CN203164325U - Testing apparatus for temperature characteristic of chip type thin-film resistor - Google Patents
Testing apparatus for temperature characteristic of chip type thin-film resistor Download PDFInfo
- Publication number
- CN203164325U CN203164325U CN 201320086297 CN201320086297U CN203164325U CN 203164325 U CN203164325 U CN 203164325U CN 201320086297 CN201320086297 CN 201320086297 CN 201320086297 U CN201320086297 U CN 201320086297U CN 203164325 U CN203164325 U CN 203164325U
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- constant temperature
- resistance
- resistor
- base plate
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Abstract
The utility model relates to a testing apparatus, more particularly to a testing apparatus for a temperature characteristic of a chip type thin-film resistor. The testing apparatus comprises a constant-temperature preheating platform and a resistor tester. The constant-temperature preheating platform includes a thermotank, a base plate fixed at the top of the thermotank, and a constant-temperature preheating plate arranged on the top surface of the base plate; and a circuit board, a heating system and a temperature control system are arranged in the thermotank. The resistor tester includes a testing instrument, an anode resistance testing pen and a cathode resistance testing pen; the anode resistance testing pen and the cathode resistance testing pen are respectively connected with a plug by leads; and the plug is plugged in a jack arranged on the testing instrument. When the testing apparatus is used to test a resistor temperature characteristic of a thin-film resistor product, the resistor temperature characteristic of the product can be tested to a certain extent without damage on the completeness of the chip type thin-film resistor product; and wasting of the substrate and other materials can be reduced and the resistor temperature characteristic batch qualified rate of the product is improved.
Description
Technical field
The utility model relates to a kind of proving installation, specifically, relates to a kind of chip sheet resistance temperature property test device.
Background technology
The chip sheet resistance need be after sputter and thermal treatment in manufacture process, the resistance-temperature characteristic of test products.
In the prior art, the method for test resistance temperature property test all must be split product and be single product, and is welded on the brassboard and carries out.Yet, if the chip sheet resistance product after sputter and the thermal treatment is adopted above-mentioned method of testing, because the product that is cleaved into after single can't carry out the later operation of sputter, also just becoming waste product, this is undoubtedly a kind of great waste.And if product carries out complete manufacturing process fully by the time, test its resistance-temperature characteristic again, can waste the more time again.In addition, adopt batch qualification rate of resistance-temperature characteristic of traditional method of testing test chip sheet resistance product very low, be about 25%.
The utility model content
The purpose of this utility model is, provides a kind of chip sheet resistance temperature property test device, to solve above-mentioned technical matters.
For addressing the above problem, the technical scheme that the utility model adopts is:
A kind of chip sheet resistance temperature property test device is characterized in that: comprise a constant temperature preheating platform and a resistance meter;
Described constant temperature preheating platform comprises that base plate and that a constant temperature oven, is fixed on the constant temperature oven top is arranged on the constant temperature preheating table on the plate top surface; The front end outer wall of described constant temperature oven is provided with guidance panel, and described guidance panel is provided with power switch, display screen, No. two display screens and operation push-button; The end of the power lead of drawing in the constant temperature oven is connected with attaching plug; Be provided with wiring board, heating system and temperature control system in the described constant temperature oven, the power switch on the described guidance panel, display screen, No. two display screens and operation push-button, and power lead, heating system and temperature control system all are electrically connected with wiring board;
Described resistance meter comprises a test instrumentation, positive electrode resistance test pen and negative pole resistance test pen, and described positive electrode resistance test pen is connected with plug by lead respectively with negative pole resistance test pen, and plug is plugged in the jack on the test instrumentation.
Say that further position corresponding with four angles of described base plate on the end face of described constant temperature oven fixedly has joint pin respectively, four angles of described base plate are fixed on the joint pin by screw respectively.
Beneficial effect: compared with prior art, adopt the utility model that chip sheet resistance product is carried out the resistance-temperature characteristic test, can either not destroy the integrality of chip sheet resistance product, can test the resistance-temperature characteristic of product to a certain extent again, resistance-temperature characteristic as fruit product meets the demands, then can carry out the operation of back until becoming finished product, do not satisfy related request if monitor the resistance-temperature characteristic of product after sputter and the thermal treatment, then can improve sputtering condition and heat-treat condition, satisfy the requirement of resistance-temperature characteristic energy until this batch product, and then carry out subsequent handling until becoming finished product.So, just reduced the waste of substrate and other materials to a great extent, also monitored the influence of each operation to the product resistance-temperature characteristic to a certain extent, the resistance-temperature characteristic of product batch qualification rate can reach more than 90%.
Description of drawings
Fig. 1 is the structural representation of constant temperature preheating platform described in the utility model;
Fig. 2 is the structural representation of resistance meter described in the utility model.
Embodiment
The utility model is described in further detail below in conjunction with the drawings and specific embodiments.
