CN203204148U - Test apparatus for target scattering characteristic of terahertz - Google Patents
Test apparatus for target scattering characteristic of terahertz Download PDFInfo
- Publication number
- CN203204148U CN203204148U CN 201320061081 CN201320061081U CN203204148U CN 203204148 U CN203204148 U CN 203204148U CN 201320061081 CN201320061081 CN 201320061081 CN 201320061081 U CN201320061081 U CN 201320061081U CN 203204148 U CN203204148 U CN 203204148U
- Authority
- CN
- China
- Prior art keywords
- terahertz
- target scattering
- proving installation
- scattering characteristics
- detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
The utility model relates to the field of testing properties of terahertz, and specifically relates to a test apparatus for the target scattering characteristic of terahertz. The test apparatus comprises an optical experiment table. An automatic rotary optical platform, a gantry, a motion controller, a terahertz wave source, a lens and a data reading apparatus are disposed on the optical experiment table, wherein the gantry crosses the automatic rotary optical platform; a horizontal slide rail is disposed on the gantry; a vertical automatic rotating platform is connected onto the slide rail; the to-be-tested object is disposed on the automatic rotating platform; and a detector is disposed on the automatic rotary optical platform and is electrically connected with the data reading apparatus. The testing method is that the target scattering characteristic of terahertz is analyzed through a scattering test of a metal or plastic disc. The test apparatus for the target scattering characteristic of terahertz is simple and convenient, easy to install and low in cost; and the testing method is simple and easy, and the data error is small.
Description
Technical field
The utility model relates to the characteristic test field of Terahertz, relates in particular to a kind of Terahertz target scattering characteristics proving installation and method of testing.
Background technology
The research of THz wave scattering experiment is for research Terahertz radar target signature, and then the research that realizes the Terahertz RCS and be scattering into picture all has significant values.Transmission and the reflection characteristic research work that centers on the THz wave target both at home and abroad in recent years obtained multinomial achievement in research, and driven the carrying out of research work of relevant catoptric imaging and transmission imaging, research work at the THz wave target scattering characteristics has obtained some achievements abroad, although the theoretical research of domestic relevant Terahertz Radar Target Scatter characteristic also receives publicity, but owing to be subjected to the restriction of factors such as Terahertz radar system, experimental study work is started late, and does not also see the relevant report of relevant Terahertz target scattering characteristics experiment.
The utility model content
The utility model purpose provides a kind of Terahertz target scattering characteristics proving installation.
The utility model embodiment provides a kind of Terahertz target scattering characteristics proving installation, it comprises optical bench, and automatic rotary optical platform, portal frame, motion controller, Terahertz wave source, lens and data fetch device are set on the described optical bench; Described portal frame arranges the slide rail of level across described automatic rotary optical platform on the described portal frame, connect a vertical automatic universal stage on the described slide rail, on the described vertical automatic universal stage measured object is set; On the described automatic rotary optical platform detector is set, described lens are arranged on described Terahertz wave source exit portal, described vertical automatic universal stage can be regulated direction, described detector is arranged on the direction that described vertical automatic universal stage scattered light penetrates, and described detector is electrically connected with described data fetch device.
Preferably, described Terahertz wave source is the carcinotron oscillator source, and described detector is the pyroelectricity detector,
Preferably, described lens are the teflon lens.
Preferably, described motion controller comprises CPU, LCD and operation keyboard.
Be that the side frames of described portal frame is provided with size scale to further improvement in the technical proposal.
Preferably, described automatic rotary optical platform is driven by the segmentation stepper motor, and its precision reaches 0.005r, and rotating speed is 20r/S.
To further improvement in the technical proposal be, described vertical automatic universal stage is connected with described slide rail by a governor motion, and adopts the turbine and worm mechanism driving, and described governor motion bottom connects vertical automatic universal stage.
Be that described automatic rotary optical platform is provided with the screw for the fixed optics parts to further improvement in the technical proposal.
Be between described Terahertz wave source and the described lens chopper to be set to further improvement in the technical proposal.
The utility model Terahertz target scattering characteristics proving installation, beneficial effect is:
Utilize the stable Terahertz wave source of output dexterously, and be equipped with the rotary optical platform that accurate angle can accurately be provided, test job in the nearer zone of target range detector is accomplished, thereby by the scattering test to metal or vinyl disc, finish the test analysis to the Terahertz target scattering characteristics, easy, the easy installation of this device, cost are low.Method of testing is simple and easy to do, and data error is little.
Description of drawings
Accompanying drawing 1 is the utility model Terahertz target scattering characteristics proving installation structural representation;
Accompanying drawing 3 is the structural representation of motion controller in the utility model Terahertz target scattering characteristics proving installation;
Accompanying drawing 4 is thin copper coin scattering experiment curve when being vertical incidence;
Thick when being oblique incidence, the thin copper coin composition scattering empirical curve of accompanying drawing 5.
