CN202929143U - Piezoelectric ceramic sensor detection circuit structure - Google Patents
Piezoelectric ceramic sensor detection circuit structure Download PDFInfo
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- CN202929143U CN202929143U CN 201220673617 CN201220673617U CN202929143U CN 202929143 U CN202929143 U CN 202929143U CN 201220673617 CN201220673617 CN 201220673617 CN 201220673617 U CN201220673617 U CN 201220673617U CN 202929143 U CN202929143 U CN 202929143U
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Abstract
The utility model relates to a piezoelectric ceramic sensor detection circuit structure and belongs to the technical field of circuit structure. The piezoelectric ceramic sensor detection circuit structure comprises a high voltage generation module, a shunt and a digital signal processing main control chip. The shunt can divide drive signals, which are generated by a piezoelectric ceramic sensor to be detected under high voltage, into two channels to be outputted to the digital signal processing main control chip. Voltage-to-frequency characteristic and impedance characteristic of the two-channel signals are respectively analyzed by the digital signal processing main control chip, and finally a test result of the piezoelectric ceramic sensor is automatically generated and each parameter's measurement value is outputted so as to integrate each parameter measurement and replace present various test tools and many test methods. In the meantime, users themselves can set a reference value as the assessment standard, thus effectively raising testing efficiency and reducing testing workload. In addition, the piezoelectric ceramic sensor detection circuit structure provided by the utility model has a simple structure, requires low cost, and has a wide application range.
Description
Technical field
The utility model relates to the circuit structure technical field, and particularly the sensor detection circuit technical field of structures, specifically refer to a kind of piezoceramic transducer testing circuit structure.
Background technology
At present, test for piezoceramic transducer in prior art is to judge that by testing some conventional parameters the performance of sensor is good and bad, and these parameters comprise: dielectric properties (comprising specific inductive capacity, dielectric loss factor, dielectric frequency etc.), piezoelectric constant, electromechanical coupling factor, ferroelectric hysteresis loop etc.Need to adopt specific testing apparatus and method of testing for each parameter, such as: dielectric constant measurement need to be used the LCR instrument; The dielectric frequency need to be used accurate electric impedance analyzer; Obtain anti-resonance frequency Fa and resonance frequency Fr by resonance-antiresonance method, thus computing machine electric coupling coefficient Kp etc.
This shows, performance test for a product need to can obtain correct result by multiple working procedure, several evaluation methods, this process is too loaded down with trivial details and shortage efficient obviously, and can not test targetedly it in the working condition of special occasions for the piezoelectric sensor of special-purpose.
The utility model content
The purpose of this utility model is to have overcome above-mentioned shortcoming of the prior art, providing a kind of is incorporated into the parameters measurement in a device, replace various testing tool of the prior art and various test, the user can set up the canonical reference value on their own as estimating good and bad foundation, the automatic measurement numerical value that generates test result and export each parameter, thereby effectively improve testing efficiency, reduce test job intensity, and simple in structure, with low cost, range of application is piezoceramic transducer testing circuit structure comparatively widely.
In order to realize above-mentioned purpose, piezoceramic transducer testing circuit structure of the present utility model has following formation:
This piezoceramic transducer testing circuit structure comprises high pressure generation module, shunt and digital signal processing main control chip.The high-voltage output end of described high pressure generation module connects outside piezoceramic transducer to be measured, the pumping signal output terminal of described testing pressure ceramic sensor element connects the input end of described shunt, the two-way output terminal of described shunt all connects the input end of described digital signal processing main control chip, and the control signal output terminal of described digital signal processing main control chip connects respectively described high pressure generation module and shunt.
In this piezoceramic transducer testing circuit structure, one road output terminal of described shunt connects the input end of described digital signal processing main control chip by the amplifying circuit module.
In this piezoceramic transducer testing circuit structure, the amplifying circuit module comprises the level Four operational amplification circuit, the input end of described level Four operational amplification circuit connects one road output terminal of described shunt, and the output terminal of described level Four operational amplification circuit connects described digital signal processing main control chip.
In this piezoceramic transducer testing circuit structure, the digital signal processing main control chip comprises voltage-frequency specificity analysis parts, described voltage-frequency specificity analysis parts comprise analog to digital converter and fast Fourier transformer, the output terminal of described level Four operational amplification circuit connects the input end of described analog to digital converter, the output terminal of described analog to digital converter connects the input end of described fast Fourier transformer, and the output terminal of described fast Fourier transformer is piezoceramic transducer natural frequency and amplitude output terminal.
In this piezoceramic transducer testing circuit structure, one road output terminal of shunt connects the input end of described digital signal processing main control chip by the integration sampling circuit module.
