CN203069510U - Sample gas chamber device of gas analyzer facilitating light path adjustment - Google Patents
Sample gas chamber device of gas analyzer facilitating light path adjustment Download PDFInfo
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- CN203069510U CN203069510U CN 201220708033 CN201220708033U CN203069510U CN 203069510 U CN203069510 U CN 203069510U CN 201220708033 CN201220708033 CN 201220708033 CN 201220708033 U CN201220708033 U CN 201220708033U CN 203069510 U CN203069510 U CN 203069510U
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Abstract
The utility model provides a sample gas chamber device of a gas analyzer facilitating light path adjustment. The sample gas chamber device comprises a sample gas chamber pipe, a near-end spherical reflector and a far-end spherical reflector which are arranged inside the sample gas chamber pipe, as well as an adjusting device which is connected with the inner wall of the sample gas chamber pipe in a sealed manner and is used for adjusting a distance between the far-end spherical reflector and the near-end spherical reflector, wherein the far-end spherical reflector or the near-end spherical reflector is connected with the adjusting device. During detection, the distance between the far-end spherical reflector and the near-end spherical reflector is changed by adjusting the adjusting device arranged on the inner wall of the sample gas chamber pipe, so as to meet a detection demand. By the adjusting device, the distance between the far-end spherical reflector and the near-end spherical reflector which are arranged on the adjusting device is correspondingly changed, so that a process of frequently adjusting the far-end spherical reflector is avoided, and the labor intensity of an operator is effectively reduced.
Description
Technical field
The utility model relates to the gas analysis technology field, particularly a kind of gas analyzer sample gas cell device of being convenient to the light path adjustment.
Background technology
In the colliery, industries such as petrochemical complex, metallurgy and environmental protection, along with people are more and more higher to the requirement that gas detects, measuring technique and equipment more and more are subject to people's attention.In the last few years, optical measuring technique particularly tunable laser absorption spectrum technology had obtained swift and violent development, successful Application in numerous industries.
Because the content of tested gas is lower usually, is generally ppm(Part per million, parts per million (ppm)) rank.For guaranteeing higher measuring accuracy, at present, the normal employing of tunable laser absorption spectrum technology is repeatedly reflected the sample air chamber and is improved the measurement light path, and then improves the measuring accuracy of laser gas analyzer.Wherein, the modal sample air chamber that repeatedly reflects is that the Herriott type repeatedly reflects the sample air chamber.The Herriott type repeatedly reflects the sample air chamber to be made up of two spherical reflectors, laser is by the perforate on the near-end spherical reflector, inject the sample air chamber with specific angle, get to then on the far-end spherical reflector, laser beam is passed through the reflection of specific times in two spherical reflectors after, tapping by the near-end spherical reflector penetrates again, thereby finishes detection.Owing to through repeatedly reflection, increased the measurement light path of laser gas analyzer greatly, thereby improved the measuring accuracy of laser gas analyzer.
Repeatedly reflect the sample air chamber for the Herriott type, most important parameter is the distance between near-end spherical reflector and the far-end spherical reflector, and usually the difference of 1mm just may cause very big influence to light path.This has just proposed very strict requirement to machining precision and the installation requirement of physical construction, thereby has increased the processing cost of laser gas analyzer and laborer's labour intensity greatly.In addition, the temperature that many industry spot require to measure is than higher, and for example the escaping of ammonia requires the temperature of sample air chamber to reach 180 ℃ even higher.In this case, reached optimum condition even repeatedly reflect the light path adjusting of sample air chamber at ambient temperature, but when it is placed into 180 ℃ or higher temperature, factor also may cause very big influence to the sample air chamber light path of repeatedly reflection owing to expand with heat and contract with cold etc., has to air chamber is carried out the light path of repeated multiple times for this reason and regulates.
Adjusting to light path, namely the distance between far-end spherical reflector and the near-end spherical reflector is regulated, at present, regulate the process of light path: the operator fixes the position of far-end sphere transmitting mirror, and then according to actual conditions, with the position of far-end spherical reflector carry out away from or close adjusting, then fixing.Therefore, repeatedly the light path of Fan She sample air chamber is regulated also more complicated, needs the process that the far-end spherical reflector is fixed and discharged repeatedly, and required time is also very long, has wasted the labour greatly, has improved operator's labour intensity.
Therefore, how providing a kind of gas analyzer sample gas cell device that light path is adjusted of being convenient to, to reduce operator's labour intensity, is the present technical issues that need to address of those skilled in the art.
The utility model content
The purpose of this utility model provides a kind of gas analyzer sample gas cell device that light path is adjusted of being convenient to, to reduce operator's labour intensity.
For solving the problems of the technologies described above, the utility model provides following technical scheme:
A kind ofly be convenient to the gas analyzer sample gas cell device that light path is adjusted, comprise sample air chamber pipe, be arranged on near-end spherical reflector and the far-end spherical reflector of described sample air chamber pipe inside, it also comprises:
Link to each other with the inner wall sealing of described sample air chamber pipe, be used for regulating the regulating device of distance between described far-end spherical reflector and the described near-end spherical reflector, described far-end spherical reflector or described near-end spherical reflector link to each other with described regulating device.