Wherein:
1, optical bench 2, automatic rotary optical platform 3, portal frame
4, motion controller 5, Terahertz wave source 6, lens
7, data fetch device 8, slide rail 9, vertical automatic universal stage
10, detector 11, power supply 12, LCD
13, operation keyboard 15, governor motion
17, screw 18, chopper 19, copper dish
Embodiment
For making the purpose of this utility model, technical scheme and advantage clearer, below in conjunction with accompanying drawing the utility model is described in further detail.
Embodiment 1:
Terahertz target scattering characteristics proving installation described in the utility model, as shown in Figure 1, it comprises optical bench 1, and it is small-sized automatic rotary optical platform 2, portal frame 3, motion controller 4, the carcinotron oscillator source 5(BOW of 600mm that diameter is set on the optical bench 1), chopper 18, teflon lens 6 and data fetch device 7.Power supply 11 also is set on the optical bench 1.
The carcinotron oscillator source 5 that present embodiment uses, its frequency of operation is used 206.2GHz, and output power is 40mw.Chopper 18 frequencies are 10Hz, and teflon lens 6 focal lengths are 15cm.
Portal frame 3 is across automatic rotary optical platform 2, its side frames is in automatic rotary optical platform 2 sides, side frames is provided with size scale, the slide rail 8 of level is set on its cross bar, connect a governor motion 15 on the slide rail 8, it adopts turbine and worm mechanism (not marking among the figure) transmission, and can regulate upper-lower position.Governor motion 15 bottoms connect vertical automatic universal stage 9, and measured object is connected on the vertical automatic universal stage 9.
Automatically rotary optical platform 2 is driven by the segmentation stepper motor, and its precision can reach 0.005r, and rotating speed is 20r/S.Automatically rotary optical platform 2 is provided with the screw 17 for the fixed optics parts, automatically fix a pyroelectricity detector 10 by screw 17 on the rotary optical platform 2, teflon lens 6 are arranged on the exit portal in carcinotron oscillator source 5, connect measured object on the vertical automatic universal stage 9, it can regulate direction.
Utilize said apparatus research metal or vinyl disc to the scattering of Terahertz, analyze its scattering properties.
The method of present embodiment Terahertz target scattering characteristics proving installation test Terahertz target scattering characteristics utilizes the copper dish of different roughness to perform an analysis, and method is as follows:
Regulate the room temperature to 22.5 ℃, humidity 30.3%, connect a coarse copper dish 19 at vertical automatic universal stage, power-on, wave beam is sent in carcinotron oscillator source 5, shine on the chopper 18 of 10Hz, after chopper 18 modulation, be to shine on the copper dish 19 after the teflon lens 6 of 15cm become parallel light wave through focal length again, forming radius at the copper dish is hot spot about 5cm, move or rotate portal frame 3 by motion controller, adjust normal direction and the angle of incident light normal direction and the dimensional orientation of pyroelectricity detector 10 of copper dish 19, scale on portal frame 3 bogie side frames can help adjust vertical automatic universal stage 9 height, being adjusted to pyroelectricity detector 10 receiving ports during test is 150mm apart from the distance of copper disk center, thereby pyroelectricity detector 10 receives the light signal that copper dish 19 scatters, and data fetch device 7 is equivalent to a lock-in amplifier, and it obtains output voltage and the frequency of pyroelectricity detector 10;
The utility model is by the copper dish 19 to two kinds of different roughness, and the mean value of its surfaceness is respectively: thin copper dish R
Z1=15.2 μ m, blister copper dish R
Z2=28.6 μ m, the output voltage values of copper dish when different incidence angles degree and different scattering angle of two kinds of different roughness of detection, comparative analysis Terahertz target scattering characteristics.
Test result and analysis:
Utilize the utility model proving installation respectively above-mentioned two kinds of copper dish vertical incidence, oblique incidences to be experimentized, because scattered signal almost decayed into 0 after scattering angle reached 50 degree, therefore test specification is selected in from 0～55 degree, automatic rotary optical platform 2 is set at every turn drives pyroelectricity detector 10 rotation 5 degree automatically, and duplicate measurements twice, get twice mean value as test data.Can block the BOW outgoing beam owing to being placed on the detector of scattering angle β less than the positions of 5 degree, therefore measure since 10 degree.
Table 1 has provided vertical incidence, thin copper dish scattering data when namely incident angle is, and Fig. 4 has then provided corresponding scattering curve.
The scattering data table of thin copper dish during table 1 vertical incidence
The scattering data of blister copper dish when following table 2, table 3, table 4 are respectively 15 degree, 30 thin copper dish and 20 is spent when spending for incident angle.Fig. 5 is that the scattering data of table 2, table 3, table 4 synthesizes the scattering curve on a figure.
