CN203054018U - Spring seat for conducting test probe with test machine - Google Patents
Spring seat for conducting test probe with test machine Download PDFInfo
- Publication number
- CN203054018U CN203054018U CN 201220730286 CN201220730286U CN203054018U CN 203054018 U CN203054018 U CN 203054018U CN 201220730286 CN201220730286 CN 201220730286 CN 201220730286 U CN201220730286 U CN 201220730286U CN 203054018 U CN203054018 U CN 203054018U
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- China
- Prior art keywords
- spring
- springs
- spring seat
- seat
- bullet
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- Expired - Fee Related
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Abstract
The utility model discloses a spring seat for conducting a test probe with a test machine. The spring seat comprises an upper spring seat, a middle spring seat, a lower spring seat and multiple springs, wherein each spring is integrally composed of an upper portion spring, a projection portion spring and a lower portion spring; the upper spring seat is provided with multiple upper spring seat spring holes matching the upper portion springs; the middle spring seat is provided with multiple middle spring seat spring holes matching the projection portion springs; and the lower spring seat is provided with multiple lower spring seat spring holes matching the lower portion springs. The projection portion springs enable the spring seat to be not easy to fall off when the spring seat is planted into an engine base, and the springs are able to maintain upright so that electric conduction is stable; since the upper ends of the springs are kept in a state of no extrusion, elastic force gram numbers of the springs are controlled to be within a required scope.
Description
Technical field
The utility model relates to a kind of spring base for test probe and test machine conducting, belongs to the parts of probe test tool.
Background technology
The detection tool of existing high-end pcb (printed circuit board (PCB)) BGA, TF, mobile phone board, flat computer is all by external control, and domesticly can only make low-end product and can't industrial upgrading.At present, be used for the spring parts of test probe and test machine conducting, the direct source of welding current line of tail end, but because the available circuit printed line is passed by in fine, therefore can't be suitable for; And spring inside diameter is too tiny, also can't weld.
The utility model content
It is a kind of simple in structure that the purpose of this utility model is to provide, the spring base of being convenient to install that is used for test probe and test machine conducting.
For achieving the above object, the utility model has adopted following technical scheme:
A kind of spring base for test probe and test machine conducting, it comprises upper spring seat, the spring abutment of being hit by a bullet, lower spring cup and complex root spring, described spring is made of upper springs, lug boss spring and lower springs one, described upper spring seat is provided with a plurality of upper spring seat spring eyes that cooperate with described upper springs, the described spring abutment of being hit by a bullet is provided with a plurality of spring abutment spring eyes of being hit by a bullet that cooperate with described lug boss spring, and described lower spring cup is provided with a plurality of lower spring cup spring eyes that cooperate with described lower springs; Described upper spring seat spring eye, described spring abutment spring eye and the described lower spring cup spring of being hit by a bullet are corresponding one by one.
Preferably, the described spring abutment spring eye length of being hit by a bullet equals lug boss spring length, and the described spring abutment spring eye internal diameter of being hit by a bullet equals lug boss spring external diameter.
Preferably, described upper spring seat spring eye length equals upper springs length, and described upper spring seat spring eye internal diameter equals the upper springs external diameter.
Preferably, described lower spring cup spring eye length equals lower springs length, and described lower spring cup spring eye internal diameter equals the lower springs external diameter.
When spring base is installed, the complex root spring is placed the lower spring cup spring eye, be inserted in be hit by a bullet spring abutment and upper spring seat then successively; Upper springs is inserted fine probe with contact circuit printed line terminal point, and lower springs contacts the back with the electrode tip holder extruding and forms electrically conducting.
Compared with prior art, the beneficial effects of the utility model are: the lug boss spring of setting is difficult for dropping in the time of can making spring base implant in the support, and it is just vertical that spring keeps, and makes electrically conducting firm; Because the upper end remains on no squeezed state, the elastic force grams of spring can be controlled in the claimed range.
Description of drawings
Fig. 1 is the longitdinal cross-section diagram that is used for the spring base of test probe and test machine conducting in the utility model one preferred embodiment;
Fig. 2 is the structural representation of Fig. 1 embodiment medi-spring.
