CN203191452U - Insertion loss testing device for pin type EMI filter - Google Patents
Insertion loss testing device for pin type EMI filter Download PDFInfo
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- CN203191452U CN203191452U CN 201320002945 CN201320002945U CN203191452U CN 203191452 U CN203191452 U CN 203191452U CN 201320002945 CN201320002945 CN 201320002945 CN 201320002945 U CN201320002945 U CN 201320002945U CN 203191452 U CN203191452 U CN 203191452U
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Abstract
The utility model relates to an insertion loss testing device, and especially relates to an insertion loss testing device for a pin type EMI filter; the device comprises a test pedestal for EMI filter insertion loss test; the test pedestal is provided with electrode contact pins connected with EMI filter pins; the test pedestal is also provided with a shielding box shielding signals of the electrode contact pins; the shielding box comprises a positioning plate and an upper cover plate arranged on the positioning plate; the positioning plate is provided with a first through hole for the EMI filter pins to penetrate and to be connected with the electrode contact pins; a sealing cavity containing the EMI filter is arranged between the positioning plate and the upper cover plate; and the first through hole and the sealing cavity can shield the signals of the EMI filter, can prevent coupling between the EMI filter pins and the electrode contact pins, and can prevent radiation conduction of head signals of the EMI filter, so the device can be applied in products like insertion loss testing devices.
Description
Technical field
The utility model relates to insertion loss test device, and particularly a kind of contact pin type electromagnetic interface filter inserts the loss test device.
Background technology
Power lead is to disturb the main path that imports equipment into and spread out of equipment, pass through power lead, the interference of electrical network can be imported equipment into, the operate as normal of jamming equipment, the interference that same equipment produces also may be passed on the electrical network by power lead, disturb the operate as normal of other equipment, therefore must add electromagnetic interface filter at the electric power incoming line place of equipment; The effect of electromagnetic interface filter is mainly reflected in following two aspects: 1, the high frequency interference in the inhibition AC network is to the influence of equipment; 2, suppression equipment is to the interference of AC network.
Any product has its specific performance properties index, or the client is desired, or some prescribed by standard.The most important technical indicator of electromagnetic interface filter is the inhibition ability to disturbing, usually use so-called insertion loss (Insertion Loss) to represent, its definition is: be transferred to the ratio of the power of load after being transferred to the power of load and inserting wave filter from interference source when not inserting wave filter from interference source, with decibel representing.
Existing test fixture can only be tested the filter insertion loss under the low frequency signal, under the high-frequency signal state, the situation of high-frequency signal radiation and reception in anchor clamps, make test result substantial deviation normal value, main cause is: 1, wave filter is contact pin type, the input and output pin of product is equivalent to emitting antenna and the receiving antenna of high-frequency signal, makes the high-frequency signal of test without wave filter, cause test error through wave filter pin emission transmission; 2, the electrode contact pin of testing base electromagnetic coupled can occur under high-frequency signal, causes test error.
The utility model content
At the prior art deficiency, the utility model proposes a kind of contact pin type electromagnetic interface filter and insert the loss test device, be intended to solve existing test fixture test filter under high-frequency signal and insert the loss existence than the problem of mistake.
The technical scheme that the utility model proposes is:
A kind of contact pin type electromagnetic interface filter inserts the loss test device, comprises that described test bench has the electrode contact pin that is connected with the electromagnetic interface filter pin for the test bench that inserts loss test for electromagnetic interface filter; On described test bench, also be provided with the shielding box of the signal of guarded electrode contact pin, described shielding box comprises location-plate and is arranged on upper cover plate on the described location-plate, described location-plate has the electromagnetic interface filter of confession pin and passes first through hole that is connected to described electrode contact pin, is provided be used to the closed cavity that holds electromagnetic interface filter between described location-plate and the described upper cover plate.
Further technical scheme can also be, described location-plate has second through hole that cooperates with described electrode contact pin, and the center of described second through hole and described first through hole is on same axis.
Further technical scheme can also be, described test bench is provided with the reference column for the described location-plate in location.
Further technical scheme can also be that described location-plate is close to the upper surface of described test bench.
Further technical scheme can also be, described closed cavity comprises and is arranged on the lower chamber that holds electromagnetic interface filter partly in the described location-plate, the upper cavity that matches with described lower chamber, described upper cavity is arranged in the described upper cover plate, and diapire is provided with the pressing plate with compression spring.
