CN203196914U - Cleaning block and spot measurement device - Google Patents
Cleaning block and spot measurement device Download PDFInfo
- Publication number
- CN203196914U CN203196914U CN 201320020604 CN201320020604U CN203196914U CN 203196914 U CN203196914 U CN 203196914U CN 201320020604 CN201320020604 CN 201320020604 CN 201320020604 U CN201320020604 U CN 201320020604U CN 203196914 U CN203196914 U CN 203196914U
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- probe
- cleaning block
- cleaning
- measurement device
- spot measurement
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Abstract
The utility model discloses a cleaning block and a spot measurement device. The spot measurement device comprises a detecting mobile platform, at least one probe seat, a cleaning platform and the cleaning block. The detecting mobile platform is used for bearing an object to be detected. The probe seat is arranged on a bearing platform and comprises at least one probe. The cleaning block is arranged on the cleaning platform. The thickness of the cleaning block is about 3mm-6mm, so that the probe can be inserted into the cleaning block, and then the cleaning block can remove multiple attachments attached to the probe in a sticky mode.
Description
Technical field
The utility model relates to a kind of spot measurement device.
Background technology
The probe of general spot measurement device is in using after a period of time, and probe can attach some attachments because of long-term contact measured thing, and these attachments may influence the result of a survey.For example when surveying determinand electrical, put on electric current on the probe and can be attached thing and disturb; Or when the photosensitiveness of a survey determinand, the attachment on the probe may produce the ill effect of shading to the light that determinand sends.Therefore the necessary cleaned at regular intervals probe of operator takes place to avoid said circumstances.
Yet the cleaning foil of selling on the market, it is when cleaning, and the operator reaches the purpose of removing attachment with the friction probe tip.But the needle point after the friction may have the possibility of wearing and tearing, and the probe after cleaning thus just can't be used in some once again and extremely require the complete point of probe to survey in the check.On the other hand, cleaning foil only can clean probe tip, and attachment that can't comprehensive removing probe pin side is the place of its inconvenience.
The utility model content
One side of the present utility model is used for removing the accompanying a plurality of attachments of at least one probe for a kind of cleaning block is provided.Cleaning block comprises one can remove the main body of attachment accompanying on the insertion probe wherein to be stained with sticking mode.The thickness of main body is about 3mm～6mm.
In one or more embodiment, the shore hardness of main body is about 0A～20A.
In one or more embodiment, cleaning block has a surface, and this surface coats the part needle point of probe when using this cleaning block cleaning probe.
In one or more embodiment, the degree of depth of the part needle point that the surface coats is about 1mm～4mm.
Of the present utility model on the other hand for a kind of spot measurement device is provided, comprise detect mobile platform, at least one probe base, cleaning platform and can be to be stained with the cleaning block that sticking mode is removed attachment accompanying on the insertion probe wherein.Detect mobile platform in order to carry a determinand.Probe base is arranged on the carrying platform, and probe base comprises at least one probe.Cleaning block places on the cleaning platform.The thickness of cleaning block is about 3mm～6mm.
In one or more embodiment, the shore hardness of cleaning block is about 0A～20A.
In one or more embodiment, when spot measurement device is in cleaning mode, detects mobile platform and can carry out displacement synchronously with the cleaning platform.
In one or more embodiment, cleaning block has a surface, and this surface coats the part needle point of probe when using this cleaning block cleaning probe.
In one or more embodiment, the degree of depth of the part needle point that the surface coats is about 1mm～4mm.
In one or more embodiment, spot measurement device also comprises the receipts electro-optical device.Receiving electro-optical device can be integrating sphere, microscope, solar panels or charge coupled cell.
Description of drawings
Fig. 1 illustrates according to the cleaning block of the utility model one embodiment and the schematic diagram of probe;
Fig. 2 illustrates the side schematic view of cleaning block when the cleaning probe of Fig. 1;
Fig. 3 illustrates the schematic diagram of spot measurement device under cleaning mode of the utility model one embodiment;
Fig. 4 illustrates the schematic diagram of spot measurement device under detecting pattern of the utility model one embodiment.