Embodiment
Consult Fig. 1-2, the spring base that should be used for test probe and test machine conducting comprise upper spring seat 1, the spring abutment 2 of being hit by a bullet, lower spring cup 3 and complex root spring 4; Spring 4 is made of upper springs 41, lug boss spring 42 and lower springs 43 one, upper spring seat 1 is provided with a plurality of upper spring seat spring eyes that cooperate with upper springs 41, the spring abutment 2 of being hit by a bullet is provided with a plurality of spring abutment spring eyes of being hit by a bullet that cooperate with lug boss spring 42, lower spring cup 3 is provided with a plurality of lower spring cup spring eyes that cooperate with lower springs 43, and upper spring seat spring eye, be hit by a bullet spring abutment spring eye and lower spring cup spring are corresponding one by one.
Wherein, the spring abutment spring eye length of being hit by a bullet equals lug boss spring 42 length, and the spring abutment spring eye internal diameter of being hit by a bullet equals lug boss spring 42 external diameters; Upper spring seat spring eye length equals upper springs 41 length, and upper spring seat spring eye internal diameter equals upper springs 41 external diameters; Lower spring cup spring eye length equals lower springs 43 length, and lower spring cup spring eye internal diameter equals lower springs 43 external diameters.
When spring base is installed, complex root spring 4 is placed the lower spring cup spring eye, be inserted in be hit by a bullet spring abutment 2 and upper spring seat 1 then successively; Upper springs 41 is inserted fine probe with contact circuit printed line terminal point, and lower springs 43 contacts the back with the electrode tip holder extruding and forms electrically conducting.
Below only be concrete exemplary applications of the present utility model, protection domain of the present utility model is not constituted any limitation.All employing equivalents or equivalence are replaced and the technical scheme of formation, all drop within the utility model rights protection scope.
Claims (4)
1. spring base that is used for test probe and test machine conducting, it is characterized in that, it comprises upper spring seat, the spring abutment of being hit by a bullet, lower spring cup and complex root spring, described spring is made of upper springs, lug boss spring and lower springs one, described upper spring seat is provided with a plurality of upper spring seat spring eyes that cooperate with described upper springs, the described spring abutment of being hit by a bullet is provided with a plurality of spring abutment spring eyes of being hit by a bullet that cooperate with described lug boss spring, and described lower spring cup is provided with a plurality of lower spring cup spring eyes that cooperate with described lower springs; Described upper spring seat spring eye, described spring abutment spring eye and the described lower spring cup spring of being hit by a bullet are corresponding one by one.
2. the spring base for test probe and test machine conducting according to claim 1 is characterized in that, the described spring abutment spring eye length of being hit by a bullet equals lug boss spring length, and the described spring abutment spring eye internal diameter of being hit by a bullet equals lug boss spring external diameter.
3. the spring base for test probe and test machine conducting according to claim 1 is characterized in that, described upper spring seat spring eye length equals upper springs length, and described upper spring seat spring eye internal diameter equals the upper springs external diameter.
4. the spring base for test probe and test machine conducting according to claim 1 is characterized in that, described lower spring cup spring eye length equals lower springs length, and described lower spring cup spring eye internal diameter equals the lower springs external diameter.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220730286 CN203054018U (en) | 2012-12-27 | 2012-12-27 | Spring seat for conducting test probe with test machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220730286 CN203054018U (en) | 2012-12-27 | 2012-12-27 | Spring seat for conducting test probe with test machine |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203054018U true CN203054018U (en) | 2013-07-10 |
Family
ID=48736958
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201220730286 Expired - Fee Related CN203054018U (en) | 2012-12-27 | 2012-12-27 | Spring seat for conducting test probe with test machine |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203054018U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108845165A (en) * | 2018-04-28 | 2018-11-20 | 德淮半导体有限公司 | Probe structure and its application method |
-
2012
- 2012-12-27 CN CN 201220730286 patent/CN203054018U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108845165A (en) * | 2018-04-28 | 2018-11-20 | 德淮半导体有限公司 | Probe structure and its application method |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130710 Termination date: 20131227 |