Further technical scheme can also be, a side of described location-plate is provided with side plate, and described side plate is hinged to the top ends of described upper cover plate.
Further technical scheme can also be, described upper cover plate is provided with hold down gag, and described hold down gag is colluded body, colluded the post that colludes that body cooperates and constitute with described by what can swing, describedly colludes the side that post is arranged on described test bench.
Further technical scheme can also be that described test bench is fixed on the substrate.
According to above-mentioned technical scheme, the utility model beneficial effect: the signal that shields the electromagnetic interface filter pin at described first through hole of described location-plate, described second through hole shields the signal of described electrode contact pin, form the signal of the head of described closed cavity shielding electromagnetic interface filter between described location-plate and the described upper cover plate, avoid being coupled between electromagnetic interface filter pin or the described electrode contact pin, the signal of the head of electromagnetic interface filter and described test bench or other carry out the radiation conduction, thereby under high-frequency signal, described test bench can test out electromagnetic interface filter exactly and insert loss value.
Owing to the utlity model has above-mentioned characteristics and advantage, can be applied in the products such as inserting the loss test device for this reason.
Description of drawings
Fig. 1 is the structural representation of using a kind of contact pin type electromagnetic interface filter insertion loss test device of technical solutions of the utility model;
Fig. 2 is the structural representation of using the described shielding box of technical solutions of the utility model;
Fig. 3 is the partial enlarged drawing at A place among Fig. 2;
Fig. 4 is the structural representation of using the described location-plate lower surface of technical solutions of the utility model.
Embodiment
In order to make the purpose of this utility model, technical scheme and advantage clearer, below in conjunction with drawings and Examples, the utility model is further elaborated.Should be appreciated that specific embodiment described herein only in order to explaining the utility model, and be not used in restriction the utility model.
The insertion loss test method of wave filter mainly is to test by network analyzer or spectrum analyzer, network analyzer one port output test signal, receive measured signal through another port behind the tested wave filter, calculate the insertion loss value of wave filter then, so require measured signal could guarantee the accuracy of test fully by wave filter.
According to the testing feature that inserts loss, must allow the high-frequency test signal integrity by tested electromagnetic interface filter, and can not be by electromagnetic interface filter pin or the coupling of electrode contact pin, can only shield or ground connection high-frequency signal, but test signal will can not ground connection be handled by electromagnetic interface filter, can only carry out shielding processing to wave filter and electrode contact pin, as Fig. 1, Fig. 2 and shown in Figure 3, the utility model proposes a kind of contact pin type electromagnetic interface filter and insert the loss test device, comprise that described test bench 1 has the electrode contact pin 11 that is connected with the electromagnetic interface filter pin for the test bench 1 that inserts loss test for electromagnetic interface filter; On described test bench 1, also be provided with the shielding box 2 of the signal of guarded electrode contact pin 11, described shielding box 2 comprises location-plate 21 and is arranged on upper cover plate 22 on the described location-plate 21, described location-plate 21 has the electromagnetic interface filter of confession pin and passes first through hole 3 that is connected to described electrode contact pin 11, is provided be used to the closed cavity 4 that holds electromagnetic interface filter between described location-plate 21 and the described upper cover plate 22.
Described location-plate 21 in the described shielding box 2 and described upper cover plate 22 all are to be made by metal material, described test bench 1 has four described electrode contact pins 11, four described electrode contact pins 11 comprise I/O, described location-plate 21 has can be to described first through hole 3 of electromagnetic interface filter leg signal shielding, avoid producing coupling phenomenon between the electromagnetic interface filter pin, if produce coupling phenomenon, the test high-frequency signal can not pass through electromagnetic interface filter fully, can not guarantee the accuracy of testing, form the head signal of described closed cavity 4 shielding electromagnetic interface filters between described location-plate 21 and the described upper cover plate 22, prevent that the head of electromagnetic interface filter and described test bench 1 or other from carrying out the radiation conduction, causes test errors.