Chip sheet resistance temperature property test device described in the utility model comprises a constant temperature preheating platform and a resistance meter.
With reference to Fig. 1, described constant temperature preheating platform comprises that base plate 16 and that a constant temperature oven 1, is fixed on constant temperature oven 1 top is arranged on the constant temperature preheating table 15 on base plate 16 end faces.Position corresponding with four angles of described base plate 16 on the end face of described constant temperature oven 1 fixedly has joint pin 11 respectively, and four angles of described base plate 16 are fixed on the joint pin 11 by screw 12 respectively.The front end outer wall of described constant temperature oven 1 is provided with guidance panel 10, described guidance panel 10 is provided with power switch 13, display screen 17, No. two display screens 14 and operation push-button 18, No. one display screen 17 is used for the display setting temperature, and No. two display screen 14 is used for showing actual temperature.The end of the power lead 19 of drawing in the constant temperature oven 1 is connected with attaching plug.Be provided with wiring board, heating system and temperature control system in the described constant temperature oven 1.Power switch 13 on the described guidance panel 10, display screen 17, No. two display screens 14 and operation push-button 18, and power lead 19, heating system and temperature control system all are electrically connected with wiring board.
Described resistance meter comprises a test instrumentation 2, positive electrode resistance test pen 22 and negative pole resistance test pen 23, described positive electrode resistance test pen 22 is connected with plug 21 by lead respectively with negative pole resistance test pen 23, and plug 21 is plugged in the jack on the test instrumentation 2.
Principle of work of the present utility model is summarized as follows:
1, attaching plug is plugged in the supply socket, by power switch 13 opening power, target setting temperature (140～150 ℃);
2, heat by 1 pair of constant temperature preheating table 15 of constant temperature oven, make the surface temperature of constant temperature preheating table 15 reach 120 ~ 130 ℃, then chip sheet resistance to be measured is placed on the constant temperature preheating table 15;
3, the two end electrodes of the abundant contact measured chip sheet resistance of nib difference of the positive electrode resistance test pen 22 of usefulness resistance meter and negative pole resistance test pen 23; Display on the test instrumentation 2 will demonstrate the resistance value of chip sheet resistance to be measured, treat that reading is stable after, record this resistance value, be the resistance of resistor;
4, utilize the resistance-temperature characteristic computing formula to calculate the resistance-temperature characteristic value, thereby realize the resistance-temperature characteristic test of product.
Claims (2)
1. a chip sheet resistance temperature property test device is characterized in that: comprise a constant temperature preheating platform and a resistance meter;
Described constant temperature preheating platform comprises that base plate (16) and that a constant temperature oven (1), is fixed on constant temperature oven (1) top is arranged on the constant temperature preheating table (15) on base plate (16) end face; The front end outer wall of described constant temperature oven (1) is provided with guidance panel (10), and described guidance panel (10) is provided with power switch (13), a display screen (17), No. two display screens (14) and operation push-button (18); The end of the power lead (19) of drawing in the constant temperature oven (1) is connected with attaching plug; Described constant temperature oven is provided with wiring board, heating system and temperature control system in (1), power switch (13) on the described guidance panel (10), a display screen (17), No. two display screens (14) and operation push-button (18), and power lead (19), heating system and temperature control system all are electrically connected with wiring board;
Described resistance meter comprises a test instrumentation (2), positive electrode resistance test pen (22) and negative pole resistance test pen (23), described positive electrode resistance test pen (22) is connected with plug (21) by lead respectively with negative pole resistance test pen (23), and plug (21) is plugged in the jack on the test instrumentation (2).
2. chip sheet resistance temperature property test device according to claim 1, it is characterized in that: position corresponding with four angles of described base plate (16) on the end face of described constant temperature oven (1) fixedly has joint pin (11) respectively, and four angles of described base plate (16) are fixed on the joint pin (11) by screw (12) respectively.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320086297 CN203164325U (en) | 2013-02-02 | 2013-02-02 | Testing apparatus for temperature characteristic of chip type thin-film resistor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320086297 CN203164325U (en) | 2013-02-02 | 2013-02-02 | Testing apparatus for temperature characteristic of chip type thin-film resistor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203164325U true CN203164325U (en) | 2013-08-28 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201320086297 Expired - Fee Related CN203164325U (en) | 2013-02-02 | 2013-02-02 | Testing apparatus for temperature characteristic of chip type thin-film resistor |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203164325U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109872852A (en) * | 2017-12-02 | 2019-06-11 | 中国振华集团云科电子有限公司 | A method of improving thick-film resistor TCR qualification rate |
-
2013
- 2013-02-02 CN CN 201320086297 patent/CN203164325U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109872852A (en) * | 2017-12-02 | 2019-06-11 | 中国振华集团云科电子有限公司 | A method of improving thick-film resistor TCR qualification rate |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130828 Termination date: 20200202 |