[main element symbol description]
100: cleaning block 110: main body
120: surface 410: probe
412: attachment 300: detect mobile platform
310: determinand 400: probe base
500: cleaning platform 700: receive electro-optical device
800: carrying platform 810: surveyed area
H1: thickness H2: the degree of depth
The specific embodiment
Below will disclose a plurality of embodiment of the present utility model with accompanying drawing, as clearly stated, the details on many practices will be explained in the following description.Yet, should be appreciated that the details on these practices does not use to limit the utility model.That is to say that in the utility model part embodiment, the details on these practices is inessential.In addition, for the purpose of simplifying accompanying drawing, some known habitual structures and element will illustrate in the mode of simple signal in the accompanying drawings.
Fig. 1 illustrates according to the cleaning block 100 of the utility model one embodiment and the schematic diagram of probe 410.As shown in Figure 1, cleaning block 100 is used for removing the accompanying a plurality of attachments 412 of at least one probe 410.Cleaning block 100 comprises main body 110.The thickness H1 of main body 110 is about 3mm～6mm, makes probe 410 can insert main body 110, and and then allows main body 110 remove the accompanying attachment 412 of probe 410 to be stained with sticking mode.
Above-mentioned probe 410 mainly is used in the spot measurement device, and the contact measured thing is to measure the electrical or photosensitiveness of determinand.Yet the result of more than 410 contact measured thing of probe may make some materials on the determinand attach to probe 410, and becomes the attachment 412 on the probe 410.These attachments 412 can make probe 410 increase different changes because of, thereby influence spot measurement device measured come out electrically or photosensitiveness, so probe 410 needs cleaning often, to guarantee the reliability of probe 410 measurements.Yet general commercially available cleaning foil is merely able to remove the attachment 412 that is positioned at probe 410 tip portion more, can't remove the attachment 412 that is positioned at probe 410 pin sides, therefore the effect of influence cleaning greatly.In view of this, the thickness H1 of the cleaning block 100 of present embodiment reaches about 3mm～6mm, makes probe 410 fully to insert in the cleaning block 100.Thus, cleaning block 100 is not merely able to clean the attachment 412 of probe 410 tip portion, can further remove probe 410 near the attachment 412 of the part pin side of needle point yet, therefore has cleaning effect preferably compared with commercially available cleaning foil.On the other hand, commercially available cleaning foil removes attachment 412 in the mode of friction needle point mostly, and in friction, probe 410 is more impaired.Comparatively speaking, the cleaning block 100 of present embodiment is to be stained with the attachment 412 that sticking mode is removed probe 410, so probe 410 is not easy because cleaning causes damage, and can significantly prolong its service life.
Specifically, please refer to Fig. 2, it illustrates the side schematic view of cleaning block 100 when cleaning probe 410 of Fig. 1.Cleaning block 100 has a surface 120.When using cleaning block 100 cleaning probes 410, probe 410 inserts in the cleaning block 100, make surface 120 can coat the part needle point of probe 410, the attachment 412 on the probe 410 so the piece 100 that can be cleaned are stained with sticking and are left probe 410, to reach the effect of cleaning.
Wherein, the depth H 2 of the part needle point that above-mentioned surface 120 coats is about 1mm～4mm, so cleaning block 100 can coat the zone that probe 410 more easily attaches attachment 412 as far as possible.Yet above-mentioned depth H 2 only is illustration, and in fact the depth H 2 of the surface 120 part needle points that coat can change along with the region of the attachment 412 on probe 410 kinds or the probe 410, and the utility model is not as limit.
When probe 410 inserts cleaning blocks 100, probe 410 is may be because of the material of cleaning block 100 different have fracture may, and probe 410 more gos deep into cleaning block 100, the probability of fracture is just more big.Therefore can suitably select the shore hardness of the main body 110 of cleaning block 100, make cleaning block 100 when cleaning probe 410, can offset probe 410 as far as possible and insert the strength that cleaning block 100 bears.In one or more embodiment, the shore hardness of the main body 110 of cleaning block 100 may be selected to be about 0A～20A.Should be appreciated that, more than the value of the shore hardness lifted only be illustration, be not in order to limiting the utility model, to have in the technical field under the utility model and know the knowledgeable usually, should look actual needs, elasticity is selected the shore hardness of main body 110.
