CN202871800U - Semiconductor device including junction field effect transistor - Google Patents
Semiconductor device including junction field effect transistor Download PDFInfo
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- CN202871800U CN202871800U CN 201220562097 CN201220562097U CN202871800U CN 202871800 U CN202871800 U CN 202871800U CN 201220562097 CN201220562097 CN 201220562097 CN 201220562097 U CN201220562097 U CN 201220562097U CN 202871800 U CN202871800 U CN 202871800U
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Abstract
A semiconductor device including a junction field effect transistor is disclosed. The semiconductor device includes a junction field effect transistor including: a semiconductor substrate having a first doping type and serving as a drain region of the junction field effect transistor; the epitaxial layer is positioned on the semiconductor substrate and has a first doping type; the body region is positioned in the epitaxial layer and has a second doping type, and the second doping type is opposite to the first doping type; a source region in the epitaxial layer and having a first doping type; and a gate region of the second doping type in the body region, wherein the junction field effect transistor further comprises a shield layer of the second doping type in the epitaxial layer and in the conductive path between the source region and the drain region. Due to the shielding layer, a new pinch-off region is generated in the junction field effect transistor, so that the pinch-off voltage can be reduced.
Description
Technical field
The utility model relates to semiconductor device, relates more specifically to comprise the semiconductor device of junction field effect transistor.
Background technology
Figure 1 shows that the cutaway view of existing N channel junction field-effect transistors (JFET) 100.This JFET100 comprises N+ type drain region 101 (being generally substrate), in the N-type epitaxial loayer 102 on the N+ type drain region 101, the P type tagma 103 in N-type epitaxial loayer 102, the N+ type source area 104 in N-type epitaxial loayer 102 and between the P type tagma 103 and the P+ type gate regions 105 that is arranged in P type tagma 103.This JFET100 also comprises interlayer dielectric layer (ILDL) 106, and pass source electrode that ILDL106 and N+ type source area 104 be electrically connected contact 107 with pass the gate contact 108 that ILDL106 is electrically connected with P+ type gate regions 105., P type tagma 103 is around the part of N-type epitaxial loayer 102.N+ type source area 104 is arranged in this part of N-type epitaxial loayer 102.And this part of N-type epitaxial loayer 102 extends to N+ type drain region 101 from N+ type source area 104, thereby forms conductive path.JFET100 shown in Figure 1 is vertical devices.
When gate contact 108 applied bias voltage, tagma 103 produced pinchoff effect, thus the electric current in the control conductive path.The pinch off region that Reference numeral in Fig. 1 " A " expression tagma 103 produces in N-type epitaxial loayer 102.For the pinchoff effect that obtains to strengthen, size that must pinch off region A is set to as far as possible little, thereby advantageously obtains the pinch-off voltage that reduces.Yet the size reduction of pinch off region A causes reducing of channel width, thereby adversely increases conducting resistance Ron.And, the size reduction of pinch off region A so that source area 104 near gate regions 105, thereby adversely reduce the source drain breakdown voltage.The size reduction of pinch off region A also improves the resolution requirement of photoetching process, thereby has adversely increased process complexity.
Therefore, still wish at source area 104 and the gate regions 105 distances pinch-off voltage that enough acquisition reduces under the situation far away.
The utility model content
In order to solve previously described problem, the utility model proposes the semiconductor device of a kind of improved JFET of comprising, wherein the source area of JFET and gate regions can keep enough distances, can reduce the pinch-off voltage of JFET simultaneously.
According to one side of the present utility model, a kind of semiconductor device is provided, comprise junction field effect transistor, described junction field effect transistor comprises: Semiconductor substrate has the first doping type and as the drain region of junction field effect transistor; Epitaxial loayer is positioned on the Semiconductor substrate, has the first doping type; The tagma is arranged in epitaxial loayer, has the second doping type, and the second doping type and the first doping type are opposite doping types; Source area is arranged in epitaxial loayer, has the first doping type; And gate regions, be arranged in the tagma, have the second doping type, wherein, described junction field effect transistor also comprises screen, screen has the second doping type, is positioned at the inside of epitaxial loayer, and in the conductive path between source area and drain region.