In this piezoceramic transducer testing circuit structure, the integration sampling circuit module comprises the capacitance integral circuit unit that is linked in sequence and voltage sampling circuit unit, the input end of described capacitance integral circuit unit connects one road output terminal of described shunt, and the output terminal of described voltage sampling circuit unit connects the input end of described digital signal processing main control chip.
In this piezoceramic transducer testing circuit structure, the digital signal processing main control chip comprises the analysis of Impedance Characteristic parts, and described analysis of Impedance Characteristic parts connect the output terminal of described voltage sampling circuit unit.
In this piezoceramic transducer testing circuit structure, circuit structure also comprises host computer, and described host computer connects the bottom control plate of described digital signal processing main control chip by USB interface.
In this piezoceramic transducer testing circuit structure, host computer comprises that sensor natural frequency reference value and reference amplitude setup unit, capacitance integral circuit unit charging curve duration of charging reference value setup unit and measured value show and analytic unit, and described sensor natural frequency reference value and reference amplitude setup unit, capacitance integral circuit unit charging curve duration of charging reference value setup unit and measured value show the bottom control plate that all is connected described digital signal processing main control chip with analytic unit.
adopted the piezoceramic transducer testing circuit structure of this utility model, because it comprises the high pressure generation module, shunt and digital signal processing main control chip, the pumping signal that makes shunt produced by high pressure divides two-way to export the input end of digital signal processing main control chip to, the digital signal processing main control chip carries out voltage-frequency characteristic and analysis of Impedance Characteristic to two paths of signals respectively, the final measurement numerical value that automatically generates the test result of piezoceramic transducer and export each parameter, thereby the parameters measurement is incorporated in a device, various testing tool of the prior art and various test have been replaced, the user can set up the canonical reference value on their own as estimating good and bad foundation simultaneously, effectively improved testing efficiency, reduced test job intensity, and piezoceramic transducer testing circuit structure of the present utility model is simple in structure, with low cost, range of application is also comparatively extensive.
Description of drawings
Fig. 1 is the schematic diagram of piezoceramic transducer testing circuit structure of the present utility model.
Embodiment
In order more clearly to understand technology contents of the present utility model, describe in detail especially exemplified by following examples.
See also shown in Figure 1ly, be the schematic diagram of piezoceramic transducer testing circuit structure of the present utility model.
In one embodiment, this piezoceramic transducer testing circuit comprises high pressure generation module, shunt and digital signal processing main control chip.The high-voltage output end of described high pressure generation module connects outside piezoceramic transducer to be measured, the pumping signal output terminal of described testing pressure ceramic sensor element connects the input end of described shunt, the two-way output terminal of described shunt all connects the input end of described digital signal processing main control chip, and the control signal output terminal of described digital signal processing main control chip connects respectively described high pressure generation module and shunt.
A kind of preferred embodiment in, one road output terminal of described shunt connects the input end of described digital signal processing main control chip by the amplifying circuit module.Another road output terminal of described shunt connects the input end of described digital signal processing main control chip by the integration sampling circuit module.wherein, described amplifying circuit module comprises the level Four operational amplification circuit, the input end of described level Four operational amplification circuit connects one road output terminal of described shunt, the output terminal of described level Four operational amplification circuit connects the voltage-frequency specificity analysis parts in described digital signal processing main control chip, described voltage-frequency specificity analysis parts comprise analog to digital converter and fast Fourier transformer, the output terminal of described level Four operational amplification circuit connects the input end of described analog to digital converter, the output terminal of described analog to digital converter connects the input end of described fast Fourier transformer, the output terminal of described fast Fourier transformer is piezoceramic transducer natural frequency and amplitude output terminal.And described integration sampling circuit module comprises the capacitance integral circuit unit that is linked in sequence and voltage sampling circuit unit, the input end of described capacitance integral circuit unit connects one road output terminal of described shunt, and the output terminal of described voltage sampling circuit unit connects the analysis of Impedance Characteristic parts in described digital signal processing main control chip.Above-mentioned voltage-frequency specificity analysis parts and analysis of Impedance Characteristic parts are all realized by the hardware configuration that the DSP main control chip has.
In preferred embodiment, described circuit structure also comprises host computer, and described host computer connects the bottom control plate of described digital signal processing main control chip by USB interface.Described host computer comprises that sensor natural frequency reference value and reference amplitude setup unit, capacitance integral circuit unit charging curve duration of charging reference value setup unit and measured value show and analytic unit, and described sensor natural frequency reference value and reference amplitude setup unit, capacitance integral circuit unit charging curve duration of charging reference value setup unit and measured value show the bottom control plate that all is connected described digital signal processing main control chip with analytic unit.
In actual applications, circuit structure of the present utility model with a DSP as main control chip, voltage-frequency characteristic and impedance operator for sensor are tested, and have wherein comprised the measurement of piezoelectric constant, dielectric frequency and electromechanical coupling factor for the test of voltage-frequency characteristic; The measurement of impedance operator has been comprised the measurement of specific inductive capacity and dielectric loss factor.
