CN203012122U - Overall performance testing system for clock chip used for electric energy meter - Google Patents
Overall performance testing system for clock chip used for electric energy meter Download PDFInfo
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- CN203012122U CN203012122U CN 201220600681 CN201220600681U CN203012122U CN 203012122 U CN203012122 U CN 203012122U CN 201220600681 CN201220600681 CN 201220600681 CN 201220600681 U CN201220600681 U CN 201220600681U CN 203012122 U CN203012122 U CN 203012122U
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- 238000012360 testing method Methods 0.000 title claims abstract description 115
- 239000013078 crystal Substances 0.000 claims abstract description 14
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- 230000010354 integration Effects 0.000 claims description 10
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- 238000013461 design Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
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Abstract
The utility model provides an overall performance testing system for a clock chip used for an electric energy meter, comprising a test module, a time-of-day error tester and a temperature test box. The clock chip arranged in the test module outputs second pulse signals, the test module inputs the second pulse signals to the time-of-day error tester, and temperature of the temperature test box is adjusted so that the test module and the time-of-day error tester test crystal oscillation output frequency deviations and time-of-day errors in different temperatures. The overall performance testing system can test the clock chip as well as the whole electric energy meter employing the clock chip; the clock chip is installed via a chip testing seat, thereby avoiding chip welding in testing, and improving test efficiency and reducing test cost; the testing system is expandable, wherein different chips can be tested by connecting the chips with an external test board; and the clock chip can be reliably evaluated, thereby predicting service life of the clock chip.
Description
Technical field
The utility model belongs to be controlled and technical field of measurement and test, is specifically related to a kind of electric energy meter with clock chip full performance test system.
Background technology
With universal, the accuracy of clock is not only having important effect aspect block meter rate, time-shared charge, provide important evidence for the analysis of intelligent electric energy meter operating condition, dsm simultaneously along with the popularization of intelligent electric energy meter.The timing error of intelligent electric energy meter needs just can come into operation after tested.Clock chip is as the foundation of intelligent electric energy meter timing, and its quality has determined the accuracy of intelligent electric energy meter complete machine timing, only has through the qualified clock chip of full Performance Detection just to can be applicable in intelligent electric energy meter.
Clock chip essence is to carry out the then cumulative date Hour Minute Second equal time information that obtains of frequency division by the concussion frequency that crystal oscillator is produced, and sends into processor by the computer communication mouth and process.Along with intelligent electric energy meter is more and more higher to the requirement of clock chip, the actual condition that need to use in electric energy meter according to clock chip, formulate the full method for testing performance of clock chip, comprise basic parameter test, environmental parameter test, to check its process design method.Timing error for intelligent electric energy meter only detects its error of time of day at present, does not take special checkout equipment and detection method for clock chip, causes occurring in practical application at the scene the timing error of intelligent electric energy meter.Therefore be necessary to provide a kind of electric energy meter with the full performance detecting system of clock chip and method thereof, guarantee the reliability of clock chip, for the electric energy meter timing precision provides safeguard.
The utility model content
In order to overcome above-mentioned the deficiencies in the prior art, the utility model provides a kind of electric energy meter with clock chip full performance test system, can test clock chip, can test the electric energy meter complete machine that adopts this clock chip simultaneously, adopt the chip test base form clock chip of packing into, avoid the chips welding in test, improved testing efficiency and testing cost; Can complete basic performance tests, chip reliability test, the electric energy meter timing fail-test of clock chip, pilot project is comprehensive, and is simple to operate; Have extendability, can test for the external corresponding test board of different chips; Can assess the clock chip reliability, realize the biometrics of clock chip.
To achieve these goals, the utility model is taked following scheme:
Provide a kind of electric energy meter with clock chip full performance test system, described system comprises test module, error of time of day tester and temperature test chamber; Be placed in the clock chip output pps pulse per second signal of test module, described test module is inputted the error of time of day tester with pps pulse per second signal, by regulating the temperature of temperature test chamber, crystal oscillation output frequency deviation and error of time of day under test module and error of time of day tester test different temperatures; Described temperature test chamber comprises temperature control panel.