Preferably, this semiconductor device also comprises groove MOSFET, and this groove MOSFET comprises: described Semiconductor substrate, as the drain region; Described epitaxial loayer; Described tagma; Source area is arranged in epitaxial loayer, has the first doping type; Trench-gate passes described tagma and enters in the described epitaxial loayer; And gate dielectric layer, trench-gate and described tagma and described epitaxial loayer are separated.
Preferably, this semiconductor device also comprises planar MOSFET, and this planar MOSFET comprises: described Semiconductor substrate; Described epitaxial loayer; Described tagma; Source area and drain region are arranged in described tagma, have the first doping type; Grid conductor is on the tagma between source area and the drain region; And gate dielectric layer, between grid conductor and tagma, grid conductor and described tagma are separated.
In according to semiconductor device of the present utility model, owing to adopt screen, in JFET, produce new pinch off region.Even under the situation of the source area of JFET and the enough distances between the gate regions, also can strengthen pinchoff effect, thereby can reduce pinch-off voltage.On the other hand, this JFET can obtain high-breakdown-voltage by keeping the enough distances between source area and the gate regions.Owing to can correspondingly increase channel width, therefore can obtain low on-resistance.Therefore, needn't when designing JFET, carry out trading off on the performance according to semiconductor device of the present utility model.In addition, at least a portion step of making JFET can be identical with a part of step of making groove MOSFET or planar MOSFET, thereby can reduce JFET and groove MOSFET or planar MOSFET are integrated in a complexity on the chip, reduces production costs.
Description of drawings
In order to understand better the utility model, will be described in detail the utility model according to the following drawings:
Fig. 1 is the cutaway view of existing junction field effect transistor;
Fig. 2 is the cutaway view according to the junction field effect transistor of an embodiment of the utility model.
Fig. 3 is the cutaway view according to the junction field effect transistor of an embodiment of the utility model.
Fig. 4 is the cutaway view according to the semiconductor device that comprises junction field effect transistor and groove MOSFET of an embodiment of the utility model.
Fig. 5 is the cutaway view according to the semiconductor device that comprises junction field effect transistor and planar MOSFET of an embodiment of the utility model.
Embodiment
Example embodiment of the present utility model is fully described with reference to the accompanying drawings.In each accompanying drawing, identical element adopts similar Reference numeral to represent.For the sake of clarity, the various piece in the accompanying drawing is not drawn in proportion, and has simplified the detailed description of some concrete structures and function.In addition, the similar 26S Proteasome Structure and Function of having described in detail in certain embodiments repeats no more in other embodiments.Although every term of the present utility model is to describe one by one in conjunction with concrete example embodiment, these terms are applicable to any reasonable occasion of this area, should not be construed as the demonstration execution mode that is confined to set forth here.
Fig. 2 is the cutaway view according to the junction field effect transistor of an embodiment of the utility model (JFET) 200.In Fig. 2, adopt to represent identical element with the similar Reference numeral of Fig. 1, wherein Reference numeral is three bit digital, and first is " 2 ", and second is identical with the respective digital of respective element among Fig. 1 with the 3rd.
This JFET200 comprises N+ type drain region 201 (being generally substrate), in the N-type epitaxial loayer 202 on the N+ type drain region 201, the P type tagma 203 in N-type epitaxial loayer 202, the N+ type source area 204 in N-type epitaxial loayer 202 and between the P type tagma 203 and the P+ type gate regions 205 that is arranged in P type tagma 203.This JFET200 also comprises interlayer dielectric layer (ILDL) 206, and pass source electrode that ILDL206 and N+ type source area 204 be electrically connected contact 207 with pass the gate contact 208 that ILDL206 is electrically connected with P+ type gate regions 205.P type tagma 203 is around the part of N-type epitaxial loayer 202.N+ type source area 204 is arranged in this part of N-type epitaxial loayer 202.And this part of N-type epitaxial loayer 202 extends to N+ type drain region 201 from N+ type source area 204, thereby forms conductive path.JFET200 is vertical devices shown in figure 2.
The difference of JFET100 shown in JFET200 shown in Fig. 2 and Fig. 1 is that JFET200 also comprises the P type screen 209 of the N-type epitaxial loayer 202 that is arranged in N+ type source area 204 belows.In the conductive path of this P type screen 209 between source area and drain region.
