CN202794343U - CAP/DF (Capacity/Dissipation Factor) testing device - Google Patents
CAP/DF (Capacity/Dissipation Factor) testing device Download PDFInfo
- Publication number
- CN202794343U CN202794343U CN 201220382630 CN201220382630U CN202794343U CN 202794343 U CN202794343 U CN 202794343U CN 201220382630 CN201220382630 CN 201220382630 CN 201220382630 U CN201220382630 U CN 201220382630U CN 202794343 U CN202794343 U CN 202794343U
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- China
- Prior art keywords
- probe base
- toughness
- tape guide
- probes
- cap
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- Measuring Leads Or Probes (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model discloses a CAP/DF (Capacity/Dissipation Factor) testing device, which comprises a bracket, a carrier paper tape guide rail, a height adjustment device opposite to the carrier paper tape guide rail, a probe base, two toughness probes and a testing circuit, wherein the fixed ends of the carrier paper tape guide rail and the height adjustment device are fixedly installed together with the bracket; the probe base and the adjusting end of the height adjustment device are installed in a connecting manner; one ends of the two toughness probes are fixed with the probe base and respectively connected with the anode and the cathode of the testing circuit; and the other ends of the two toughness probes are free ends, which are pressed onto the carrier paper tape guide rail and inclined towards the guide direction of the carrier paper tape guide rail. The CAP/DF testing device provided by the utility model can adapt to the pin interval requirements of different products through the height adjustment device and a rotary adjustment device by adjusting the position of the probe base in relation to the carrier paper tape guide rail; repetitive adjustment and periodic detection in artificial and manual shifting for the toughness probes are avoided; erroneous judgment is effectively avoided; and the working efficiency is provided.
Description
Technical field
The utility model relates to the electric capacity production equipment, relates in particular to a kind of CAP/DF(capacity/loss value) proving installation.
Background technology
In the production run of ceramic capacitor, need at first wire to be arranged on the carrier paper tape (being the ox-hide paper tape), and after being fixed by masking tape (being high temperature gummed tape), carry out follow-up routing, inserted sheet, scolding tin, application, curing, printing, characteristic test, outward appearance screening by transmission carrier paper tape transmission wire again.Wherein characteristic test comprises the CAP/DF test, usually uses the CAP/DF proving installation to carry out the CAP/DF test.
As shown in Figure 1 and Figure 2, existing CAP/DF proving installation comprises support, probe base, two toughness probes, carrier tape guide and test circuits, described probe base and the fixed installation of carrier tape guide; The assembly structure of probe base and toughness probe as shown in Figure 3, Figure 4, an end of two toughness probes fixes with probe base, and be connected with negative pole with the positive pole of test circuit respectively, the toughness probe other end is free end.During use, the carrier paper tape is mobile at the carrier tape guide, the free end of toughness probe is pressed on the carrier paper tape and tilts to the direction of motion of carrier paper tape, as shown in Figure 5, when the free end of two toughness probes was pushed down respectively two pins of a product, test circuit can carry out the CAP/DF test to product.Because the spacing of two pins of the product of different customer demands does not wait, therefore when the different batches product being carried out the CAP/DF test, all need to adjust the free end of two toughness probes along the spacing of paper-carrier direction of belt travel, to satisfy the spacing demand of two pins of product; Present control method is to break off with the fingers and thumb by manual, because the toughness of toughness probe, adjustment need to be carried out repeatedly just reaching requirement repeatedly, and the movement velocity of carrier paper tape is very fast, and the spacing later stage of breaking off with the fingers and thumb in advance very likely changes, and causes erroneous judgement, must manually again detect, operating efficiency is low.
The utility model content
Goal of the invention: in order to overcome the deficiencies in the prior art, the utility model provides a kind of CAP/DF proving installation, avoids when detecting the different batches product, by manual work of breaking two toughness probes off with the fingers and thumb, provides operating efficiency.
Technical scheme: for solving the problems of the technologies described above, the technical solution adopted in the utility model is:
The CAP/DF proving installation, comprise support, the carrier tape guide, the arrangement for adjusting height of relative carrier tape guide, probe base, two toughness probes and test circuit, the stiff end of described carrier tape guide and arrangement for adjusting height and support fixed installation, the adjustable side connection of probe base and arrangement for adjusting height, one end and the probe base of two toughness probes are fixed, and be connected with negative pole with the positive pole of test circuit respectively, the other end of two toughness probes is free end, and the free end of described two toughness probes is pressed on the carrier tape guide, and tilt to the guide direction of carrier tape guide.
In the said structure, increased arrangement for adjusting height, can adjust the free-ended bending amount of toughness probe by regulating arrangement for adjusting height, to adapt to the pin-pitch requirement of different product, avoid breaking off with the fingers and thumb manually repeatedly adjustment and the cycle detection of toughness probe, effectively avoid erroneous judgement, work efficiency is provided.
Preferably, also comprise device for regulating rotary, the stiff end of described device for regulating rotary and the fixed installation of the adjustable side of arrangement for adjusting height, the adjustable side fixed installation of described probe base and device for regulating rotary; Basis at arrangement for adjusting height increases device for regulating rotary, can increase the area requirement that two toughness probe free ends adapt to product.
Preferably, described arrangement for adjusting height is screw-nut body, and described screw-nut body comprises screw structure and nut structure, and described screw structure and support are fixed, and nut structure and probe base are fixed; Screw-nut body is comparatively easy, a reliable structure, and its application is also comparatively general.Described nut structure is and the hard-wired independent nut spare of probe base, perhaps for being arranged on the probe base upper screwed hole.
