CN202975189U - Laser light emitting component aging test system - Google Patents

Laser light emitting component aging test system Download PDF

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Publication number
CN202975189U
CN202975189U CN 201220624015 CN201220624015U CN202975189U CN 202975189 U CN202975189 U CN 202975189U CN 201220624015 CN201220624015 CN 201220624015 CN 201220624015 U CN201220624015 U CN 201220624015U CN 202975189 U CN202975189 U CN 202975189U
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CN
China
Prior art keywords
component aging
light emitting
laser light
test system
emitting component
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN 201220624015
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Chinese (zh)
Inventor
黄秋元
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
WUHAN PRECISE ELECTRONIC TECHNOLOGY Co Ltd
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WUHAN PRECISE ELECTRONIC TECHNOLOGY Co Ltd
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Priority to CN 201220624015 priority Critical patent/CN202975189U/en
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Publication of CN202975189U publication Critical patent/CN202975189U/en
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  • Semiconductor Lasers (AREA)

Abstract

The utility model discloses a laser light emitting component aging test system. The laser light emitting component aging test system includes a power source slow start circuit, a constant current source drive circuit and a control unit, wherein the power source slow start circuit selects linear voltage-stabilizing power source systems, and the control unit controls a circuit and enables the same to output voltage control signals to the constant current source drive circuit so as to control the current of laser light emitting components. The laser light emitting component aging test system of the utility model can support simultaneous working of 1600 lasers; different working modes and different magnitudes of the current can be respectively set; the laser light emitting component aging test system can be controlled by a PC in a centralized manner and can transmit data of each channel in a real-time manner; and therefore the laser light emitting component aging test system has excellent technical effects.

Description

A kind of laser instrument luminescence component aging testing system
Technical field
The utility model relates to a kind of laser instrument luminescence component aging testing system.
Background technology
At present, when laser instrument luminescence component (TO) carries out burn-in test, need to carry out the test of various modes, yet existing test macro can not satisfy above-mentioned requirements.
The utility model content
The utility model provides a kind of laser instrument luminescence component aging testing system, and this system has various modes, and can satisfy the purpose to the TO burn-in test.
It is as follows that the utility model solves the problems of the technologies described above the technical scheme of taking: a kind of laser instrument luminescence component aging testing system, comprise: power supply soft-start circuit, constant current source driving circuit and control module, wherein, described power supply soft-start circuit is chosen linear regulated power supply system; Described control module control circuit output voltage control signal controls the electric current of laser instrument luminescence component for described constant current source driving circuit.
Further preferably structure is, laser diode current and/or the back facet current signal of the described constant current source driving circuit output of described control module real-time sampling, and driving circuit is controlled, make laser instrument be stabilized in required electric current and/or backlight power.
Further preferred structure is that described control module is connected with PC by 485 buses.
Further preferred structure is also to be provided with power protecting circuit.
The utility model system can support 1600 laser instruments to work simultaneously, and different mode of operations and size of current are set respectively, and can by PC centralized control and each circuit-switched data of real-time Transmission, have good technology and control effect.
Other features and advantages of the utility model will be set forth in the following description, and, partly become apparent from instructions, perhaps understand by implementing the utility model.The purpose of this utility model and other advantages can realize and obtain by specifically noted structure in the instructions of writing, claims and accompanying drawing.
Description of drawings
Below in conjunction with accompanying drawing, the utility model is described in detail, so that above-mentioned advantage of the present utility model is clearer and more definite.
Fig. 1 is the structural representation of the utility model laser instrument luminescence component aging testing system.
Embodiment
Below in conjunction with specific embodiment, the utility model is described in detail.
As shown in Figure 1, this system carries out burn-in test mainly for TO, and two kinds of mode of operations of continuous current and permanent merit are arranged, and under permanent power, the protective current size can be set; Can and save the data in the database of PC LD electric current and PD back facet current Real Time Monitoring in the TO ageing process; Every equipment of this system is supported 20 or 40 TO laser works.Compare with ageing system in the past, this system can arrange respectively the size of electric current or the power of each TO, can be operated in different patterns; Wherein one road drive current occurs extremely can not affecting other laser works; System can support at most 40 equipment centralized control, and quantity reaches 1600 laser instruments and works simultaneously.
As shown in Figure 1, shown in laser instrument luminescence component aging testing system, comprising: power supply soft-start circuit, constant current source driving circuit and control module, wherein, described power supply soft-start circuit is chosen linear regulated power supply system; Described control module control circuit output voltage control signal controls the electric current of laser instrument luminescence component for described constant current source driving circuit.
Laser diode current and/or the back facet current signal of the described constant current source driving circuit output of described control module real-time sampling, and driving circuit is controlled, make laser instrument be stabilized in required electric current and/or backlight power.
Described control module is connected with PC by 485 buses.
This test macro also is provided with power protecting circuit.
The utility model system can support 1600 laser instruments to work simultaneously, and different mode of operations and size of current are set respectively, and can by PC centralized control and each circuit-switched data of real-time Transmission, have good technology and control effect.
Specifically, power-supply system mainly adopts the linear voltage stabilization source to provide, and adds large-scale radiator heat-dissipation and reduces temperature; Connect the slow switch circuit power-on time and be controlled at 10 milliseconds of left and right; Control circuit output 40 road voltage signals are controlled the TO electric current to driving circuit, and real-time sampling LD laser diode current, back facet current are monitored duty, No. 40 driving circuits carried out PID the controlling of control circuit poll, make laser instrument be stabilized in required LD electric current or backlight power, current precision is controlled and is at first adopted wave filter filtering ripple, carries out software and process on software; System supports 485 buses and 40 equipment is concentrated controlled by PC; can configure mode of operation and the size of current on each road by software; and the duty of real-time every equipment of inquiry; instruction have broadcast type and separately the configuration querying order reduced the load of machinery systems of system, system in a single day break down software can in time record, and under send instructions and do corresponding conservation treatment.
And in an embodiment, 40 road PID control to guarantee LD electric currents precision of 3% under 3% precision, back facet current 50~2450 μ A under 10~200ma
Wherein, system can support 1600 laser instruments to work simultaneously, and different mode of operations and size of current are set respectively; Can be by PC centralized control and each circuit-switched data of real-time Transmission.
It should be noted that at last: the above only is preferred embodiment of the present utility model, be not limited to the utility model, although with reference to previous embodiment, the utility model is had been described in detail, for a person skilled in the art, it still can be modified to the technical scheme that aforementioned each embodiment puts down in writing, and perhaps part technical characterictic wherein is equal to replacement.All within spirit of the present utility model and principle, any modification of doing, be equal to replacement, improvement etc., within all should being included in protection domain of the present utility model.