Described shielding box 2 can shield the signal of described electrode contact pin 11, particularly, as shown in Figures 2 and 3, described location-plate 21 has second through hole 5 that cooperates with described electrode contact pin 11, and the center of described second through hole 5 and described first through hole 3 is on same axis.Described electrode contact pin 11 can insert described second through hole 5 fully, described second through hole 5 plays the described electrode contact pin 11 signal effects of shielding, prevent from producing between the described electrode contact pin 11 coupling, the center of described second through hole 5 and described first through hole 3 is on same axis, the diameter of described first through hole 3 is littler than described second through hole 5, guarantee that the electromagnetic interface filter pin is inserted into described second through hole 5 centers, accurate positioning along described first through hole 3.
As shown in Figure 1, described test bench 1 is provided with the reference column 6 for the described location-plate 21 in location.Described test bench 1 is provided with four described reference columns 6, described reference column 6 is the L shape, four described reference columns 6 are distributed in the junction between described test bench 1 side, be used for the described location-plate 21 in location, and described location-plate 21 can not be avoided damaging described electrode contact pin 11 or electromagnetic interface filter pin and can not be inserted into described electrode contact pin 11 accordingly to all around mobile.
As shown in Figure 1 and Figure 4, described location-plate 21 is close to the upper surface of described test bench 1.The lower surface of described location-plate 21 is close to the upper surface of described test bench 1, the upper surface of described test bench 1 has the part that is higher than it, as stem knob, as described in the lead etc. of electrode contact pin 11, the lower surface of described location-plate 21 is provided with and keeps away a groove accordingly, be close to the upper surface of described test bench 1 with the lower surface that guarantees described location-plate 21, thereby described location-plate 21 shields described electrode contact pin 11 signals effectively.
As shown in Figure 2, described closed cavity 4 comprises and is arranged on the lower chamber 41 that holds electromagnetic interface filter partly in the described location-plate 21, the upper cavity 42 that matches with described lower chamber 41, described upper cavity 42 is arranged in the described upper cover plate 22, and diapire is provided with the pressing plate 7 with compression spring.The area of described lower chamber 41 is more bigger than the head of electromagnetic interface filter, be convenient to electromagnetic interface filter and insert described lower chamber 41, and can locate electromagnetic interface filter, make the electromagnetic interface filter pin be connected to described electrode contact pin 11 by described first through hole 3, this structure is lacked than directly aiming at the described 11 required times of electrode contact pin with the electromagnetic interface filter pin, improves the electromagnetic interface filter testing efficiency; Described lower chamber 41 can hold partly electromagnetic interface filter, that is to say, the height of electromagnetic interface filter head is greater than the degree of depth of described lower chamber 41, and electromagnetic interface filter has part when inserting described lower chamber 41 fully electromagnetic interface filter exposes, and is convenient to artificial or mechanical arm takes out electromagnetic interface filter; The diapire of described upper cavity 42 is connected with the pressing plate 7 of band compression spring, electromagnetic interface filter inserts described lower chamber 41, when covering described upper cavity 42, described pressing plate 7 leans the upper surface of electromagnetic interface filter, under the effect of compression spring, described pressing plate 7 makes the lower surface of electromagnetic interface filter be close to the diapire of described lower chamber 41, guarantees that electromagnetic interface filter inserts in described first through hole 3 fully.
As shown in Figure 1, a side of described location-plate 21 is provided with side plate 8, and described side plate 8 is hinged to the top ends of described upper cover plate 22.One side of described location-plate 21 is stepped, described side plate 8 one ends are fixedly connected on the stepped side of described location-plate 21, the other end is hinged to the top ends with described upper cover plate 22, described upper cover plate 22 can move along the direction of hinged activity, can make described upper cavity 42 and described lower chamber 41 sealings or open fast, improve the testing efficiency of electromagnetic interface filter.
Described upper cover plate 22 is provided with hold down gag 9, and described hold down gag 9 is colluded body 91, colluded the post 92 that colludes that body 91 cooperates and constitute with described by what can swing, describedly colludes the side that post 92 is arranged on described test bench 1.Described body 91 1 ends that collude have circular hole and are passed on the side that circular hole is movably connected in described upper cover plate 22 by right cylinder, the other end is and colludes shape, the described body 91 that colludes radially wobbles with the described post 92 that colludes along right cylinder and is connected for this reason, the described side plate 8 of described upper cover plate 22 opposite sides also correspondingly is provided with the described post 92 that colludes, two described posts 92 that collude compress described upper cover plate 22 downwards evenly, described upper cover plate 22 and described location-plate 21 are fixed on the described test bench 1, and further impel the lower surface of described location-plate 21 to be close to the upper surface of described test bench 1.