In one or more embodiment, the material of cleaning block 100 may be selected to be flexible glue, as thermoplastic elastomer (ThermoPlastic Rubber; TPR), to meet the requirement of above-mentioned shore hardness.Thermoplastic elastomer is nontoxic flexible glue, and it has plasticity and is stained with viscosity, can coat probe 410 needle points and remove its attachment 412 when clear pin.Add thermoplastic elastomer and do not have back the problem of being stained with, therefore after clear pin finishes, can't influence probe 410 character originally.On the other hand, thermoplastic elastomer can directly be pasted on the cleaning platform, has advantage easy for installation.Yet the utility model is not limited with this kind material.
Therefore, above-mentioned cleaning block 100 can be applicable on the spot measurement device of at least one probe 410 of tool.It should be noted that in the following description, the details of the cleaning block of carrying at above-mentioned embodiment 100 will repeat no more, only be described in detail with regard to variation place of following embodiment.
Fig. 3 illustrates the schematic diagram of spot measurement device under cleaning mode of the utility model one embodiment.Spot measurement device comprises cleaning block 100, detection mobile platform 300, probe base 400, probe 410, cleaning platform 500 and carrying platform 800.Detect mobile platform 300 in order to carry a determinand 310, probe base 400 is arranged on the carrying platform 800, comprises a probe 410 at least, and cleaning block 100 places on the cleaning platform 500.The thickness H1 (as shown in Figure 1) of cleaning block 100 is about 3mm～6mm, makes probe 410 can insert cleaning block 100, and and then allows cleaning block 100 remove the accompanying attachment 412 (as shown in Figure 1) of probe 410 to be stained with sticking mode.Specifically, please be simultaneously with reference to Fig. 3 and Fig. 4.Fig. 4 illustrates the schematic diagram of spot measurement device under detecting pattern of the utility model one embodiment.Please earlier with reference to Fig. 4, when practical operation is in detecting pattern when spot measurement device, detects mobile platform 300 and will move up into surveyed area 810, afterwards, detect mobile platform 300 and move up and down, so can make 310 pairs of probes 410 of determinand relatively move to carry out a survey.Then please refer to Fig. 3, when spot measurement device is in cleaning mode, detect mobile platform 300 and will shift out surveyed area 810, and cleaning platform 500 is with shift-in surveyed area 810, and cleaning platform 500 will move up and down, so can make 100 pairs of probes 410 of cleaning block relatively move to carry out cleaning action, cleaning action namely is to make probe 410 can insert cleaning block 100, and and then allow cleaning block 100 remove the accompanying a plurality of attachments 412 of probe 410 to be stained with sticking mode.What specify is, when spot measurement device is in cleaning mode, detect mobile platform 300 and can carry out displacement synchronously with cleaning platform 500, can make synchronously that cleaning platform 500 shift-in surveyed areas 810 are preferable when namely detecting mobile platform 300 and shifting out surveyed area 810.Certainly also can carry out displacement stage by stage, can make detection mobile platform 300 shift out surveyed area 810 earlier, afterwards, make again and clean platform 500 shift-in surveyed areas 810, be decided by actual demand.Detecting mobile platform 300 can make and detect the function that mobile platform 300 itself and cleaning platform 500 carry out level, move up and down.
Thus; because cleaning platform 500 namely is positioned at a side that detects mobile platform 300, so probe 410 need not allow spot measurement device shut down after measuring the determinand 310 that detects on the mobile platform 300; can carry out pin program clearly at same spot measurement device, can significantly reduce step and the time of clear pin.On the other hand, therefore the cleaning block 100 of present embodiment directly places on the cleaning platform 500 and can fix because itself has viscosity, does not need extra installation steps.It should be noted that in addition though in institute's drawings attached that this narration is arranged in pairs or groups, the shape of probe 410 is all looper, this does not limit the utility model.Have in the technical field under the utility model and know the knowledgeable usually, should look actual needs, elasticity is selected the shape of probe 410.