Described test module comprises chip test base, chip crystal oscillation frequency lead-out terminal, current detecting unit, chip power-consumption test output terminal, frequency meter, electric energy meter integration module, chip periphery circuit and adjustable direct voltage source.
Described clock chip is placed in described chip test base, and chip crystal oscillation frequency lead-out terminal rate of connections meter, current detecting unit connect chip power consumption test lead-out terminal, and adjustable direct voltage source is described chip periphery circuit and the power supply of electric energy meter integration module.
Described current detecting unit comprises digital microampere meter, and described electric energy meter integration module comprises testing base and electric energy meter.
Described system carries out output frequency test, chip power-consumption test, error of time of day test, temperature frequency difference test, the test of temperature error of time of day and temperature power consumption test to clock chip.
Compared with prior art, the beneficial effects of the utility model are:
(1) the utility model can be tested clock chip, can test the electric energy meter complete machine that adopts this clock chip simultaneously;
(2) adopt the chip test base form clock chip of packing into, avoided the chips welding in test, improve testing efficiency and testing cost;
(3) can complete basic performance tests, chip reliability test, the electric energy meter timing fail-test of clock chip, pilot project is comprehensive, and is simple to operate;
(4) adopt modular design, adopt different test modules for different test requests, and have extendability, can test for the external corresponding test board of different chips;
(5) can assess the clock chip reliability, realize the biometrics of clock chip.
Description of drawings
Fig. 1 is the structural representation that in the utility model embodiment, electric energy meter is used clock chip full performance test system;
Wherein, 1-chip crystal oscillation frequency lead-out terminal, 2-current detecting unit, 3-chip test base, 4-chip power-consumption test output terminal, 5-chip periphery circuit, 6-frequency meter, 7-temperature control panel, 8-electric energy meter integration module, the 9-adjustable direct voltage source, 10-error of time of day tester, 11-temperature test chamber.
Embodiment
Below in conjunction with accompanying drawing, the utility model is described in further detail.
Provide a kind of electric energy meter with clock chip full performance test system, described system comprises test module, error of time of day tester and temperature test chamber 11; Be placed in the clock chip output pps pulse per second signal of test module, described test module is inputted error of time of day tester 10 with pps pulse per second signal, by regulating the temperature of temperature test chamber 11, crystal oscillation output frequency deviation and error of time of day under test module and error of time of day tester 10 test different temperatures; Described temperature test chamber 11 comprises temperature control panel 7, observation window, temperature sensor, fan blower, well heater, temperature regulator.
Described test module comprises chip test base 3, chip crystal oscillation frequency lead-out terminal 1, current detecting unit 2, chip power-consumption test output terminal 4, frequency meter 6, electric energy meter integration module 8, chip periphery circuit 5 and adjustable direct voltage source 9.
Described clock chip is placed in described chip test base 3, chip crystal oscillation frequency lead-out terminal 1 rate of connections meter 6, current detecting unit 2 connects chip power consumption test lead-out terminal 4, and adjustable direct voltage source 9 is described chip periphery circuit 5 and 8 power supplies of electric energy meter integration module.
Described current detecting unit 2 comprises digital microampere meter, and described electric energy meter integration module 8 comprises testing base and electric energy meter.
Described system carries out output frequency test, chip power-consumption test, error of time of day test, temperature frequency difference test, the test of temperature error of time of day and temperature power consumption test to clock chip.
