CN202837438U - High and low temperature environment integrated test cabinet - Google Patents

High and low temperature environment integrated test cabinet Download PDF

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Publication number
CN202837438U
CN202837438U CN 201220499029 CN201220499029U CN202837438U CN 202837438 U CN202837438 U CN 202837438U CN 201220499029 CN201220499029 CN 201220499029 CN 201220499029 U CN201220499029 U CN 201220499029U CN 202837438 U CN202837438 U CN 202837438U
Authority
CN
China
Prior art keywords
box body
low temperature
enclosed
test cabinet
integrated test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN 201220499029
Other languages
Chinese (zh)
Inventor
张永超
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Zhuhai Gotech Intelligent Technology Co Ltd
Original Assignee
ZHUHAI GOTECH ELECTRONIC TECHNOLOGY Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ZHUHAI GOTECH ELECTRONIC TECHNOLOGY Co Ltd filed Critical ZHUHAI GOTECH ELECTRONIC TECHNOLOGY Co Ltd
Priority to CN 201220499029 priority Critical patent/CN202837438U/en
Application granted granted Critical
Publication of CN202837438U publication Critical patent/CN202837438U/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

The utility model relates to a high and low temperature environment integrated test cabinet, comprising an enclosed box body and a temperature difference electric assembly arranged at the center inside the enclosed box body, wherein the temperature difference electric assembly divides the enclosed box body into mutually-enclosed heat box body and cold box body, and inside the heat box body and the cold box body there are provided a high temperature detection device and a low temperature detection device respectively. The high and low temperature environment integrated test cabinet enables a DC current to flow through the temperature difference electric refrigeration assembly to generate energy transfer and form high and low temperature end faces, the high and low temperature end faces are corresponding to the heat box body and the cold box body respectively and simultaneously generate a heat source and a cold source, and the enclosed box body is used as a test environment, thereby being small in refrigeration and heating range and reducing resource waste.

Description

High and low temperature environment one test cabinet
Technical field
The utility model relates to the electronic product technical field of measurement and test, especially relates to a kind of high low temperature integrated testing of electronic product cabinet of thermoelectric cooling establishment of component.
Background technology
Electronic product all needs high low temperature test environment in processing test link.Present way much all obtains hot environment by heating by the heating heating wire a closed room the inside.Then utilize freon refrigeration to obtain low temperature environment.Shortcoming be to whole room heat or the floor area of freezing large, heat and the required power of freezing can be very large, the wasting of resources.
The utility model content
Because the problem of mentioning in the background technology, the purpose of this utility model just provides a kind of novel set-top box that is integrated with the function of video input.
The purpose of this utility model is achieved through the following technical solutions:
A kind of high and low temperature environment one test cabinet, the thermoelectric assembly that it comprises an airtight casing and is arranged at described airtight casing central interior, described thermoelectric assembly is divided into mutually airtight hot casing and ice chest body with described airtight casing, in described hot casing and the described ice chest body high temperature checkout equipment and low temperature checkout equipment is set respectively.
Compared with prior art, the utility model has the advantage of:
The thermoelectric cooling assembly is that to utilize the thermoelectric effect of semiconductor material be that Bohr's note effectiveness realizes the new technology of freezing: P-type semiconductor material and N-type semiconductor material are connected into galvanic couple pair, energy occurs during by DC current to be shifted, produce high temperature and two end faces of low temperature, corresponding hot casing described in the utility model and two airtight casings of ice chest body produce thermal source and low-temperature receiver simultaneously; And adopt airtight casing to do test environment, power consumption is few, can avoid the wasting of resources.
Description of drawings
Fig. 1 is the structural representation of the utility model embodiment.
Embodiment
As shown in Figure 1, the high and low temperature environment one test cabinet of the present embodiment comprises an airtight casing 10 and is arranged at the thermoelectric assembly 20 of described airtight casing central interior, described thermoelectric assembly 20 is divided into mutually airtight hot casing 11 and ice chest body 12, described hot casing 11 and described ice chest body 12 interior high temperature checkout equipment 110 and the low temperature checkout equipments 120 of arranging respectively with described airtight casing 20.
Concrete, the temperature end of described thermoelectric assembly 20 is facing to described hot casing 11, and low-temperature end is facing to described ice chest body 12.After the energising, the high temperature end face of described thermoelectric assembly 20 heats, and provides heat energy to described hot casing 11; The low temperature end face refrigeration of thermoelectric assembly 20 provides refrigeration source to described ice chest body 12.
The above embodiment has only expressed several embodiment of the present utility model, and it describes comparatively concrete and detailed, but can not therefore be interpreted as the restriction to the utility model claim.Should be pointed out that for the person of ordinary skill of the art, without departing from the concept of the premise utility, can also make some distortion and improvement, these all belong to protection domain of the present utility model.Therefore, the protection domain of the utility model patent should be as the criterion with claims.

Claims (1)

1. a high and low temperature environment one is tested cabinet, it is characterized in that: the thermoelectric assembly that it comprises an airtight casing and is arranged at described airtight casing central interior, described thermoelectric assembly is divided into mutually airtight hot casing and ice chest body with described airtight casing, in described hot casing and the described ice chest body high temperature checkout equipment and low temperature checkout equipment is set respectively.
CN 201220499029 2012-09-28 2012-09-28 High and low temperature environment integrated test cabinet Expired - Fee Related CN202837438U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 201220499029 CN202837438U (en) 2012-09-28 2012-09-28 High and low temperature environment integrated test cabinet

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 201220499029 CN202837438U (en) 2012-09-28 2012-09-28 High and low temperature environment integrated test cabinet

Publications (1)

Publication Number Publication Date
CN202837438U true CN202837438U (en) 2013-03-27

Family

ID=47949114

Family Applications (1)

Application Number Title Priority Date Filing Date
CN 201220499029 Expired - Fee Related CN202837438U (en) 2012-09-28 2012-09-28 High and low temperature environment integrated test cabinet

Country Status (1)

Country Link
CN (1) CN202837438U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105548761A (en) * 2015-12-23 2016-05-04 苏州创瑞机电科技有限公司 High and low temperature aging test equipment based on semiconductor chilling plates

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105548761A (en) * 2015-12-23 2016-05-04 苏州创瑞机电科技有限公司 High and low temperature aging test equipment based on semiconductor chilling plates

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Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
C56 Change in the name or address of the patentee

Owner name: ZHUHAI MAIKE INTELLIGENT TECHNOLOGY CO., LTD.

Free format text: FORMER NAME: ZHUHAI GOTECH ELECTRONIC TECHNOLOGY CO., LTD.

CP03 Change of name, title or address

Address after: 519000 Guangdong city in Zhuhai Province town of Red Bay Area Yongda Road No. 66 No. 2 building

Patentee after: ZHUHAI MAIKE INTELLIGENT TECHNOLOGY CO., LTD.

Address before: 519000 Guangdong city in Zhuhai Province town of Red Bay Area Yongda Road No. 66

Patentee before: Zhuhai Gotech Electronic Technology Co., Ltd.

CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20130327

Termination date: 20190928

CF01 Termination of patent right due to non-payment of annual fee