Claims (4)

1. a laser instrument luminescence component aging testing system, is characterized in that, comprising: power supply soft-start circuit, constant current source driving circuit and control module, and wherein, described power supply soft-start circuit is chosen linear regulated power supply system; Described control module control circuit output voltage control signal controls the electric current of laser instrument luminescence component for described constant current source driving circuit.
2. laser instrument luminescence component aging testing system according to claim 1, it is characterized in that, laser diode current and/or the back facet current signal of the described constant current source driving circuit output of described control module real-time sampling, and driving circuit is controlled, make laser instrument be stabilized in required electric current and/or backlight power.
3. laser instrument luminescence component aging testing system according to claim 1, is characterized in that, described control module is connected with PC by 485 buses.
4. laser instrument luminescence component aging testing system according to claim 1 and 2, is characterized in that, also is provided with power protecting circuit.
CN 201220624015 2012-11-13 2012-11-13 Laser light emitting component aging test system Expired - Fee Related CN202975189U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 201220624015 CN202975189U (en) 2012-11-13 2012-11-13 Laser light emitting component aging test system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 201220624015 CN202975189U (en) 2012-11-13 2012-11-13 Laser light emitting component aging test system

Publications (1)

Publication Number Publication Date
CN202975189U true CN202975189U (en) 2013-06-05

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CN 201220624015 Expired - Fee Related CN202975189U (en) 2012-11-13 2012-11-13 Laser light emitting component aging test system

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CN (1) CN202975189U (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104237762A (en) * 2014-07-23 2014-12-24 北京光电技术研究所 Semiconductor laser testing device, system and method
CN104897365A (en) * 2015-05-27 2015-09-09 广东高聚激光有限公司 Aging tester for fiber laser
CN107219385A (en) * 2017-04-20 2017-09-29 深圳市杰普特光电股份有限公司 Signal generation apparatus
CN108037390A (en) * 2017-12-14 2018-05-15 武汉电信器件有限公司 It is a kind of to screen detection method and the device that optical module is degenerated
CN108521293A (en) * 2018-04-04 2018-09-11 中国人民解放军国防科技大学 Method for monitoring semiconductor laser degradation on line

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104237762A (en) * 2014-07-23 2014-12-24 北京光电技术研究所 Semiconductor laser testing device, system and method
CN104897365A (en) * 2015-05-27 2015-09-09 广东高聚激光有限公司 Aging tester for fiber laser
CN107219385A (en) * 2017-04-20 2017-09-29 深圳市杰普特光电股份有限公司 Signal generation apparatus
CN108037390A (en) * 2017-12-14 2018-05-15 武汉电信器件有限公司 It is a kind of to screen detection method and the device that optical module is degenerated
CN108037390B (en) * 2017-12-14 2020-06-30 武汉电信器件有限公司 Detection method and device for screening degradation of optical module
CN108521293A (en) * 2018-04-04 2018-09-11 中国人民解放军国防科技大学 Method for monitoring semiconductor laser degradation on line
CN108521293B (en) * 2018-04-04 2019-10-08 中国人民解放军国防科技大学 Method for monitoring semiconductor laser degradation on line

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C14 Grant of patent or utility model
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CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20130605

Termination date: 20161113

CF01 Termination of patent right due to non-payment of annual fee