CN202916452U - Semiconductor device on-line measurement apparatus - Google Patents

Semiconductor device on-line measurement apparatus Download PDF

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Publication number
CN202916452U
CN202916452U CN 201220587593 CN201220587593U CN202916452U CN 202916452 U CN202916452 U CN 202916452U CN 201220587593 CN201220587593 CN 201220587593 CN 201220587593 U CN201220587593 U CN 201220587593U CN 202916452 U CN202916452 U CN 202916452U
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China
Prior art keywords
infrared
semiconductor devices
sensor
semiconductor device
utility
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Expired - Fee Related
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CN 201220587593
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Chinese (zh)
Inventor
王焕平
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Individual
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Individual
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Priority to CN 201220587593 priority Critical patent/CN202916452U/en
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Publication of CN202916452U publication Critical patent/CN202916452U/en
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Expired - Fee Related legal-status Critical Current

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Abstract

The utility model provides a semiconductor device on-line measurement apparatus, comprising a body, a reflector, an infrared receiver and an infrared emitter. The infrared receiver and the infrared emitter are arranged on a PCB to form a sensor. The body comprises a semiconductor device. The sensor and the reflector are respectively arranged on opposite two sides of a semiconductor device on the body. The infrared receiver and the infrared emitter are respectively arranged oppositely to the reflector. According to the utility model, the problem can be avoided that a sensor of a semiconductor device automatic burning machine or a test separator loses efficacy caused by dust in work environments or shred dropped from chips.

Description

Semiconductor devices is at level detecting apparatus
Technical field
The utility model relates to a kind of semiconducter device testing field, relates in particular to a kind of semiconductor devices at level detecting apparatus.
Background technology
In semiconductor devices automatic recording machine or Test handler, by semiconductor devices at level detecting apparatus to chip detection in place, adopt at present the correlation infrared detection.Shown in Fig. 1-2, infrared emission (or reception) device 2 ' is fixed on the PCB1 ', infrared reception (or emission) device 4 ' is fixed on the PCB3 ', and when semiconductor devices 6 ' was not in place, the light of infrared emission device 2 ' emission can arrive infrared receiver device 4 '; Can block Infrared when semiconductor devices is in place, infrared receiver device 4 ' does not receive light.
Can have so following 2 problems: 1, extraneous light can exert an influence to reception, in the serious situation, may produce flase drop; 2, because the assorted bits that the dust in the test environment or chip itself come off can cover on the sensor, cause sensor failure.
The utility model content
The purpose of this utility model is, provides a kind of semiconductor devices at level detecting apparatus, can prevent extraneous light and dust, assorted impact of considering to be worth doing sensor.
To achieve these goals, the utility model provides a kind of semiconductor devices at level detecting apparatus, it comprises: body, reverberator, infrared remote receiver, and infrared transmitter, this infrared remote receiver and infrared transmitter are located at a PCB and are upward formed a sensor, this body comprises semiconductor devices, this sensor and reverberator are located at respectively the relative both sides of body semiconductor-on-insulator device, and infrared remote receiver and infrared transmitter are oppositely arranged with reverberator respectively.
Wherein, described body also comprises the track cover plate, reaches the track relative with the track cover plate, and this sensor is located on the track cover plate, and reverberator is located on the track.
Wherein, described body also comprises the stock stop that is connected with semiconductor devices.
The beneficial effects of the utility model: the utility model has been stopped semiconductor devices automatic recording machine or Test handler and has been caused the sensor failure problem because of the assorted bits that the dust in the environment or chip itself come off at work.
In order further to understand feature of the present utility model and technology contents, see also following about detailed description of the present utility model and accompanying drawing, yet accompanying drawing only provide with reference to and the explanation usefulness, the utility model is limited.
Description of drawings
Below in conjunction with accompanying drawing, by embodiment of the present utility model is described in detail, will make the technical solution of the utility model and other beneficial effect apparent.
In the accompanying drawing,
Fig. 1 is that existing semiconductor devices is at the structural representation of level detecting apparatus;
Fig. 2 is that the A-A of Fig. 1 is to view;
Fig. 3 is that semiconductor devices of the present utility model is at the structural representation of level detecting apparatus;
Fig. 4 is that the A-A of Fig. 3 is to view.
Embodiment
Technological means and the effect thereof taked for further setting forth the utility model are described in detail below in conjunction with preferred embodiment of the present utility model and accompanying drawing thereof.
As shown in Figure 3-4, semiconductor devices of the present utility model comprises at level detecting apparatus: body 10, reverberator 4, infrared remote receiver 3, and infrared transmitter 2, this infrared remote receiver 3 and infrared transmitter 2 are located at a PCB1 and are upward formed a sensor, this body comprises semiconductor devices 6, this sensor and reverberator 4 are located at respectively the relative both sides of body semiconductor-on-insulator device 6, and infrared remote receiver 3 is oppositely arranged with reverberator 4 respectively with infrared transmitter 2.
This body 10 comprises track cover plate 7, the track 5 relative with track cover plate 7, the stock stop 8 that is connected with semiconductor devices 6.
Form by being welded on infrared transmitter 2 on the PCB1 and infrared remote receiver 3 and reverberator 4, because transmit and receive on the top of track 5, so dust and assorted bits can not have any impact to sensor.And the angle of reverberator 4 and surface level is spent greater than 50, and dust and assorted bits can not rest on the reverberator yet.
At PCB1 welding infrared transmitter 2 and infrared remote receiver 3, be fixed on the track cover plate 7; Fixed reflector 4 on track 5.
When not having semiconductor devices 6 at station, the infrared ray that infrared transmitter 2 sends is received by infrared receiver device 3 after being reflected by reverberator 4; When semiconductor devices 6 was kept off at station by stock stop 8, the infrared ray that infrared emission device 2 sends was absorbed by semiconductor devices 6, and is not reflected.So infrared receiver device 3 can not receive.
The above; for the person of ordinary skill of the art; can make other various corresponding changes and distortion according to the technical solution of the utility model and technical conceive, and all these changes and distortion all should belong to the protection domain of the utility model claim.