Preferably, in the above-mentioned device, described regulating device is slide block, and described slide block links to each other by screw thread with the inwall of described sample air chamber pipe.
Preferably, in the above-mentioned device, described slide block is cylindrical block.
Preferably, in the above-mentioned device, also comprise the seal between the inwall that is arranged on described regulating device and described sample air chamber pipe.
Preferably, in the above-mentioned device, described regulating device is provided with screw thread away from an end of described far-end spherical reflector or described near-end spherical reflector, and the other end is provided with the seal pickup groove.
Preferably, in the above-mentioned device, described seal is sealing gasket or O-ring seal.
From above-mentioned technical scheme as can be seen, the utility model provides a kind of gas analyzer sample gas cell device that light path is adjusted of being convenient to, comprise sample air chamber pipe, be arranged on near-end spherical reflector and the far-end spherical reflector of sample air chamber pipe inside, this device also comprises: link to each other with the inner wall sealing of sample air chamber pipe, be used for to regulate the regulating device of distance between far-end spherical reflector and the near-end spherical reflector, and far-end spherical reflector or near-end spherical reflector link to each other with regulating device.When detecting, can be arranged on regulating device on the inwall of sample air chamber pipe by adjusting, make the distance between far-end sphere scintilloscope and the near-end spherical reflector that corresponding the variation be taken place, to adapt to the detection needs.This device passes through to regulate regulating device, thereby makes the distance between far-end spherical reflector and the near-end spherical reflector that corresponding variation take place, and has avoided the process of repeatedly regulating to the far-end spherical reflector, effectively reduces operator's labour intensity.
Description of drawings
The cut-open view of being convenient to the gas analyzer sample gas cell device that light path adjusts that Fig. 1 provides for the utility model embodiment;
The structural representation of being convenient to the gas analyzer sample gas cell device that light path adjusts that Fig. 2 provides for the utility model embodiment.
Embodiment
The utility model core provides a kind of gas analyzer sample gas cell device that light path is adjusted of being convenient to, to reduce operator's labour intensity.
In order to make those skilled in the art person understand the utility model scheme better, the utility model is described in further detail below in conjunction with drawings and embodiments.
Please refer to Fig. 1-shown in Figure 2, the utility model discloses a kind of gas analyzer sample gas cell device that light path is adjusted of being convenient to, comprise sample air chamber pipe 2, be arranged on near-end spherical reflector 1 and the far-end spherical reflector 3 of sample air chamber pipe 2 inside, this device also comprises: link to each other with the inner wall sealing of sample air chamber pipe 2, be used for to regulate the regulating device 4 of distance between far-end spherical reflector 3 and the near-end spherical reflector 1, and far-end spherical reflector 3 or near-end spherical reflector 1 link to each other with regulating device 4.
When detecting, can be arranged on regulating device 4 on the inwall of sample air chamber pipe 2 by adjusting, make the distance between far-end sphere scintilloscope 3 and the near-end spherical reflector 1 that corresponding the variation be taken place, to adapt to the detection needs.This device passes through to regulate regulating device 4, thereby makes the distance between far-end spherical reflector 3 and the near-end spherical reflector 1 that corresponding variation take place, and has avoided the process of repeatedly regulating to far-end spherical reflector 3, effectively reduces operator's labour intensity.
In the specific embodiment, regulating device 4 is set to slide block, and slide block links to each other by screw thread with the inwall of sample air chamber pipe 2.In the present embodiment by being threaded.When regulating, can pass through rotation adjustment device 4, its inwall along sample air chamber pipe 2 is slided, thereby finish the adjusting to distance between far-end spherical reflector 3 and the near-end spherical reflector 1.It will be understood by those skilled in the art that, in actual production, different regulating device 4 can also be set according to different needs, as long as can realize sliding along the inwall of sample air chamber pipe 2, thereby realize the adjusting of distance between far-end spherical reflector 3 and the near-end spherical reflector 1 is got final product.For example: the inwall at sample air chamber pipe 2 arranges slideway, correspondingly, in regulating device 4 pulley that cooperates with slideway is set and gets final product.
In the preferred embodiment, slide block is set to cylindrical block.Be set to the structure of fitting with the inwall of sample air chamber pipe 2 by slide block, to guarantee slide block in the process of sliding, avoid taking place the problem that sample gas is revealed.
In order further to guarantee when regulating regulating device 4, to prevent the leakage of sample gas, also comprise the seal 5 between the inwall that is arranged on regulating device 4 and sample air chamber pipe 2 in the present embodiment, to guarantee the laser gas analyzer operate as normal.
On the basis of technique scheme, for the ease of the installation of seal 5, in the present embodiment regulating device 4 is provided with screw thread away from an end of far-end spherical reflector 3, the other end is provided with the seal pickup groove.When mounted, at first seal 5 is installed in the seal pickup groove, to realize fixing to seal 5, by threaded engagement regulating device 4 is installed on the inwall of sample air chamber pipe 2 then.
