CN203217045U - 一种可控硅状态测定仪 - Google Patents
一种可控硅状态测定仪 Download PDFInfo
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- CN203217045U CN203217045U CN 201320085392 CN201320085392U CN203217045U CN 203217045 U CN203217045 U CN 203217045U CN 201320085392 CN201320085392 CN 201320085392 CN 201320085392 U CN201320085392 U CN 201320085392U CN 203217045 U CN203217045 U CN 203217045U
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- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims abstract description 49
- 229910052710 silicon Inorganic materials 0.000 title claims abstract description 49
- 239000010703 silicon Substances 0.000 title claims abstract description 49
- 238000012360 testing method Methods 0.000 claims abstract description 12
- 230000002457 bidirectional effect Effects 0.000 claims description 21
- 230000004224 protection Effects 0.000 description 8
- 241000270722 Crocodylidae Species 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- LNNWVNGFPYWNQE-GMIGKAJZSA-N desomorphine Chemical compound C1C2=CC=C(O)C3=C2[C@]24CCN(C)[C@H]1[C@@H]2CCC[C@@H]4O3 LNNWVNGFPYWNQE-GMIGKAJZSA-N 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 238000005406 washing Methods 0.000 description 2
- 241001062009 Indigofera Species 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
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CN 201320085392 CN203217045U (zh) | 2013-02-25 | 2013-02-25 | 一种可控硅状态测定仪 |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104965164A (zh) * | 2015-07-09 | 2015-10-07 | 安徽淮化股份有限公司 | 一种可控硅测试仪 |
CN105277866A (zh) * | 2015-09-11 | 2016-01-27 | 中冶宝钢技术服务有限公司 | 晶闸管检测器和该检测器的晶闸管检测方法 |
CN106324467A (zh) * | 2016-08-25 | 2017-01-11 | 田红卫 | 单向可控硅全状态监测器 |
-
2013
- 2013-02-25 CN CN 201320085392 patent/CN203217045U/zh not_active Expired - Fee Related
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104965164A (zh) * | 2015-07-09 | 2015-10-07 | 安徽淮化股份有限公司 | 一种可控硅测试仪 |
CN104965164B (zh) * | 2015-07-09 | 2018-03-09 | 安徽淮化股份有限公司 | 一种可控硅测试仪 |
CN105277866A (zh) * | 2015-09-11 | 2016-01-27 | 中冶宝钢技术服务有限公司 | 晶闸管检测器和该检测器的晶闸管检测方法 |
CN106324467A (zh) * | 2016-08-25 | 2017-01-11 | 田红卫 | 单向可控硅全状态监测器 |
CN106324467B (zh) * | 2016-08-25 | 2019-02-01 | 田红卫 | 单向可控硅全状态监测器 |
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Owner name: SHENZHEN GAOKETE SEMICONDUCTOR CO., LTD. Free format text: FORMER OWNER: WENG CEGAO Effective date: 20140422 |
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Effective date of registration: 20140422 Address after: 518133, Shenzhen 45, Guangdong province Baoan District district turn over the road Fuyuan Building 1 Factory (office space) Patentee after: Shenzhen hi tech special Semiconductor Co., Ltd. Address before: 516622 supply and Marketing Cooperative 9, six village Avenue, red bay area, Guangdong, Shanwei Patentee before: Weng Cegao |
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CF01 | Termination of patent right due to non-payment of annual fee | ||
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