When gate contact 208 applied bias voltage, tagma 203 produced pinchoff effect, produced pinch off region A in N-type epitaxial loayer 202.Screen 209 reduces the electric field among the pinch off region A at least in part as the electric field shielding layer.Moreover, screen 209 also in epitaxial loayer 202 part between screen 209 and tagma 203 produce new pinch off region B.As a result, tagma 203 and the screen 209 common pinchoff effect that produce.Even the distance of source area 204 and gate regions 205 is larger, the existence of screen 209 also can be so that the effective dimensions of pinch off region be less, thereby strengthens pinchoff effect.
Screen 209 for example is the high energy ion implantation district that forms in epitaxial loayer 202.The degree of depth of screen 209 is determined by the distance between screen 209 and the tagma 203.Minimum range between screen 209 and the tagma 203 should be enough little so that can form pinch off region B.Preferably, at least a portion of screen 209 is positioned on the bottom in tagma 203.The lateral dimension of screen 209 is also determined by the distance between screen 209 and the tagma 203.Minimum range between screen 209 and the tagma 203 should be wide enough so that screen 209 and tagma 203 are not in contact with one another, otherwise will adversely block conductive path.Preferably, the lateral dimension of screen 209 is consistent with the top dimension of conductive path.As shown in Figure 2, tagma 203 limits conductive path in epitaxial region 202.Because the dopant profiles in tagma 203, the top dimension of conductive path is minimum.The shape of the lateral cross section of screen 209 depends on the mask that uses in the manufacturing process.Preferably, the shape of the lateral cross section of screen 209 is consistent with the shape of the top cross-section of conductive path, also namely with the shape complementarity of the top cross-section in tagma 203.Preferably, in active area was square JFET200, being shaped as of the lateral cross section of screen 209 was square, in active area is circular JFET200, the lateral cross section of screen 209 be shaped as circle.Under the shape of the lateral cross section of screen 209 situation consistent with the shape of active area, can advantageously control the minimum range between screen 209 and the tagma 203.
In one embodiment, the N+ type drain region 201 of JFET200 is formed by the Semiconductor substrate of high-dopant concentration.In one embodiment, N-type epitaxial loayer 202 is the epitaxial semiconductor layer on the Semiconductor substrate.Semiconductor substrate or semiconductor layer are comprised of semi-conducting material, and semi-conducting material for example comprises III-V family semiconductor, such as GaAs, InP, GaN, SiC, and IV family semiconductor, such as Si, Ge.In a preferred embodiment, Semiconductor substrate or semiconductor layer can adopt for example SiGe (binary compound), the different compounds such as carborundum (in particular for the high pressure occasion), germanium nitride.
In one embodiment, P type tagma 203 is the injection regions that form in N-type epitaxial loayer 202, for example injects P type doped chemical (for example boron) in N-type epitaxial loayer 202 and forms.In one embodiment, come the dopant implant element by Ions Bombardment.
In one embodiment, N+ type source area 204 is the injection regions that form in N-type epitaxial loayer 202, for example further injects N-type doped chemical (for example arsenic, phosphorus or antimony) in N-type epitaxial loayer 202 and forms.
In one embodiment, P+ type gate regions 205 is the injection regions that form in P type tagma 203, for example further injects P type doped chemical (for example boron) in P type tagma 203 and forms.
In one embodiment, interlayer dielectric layer 206 comprises silicon dioxide.Can adopt any known method to make oxide layer, such as heat growth, deposit etc.
In one embodiment, source electrode contact 207 and gate contact 208 comprise tungsten.Can adopt any known method to make Metal Contact, for example adopt the through hole in the metal filled interlayer dielectric layer 206.
In one embodiment, P type tagma 203 forms the annular of sealing around the part of N-type epitaxial loayer 202, thereby this part of N-type epitaxial loayer 202 forms at least a portion of the conductive path between source area and the drain region.
In certain embodiments, can adopt the physical dimension in the following description, but these physical dimensions and do not mean that restriction scope of the present utility model and only are as example.