Preferably, seal 5 is sealing gasket or O-ring seal.It will be appreciated by persons skilled in the art that to be not limited to above-mentioned hermetically-sealed construction that other structures of sealing that can realize sample air chamber pipe 2 and regulating device 4 are also in the present embodiment protection domain.
Use that present embodiment provides be convenient to regulate the repeatedly reflection sample air chamber of light path the time, can adopt visible light as light source, the light beam that optical emitting end 7 sends is injected the perforation of going into of near-end spherical reflector 1 with specific angle, by the adjusting of regulating device 4 realizations to the distance between far-end spherical reflector 3 and the near-end spherical reflector 1, the operator is by observing the facula position on near-end spherical reflector 1 and the far-end spherical reflector 3, quantity and distributed intelligence, far-end spherical reflector 3 is adjusted to the best position that is, finally, light beam reaches optics receiving end 6 from the perforation ejaculation sample air chamber of going into of near-end spherical reflector 1.Visible light source is replaced with the LASER Light Source of specific wavelength, and observe the power that detector receives signal, fine setting regulating device 4 transfers to maximum with detector signal, and the position of far-end spherical reflector 3 is locked, and finishes the room temperature of light path and regulates.
For the repeatedly reflection sample air chamber that needs at high temperature use, at room temperature light path is adjusted into optimum condition after, the sample air chamber is carried out high temperature heating, such as being heated to 180 ℃ or higher, observe the measurement light intensity of detector, because the factor of expanding with heat and contract with cold, light intensity can descend to some extent.When temperature reaches stationary value, fine setting regulating device 4, namely the spacing between far-end spherical reflector 3 and the near-end spherical reflector 1 so that detector signal transfers to maximum, repeatedly reflects the light path adjusting of sample air chamber under the condition of high temperature thereby finish.
By said process as can be known, present embodiment provides be convenient to regulate light path repeatedly reflect the accurate adjusting that the sample air chamber has been realized far-end spherical reflector 3, simplified the adjustment process of light path, even the layman also can carry out adjusting and the operation of light path according to instructions, greatly reduced the maintenance cost of analyser.
Each embodiment adopts the mode of going forward one by one to describe in this instructions, and what each embodiment stressed is and the difference of other embodiment that identical similar part is mutually referring to getting final product between each embodiment.
To the above-mentioned explanation of the disclosed embodiments, make this area professional and technical personnel can realize or use the utility model.Multiple modification to these embodiment will be apparent concerning those skilled in the art, and defined General Principle can realize under the situation that does not break away from spirit or scope of the present utility model in other embodiments herein.Therefore, the utility model will can not be restricted to these embodiment shown in this article, but will meet the wideest scope consistent with principle disclosed herein and features of novelty.
Claims (6)
1. be convenient to the gas analyzer sample gas cell device that light path is adjusted for one kind, comprise sample air chamber pipe, be arranged on near-end spherical reflector and the far-end spherical reflector of described sample air chamber pipe inside, it is characterized in that, also comprise:
Link to each other with the inner wall sealing of described sample air chamber pipe, be used for regulating the regulating device of distance between described far-end spherical reflector and the described near-end spherical reflector, described far-end spherical reflector or near-end spherical reflector link to each other with described regulating device.
2. device according to claim 1 is characterized in that, described regulating device is slide block, and described slide block links to each other by screw thread with the inwall of described sample air chamber pipe.
3. device according to claim 2 is characterized in that, described slide block is cylindrical block.
4. device according to claim 3 is characterized in that, also comprises the seal between the inwall that is arranged on described regulating device and described sample air chamber pipe.
5. device according to claim 4 is characterized in that, described regulating device is provided with screw thread away from an end of described far-end spherical reflector or described near-end spherical reflector, and the other end is provided with the seal pickup groove.
6. device according to claim 4 is characterized in that, described seal is sealing gasket or O-ring seal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220708033 CN203069510U (en) | 2012-12-19 | 2012-12-19 | Sample gas chamber device of gas analyzer facilitating light path adjustment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220708033 CN203069510U (en) | 2012-12-19 | 2012-12-19 | Sample gas chamber device of gas analyzer facilitating light path adjustment |
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| Publication Number | Publication Date |
|---|---|
| CN203069510U true CN203069510U (en) | 2013-07-17 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201220708033 Expired - Fee Related CN203069510U (en) | 2012-12-19 | 2012-12-19 | Sample gas chamber device of gas analyzer facilitating light path adjustment |
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| CN (1) | CN203069510U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103884677A (en) * | 2012-12-19 | 2014-06-25 | 北京大方科技有限责任公司 | Gas analyzer sample gas chamber apparatus with characteristic of easy optical path adjustment |
-
2012
- 2012-12-19 CN CN 201220708033 patent/CN203069510U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103884677A (en) * | 2012-12-19 | 2014-06-25 | 北京大方科技有限责任公司 | Gas analyzer sample gas chamber apparatus with characteristic of easy optical path adjustment |
| CN103884677B (en) * | 2012-12-19 | 2017-05-03 | 北京大方科技有限责任公司 | Gas analyzer sample gas chamber apparatus with characteristic of easy optical path adjustment |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130717 Termination date: 20181219 |
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| CF01 | Termination of patent right due to non-payment of annual fee |