The quantity of above-mentioned probe 410 can be a plurality of, and for example 4, so that in spot measurement device, handle multiplex's program.The cleaning block 100 of present embodiment has certain thickness H1 (as shown in Figure 1) because of it, can be convenient to once clean many probes 410.Specifically, because probe 410 needs to insert the purpose that cleaning block 100 reaches cleaning, so the thickness H1 of cleaning block 100 is relevant with probe 410 quantity that can clean simultaneously.Yet the depth H 2 (as shown in Figure 2) of inserting cleaning block 100 because of probe 410 is limited, for example depth H 2 is about 1mm～4mm in the present embodiment, if cleaning block 100 is blocked up, there is no essence for clear pin effect and help, and therefore cleaning block 100 may can't puts into spot measurement device.Therefore in one or more embodiment, the thickness H1 of cleaning block 100 can select about 3mm～6mm, in order to clean many probes 410 more simultaneously.
Then please refer to Fig. 4.When spot measurement device was in detecting pattern, probe 410 can be used to measure the electrical or photosensitiveness of determinand 310.Under the pattern of electrical detection, determinand 310 for example can be a crystal grain.At least two probes 410 can be distinguished contact measured thing 310 earlier, and then spot measurement device provides a measuring current to determinand 310 from a probe 410 wherein, to measure the voltage difference between two probes 410.Therefore if wherein have attachment 412 (as shown in Figure 1) on arbitrary probe 410, because attachment 412 itself also can have a resistance value, the measured voltage difference that comes out is just no longer accurate.What is more, if use commercially available cleaning foil to remove the attachment 412 of probe 410 in the mode of friction, then therefore the surface area of probe 410 also may change, and makes the resistance value of probe 410 also change.And the cleaning block 100 of the utility model one embodiment can avoid said circumstances to take place because of to be stained with the clear pin of sticking mode.
Please continue with reference to Fig. 4.In one or more embodiment, spot measurement device also can be used to measure the photosensitiveness of determinand 310, and namely determinand 310 can be a light-emitting component.Spot measurement device can also comprise receives electro-optical device 700.Receipts electro-optical device 700 places the top of light-emitting component, in order to detect the light that light-emitting component sends.Specifically, when spot measurement device under the pattern that photosensitiveness detects, probe 410 in order to provide a voltage to light-emitting component, makes light-emitting component luminous receiving between electro-optical device 700 and the light-emitting component.Therefore must guarantee that probe 410 can not influence the receipts light of receiving electro-optical device 700, namely probe 410 light that light-emitting component can not sent covers.Yet if probe 410 is stained with and has been glued attachment 412 (as shown in Figure 1), especially be built-up in the attachment 412 of probe 410 pin sides, the attachment 412 of this part is easier to cover the light that light-emitting component sends.And clean probes 410 with the cleaning block 100 of present embodiment, not only can be easy to remove the attachment 412 in probe 410 pin sides, and do not have foreign matter and return the problem of being stained with, therefore for the probe 410 that is used in the photosensitiveness measurement, using cleaning block 100 cleanings is to select preferably.In addition, relevant with its receipts electrical distance (in this embodiment, being light-emitting component and the distance of receiving between the electro-optical device 700) because of the receipts luminous intensity of receiving electro-optical device 700, therefore measure under the operation at photosensitiveness, receive electrical distance and must keep identical, be beneficial to the unified compensation of the luminous intensity of follow-up data.Thus, the height of probe 410 when photosensitiveness is measured must be kept identical (for example being 3mm in the present embodiment), i.e. the not allowable wear of needle point of probe 410, and use cleaning block 100 can avoid said circumstances to take place.
In one or more embodiment, above-mentioned receipts electro-optical device 700 can be integrating sphere, microscope, solar panels or electricity symbol coupling element (Charge-Coupled Device; CCD) or above-mentioned any combination.On the other hand, light-emitting component can be light emitting diode, and the utility model is not as limit.
