CN203376144U - Simple and automatic test system for polarization of semiconductor laser - Google Patents

Simple and automatic test system for polarization of semiconductor laser Download PDF

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Publication number
CN203376144U
CN203376144U CN201320397527.3U CN201320397527U CN203376144U CN 203376144 U CN203376144 U CN 203376144U CN 201320397527 U CN201320397527 U CN 201320397527U CN 203376144 U CN203376144 U CN 203376144U
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China
Prior art keywords
semiconductor laser
polarization
electric machine
test system
motor
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Expired - Fee Related
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CN201320397527.3U
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Chinese (zh)
Inventor
徐昊
李超
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Suzhou Institute of Biomedical Engineering and Technology of CAS
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Suzhou Institute of Biomedical Engineering and Technology of CAS
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Abstract

The utility model discloses a simple and automatic test system for polarization of a semiconductor laser. The system comprises a semiconductor laser. An emitting end of the semiconductor laser is successively provided with a combined optical path, a polarization prism and a power detector. The polarization prism is connected with a motor inside a motor control rotary device through driving of a belt or a gear. The motor control rotary device includes the motor and a motor controller. The polarization prism is connected with the motor controller via a limit switch. The motor control rotary device and the power detector are both connected with a computer. The system is simple to operate, allows errors among different detectors to be avoided, and can accurately measure power values of P and S directions, i.e., the system can accurately measure power of a TM laser mode and a TE laser mode. A prism fixing device has a 90-degree spacing function and can accurately enable P and S split light to correspond to each other, that is to say, the TM mode and the TE mode, with the same light beam, are accurately separated.

Description

A kind of Simple automation semiconductor laser polarization test system
Technical field
The utility model relates to a kind of semiconductor laser polarization test system, is specifically related to a kind of Simple automation semiconductor laser polarization test system.
Background technology
High power, high-level efficiency, high-brightness semiconductor laser diode, because of advantages such as its volume are little, the efficiency high life is long, reliable and stable, use cost is low, are widely used in the fields such as solid state laser and fiber laser manufacture, industry, medical treatment, amusement demonstration, national defence, laser communications and fundamental research.The application of high power, high-level efficiency, high-brightness semiconductor laser diode is most important for the upgrading of industries in the fields such as China's industry, medical treatment, amusement demonstration, national defence, it not only can help to improve the production efficiency of industry etc., can also reduce the product use cost, both energy-conservation, environmental protection again.
High power semiconductor lasers all adopts strained quantum well structure, is output as linearly polarized light, the polarization of test Output of laser, semiconductor material and intra resonant cavity architectural characteristic that can reaction member; In the commercial Application of semiconductor laser, for improving the beam quality of semiconductor laser, often utilize the polarization coupled technology, linearly polarized light is coupled as to circularly polarized light.Therefore the measurement of polarization of semiconductor laser has very important meaning to Performance Detection and the later stage use of laser instrument.
" Chinese laser " " semiconductor laser array polarization characteristic and with the experimental study of stress relation " (Vol.36, No.5, May, 2009) having introduced a kind of method of testing of semiconductor laser array polarization characteristic in, is that laser beam shines on the CCD camera through polaroid, by the polaroid half-twist, record result, obtain the value of degree of polarization, the method can't judge polarization mode, polaroid can't bear high power laser, is difficult to test the degree of polarization of high power semiconductor lasers.
State Intellectual Property Office of the People's Republic of China discloses on May 2nd, 2012 patent documentation that publication number is CN 1024435422A, and name is called a kind of semiconductor laser polarization test system.After the laser of this system noise spectra of semiconductor lasers compresses and converges, by polarized light splitting device, P, S light are separated, place two power detector probe power on the P after light splitting, S direction.By calculating P, S power ratio, calculate polarization value.
State Intellectual Property Office of the People's Republic of China discloses on May 30th, 2012 patent documentation that publication number is CN 202255839U, and name is called a kind of semiconductor laser polarization test system.The laser of this system noise spectra of semiconductor lasers carries out light splitting, and 95% light by photodetector and digital multimeter probe power, by the rotatory polarization sheet, records multimeter maximal value and minimum value after polaroid-convergence compression, calculates polarization value; 5% light is through polarization splitting prism, with two groups of photodetectors that are placed on P, S direction and data collecting card, gathers and compares P, S power, judges the inclined to one side pattern of master of laser instrument.
In above two schemes, the first scheme is used two detectors to survey P, S power, is difficult to eliminate two errors between detector; First scheme, by the rotatory polarization sheet, record maximal value and the minimum value of multimeter in this process, is difficult to operation and robotization.
The utility model content
For addressing the above problem, the purpose of this utility model is to provide a kind of Simple automation semiconductor laser polarization test system, with fast, accurately, the test of robotization the polarization value of writing laser, go for the test of semiconductor laser product in enormous quantities.
The apprizing system of sample treatment plant, for realizing above-mentioned technical purpose, reaches above-mentioned technique effect, and the utility model is achieved through the following technical solutions:
A kind of Simple automation semiconductor laser polarization test system, comprise semiconductor laser, described semiconductor laser exit end is disposed with combined optical path, polarizing prism and power detector, described polarizing prism is connected with the motor in the Electric Machine Control wheelwork by belt or gear drive, described Electric Machine Control wheelwork comprises described motor and electric machine controller, described polarizing prism is connected with described electric machine controller by limit switch, and described Electric Machine Control wheelwork is connected respectively computer with described power detector.
Further, described combined optical path is combined by many groups aspheric mirror.
Further, described polarizing prism is polarization PBS cube beamsplitter.
Further, described Electric Machine Control wheelwork also comprises fixed sleeve part.
The beneficial effects of the utility model are:
The utility model is simple to operate, can avoid the error between different detectors, Measurement accuracy P, S direction performance number, be the power of Measurement accuracy TM, two kinds of zlasing modes of TE, prism fixing device is spacing with 90 °, accurately realize the correspondence of P, S light splitting, i.e. the accurate separation of same light beam TM, two kinds of patterns of TE.
Above-mentioned explanation is only the general introduction of technical solutions of the utility model, in order to better understand technological means of the present utility model, and can be implemented according to the content of instructions, below with preferred embodiment of the present utility model and coordinate accompanying drawing to be described in detail as follows.Embodiment of the present utility model is provided in detail by following examples and accompanying drawing thereof.
The accompanying drawing explanation
Fig. 1 is structural representation of the present utility model.
The number in the figure explanation:
1, semiconductor laser, 2, combined optical path, 3, polarizing prism, 4, power detector, 5, the Electric Machine Control wheelwork, 6, belt, 7, limit switch, 8, computer, 9, motor, 10, electric machine controller.
Embodiment
Below with reference to the accompanying drawings and in conjunction with the embodiments, describe the utility model in detail.
Shown in Figure 1, a kind of Simple automation semiconductor laser polarization test system,
Comprise semiconductor laser 1, described semiconductor laser 1 exit end is disposed with combined optical path 2, polarizing prism 3 and power detector 4, described polarizing prism 3 is connected with the motor 9 in Electric Machine Control wheelwork 5 by belt 6 or gear drive, described Electric Machine Control wheelwork 5 comprises described motor 9 and electric machine controller 10, described polarizing prism 3 is connected with described electric machine controller 10 by limit switch 7, and described Electric Machine Control wheelwork 5 is connected respectively computer 8 with described power detector 4.
Further, described combined optical path 2 is combined by many groups aspheric mirror.
Further, described polarizing prism 3 is polarization PBS cube beamsplitter, P polarized light transmission, the reflection of S polarized light.
Further, described Electric Machine Control wheelwork 5 also comprises fixed sleeve part.Producing switching signals by described limit switch 7, can stop the rotation of described motor 9, is 90 ° thereby accurately control the angle that described polarizing prism 3 rotates.
The course of work of the present utility model is:
The light that described semiconductor laser 1 sends is after described combined optical path 2, the light beam of assembling incides on described polarizing prism 3, enter to inject the integrating sphere of described power detector 4 through the laser of described polarizing prism 3, described polarizing prism 3 allows the P polarized light to pass through, the reflection of S polarized light, the TM mode power value that known described integrating sphere gauge outfit collects, rotating described polarizing prism 3 is 90 °, TE, the relative prism exchange of TM pattern, again gather described integrating sphere reading, obtain TE mode power value, data are sent to described computer 8 by data line, by the software on described computer 8, polarization value is calculated.
Described motor 9 drives described polarizing prism 3 rotation processes:
Control described motor 9 by described Electric Machine Control wheelwork 5, drive described polarizing prism 3 rotations by described belt 6 or gear drive, put by described polarizing prism 3 90 ° spacing and described limit switches 7 coordinate and produce switching signal, this signal can be by described Electric Machine Control wheelwork 5, stopping described motor 9 and rotate, is 90 ° thereby accurately control described polarizing prism 3 rotational angles.
The foregoing is only the preferred embodiment of utility model, be not limited to the utility model, for a person skilled in the art, the utility model can have various modifications and variations.All within spirit of the present utility model and principle, any modification of doing, be equal to replacement, improvement etc., within all should being included in protection domain of the present utility model.