Preferably, described device for regulating rotary can comprise threaded hole, the adaptive bolt of the adjustable side that is arranged on arrangement for adjusting height and be arranged on threaded hole on the probe base, bolt is screwed in successively in the threaded hole of adjustable side of probe base and arrangement for adjusting height, get final product by bolt-locking behind the relative position of the adjustable side of adjustment probe base and arrangement for adjusting height, simple in structure, easy to adjust.
Beneficial effect: the CAP/DF proving installation that the utility model provides is by arrangement for adjusting height and device for regulating rotary, can adapt to by the position of regulating the relative carrier tape guide of probe base the pin-pitch requirement of different product, avoid breaking off with the fingers and thumb manually repeatedly adjustment and the cycle detection of toughness probe, effectively avoid erroneous judgement, work efficiency is provided.
Description of drawings
Fig. 1 is the structural representation of facing of prior art;
Fig. 2 be among Fig. 1 A-A to cut-open view;
Fig. 3 is the structural representation of facing of probe base and toughness probe assembly;
Fig. 4 is the plan structure synoptic diagram of probe base and toughness probe assembly;
Fig. 5 is the structural representation that probe is pushed down pins of products;
Fig. 6 is the structural representation of facing of the present utility model;
Fig. 7 is the structural representation of facing of probe base and arrangement for adjusting height assembly;
Fig. 8 is the plan structure synoptic diagram of probe base and arrangement for adjusting height assembly.
Embodiment
Below in conjunction with accompanying drawing the utility model is further described.
Such as Fig. 6, Fig. 7, Figure 8 shows that a kind of CAP/DF proving installation, comprise support, carrier tape guide 3, the arrangement for adjusting height of relative carrier tape guide 3, probe base 1, two toughness probes 2 and test circuit, the stiff end of described carrier tape guide 3 and arrangement for adjusting height and support fixed installation, the adjustable side connection of probe base 1 and arrangement for adjusting height, one end of two toughness probes 2 and probe base 1 are fixing, and be connected with negative pole with the positive pole of test circuit respectively, the other end of two toughness probes 2 is free end, and the free end of described two toughness probes 2 is pressed on the carrier tape guide 3, and tilt to the guide direction of carrier tape guide 3.
Preferably, also comprise device for regulating rotary, the stiff end of described device for regulating rotary and the fixed installation of the adjustable side of arrangement for adjusting height, described probe base 1 fixedly mounts with the adjustable side of device for regulating rotary.
Preferably, described arrangement for adjusting height is screw-nut body, and described screw-nut body comprises screw structure 5 and nut structure 6, and described screw structure 5 is fixed with support, and nut structure 6 is fixing with probe base 1; Wherein nut structure 6 is and probe base 1 hard-wired independent nut spare, perhaps for being arranged on probe base 1 upper screwed hole.
The above only is preferred implementation of the present utility model; be noted that for those skilled in the art; under the prerequisite that does not break away from the utility model principle; can also make some improvements and modifications, these improvements and modifications also should be considered as protection domain of the present utility model.
Claims (4)
1.CAP/DF proving installation, it is characterized in that: comprise support, carrier tape guide (3), the arrangement for adjusting height of relative carrier tape guide (3), probe base (1), two toughness probes (2) and test circuit, the stiff end of described carrier tape guide (3) and arrangement for adjusting height and support fixed installation, the adjustable side connection of probe base (1) and arrangement for adjusting height, one end of two toughness probes (2) and probe base (1) are fixing, and be connected with negative pole with the positive pole of test circuit respectively, the other end of two toughness probes (2) is free end, and the free end of described two toughness probes (2) is pressed on the carrier tape guide (3), and tilt to the guide direction of carrier tape guide (3).
2. CAP/DF proving installation according to claim 1, it is characterized in that: also comprise device for regulating rotary, the stiff end of described device for regulating rotary and the fixed installation of the adjustable side of arrangement for adjusting height, described probe base (1) fixedly mounts with the adjustable side of device for regulating rotary.
3. CAP/DF proving installation according to claim 1, it is characterized in that: described arrangement for adjusting height is screw-nut body, described screw-nut body comprises screw structure (5) and nut structure (6), described screw structure (5) is fixed with support, and nut structure (6) is fixing with probe base (1).
4. CAP/DF proving installation according to claim 3 is characterized in that: described nut structure (6) for and the hard-wired independent nut spare of probe base (1), perhaps for being arranged on probe base (1) upper screwed hole.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220382630 CN202794343U (en) | 2012-08-03 | 2012-08-03 | CAP/DF (Capacity/Dissipation Factor) testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220382630 CN202794343U (en) | 2012-08-03 | 2012-08-03 | CAP/DF (Capacity/Dissipation Factor) testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202794343U true CN202794343U (en) | 2013-03-13 |
Family
ID=47821585
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201220382630 Expired - Fee Related CN202794343U (en) | 2012-08-03 | 2012-08-03 | CAP/DF (Capacity/Dissipation Factor) testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202794343U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102788907A (en) * | 2012-08-03 | 2012-11-21 | 昆山微容电子企业有限公司 | Capacitance (CAP)/dissipation factor (DF) testing device |
-
2012
- 2012-08-03 CN CN 201220382630 patent/CN202794343U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102788907A (en) * | 2012-08-03 | 2012-11-21 | 昆山微容电子企业有限公司 | Capacitance (CAP)/dissipation factor (DF) testing device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130313 Termination date: 20160803 |