Described test bench 1 is fixed on the substrate 12.Described substrate 12 can make test electromagnetic interface filter insertion loss be operated in plateau and carry out for described test bench 1 provides a stationary plane that work is required.
According to above-mentioned technical scheme, under the high frequency state, the insertion loss of proving installation itself can reach more than 55 decibels, require absolute value all to be greater than 40 decibels electromagnetic interface filter product applicable to the insertion loss in whole filtered band, because test 40 decibels electromagnetic interface filter, the insertion loss value of proving installation itself must guarantee the accuracy of test greater than 50 decibels of ability.
Below only be preferred embodiment of the present utility model, not in order to limiting the utility model, all any modifications of within spirit of the present utility model and principle, doing, be equal to and replace and improvement etc., all should be included within the protection domain of the present utility model.
Claims (8)
1. a contact pin type electromagnetic interface filter inserts the loss test device, comprises that described test bench has the electrode contact pin that is connected with the electromagnetic interface filter pin for the test bench that inserts loss test for electromagnetic interface filter; It is characterized in that, on described test bench, also be provided with the shielding box of the signal of guarded electrode contact pin, described shielding box comprises location-plate and is arranged on upper cover plate on the described location-plate, described location-plate has the electromagnetic interface filter of confession pin and passes first through hole that is connected to described electrode contact pin, is provided be used to the closed cavity that holds electromagnetic interface filter between described location-plate and the described upper cover plate.
2. a kind of contact pin type electromagnetic interface filter according to claim 1 inserts the loss test device, it is characterized in that described location-plate has second through hole that cooperates with described electrode contact pin, and the center of described second through hole and described first through hole is on same axis.
3. a kind of contact pin type electromagnetic interface filter according to claim 1 inserts the loss test device, it is characterized in that, described test bench is provided with the reference column for the described location-plate in location.
4. a kind of contact pin type electromagnetic interface filter according to claim 1 inserts the loss test device, it is characterized in that described location-plate is close to the upper surface of described test bench.
5. a kind of contact pin type electromagnetic interface filter according to claim 1 inserts the loss test device, it is characterized in that, described closed cavity comprises and is arranged on the lower chamber that holds electromagnetic interface filter partly in the described location-plate, the upper cavity that matches with described lower chamber, described upper cavity is arranged in the described upper cover plate, and diapire is provided with the pressing plate with compression spring.
6. a kind of contact pin type electromagnetic interface filter according to claim 1 inserts the loss test device, it is characterized in that a side of described location-plate is provided with side plate, and described side plate is hinged to the top ends of described upper cover plate.
7. a kind of contact pin type electromagnetic interface filter according to claim 1 inserts the loss test device, it is characterized in that, described upper cover plate is provided with hold down gag, described hold down gag is colluded body, is colluded the post that colludes that body cooperates and constitute with described by what can swing, describedly colludes the side that post is arranged on described test bench.
8. a kind of contact pin type electromagnetic interface filter according to claim 1 inserts the loss test device, it is characterized in that described test bench is fixed on the substrate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320002945 CN203191452U (en) | 2013-01-05 | 2013-01-05 | Insertion loss testing device for pin type EMI filter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320002945 CN203191452U (en) | 2013-01-05 | 2013-01-05 | Insertion loss testing device for pin type EMI filter |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203191452U true CN203191452U (en) | 2013-09-11 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201320002945 Expired - Lifetime CN203191452U (en) | 2013-01-05 | 2013-01-05 | Insertion loss testing device for pin type EMI filter |
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| CN (1) | CN203191452U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104991126A (en) * | 2015-07-08 | 2015-10-21 | 深圳振华富电子有限公司 | Test fixture of network transformer |
-
2013
- 2013-01-05 CN CN 201320002945 patent/CN203191452U/en not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104991126A (en) * | 2015-07-08 | 2015-10-21 | 深圳振华富电子有限公司 | Test fixture of network transformer |
| CN104991126B (en) * | 2015-07-08 | 2018-03-06 | 深圳振华富电子有限公司 | The measurement jig of network transformer |
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| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term |
Granted publication date: 20130911 |
|
| CX01 | Expiry of patent term |