Due to the inherent characteristic of piezoelectric ceramics, apply at sensor two ends the vibration that high pressure can make piezoelectric ceramics generation miniature deformation and produce fixed frequency, after this microvibration is amplified through amplifying circuit, can measure its frequency and amplitude by corresponding digital circuit; When applying high pressure, sensor allows certain electric current to flow through, be that piezoelectric ceramics has certain impedance operator, this characteristic changes along with the difference of high pressure application time, the size of current that shows as flows through sensor can change, and judges the Changing Pattern of impedance operator by the integral characteristic of measuring electric current.
Above measuring method can build and can be incorporated on a control panel by digital circuit and the mimic channel of routine, automatically completes by the control of software.The display module output that test result can be carried by plate also can be connected in mutually on the upper computer software interface by USB interface and PC and export.
When needs carried out the piezoceramic transducer test, DSP sent enabling signal to the high pressure generation module.The high pressure generation module is comprised of the common device that boosts, and is inputted as voltage by the operating voltage that stabilized voltage supply produces, and the high pressure after boosting (greater than 30V) directly acts on piezoceramic transducer.Piezoceramic transducer is a two terminal device, according to aforesaid piezoelectric ceramics characteristic, when High Pressure is arranged in sensor one end, can produce miniature deformation, follow fixed frequency output and have Weak current to flow through, these response signals are from the other end output of sensor, and DSP can select voltage-frequency characteristic or the impedance operator of sensor are measured by controlling shunt.
When selecting to measure the voltage-frequency characteristic, need to measure frequency and the amplitude of oscillator signal, the excitation output of considering sensor is small-signal, the ADC(analog to digital converter of DSP) None-identified, therefore must amplify this pumping signal, adopted 4 grades of amplifiers to carry out signal in the utility model and amplified, the signal after amplification can directly be sampled by ADC; In DSP embedded fft algorithm (fast fourier algorithm), the sampled signal of ADC is inputted natural frequency and the amplitude size that this algorithm can draw piezoceramic transducer.
When selecting to measure impedance operator, need to carry out integral operation to the Weak current by sensor, the utility model has adopted the capacitance integral circuit, adopt comparer that integrating circuit voltage is sampled, calculating begins to arrive the time of given voltage point from charging, can learn cumulative effect by the Weak current of sensor by assessing this duration of charging, thereby judge the variation tendency of impedance operator.
Simultaneously, for user-friendly, the utility model can also carry out technical support in conjunction with the PC host computer, and the bottom control plate take DSP as main control chip is connected with PC by the USB interface chip.The function that this host computer can be realized comprises: sensor natural frequency reference value and reference amplitude are set, charging curve duration of charging reference value is set, shown and analyzes each measured value etc.
It is apparent adopting testing circuit structure of the present utility model to detect to piezoceramic transducer the improved efficiency of bringing.At first, a plurality of testing tools of conventional test methodologies are integrated into a control panel, have reduced greatly testing cost, simultaneously, because test module has cured, as long as additional branch switch can expand to duplex tester with the single channel sensor tester easily.Secondly, this device is reduced to measurement to two inherent characteristics of piezoelectric ceramics with traditional Multi-parameter Measurement Method, and the measurement of these two inherent characteristics all can by dsp program is completed automatically, need not artificial participation, greatly improve testing efficiency, reduced the possibility of makeing mistakes.Again, because this device can be connected with PC by USB interface, can utilize the PC host computer that this testing circuit is supported, the user can modify to testing standard easily in the PC application interface and can be clear that the Output rusults of test.
Use through actual, adopt testing circuit structure of the present utility model that piezoceramic transducer is detected, change a present key into by the testing process of original many devices multiple operation and automatically complete, required time was less than one second.
adopted the piezoceramic transducer testing circuit structure of this utility model, because it comprises the high pressure generation module, shunt and digital signal processing main control chip, the pumping signal that makes shunt produced by high pressure divides two-way to export the input end of digital signal processing main control chip to, the digital signal processing main control chip carries out voltage-frequency characteristic and analysis of Impedance Characteristic to two paths of signals respectively, the final measurement numerical value that automatically generates the test result of piezoceramic transducer and export each parameter, thereby the parameters measurement is incorporated in a device, various testing tool of the prior art and various test have been replaced, the user can set up the canonical reference value on their own as estimating good and bad foundation simultaneously, effectively improved testing efficiency, reduced test job intensity, and piezoceramic transducer testing circuit structure of the present utility model is simple in structure, with low cost, range of application is also comparatively extensive.
In this instructions, the utility model is described with reference to its specific embodiment.But, still can make various modifications and conversion obviously and not deviate from spirit and scope of the present utility model.Therefore, instructions and accompanying drawing are regarded in an illustrative, rather than a restrictive.