The thickness of interlayer dielectric layer 206 is relevant with the electric pressure of JFET200, can do corresponding the adjustment according to different voltage requirements.In one embodiment, the thickness of interlayer dielectric layer 206 is selected the minimum thickness that can realize the JFET200 required voltage.Along with the increase of required voltage, the thickness of interlayer dielectric layer 206 also increases thereupon.In one embodiment, interlayer dielectric layer 206 is oxide layer.
In one embodiment, the thickness of N+ type source area 204 is approximately 0.1 μ m～2 μ m.The thickness of N+ type source area 204 is not only relevant with the required puncture voltage of JFET, and relevant with its constituent material.In one embodiment, the thickness of N+ type source area 204 approximately is 0.25 μ m.
Fig. 3 is the cutaway view according to the junction field effect transistor of an embodiment of the utility model (JFET) 300.In Fig. 3, adopt to represent identical element with the similar Reference numeral of Fig. 2, wherein Reference numeral is three bit digital, and first is " 3 ", and second is identical with the respective digital of respective element among Fig. 2 with the 3rd.To no longer describe in detail element identical among two embodiment.
The difference of JFET200 shown in JFET300 shown in Fig. 3 and Fig. 2 is that JFET300 also is included in the groove that forms in the N-type epitaxial loayer 302.The inwall of groove is lined with for example gate dielectric layer 310 of HfO2, and fills for example grid conductor 311 of doped polycrystalline silicon in groove.This JFET300 also comprises and passes another gate contact 312 that interlayer dielectric layer (ILDL) 306 is electrically connected with grid conductor 311.Grid conductor 311 is also referred to as trench-gate.
When gate contact 308 and another gate contact 312 apply identical or different bias voltage, between tagma 303 and grid conductor 311, produce pinch off region A.Screen 309 reduces the electric field among the pinch off region A at least in part as the electric field shielding layer.Moreover, screen 309 is the new pinch off region B of the generation of the part between screen 309 and tagma 303 in epitaxial loayer 302 also, and the part between screen 309 and grid conductor 311 produces new pinch off region C in epitaxial loayer 302.As a result, tagma 303, grid conductor 311 and the screen 309 common pinchoff effect that produce.
Similar with JFET200 shown in Figure 2, determine the degree of depth and the lateral dimension of blind zone 309 according to blind zone 309 and the minimum range of tagma 303, grid conductor 311, so that both can form pinch off region B, C, can not block conductive path again.
In one embodiment, grid conductor 311 is positioned at the centre of active area, P type tagma 303 arranges with one heart with grid conductor 311, part around N-type epitaxial loayer 302, form the annular of sealing, thereby this part of N-type epitaxial loayer 302 is at least a portion that forms the conductive path between source area and the drain region between P type tagma 303 and the grid conductor 311.
Fig. 4 is the cutaway view according to the semiconductor device 400 that comprises junction field effect transistor (JFET) of an embodiment of the utility model.In Fig. 4, adopt to represent identical element with the similar Reference numeral of Fig. 2, wherein Reference numeral is three bit digital, and first is " 4 ", and second is identical with the respective digital of respective element among Fig. 2 with the 3rd.To no longer describe in detail element identical among two embodiment.
This semiconductor device 400 comprises JFET400a and groove MOSFET (mos field effect transistor) 400b that is integrated on the same semiconductor chip.JFET400a and groove MOSFET 400b are the vertical-type device.Preferably, isolated by the trench-gate electricity that does not apply bias voltage between JFET400a and the groove MOSFET 400b, thereby can save the step that forms additional fleet plough groove isolation structure.JFET400a and groove MOSFET 400b share N+ type drain region 401 (being generally substrate), N-type epitaxial loayer 402 and interlayer dielectric layer (ILDL) 406.
JFET400a is identical with the JFET200 shown in Fig. 2.Groove MOSFET 400b then can be the type of any routine.Groove MOSFET 400b shown in Figure 4 is included in the P type tagma 403b that forms in the N-type epitaxial loayer 402, the N+ type source area 404b that in P type tagma 403b, forms, and in P type tagma 403b, form be positioned at P+ doped region 405b below the N+ type source area 404b.N+ type source area 404b does not directly contact with P+ doped region 405b.Source electrode contact 408b passes ILDL406 and N+ type source area 404b and extends to P+ doped region 405b, and electrically contacts with N+ type source area 404b and P+ doped region 405b.