Table 2 incident angle is the scattering data table of the thin copper dish of 15 degree
Table 3 incident angle is the scattering data table of 30 thin copper dishes when spending
Table 4 incident angle is the scattering data table of 20 dishes of blister copper when spending
Being horizontal ordinate with scattering angle β, is matched curve such as Fig. 2 of ordinate with output voltage shown in the data fetch device (mv).
Conclusion:
Utilize the scatterometry of the utility model Terahertz target scattering characteristics proving installation and method of testing terahertz light to realize.Terahertz is similar to the envelope of metal plate pectination scattering curve to scattering properties and the microwave of textured metal target, and have infrared lambert's volume scattering curve and be cosine rule downward trend, show that electromagnetic scattering and lambert's volume scattering are simultaneous in the coarse target scattering of metal, but because the frequency in the BOW source that this test is selected for use is lower, Terahertz part with very close microwave edge just, and the wavelength of Terahertz wave source is much larger than the target roughness in the experiment, so the sign of the electromagnetic scattering of experimental result and microwave frequency band is more near some; The effect of the direct reflection of rough surface is very obvious when oblique incidence, and therefore the Rough Metal Surface at this this lambert's of being similar to body in wavelength field almost can be seen as the mirror body, but along with the roughness of target surface becomes big, reflection dies down, and scattering strengthens; Under the situation of vertical incidence, scattering curve descended comparatively fast when scattering angle was spent less than 40, surpass 40 degree scattering curves and become very slow, but near 50 degree little peak value of meeting appearance; Owing to target scattering has only about 150mm to the transmission range of detector, shorter relatively in this experiment, the influence that scattering meetings such as the optical table of close target and target support bring some to measurement, thus test result is brought deviation.
The above is preferred implementation of the present utility model; should be pointed out that for those skilled in the art, under the prerequisite that does not break away from the utility model principle; can also make some improvements and modifications, these improvements and modifications also are considered as protection domain of the present utility model ".
Claims (8)
1. Terahertz target scattering characteristics proving installation is characterized in that:
Comprise optical bench (1), automatic rotary optical platform (2), portal frame (3), motion controller (4), Terahertz wave source (5), lens (6) and data fetch device (7) are set on the described optical bench (1);
Described portal frame (3) is across described automatic rotary optical platform (2), the slide rail (8) of level is set on the described portal frame (3), described slide rail (8) is gone up and is connected a vertical automatic universal stage (9), on the described vertical automatic universal stage (9) measured object is set;
Detector (10) is set on the described automatic rotary optical platform (2), described lens (6) are arranged on described Terahertz wave source (5) exit portal, described vertical automatic universal stage (9) can be regulated direction, described detector (10) is arranged on the direction that described vertical automatic universal stage (9) scattered light penetrates, and described detector (10) is electrically connected with described data fetch device (7).
2. Terahertz target scattering characteristics proving installation according to claim 1 is characterized in that:
Described Terahertz wave source (5) is the carcinotron oscillator source, and described detector (10) is the pyroelectricity detector, institute
Stating lens (6) is the teflon lens.
3. Terahertz target scattering characteristics proving installation according to claim 1 is characterized in that:
Described motion controller (4) comprises CPU, LCD (12) and operation keyboard (13).
4. Terahertz target scattering characteristics proving installation according to claim 1 is characterized in that:
The side frames of described portal frame (3) is provided with size scale.
5. Terahertz target scattering characteristics proving installation according to claim 1 is characterized in that:
Described automatic rotary optical platform (2) is driven by the segmentation stepper motor, and its precision reaches 0.005 r, and rotating speed is 20 r/S.
6. Terahertz target scattering characteristics proving installation according to claim 1 is characterized in that:
Described vertical automatic universal stage (9) is connected with described slide rail (8) by a governor motion (15), and adopts the turbine and worm mechanism driving, and described governor motion (15) bottom connects vertical automatic universal stage (9).
7. Terahertz target scattering characteristics proving installation according to claim 1 is characterized in that:
Described automatic rotary optical platform (2) is provided with the screw (17) for the fixed optics parts.