Described output frequency test is: clock chip is applied the typical case recommend circuit, its output pin is accessed frequency meter 6 by probe, test its crystal oscillation frequency;
The test of described chip power-consumption is: clock chip is packed in chip test base 3, with in digital microampere meter series connection incoming clock chip operation loop, the electric energy meter complete machine is selected different working condition measurement clock chip power consumptions;
The test of described error of time of day is: clock chip packed in chip test base 3, and in electric energy meter pulse per second (PPS) output access error of time of day tester 10, test electric energy meter complete machine error of time of day;
The temperature frequency difference test is: the crystal oscillation frequency of chip pin output under different temperatures;
The temperature error of time of day is: electric energy meter complete machine error of time of day when under different temperatures, clock chip is applied in electric energy meter;
The temperature power consumption test is: power consumption test when under different temperatures, clock chip is applied in electric energy meter different operating mode.
Should be noted that at last: above embodiment is only in order to illustrate that the technical solution of the utility model is not intended to limit, although with reference to above-described embodiment, the utility model is had been described in detail, those of ordinary skill in the field are to be understood that: still can modify or be equal to replacement embodiment of the present utility model, and do not break away from any modification of the utility model spirit and scope or be equal to replacement, it all should be encompassed in the middle of claim scope of the present utility model.
Claims (5)
1. an electric energy meter is with clock chip full performance test system, and it is characterized in that: described system comprises test module, error of time of day tester and temperature test chamber; Be placed in the clock chip output pps pulse per second signal of test module, described test module is inputted the error of time of day tester with pps pulse per second signal, by regulating the temperature of temperature test chamber, crystal oscillation output frequency deviation and error of time of day under test module and error of time of day tester test different temperatures; Described temperature test chamber comprises temperature control panel.
2. electric energy meter according to claim 1 is with clock chip full performance test system, and it is characterized in that: described test module comprises chip test base, chip crystal oscillation frequency lead-out terminal, current detecting unit, chip power-consumption test output terminal, frequency meter, electric energy meter integration module, chip periphery circuit and adjustable direct voltage source.
3. electric energy meter according to claim 2 is with clock chip full performance test system, it is characterized in that: described clock chip is placed in described chip test base, chip crystal oscillation frequency lead-out terminal rate of connections meter, current detecting unit connects chip power consumption test lead-out terminal, and adjustable direct voltage source is described chip periphery circuit and the power supply of electric energy meter integration module.
4. electric energy meter according to claim 2 is with clock chip full performance test system, and it is characterized in that: described current detecting unit comprises digital microampere meter, and described electric energy meter integration module comprises testing base and electric energy meter.
5. electric energy meter according to claim 1 is with clock chip full performance test system, and it is characterized in that: described system carries out output frequency test, chip power-consumption test, error of time of day test, temperature frequency difference test, the test of temperature error of time of day and temperature power consumption test to clock chip.
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CN 201220600681 CN203012122U (en) | 2012-11-14 | 2012-11-14 | Overall performance testing system for clock chip used for electric energy meter |
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CN 201220600681 CN203012122U (en) | 2012-11-14 | 2012-11-14 | Overall performance testing system for clock chip used for electric energy meter |
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CN203012122U true CN203012122U (en) | 2013-06-19 |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110837073A (en) * | 2019-10-21 | 2020-02-25 | 浙江恒业电子有限公司 | Intelligent ammeter clock error adjustment test system and method |
CN113138362A (en) * | 2021-05-11 | 2021-07-20 | 深圳市先行电气技术有限公司 | Calibration method for automatically compensating electric energy metering error of electric energy meter |
-
2012
- 2012-11-14 CN CN 201220600681 patent/CN203012122U/en not_active Expired - Lifetime
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110837073A (en) * | 2019-10-21 | 2020-02-25 | 浙江恒业电子有限公司 | Intelligent ammeter clock error adjustment test system and method |
CN113138362A (en) * | 2021-05-11 | 2021-07-20 | 深圳市先行电气技术有限公司 | Calibration method for automatically compensating electric energy metering error of electric energy meter |
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Granted publication date: 20130619 |
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CX01 | Expiry of patent term |