Claims (3)

1. a semiconductor devices is at level detecting apparatus, it is characterized in that, comprise: body, reverberator, infrared remote receiver, and infrared transmitter, this infrared remote receiver and infrared transmitter are located at a PCB and are upward formed a sensor, this body comprises semiconductor devices, this sensor and reverberator are located at respectively the relative both sides of body semiconductor-on-insulator device, and infrared remote receiver and infrared transmitter are oppositely arranged with reverberator respectively.
2. semiconductor devices as claimed in claim 1 is characterized in that at level detecting apparatus, and described body also comprises the track cover plate, reaches the track relative with the track cover plate, and this sensor is located on the track cover plate, and reverberator is located on the track.
3. semiconductor devices as claimed in claim 1 is characterized in that at level detecting apparatus, and described body also comprises the stock stop that is connected with semiconductor devices.
CN 201220587593 2012-11-08 2012-11-08 Semiconductor device on-line measurement apparatus Expired - Fee Related CN202916452U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 201220587593 CN202916452U (en) 2012-11-08 2012-11-08 Semiconductor device on-line measurement apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 201220587593 CN202916452U (en) 2012-11-08 2012-11-08 Semiconductor device on-line measurement apparatus

Publications (1)

Publication Number Publication Date
CN202916452U true CN202916452U (en) 2013-05-01

Family

ID=48164754

Family Applications (1)

Application Number Title Priority Date Filing Date
CN 201220587593 Expired - Fee Related CN202916452U (en) 2012-11-08 2012-11-08 Semiconductor device on-line measurement apparatus

Country Status (1)

Country Link
CN (1) CN202916452U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110109795A (en) * 2018-02-01 2019-08-09 中兴通讯股份有限公司 Movable component in level detecting apparatus, method and relevant device
CN111599147A (en) * 2020-05-14 2020-08-28 固力发电气有限公司 Lightning arrester monitoring device and lightning arrester monitoring method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110109795A (en) * 2018-02-01 2019-08-09 中兴通讯股份有限公司 Movable component in level detecting apparatus, method and relevant device
CN111599147A (en) * 2020-05-14 2020-08-28 固力发电气有限公司 Lightning arrester monitoring device and lightning arrester monitoring method

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C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20130501

Termination date: 20151108

EXPY Termination of patent right or utility model