Groove MOSFET 400b comprises that also passing N+ type source area 404b and P type tagma 403b extends to groove in the N-type epitaxial loayer.The inwall of groove is lined with for example gate dielectric layer 410 of HfO2, and fills for example grid conductor 411 of doped polycrystalline silicon in groove.Gate contact 412 passes interlayer dielectric layer (ILDL) 406 and is electrically connected with grid conductor 411.Grid conductor 411 is also referred to as trench-gate.
When gate contact 412 applies bias voltage, can be controlled at the electric current of the conductive path among the P type tagma 403b that flows through between source area 404b and the drain region 401.
In the semiconductor device 400 of this embodiment, the P type tagma 403a of JFET400a, P+ type doped region 405a, N+ source area 404a contact 408a and can contact 408b with source electrode with P type tagma 403b, P+ doped region 405b, the N+ source area 404b of groove MOSFET 400b and utilize respectively identical mask to form in identical step with source electrode.The trench-gate of groove MOSFET 400b can be used for utilizing identical mask to form in identical step JFET400a and groove MOSFET 400b trench-gate spaced apart from each other.The trench-gate of groove MOSFET 400b only is that with the difference of the trench-gate that is used for isolation the former is applied with bias voltage at work, and the latter floats usually.
In Fig. 4, also show the termination structure adjacent with JFET400a.This termination structure comprises the trench-gate that at least one is used to isolate.Yet just as understood by the skilled person in the art, this termination structure is not limited to the form of trench-gate, can also adopt known structure, for example shallow trench isolation from.
Fig. 5 is the cutaway view according to the semiconductor device 500 that comprises junction field effect transistor (JFET) of an embodiment of the utility model.In Fig. 5, adopt to represent identical element with the similar Reference numeral of Fig. 2, wherein Reference numeral is three bit digital, and first is " 5 ", and second is identical with the respective digital of respective element among Fig. 2 with the 3rd.To no longer describe in detail element identical among two embodiment.
This semiconductor device 500 comprises JFET500a and the plane MOSFET500b that is integrated on the same semiconductor chip.JFET500a is the vertical-type device, and planar MOSFET 500b is planar device.Can directly connect (as shown in Figure 5) according to designing requirement between JFET500a and the plane MOSFET500b.Alternatively, can be by shallow trench isolation from separating between JFET500a and the plane MOSFET500b.The source electrode of the grid of JFET500a shown in Figure 5 and plane MOSFET500b or the direct-connected situation that drains.JFET500a and plane MOSFET500b common semiconductor substrate 501 (being the N+ type drain region of JFET), N-type epitaxial loayer 502, P type tagma 503, interlayer dielectric layer (ILDL) 506 and gate contact 508.
JFET500a is identical with the JFET200 shown in Fig. 2.Planar MOSFET 500b then can be the type of any routine.Should be noted that for simplicity the part of planar MOSFET 500b shown in Figure 5 comprises the part of in source/drain region and channel region, to describe each other related of JFET500a and plane MOSFET500b.As shown in Figure 5, planar MOSFET 500b is included in a N+ type source/drain region 504b who forms in the P type tagma 503.The gate regions 505 of the N+ type source of planar MOSFET 500b/drain region 504b and JFET500a is contiguous, and the gate contact of JFET500a provides electrical connection, thereby directly the N+ type source/drain region 504b of planar MOSFET 500b directly is connected with the gate regions 505 of JFET500a.Planar MOSFET 500b also is included in gate dielectric layer 513 and the grid conductor 514 that forms on the P tagma 503, and wherein gate dielectric layer 513 separates the channel region in grid conductor 514 and the P tagma 503.Although not shown in Fig. 5, planar MOSFET 500b also is included in another N+ type source/drain region 504b that forms in the P tagma 503.
When grid conductor 514 applies bias voltage, can be controlled at the electric current of the channel region in the P type tagma 503 of flowing through between a N+ type source/drain region 504b and another N+ type source/drain region 504b.