8. Terahertz target scattering characteristics proving installation according to claim 1 is characterized in that:
Between described Terahertz wave source (5) and the described lens (6) chopper (18) is set.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320061081 CN203204148U (en) | 2013-01-30 | 2013-01-30 | Test apparatus for target scattering characteristic of terahertz |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320061081 CN203204148U (en) | 2013-01-30 | 2013-01-30 | Test apparatus for target scattering characteristic of terahertz |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203204148U true CN203204148U (en) | 2013-09-18 |
Family
ID=49148244
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201320061081 Expired - Fee Related CN203204148U (en) | 2013-01-30 | 2013-01-30 | Test apparatus for target scattering characteristic of terahertz |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203204148U (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103792520A (en) * | 2013-01-30 | 2014-05-14 | 杨洋 | Terahertz target scattering characteristic test equipment and test method thereof |
| CN105572076A (en) * | 2016-01-13 | 2016-05-11 | 南京邮电大学 | Terahertz spectrum measuring device based on scattering effect and measuring method thereof |
| CN106501793A (en) * | 2016-10-26 | 2017-03-15 | 上海无线电设备研究所 | Calibration flat board calibration body and the apparatus and method of thz beam angle |
| CN106570251A (en) * | 2016-10-26 | 2017-04-19 | 上海无线电设备研究所 | Electromagnetic scattering modeling method of radar target at THz wave band |
| CN109520939A (en) * | 2019-01-03 | 2019-03-26 | 华域视觉科技(上海)有限公司 | A kind of material testing apparatus |
-
2013
- 2013-01-30 CN CN 201320061081 patent/CN203204148U/en not_active Expired - Fee Related
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103792520A (en) * | 2013-01-30 | 2014-05-14 | 杨洋 | Terahertz target scattering characteristic test equipment and test method thereof |
| CN103792520B (en) * | 2013-01-30 | 2017-05-17 | 承德石油高等专科学校 | Terahertz target scattering characteristic test equipment and test method thereof |
| CN105572076A (en) * | 2016-01-13 | 2016-05-11 | 南京邮电大学 | Terahertz spectrum measuring device based on scattering effect and measuring method thereof |
| CN105572076B (en) * | 2016-01-13 | 2018-11-30 | 南京邮电大学 | THz wave spectrometry device and its measurement method based on scattering effect |
| CN106501793A (en) * | 2016-10-26 | 2017-03-15 | 上海无线电设备研究所 | Calibration flat board calibration body and the apparatus and method of thz beam angle |
| CN106570251A (en) * | 2016-10-26 | 2017-04-19 | 上海无线电设备研究所 | Electromagnetic scattering modeling method of radar target at THz wave band |
| CN106501793B (en) * | 2016-10-26 | 2019-03-08 | 上海无线电设备研究所 | The device and method for calibrating plate calibration body and thz beam angle |
| CN109520939A (en) * | 2019-01-03 | 2019-03-26 | 华域视觉科技(上海)有限公司 | A kind of material testing apparatus |
| CN109520939B (en) * | 2019-01-03 | 2024-05-24 | 华域视觉科技(上海)有限公司 | Material detection device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN203204148U (en) | Test apparatus for target scattering characteristic of terahertz | |
| CN102323240B (en) | Indoor full-automatic BRDF (bidirectional reflectance distribution function) measurement device | |
| CN101051022B (en) | Elliptical bias detector | |
| CN103884490B (en) | The method and apparatus measuring refraction of biprism rate based on optical lever | |
| CN1928533B (en) | Outdoor high optical spectrum BRDF automatic detection method | |
| CN109342329A (en) | BRDF Auto-Test System and test method | |
| CN103543162B (en) | A kind of surface imperfection of semiconductor sheet material and thickness detecting method and device | |
| CN105259144A (en) | Large-dynamic-range omnibearing sample BRDF (bidirectional reflectance distribution function) measuring device | |
| CN108535550B (en) | Terahertz substance dielectric constant measuring system based on Brewster angle measurement | |
| CN109490253B (en) | Novel test of two-way reflection distribution function of simulation natural light device | |
| CN203572632U (en) | Device for measuring optical parameters of dielectric film | |
| CN101929889A (en) | Semiconductor laser remote field testing method and device | |
| CN2819212Y (en) | Fast elliptical polarized light measuring equipment | |
| CN104677827A (en) | Deducting device and deducting method for visible near-infrared diffuse reflection base signal and based on portable optical fiber spectrometer | |
| CN111751328A (en) | Method for rapidly measuring high-light-reflection space target material | |
| CN104034697A (en) | Test device and method for influence of roughness of manufacturing surface on laser measurement performance | |
| CN102645404B (en) | Be applicable to liquid sample stand and the method thereof of terahertz time-domain spectroscopy measurement | |
| CN103792520A (en) | Terahertz target scattering characteristic test equipment and test method thereof | |
| CN104634759A (en) | High-frequency terahertz scattering testing device, high-frequency terahertz scattering testing method and high-frequency terahertz scattering analysis method | |
| CN205038160U (en) | Surface plasma resonance absorption detector | |
| CN202255626U (en) | Optical-radiation security measurement system | |
| CN114034658B (en) | Device and method for detecting sandstone degree of dolomite | |
| CN104792699A (en) | Multifunctional sample stand applicable to terahertz time-domain spectrum detection system | |
| CN204241372U (en) | Based on the infrared glass refractive index photodetector system measuring drift angle and incident angle | |
| CN209101997U (en) | A kind of measuring device for palm production |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130918 Termination date: 20140130 |