera is connected with central processing unit by vision signal decoder module.
Preferably, described central processing unit is also connected with the light source cell being arranged between object lens and eyepiece.
Preferably, described indicative control unit comprises touch display screen.
Owing to having adopted such scheme, the CCD image unit that the utility model utilization is integrated in one and central control unit are realized and are measured signals collecting and the processing of video and carry out measurement data demonstration and control by indicative control unit; According to video image, coordinate fine-adjusting unit to measure the catercorner length of material impression, thereby draw the hardness of material, it,, without additional computer or other utility appliance, integrates each function, and measuring accuracy is high, easy to operate, has very strong practicality.
Accompanying drawing explanation
Fig. 1 is the theory structure schematic diagram of the utility model embodiment.
Embodiment
Below in conjunction with accompanying drawing, embodiment of the present utility model is elaborated, but the multitude of different ways that the utility model can be defined by the claims and cover is implemented.
As shown in Figure 1, the electron microscope Vickers of the present embodiment, it comprises body, be fixedly installed in the XY sample bench on body and be arranged at the microscope unit 10 of XY sample bench top; For a change conventional hardness meter is realized the functional form of sclerometer surveying work to connect external computer or video camera, microscope unit 10 is connected with CCD image unit 20, CCD image unit 20 is connected in the central processing unit 30 in body, central processing unit 30 be connected on body by the indicative control unit 40 that comprises that touch display screen etc. forms; Meanwhile, in microscope unit 10, be provided with for adjusting measuring accuracy, carrying out with central processing unit 30 fine-adjusting unit 50 that data are connected.
Wherein, microscope unit 10 comprises object lens 11 and the eyepiece 12 being used in conjunction with object lens 11.CCD image unit 20 comprises the CCD camera 21 being connected with eyepiece 12 and is installed on the vision signal decoder module 22 in body, and CCD camera 21 is connected with central processing unit 30 by vision signal decoder module 22.Fine-adjusting unit 50 comprises with the drum 51 of eyepiece 12 assembly and connections and is arranged at the scrambler 52 on drum 51, utilizes scrambler 52 to carry out data with central processing unit 30 and be connected.Meanwhile, central processing unit 30 is also connected with the light source cell 60 being arranged between object lens 11 and eyepiece 12, controls switch and the brightness of light source cell 60 by central processing unit 30, thinks that whole microscope unit 10 provides light source.
In use, material to be measured is positioned on XY sample bench, according to the method for hardness measurement, adopt specific diamond penetrator in detected materials, to apply certain power value, to form impression, simultaneously, utilize the height of the fine adjustment lifting gear adjustment XY sample bench on XY sample bench to realize focusing, and by microscope unit 10, image unit CCD unit 20, central processing unit 30 is presented at video pattern on indicative control unit 40, by indicative control unit 40, carry out the demonstration of video pattern and equipment operating and control, recycling indicative control unit 40 is adjusted the enlargement factor of microscope unit 10, and after the diagonal line of scale mark and material impression being coincide by adjustment drum 51, recycling scrambler 52 is confirmed reading, scrambler 52 is delivered to reading in central processing unit 30, to carry out the calculating of material hardness and carry out the demonstration of measurement result by indicative control unit 40.Obtain for convenience the measurement pattern of high definition and assist and carry out the measurement of material impression, can utilize indicative control unit 40 by central processing unit 30, to adjust the brightness of light source cells 60.
The sclerometer of the present embodiment, integrates image acquisition and hardness measurement, Based Intelligent Control, convenient to operation, measuring accuracy is high, has very strong practicality and market popularization value.
The foregoing is only preferred embodiment of the present utility model; not thereby limit the scope of the claims of the present utility model; every equivalent structure or conversion of equivalent flow process that utilizes the utility model instructions and accompanying drawing content to do; or be directly or indirectly used in other relevant technical fields, be all in like manner included in scope of patent protection of the present utility model.
Claims (6)
1. an electron microscope Vickers, it comprises body, be fixedly installed in the XY sample bench on body and be arranged at the microscope unit of XY sample bench top, it is characterized in that: described microscope unit is connected with CCD image unit, described CCD image unit is connected in the central processing unit in body, and described central processing unit is connected in the indicative control unit on body; In described microscope unit, be provided with the fine-adjusting unit for adjusting measuring accuracy, being connected with central processing unit data.
2. a kind of electron microscope Vickers as claimed in claim 1, is characterized in that: described microscope unit comprises object lens and the eyepiece being used in conjunction with object lens, and described CCD image unit connects eyepiece, and described fine-adjusting unit is arranged on eyepiece.
3. a kind of electron microscope Vickers as claimed in claim 1 or 2, is characterized in that: described fine-adjusting unit comprises drum and be arranged at the scrambler on drum, and described scrambler is connected with central processing unit data.
4. a kind of electron microscope Vickers as claimed in claim 3, it is characterized in that: described CCD image unit comprises the CCD camera that is connected with eyepiece and be installed on the vision signal decoder module in body, described CCD camera is connected with central processing unit by vision signal decoder module.
5. a kind of electron microscope Vickers as claimed in claim 4, is characterized in that: described central processing unit is also connected with the light source cell being arranged between object lens and eyepiece.
6. a kind of electron microscope Vickers as claimed in claim 5, is characterized in that: described indicative control unit comprises touch display screen.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320460636.5U CN203396645U (en) | 2013-07-26 | 2013-07-26 | Vickers hardness meter with electron microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320460636.5U CN203396645U (en) | 2013-07-26 | 2013-07-26 | Vickers hardness meter with electron microscope |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203396645U true CN203396645U (en) | 2014-01-15 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201320460636.5U Expired - Fee Related CN203396645U (en) | 2013-07-26 | 2013-07-26 | Vickers hardness meter with electron microscope |
Country Status (1)
| Country | Link |
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| CN (1) | CN203396645U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104749056A (en) * | 2014-07-22 | 2015-07-01 | 施周平 | Coating hardness tester |
| CN106546501A (en) * | 2016-09-09 | 2017-03-29 | 上海尚材试验机有限公司 | It is provided with the hardometer of ccd image acquisition system |
-
2013
- 2013-07-26 CN CN201320460636.5U patent/CN203396645U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104749056A (en) * | 2014-07-22 | 2015-07-01 | 施周平 | Coating hardness tester |
| CN106546501A (en) * | 2016-09-09 | 2017-03-29 | 上海尚材试验机有限公司 | It is provided with the hardometer of ccd image acquisition system |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140115 Termination date: 20140726 |
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| EXPY | Termination of patent right or utility model |