In the semiconductor device 500 of this embodiment, the N+ source area 504a of JFET500a can utilize identical mask to form in identical step with the N+ type source/drain region 504b of planar MOSFET 500b.
In Fig. 5, also show the termination structure adjacent with JFET500a.This termination structure can adopt known structure, for example shallow trench isolation from.
Above-described embodiment all relates to the JFET of N raceway groove, because the type of each doped region of P raceway groove JFET is opposite with the JFET of N raceway groove, therefore embodiment of the present utility model only needs slightly to do change and just can be applied to P raceway groove JFET.
Above-mentioned specification of the present utility model and enforcement only are illustrated the utility model in an exemplary fashion, and these embodiment are not fully detailed, and are not used in the scope of the present utility model that limits.It all is possible changing and revise for disclosed embodiment, the selectivity embodiment that other are feasible and can be understood by those skilled in the art the equivalent variations of element among the embodiment.Other variations of embodiment disclosed in the utility model and modification do not exceed spirit of the present utility model and protection range.Therefore, the utility model is intended to comprise that all fall into alternative, the improvement example in the utility model and the scope of the said claims and the purport and change example etc.
Claims (8)
1. a semiconductor device is characterized in that comprising junction field effect transistor, and described junction field effect transistor comprises:
Semiconductor substrate has the first doping type and as the drain region of junction field effect transistor;
Epitaxial loayer is positioned on the Semiconductor substrate, has the first doping type;
The tagma is arranged in epitaxial loayer, has the second doping type, and the second doping type and the first doping type are opposite doping types;
Source area is arranged in epitaxial loayer, has the first doping type; And
Gate regions is arranged in the tagma, has the second doping type,
Wherein, described junction field effect transistor also comprises screen, and screen has the second doping type, is positioned at the inside of epitaxial loayer, and in the conductive path between source area and drain region.
2. semiconductor device according to claim 1, the part between tagma and screen that it is characterized in that epitaxial loayer is pinch off region.
3. semiconductor device according to claim 1 it is characterized in that the tagma is the annular around the part of epitaxial loayer, and source area is arranged in the epitaxial loayer of this part.
4. semiconductor device according to claim 1 is characterized in that the shape of lateral cross section of screen is consistent with the shape of active area.
5. semiconductor device according to claim 1 is characterized in that junction field effect transistor also comprises trench-gate and gate dielectric layer, and this trench-gate is arranged in epitaxial loayer, and is separated by gate dielectric layer and epitaxial loayer.
6. semiconductor device according to claim 5, the part between trench-gate and screen that it is characterized in that epitaxial loayer is pinch off region.
7. each described semiconductor device in 6 according to claim 1 characterized by further comprising groove MOSFET, and this groove MOSFET comprises :/
Described Semiconductor substrate is as the drain region;
Described epitaxial loayer;
Described tagma;
Source area is arranged in epitaxial loayer, has the first doping type;
Trench-gate passes described tagma and enters in the described epitaxial loayer; And
Gate dielectric layer separates trench-gate and described tagma and described epitaxial loayer.
8. each described semiconductor device in 6 according to claim 1 characterized by further comprising planar MOSFET, and this planar MOSFET comprises:
Described Semiconductor substrate;
Described epitaxial loayer;
Described tagma;
Source area and drain region are arranged in described tagma, have the first doping type;
Grid conductor is on the tagma between source area and the drain region; And
Gate dielectric layer between grid conductor and tagma, separates grid conductor and described tagma.
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| CN 201220562097 CN202871800U (en) | 2012-10-30 | 2012-10-30 | Semiconductor device including junction field effect transistor |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102916049A (en) * | 2012-10-30 | 2013-02-06 | 成都芯源系统有限公司 | Semiconductor device including junction field effect transistor and method of manufacturing the same |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN102916049A (en) * | 2012-10-30 | 2013-02-06 | 成都芯源系统有限公司 | Semiconductor device including junction field effect transistor and method of manufacturing the same |
| CN102916049B (en) * | 2012-10-30 | 2015-04-22 | 成都芯源系统有限公司 | Semiconductor device including junction field effect transistor and method of manufacturing the same |
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