Next the effect of cleaning block on reality is used of the utility model one embodiment will be described with experimental data.Experiment 1 is stained with situation for inspecting returning of cleaning block, namely inspects the probe with the cleaning block cleaning, whether can attach the foreign matter of cleaning block on its needle body.Experimentation is as follows: at first use brand-new probe with survey one crystal grain.Wherein the diameter of needle point is 6.5 μ m, and the thickness of cleaning block is 6mm, and the degree of depth of probe insertion cleaning block is 1.5mm～2mm.Namely make once clear pin after surveying 120 times finishing, and each clear pin all inserts probe cleaning block 5 times, this is defined as one time.This experiment 1 repeats altogether 10 times, to inspect the effect of using cleaning block cleaning probe.Table one is behind each clear pin, surveys each voltage data of 3 times with cleaning probe points later, and its measuring current is 20mA.
Table one: the point with the probe of cleaning block cleaning is surveyed data
By the data of table one as can be known, after each clear pin, electrically still roughly keeping of probe is identical, so the deducibility probe does not have back the situation generation of being stained with.Further, after through 10 times some survey and clear pin, probe is still kept its electrical reliability, even i.e. expression uses cleaning block to clean probe 10 times, cleaning block still is unlikely the damage probe, so deducibility uses cleaning block can make probe that arranged long service life.
Though the utility model discloses as above with embodiment; so it is not in order to limit the utility model; anyly be familiar with this skill person; in not breaking away from spirit and scope of the present utility model; when can being used for a variety of modifications and variations, therefore protection domain of the present utility model is as the criterion when looking the scope that appending claims defines.
Claims (9)
1. a cleaning block is characterized in that, is used for removing the accompanying a plurality of attachments of at least one probe, and this cleaning block comprises:
One can remove the main body of described attachment accompanying on insertion this probe wherein to be stained with sticking mode, and the thickness of this main body is 3mm ~ 6mm.
2. cleaning block according to claim 1 is characterized in that, the shore hardness of this main body is 0A～20A.
3. cleaning block according to claim 1 is characterized in that, this cleaning block has a surface, and this surface coats a part of needle point of this probe when using this cleaning block to clean this probe.
4. cleaning block according to claim 3 is characterized in that, the degree of depth of this part needle point that this surface coats is 1mm～4mm.
5. a spot measurement device is characterized in that, comprises:
One detects mobile platform, in order to carry a determinand;
At least one probe base is arranged on the carrying platform, comprises at least one probe;
One cleaning platform; And
One can place on this cleaning platform to be stained with the cleaning block that sticking mode is removed described attachment accompanying on insertion this probe wherein, and the thickness of this cleaning block is 3mm～6mm.
6. spot measurement device according to claim 5 is characterized in that, the shore hardness of this cleaning block is 0A～20A.
7. spot measurement device according to claim 5 is characterized in that, this cleaning block has a surface, and this surface coats a part of needle point of this probe when using this cleaning block to clean this probe.
8. spot measurement device according to claim 7 is characterized in that, the degree of depth of this part needle point that this surface coats is 1mm～4mm.
9. spot measurement device according to claim 5 is characterized in that, also comprises one and receives electro-optical device, and this receipts electro-optical device is integrating sphere, microscope, solar panels or charge coupled cell.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320020604 CN203196914U (en) | 2013-01-15 | 2013-01-15 | Cleaning block and spot measurement device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320020604 CN203196914U (en) | 2013-01-15 | 2013-01-15 | Cleaning block and spot measurement device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203196914U true CN203196914U (en) | 2013-09-18 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201320020604 Expired - Fee Related CN203196914U (en) | 2013-01-15 | 2013-01-15 | Cleaning block and spot measurement device |
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| Country | Link |
|---|---|
| CN (1) | CN203196914U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104492760A (en) * | 2015-01-16 | 2015-04-08 | 长春理工大学 | Washing method for magnetic pollution of magnetic force microscope probe |
-
2013
- 2013-01-15 CN CN 201320020604 patent/CN203196914U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104492760A (en) * | 2015-01-16 | 2015-04-08 | 长春理工大学 | Washing method for magnetic pollution of magnetic force microscope probe |
| CN104492760B (en) * | 2015-01-16 | 2016-08-17 | 长春理工大学 | A kind of cleaning method of magnetic microscope probe magnetic contaminant |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130918 Termination date: 20220115 |
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| CF01 | Termination of patent right due to non-payment of annual fee |