Claims (4)

1. a Simple automation semiconductor laser polarization test system, comprise semiconductor laser, it is characterized in that: described semiconductor laser exit end is disposed with combined optical path, polarizing prism and power detector, described polarizing prism is connected with the motor in the Electric Machine Control wheelwork by belt or gear drive, described Electric Machine Control wheelwork comprises described motor and electric machine controller, described polarizing prism is connected with described electric machine controller by limit switch, and described Electric Machine Control wheelwork is connected respectively computer with described power detector.
2. Simple automation semiconductor laser polarization test system according to claim 1, it is characterized in that: described combined optical path is combined by many groups aspheric mirror.
3. Simple automation semiconductor laser polarization test system according to claim 1, it is characterized in that: described polarizing prism is polarization PBS cube beamsplitter.
4. Simple automation semiconductor laser polarization test system according to claim 1, it is characterized in that: described Electric Machine Control wheelwork also comprises fixed sleeve part.
CN201320397527.3U 2013-07-05 2013-07-05 Simple and automatic test system for polarization of semiconductor laser Expired - Fee Related CN203376144U (en)

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CN201320397527.3U CN203376144U (en) 2013-07-05 2013-07-05 Simple and automatic test system for polarization of semiconductor laser

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Application Number Priority Date Filing Date Title
CN201320397527.3U CN203376144U (en) 2013-07-05 2013-07-05 Simple and automatic test system for polarization of semiconductor laser

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103411752A (en) * 2013-07-05 2013-11-27 中国科学院苏州生物医学工程技术研究所 Simple and automated polarization test system of a semiconductor laser

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103411752A (en) * 2013-07-05 2013-11-27 中国科学院苏州生物医学工程技术研究所 Simple and automated polarization test system of a semiconductor laser

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