Claims (9)
1. piezoceramic transducer testing circuit structure, it is characterized in that, described circuit structure comprises the high pressure generation module, shunt and digital signal processing main control chip, the high-voltage output end of described high pressure generation module connects outside piezoceramic transducer to be measured, the pumping signal output terminal of described testing pressure ceramic sensor element connects the input end of described shunt, the two-way output terminal of described shunt all connects the input end of described digital signal processing main control chip, the control signal output terminal of described digital signal processing main control chip connects respectively described high pressure generation module and shunt.
2. piezoceramic transducer testing circuit structure according to claim 1, is characterized in that, one road output terminal of described shunt connects the input end of described digital signal processing main control chip by the amplifying circuit module.
3. piezoceramic transducer testing circuit structure according to claim 2, it is characterized in that, described amplifying circuit module comprises the level Four operational amplification circuit, the input end of described level Four operational amplification circuit connects one road output terminal of described shunt, and the output terminal of described level Four operational amplification circuit connects described digital signal processing main control chip.
4. piezoceramic transducer testing circuit structure according to claim 3, it is characterized in that, described digital signal processing main control chip comprises voltage-frequency specificity analysis parts, described voltage-frequency specificity analysis parts comprise analog to digital converter and fast Fourier transformer, the output terminal of described level Four operational amplification circuit connects the input end of described analog to digital converter, the output terminal of described analog to digital converter connects the input end of described fast Fourier transformer, the output terminal of described fast Fourier transformer is piezoceramic transducer natural frequency and amplitude output terminal.
5. piezoceramic transducer testing circuit structure according to claim 1, is characterized in that, one road output terminal of described shunt connects the input end of described digital signal processing main control chip by the integration sampling circuit module.
6. piezoceramic transducer testing circuit structure according to claim 5, it is characterized in that, described integration sampling circuit module comprises the capacitance integral circuit unit that is linked in sequence and voltage sampling circuit unit, the input end of described capacitance integral circuit unit connects one road output terminal of described shunt, and the output terminal of described voltage sampling circuit unit connects the input end of described digital signal processing main control chip.
7. piezoceramic transducer testing circuit structure according to claim 6, it is characterized in that, described digital signal processing main control chip comprises the analysis of Impedance Characteristic parts, and described analysis of Impedance Characteristic parts connect the output terminal of described voltage sampling circuit unit.
8. the described piezoceramic transducer testing circuit of any one structure according to claim 1 to 7, it is characterized in that, described circuit structure also comprises host computer, and described host computer connects the bottom control plate of described digital signal processing main control chip by USB interface.
9. piezoceramic transducer testing circuit structure according to claim 8, it is characterized in that, described host computer comprises sensor natural frequency reference value and reference amplitude setup unit, capacitance integral circuit unit charging curve duration of charging reference value setup unit and measured value show and analytic unit, described sensor natural frequency reference value and reference amplitude setup unit, capacitance integral circuit unit charging curve duration of charging reference value setup unit and measured value show the bottom control plate that all is connected described digital signal processing main control chip with analytic unit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220673617 CN202929143U (en) | 2012-12-07 | 2012-12-07 | Piezoelectric ceramic sensor detection circuit structure |
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| Application Number | Priority Date | Filing Date | Title |
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| CN 201220673617 CN202929143U (en) | 2012-12-07 | 2012-12-07 | Piezoelectric ceramic sensor detection circuit structure |
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| CN202929143U true CN202929143U (en) | 2013-05-08 |
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| CN 201220673617 Expired - Fee Related CN202929143U (en) | 2012-12-07 | 2012-12-07 | Piezoelectric ceramic sensor detection circuit structure |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109142931A (en) * | 2018-09-03 | 2019-01-04 | 苏州华兴源创科技股份有限公司 | A kind of system and method for piezoelectric ceramics test |
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2012
- 2012-12-07 CN CN 201220673617 patent/CN202929143U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109142931A (en) * | 2018-09-03 | 2019-01-04 | 苏州华兴源创科技股份有限公司 | A kind of system and method for piezoelectric ceramics test |
| CN109142931B (en) * | 2018-09-03 | 2021-11-23 | 苏州华兴源创科技股份有限公司 | System and method for testing piezoelectric ceramics |
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| Date | Code | Title | Description |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address | ||
| CP03 | Change of name, title or address |
Address after: 214135 -6, Linghu Avenue, Wuxi Taihu international science and Technology Park, Wuxi, Jiangsu, China, 180 Patentee after: China Resources micro integrated circuit (Wuxi) Co.,Ltd. Address before: 214000 Jiangsu city of Wuxi province Taihu international science and Technology Park Linghu Road No. 180 -22 Patentee before: WUXI CHINA RESOURCES SEMICO Co.,Ltd. |
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| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130508 Termination date: 20211207 |